1、 IEEE Recommended Practice for Using IEEE 1671.2TMInstrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters Sponsored by the IEEE Standards Coordinating Committee 20 o
2、n Test and Diagnosis for Electronic Systems IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Standards Coordinating Committee 20IEEE Std 1871.1-2014IEEE Std 1871.1-2014 IEEE Recommended Practice for Using IEEE 1671.2 Instrument Description Templates for Describing Synthetic Instrumentation for Cl
3、asses of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters Sponsored by the IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems Approved 10 December 2014 IEEE-SA Standards Board Abstract: Instrument Description tem
4、plates, compliant with IEEE Std 1671.2-2012, that providers of synthetic instruments should use to describe waveform generators, digitizers, external local oscillators, and up and down converters are provided in this recommended practice. These synthetic instruments may be integrated in an automatic
5、 test system (ATS) that is to be used to test and diagnose a unit under test (UUT). Keywords: ATML instance document, ATS, automatic test equipment (ATE), Automatic Test Markup Language (ATML), automatic test system, IEEE 1671.2, IEEE 1871.1, instrument, instrumentation, synthetic instrument, XML sc
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35、their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants At the time this IEEE recommended practice was completed, the 1871.1 Working Group had the following membership: Mike Seavey, Chair Chris Gorringe Chatwin Landsdowne Teresa Lopes Scott Mis
36、cha Ion Neag John Sheppard John Stabler The following members of the individual balloting committee voted on this recommended practice. Balloters may have voted for approval, disapproval, or abstention. Malcom Brown Keith Chow David Droste William Frank Chris Gorringe Randall Groves Werner Hoelzl An
37、and Jain Yuri Khersonsky Teresa Lopes Edward McCall Mukund Modi Ion Neag Michael Newman Leslie Orlidge Bartien Sayogo Mike Seavey Joseph Stanco Walter Struppler Daidi Zhong Copyright 2015 IEEE. All rights reserved. vi When the IEEE-SA Standards Board approved this recommended practice on 10 December
38、 2014, it had the following membership: John Kulick, Chair Jon Walter Rosdahl, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Peter Balma Farooq Bari Ted Burse Clint Chaplin Stephen Dukes Jean-Philippe Faure Gary Hoffman Michael Janezic Jeffrey Katz Joseph L. Koepfinger
39、* David J. Law Hung Ling Oleg Logvinov T. W. Olsen Glenn Parsons Ron Petersen Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Don Wright Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janez
40、ic, NIST Representative Don Messina IEEE-SA Content Production and Management Patricia Gerdon IEEE-SA Technical Program Operations Copyright 2015 IEEE. All rights reserved. vii Introduction This introduction is not part of IEEE Std 1871.1-2014, IEEE Recommended Practice for Using IEEE 1671.2 Instrum
41、ent Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters. The Synthetic Instrument Working Group (SIWG) was formed, at Department of Defense request, to define synthetic ins
42、trumentation and its attributes. The SIWG also developed a framework that balances user and supplier objectives, facilitates rapid technology advancements and adaption throughout the test life cycle, and complements/supports other relevant test and measurement industry activities. The goals or desir
43、ed effects of the SIWG activities were to: a) Reduce the total cost of ownership of the automatic test system (ATS). b) Reduce time to develop and field new or upgraded ATSs. c) Provide greater flexibility to the war fighter through the U.S. and coalition partners interoperable ATSs. d) Reduce the A
44、TSs logistics footprint. e) Reduce the ATSs physical footprint. f) Improve the quality of test. The SIWG addressed the reductions from the test and measurement perspective. The SIWG efforts resulted in both the definition of synthetic instruments and the specifications of their respective attributes
45、. Synthetic instruments were originally part of IEEE Std 1671.2-2008, as both an example of InstrumentDescription instances as well as to provide a definition of the necessary parameters/attributes to document a synthetic instrument as defined by the SIWG. Copyright 2015 IEEE. All rights reserved. v
46、iii Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 2 1.3 General 2 1.4 Application of this documents annexes 3 1.5 Usage . 3 1.6 XML template documents . 3 1.7 IEEE 1671.2 XML template documents 3 1.8 Application 3 1.9 Conventions used within this document 4 2. Normative references 5 3. Definition
47、s, acronyms, and abbreviations 5 3.1 Definitions . 5 3.2 Acronyms and abbreviations . 6 4. Synthetic instrumentation . 9 4.1 Digital-to-analog conversion 10 4.2 Analog-to-digital conversion 11 4.3 RF downconversion 11 4.4 RF upconversion .12 4.5 CPU, DSP, FPGA, memory 12 4.6 Signal conditioning and
48、switching 13 5. Waveform generator requirements and XML template instance .13 5.1 Synthetic instrument waveform generator requirements 13 5.2 Waveform generator XML template instance .66 6. Digitizer requirements and XML template instance 66 6.1 Synthetic Instrument digitizer requirements .66 6.2 Di
49、gitizer XML template instance .104 7. Down-converter requirements and XML template instance 105 7.1 Synthetic Instrument down-converter requirements .105 7.2 Down-converter XML template instance123 8. External local oscillator specifications 123 8.1 External LO requirements .123 9. Up converter/synthesizer requirements and XML template instance 126 9.1 Synthetic instrument Up converter/synthesizer requirements .126 9.2 Up converter/synthesizer XML template instance 160 Annex A (informative) Synthetic instrument XML template names and locations .161 Annex B (informat
