IEEE 352-2016 en Guide for General Principles of Reliability Analysis of Nuclear Power Generating Station Systems and Other Nuclear Facilities.pdf

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1、 IEEE Guide for General Principles of Reliability Analysis of Nuclear Power Generating Station Systems and Other Nuclear Facilities Sponsored by the Nuclear Power Engineering Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std 352-2016(Revision of IEEE Std

2、 352-1987)IEEE Std 352-2016 (Revision of IEEE Std 352-1987) IEEE Guide for General Principles of Reliability Analysis of Nuclear Power Generating Station Systems and Other Nuclear Facilities Sponsor Nuclear Power Engineering Committee of the IEEE Power and Energy Society Approved 7 December 2016 IEE

3、E-SA Standards Board Abstract: General reliability and availability analysis methods that can be applied to structures, systems, and components (SSCs) in nuclear power generating stations and other nuclear facilities are contained in this guide. Keywords: availability, Class 1E, failure rate, IEEE 3

4、52, MTBF, MTTF, MTTR, nuclear power generating station, reliability The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2017 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 7 April 2017. Print

5、ed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relating to: results; and workmanl

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28、cessed on the IEEE-SA Website at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by pa

29、tent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is

30、listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that ar

31、e demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for condu

32、cting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expres

33、sly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association Copyright 2017 IEEE. All rights reserved. 6 Participants At the time this IE

34、EE guide was completed, the Reliability (PE/NPE/WG_3.3) Working Group had the following membership: John A. Stevens, ChairGeorge Ballassi John Beatty Tom Crawford Marie Cuvelier John Erinc Sharon Honecker Jacob Kulangara James K. Liming Joseph Napper Vish Patel Sheila Ray Ted Riccio Yvonne Williams

35、Kiang Zee At the time this IEEE guide was completed, the Operations, Surveillance, Aging, Reliability, and Testing Subcommittee (SC-3) had the following membership: Yvonne Williams, Chair Tom Crawford, Vice-Chair Gopal Aravapalli George Ballassi John Beatty Thomas Carrier Suresh Channarasappa Marie

36、Cuvelier John Erinc Edward Eustace Hamid Heidarisafa Sharon Honecker Steven Hutchins Jacob Kulangara James K. Liming Kirklyn Melson Edward Mohtashemi Joseph Napper James Parello Vish Patel Sheila Ray Ted Riccio Rebecca Steinman Craig Sellers John Stevens John Taylor Kiang Zee At the time this IEEE g

37、uide was completed, the Nuclear Power Engineering Committee (NPEC) had the following membership: Stephen Fleger, Chair Thomas Koshy, Vice-Chair Daryl Harmon, Secretary Satish Aggarwal Ijaz Ahmad George Attarian George Ballassi Royce Beacom Mark Bowman Keith Bush Robert Carruth John Carter Suresh Cha

38、nnarasappa Paul Colaianni Tom Crawford Dennis Dellinger David Desaulniers John Disosway Kenneth Fleischer Robert Fletcher Robert Francis Cristopher Georgeson James Gleason Dale Goodney Robert Hall David Herrell Dirk Hopp Greg Hostetter Steven Hutchins Gary Johnson Chris Kerr Wolfgang Koenig Robert K

39、onnik James K. Liming Bruce Lord John MacDonald Scott Malcolm Kenneth Miller Michael Miller Edward Mohtashemi Yasushi Nakagawa Warren Odess-Gillett Ted Riccio Mitchell Staskiewicz Rebecca Steinman John Stevens Marek Tengler Sudhir Thakur James Thomas Masafumi Utsumi Tammy Womack John White Yvonne Wi

40、lliams Paul YanosyCopyright 2017 IEEE. All rights reserved. 7 The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Satish Aggarwal George Ballassi John Beatty Jason Bellamy Daniel Brosnan Gustavo Brunello

41、Nissen Burstein Robert Carruth Tom Crawford John Disosway Neal Dowling John Erinc Stephen Fleger Dale Goodney Eric W. Gray Randall Groves Ajit Gwal Daryl Harmon Hamidreza Heidarisafa Lee Herron Werner Hoelzl Greg Hostetter Steven Hutchins Yuri Khersonsky Yoonik Kim Robert Konnik Thomas Koshy Jacob K

42、ulangara Benjamin Lanz Michael Lauxman James K. Liming Bruce Lord Omar Mazzoni Kirklyn Melson Andrew Nack Warren Odess-Gillett Mirko Palazzo Howard Penrose Ted Riccio Jeremy Smith Deirdre Spaulding Rebecca Steinman John A. Stevens John Vergis Yvonne Williams Shuhui ZhangWhen the IEEE-SA Standards Bo

43、ard approved this guide on 7 December 2016, it had the following membership: Jean-Philippe Faure, Chair Ted Burse, Vice Chair John D. Kulick, Past Chair Konstantinos Karachalios, Secretary Chuck Adams Masayuki Ariyoshi Stephen Dukes Jianbin Fan J. Travis Griffith Gary Hoffman Ronald W. Hotchkiss Mic

44、hael Janezic Joseph L. Koepfinger* Hung Ling Kevin Lu Annette D. Reilly Gary Robinson Mehmet Ulema Yingli Wen Howard Wolfman Don Wright Yu Yuan Daidi Zhong *Member Emeritus8 Copyright 2017 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 352-2016, IEEE Guide for Gene

45、ral Principles of Reliability Analysis of Nuclear Power Generating Station Systems and Other Nuclear Facilities. This document is basically tutorial and has been prepared to provide the user with the basic principles that are needed to conduct a reliability analysis of safety systems. It is not expe

46、cted or intended that any individual or organization would need all of the principles that are presented. For example, an organization may be concerned with quantitative analysis and mathematical modeling as discussed in Clause 6. The very important problem of failure data is discussed in Clause 7;

47、the material on probability distributions, estimation, and confidence intervals may be used by those who are concerned with analysis and evaluation of failure and repair rate data that will be accumulated as nuclear power generating station operating experience is accrued. The material on establishe

48、d data programs may be of more immediate use to those who make reliability or availability predictions on current safety system designs. This document was originally prepared to provide a common and consistent means of reliability analysis for protection systems covered by IEEE Std 279-1971, IEEE St

49、andard: Criteria for Protection Systems for Nuclear Power Generating Stations. In the intervening years, IEEE Std 279 has been superseded by IEEE Std 603, and in March, 1984, IEEE Std 279 was withdrawn. This standard has been expanded in revisions since 1971 to include many technical areas as they have become important. In accord with the current version of IEEE Std 603, it has been generalized to apply to safety systems. The general principles presented in this document, and further information given by the references, are sufficient to conduct the reliability/availabil

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