IEEE 344-2013 en Seismic Qualification of Equipment for Nuclear Power Generating Stations《核能发电站设备抗震鉴定用IEEE标准》.pdf

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1、 IEEE Standard for Seismic Qualification of Equipment for Nuclear Power Generating Stations Sponsored by the Nuclear Power Engineering Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std 344-2013 (Revision of IEEE Std 344-2004) IEEE Std 344-2013 (Revision

2、of IEEE Std 344-2004) IEEE Standard for Seismic Qualification of Equipment for Nuclear Power Generating Stations Sponsor Nuclear Power Engineering Committee of the IEEE Power and Energy Society Approved 23 August 2013 IEEE-SA Standards Board Abstract: Practices are provided for establishing procedur

3、es that will yield data to demonstrate that the equipment can meet its performance requirements during and/or following one safe shutdown earthquake event preceded by a number of operating basis earthquake events. This standard may be used to establish tests, analyses, or experienced-based evaluatio

4、ns that will yield data to demonstrate equipment performance claims or to evaluate and verify performance of devices and assemblies as part of an overall qualification effort. Common methods currently in use for seismic qualification by test are presented. Two approaches to seismic analysis are desc

5、ribed, one based on dynamic analysis and the other on static coefficient analysis. Two approaches to experienced-based seismic evaluation are described, one based on earthquake experience and the other based on test experience. Keywords: earthquake, earthquake experience, equipment qualification, IE

6、EE 344, inclusion rules, nuclear, operating basis earthquake, prohibited features, qualification methods, required response spectrum, response spectra, safe shutdown earthquake, safety function, seismic, seismic analysis, test experience, test response spectrum, type testing The Institute of Electri

7、cal and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2013 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 22 November 2013. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fi

8、tness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relating to: results; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of

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12、vice of a competent professional in determining the appropriateness of a given IEEE standard. IN NO EVENT SHALL IEEE BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO: PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE,

13、DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH D

14、AMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE. Translations The IEEE consensus development process involves the review of documents in English only. In the event that an IEEE standard is translated, only the English version published by IEEE should be considered the approved IEEE stand

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17、omments for revision of IEEE Standards documents are welcome from any interested party, regardless of membership affiliation with IEEE. However, IEEE does not provide consulting information or advice pertaining to IEEE Standards documents. Suggestions for changes in documents should be in the form o

18、f a proposed change of text, together with appropriate supporting comments. Since IEEE standards represent a consensus of concerned interests, it is important that any responses to comments and questions also receive the concurrence of a balance of interests. For this reason, IEEE and the members of

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21、 all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, b

22、y the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights IEEE draft and approved standards are copyrighted by IEEE under U.S. and international copyright laws. They are made available by

23、 IEEE and are adopted for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making these documents available for use and adopti

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26、 can also be obtained through the Copyright Clearance Center. Updating of IEEE Standards documents Users of IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendmen

27、ts, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. Every IEEE standard is subjected to review at least every ten years. When a document is more than ten years ol

28、d and has not undergone a revision process, it is reasonable to conclude that its contents, although still of some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE standard. In order to determine whethe

29、r a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/ieeexplore.ieee.org/xpl/standards.jsp or contact IEEE at the address listed previously. For more information about the IEEE SA or IE

30、EEs standards development process, visit the IEEE-SA Website at http:/standards.ieee.org. Errata Errata, if any, for all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata

31、periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection

32、 therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willin

33、g or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of As

34、surance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with su

35、bmission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Fur

36、ther information may be obtained from the IEEE Standards Association. Participants At the time this IEEE standard was completed, the SC 2.5 (Seismic) Working Group had the following membership: James Parello, Chair Mostafa A. Ahmed* Paul D. Baughman Melanie Hamner Brown Howard Butler Suresh Channara

37、sappa Garry V. Chapman Pei-Ying Chen Walter Djordjevic Steve Eisenberg Robert Enis Gregory Ferguson* Gregory Hardy* Paul Ibanez* Robert Kassawara* Mohsin Khan William LaPay Karla-Davina Liebig* Bruce M. Lory Marie Nemier Karur S. Parthasarathy* Daniel J. Pomerening John M. Richards Donald Smith Rich

38、ard G. Starck II* *Non-voting member At the time this standard was balloted, Subcommittee 2 on Qualification had the following membership: James F. Gleason, Chair John White, Vice Chair Thomas Koshy, Secretary Chris Abernathy Saleem Akhtar Steve Benson Tom Brewington Nissen M. Burstein Steve Casadev

39、all Suresh Channarasappa Garry V. Chapman Jake Chilek Jonathan Cornelius James Dean Dennis Dellinger Phil DiBenedetto Yikang Dou Michael Dougherty Frank Drumm Yasutaka Eguchi Walter F. Emerson Wells Fargo Sean Foley Robert Francis Patrick Gove Bill Hadovski Charles Hills Jang Hong-Seok Dirk-Christia

40、n Hopp David A. Horvath Ken Kettle Robert Konnik Kofi Korsah Serena Krause Gerald Liskom Bruce M. Lory Huaxing Lu Tania Martinez-Navedo Matthew McConnell Daniel Mikow Asif Mohiuddin Charles Mohr Edward R. Mohtashemi Marie Nemier Bill Newell Sven-Olof Palm James Parello Janez Pavsek Chris Pegge Jan P

41、irrong Robert Queenan Sheila Ray Fredrick Roy Steve Sandberg Glen E. Schinzel Kjell Spng Rebecca Steinman Marek Tengler Ying Wang Carl Weber John Wheless Richard Wood Copyright 2013 IEEE. All rights reserved. viAt the time this standard was balloted, Nuclear Power Engineering Committee had the follo

42、wing membership Satish Aggarwal, Chair George A. Ballassi, Vice Chair James Parello, Secretary Ijaz Ahmad Dheya Al-Othmany George Attarian Farouk D. Baxter* Royce Beacom Mark D. Bowman Daniel F. Brosnan Nissen M. Burstein Keith Bush Robert C. Carruth John P. Carter Suresh Channarasappa Dennis Dellin

43、ger David R. Desaulniers John Disosway Walter F. Emerson Stephen Fleger Robert J. Fletcher Robert Francis Robert B. Fuld David Gladey James F. Gleason Dale T. Goodney Robert Hall Kuljit Hara Daryl Harmon Dirk C. Hopp David A. Horvath Paul R. Johnson Christopher J. Kerr Bok-Ryul Kim Thomas Koshy Jame

44、s K. Liming Bruce A. Lord John D. Macdonald J. Scott Malcolm Alexander Marion* Michael H. Miller Edward R. Mohtashemi Yasushi Nakagawa Julius Persensky* Ted Riccio Mark F. Santschi Glen E. Schinzel Zdenko Simic James E. Stoner, Jr.* Marek Tengler James E. Thomas Masafumi Utsumi Michael Waterman Edwa

45、rd Wenzinger John White Paul L. Yanosy, Sr. Won Young Yun David J. Zaprazny Oon-Pyo Zhu*Non-voting member vii Copyright 2013 IEEE. All rights reserved. The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstentio

46、n. Michael Dougherty Satish Aggarwal George A. Ballassi Royce Beacom William Bloethe Thomas Brewington Daniel Brosnan Melanie Hamner Brown Nissen M. Burstein Robert C. Carruth Suresh Channarasappa Garry Chapman Weijen Chen Tom Crawford Marie Cuvelier John Disosway Wells Fargo Stephen Fleger Sean Fol

47、ey Robert B. Fuld Dale Goodney Ron Greenthaler Randall C. Groves Ajit Gwal Daryl Harmon Hamidreza Heidarisafa Werner Hoelzl Dirk Hopp David A. Horvath Paul Johnson John Kay Jim Kulchisky Michael Lauxman Bruce M. Lory John Macdonald Jose Marrero Michael May John Merando Michael S. Newman Charles Nget

48、he James Parello Jan Pirrong Ted Riccio Fredrick Roy Bartien Sayogo Glen E. Schinzel James Smith Gary Stoedter James E. Thomas John Vergis Michael Waterman John Webb Kenneth White James Wilson Paul L. Yanosy, Sr. Shuhui Zhang viii Copyright 2013 IEEE. All rights reserved. When the IEEE-SA Standards

49、Board approved this standard on 23 August 2013, it had the following membership: John Kulick, Chair David J. Law, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Peter Balma Farooq Bari Ted Burse Wael William Diab Stephen Dukes Jean-Philippe Faure Alexander Gelman Mark Halpin Gary Hoffman Paul Houz Jim Hughes Michael Janezic Joseph L. Koepfinger* Oleg Logvinov Ron Petersen Gary Robinson Jon Walter Rosdahl Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus Also included are the following nonvotin

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