1、IEEE Std 82-2002(Revision of IEEE Std 82-1994)IEEE Standards82TMIEEE Standard Test Procedure forImpulse Voltage Tests on InsulatedConductorsPublished by The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USA3 March 2003IEEE Power Engineering SocietySpo
2、nsored by theInsulated Conductors CommitteeIEEE StandardsPrint: SH95062PDF: SS95062Recognized as anAmerican National Standard (ANSI)The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2003 by the Institute of Electrical and Electronics Engi
3、neers, Inc.All rights reserved. Published 3 March 2003. Printed in the United States of America.Second Printing: 11 August 2009. Correction to Figure 1.IEEE is a registered trademark in the U.S. Patent (978) 750-8400. Permission to photocopy portions of any individual standard for educationalclassro
4、om use can also be obtained through the Copyright Clearance Center.Note: Attention is called to the possibility that implementation of this standard may require use of subject mat-ter covered by patent rights. By publication of this standard, no position is taken with respect to the existence orvali
5、dity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patentsfor which a license may be required by an IEEE standard or for conducting inquiries into the legal validity orscope of those patents that are brought to its attention.Copyright 2003 IEEE. All
6、rights reserved. iiiIntroduction(This introduction is not part of IEEE Std 82-2002, IEEE Standard Test Procedure for Impulse Voltage Tests on InsulatedConductors.)The revision to IEEE Std 82-1994, IEEE Standard Test Procedure for Impulse Voltage Tests on InsulatedConductors, contains many changes wh
7、ich are designed to make the standard clearer and easier to follow.The revised standard is now completely metric and contains more details particularly on test reports.ParticipantsAt the time this standard was approved, Working Group C14 of the Cable Systems Subcommittee C of theInsulated Conductors
8、 Committee of the IEEE Power Engineering Society had the following membership:Vern Buchholz, ChairBill Taylor, Vice ChairThe following members of the balloting committee voted on this standard. Balloters may have voted forapproval, disapproval, or abstention. When the IEEE-SA Standards Board approve
9、d this standard on 11 December 2002, it had the followingmembership:James T. Carlo, ChairJames H. Gurney, Vice ChairJudith Gorman, Secretary*Member EmeritusAlain T. BolligerThomas C. Champion, IIIJohn H. CooperYinsan GauRichard A. HartleinWolfgang B. HaverkampLauri J. HiivalaStanley R. HowellGael R.
10、 KennedyFrank J. KrajickHarry E. OrtonJohannes RickmannDirk RusswurmJohn T. Smith, IIIMark D. WaltonTorben AaboKenneth BowKraig BaderVern BuchholzThomas C. Champion, IIIJack CherryJohn H. CooperTommy CooperGuru Dutt DhingraRandall DotsonRobert GearLuzzi GlennWilliam GoldbachAjit GwalRichard HarpWolf
11、gang B. HaverkampLauri J. HiivalaEdward Horgan, Jr.Dennis JohnsonGael R. KennedyAlbert KongWilliam LarzelereMaurice LinkerGregory LuriKeith MalmedalEric MarsdenJames MedekGary MichelDaleep MohlaShantanu NandiJohannes RickmannJames RuggieriFrank StepniakJohn TeixeiraMilan UzelacGerald VaughnJonathan
12、WoodworthSid BennettH. Stephen BergerClyde R. CampRichard DeBlasioHarold E. EpsteinJulian Forster*Howard M. FrazierToshio FukudaArnold M. GreenspanRaymond HapemanDonald M. HeirmanRichard H. HulettLowell G. JohnsonJoseph L. Koepfinger*Peter H. LipsNader MehravariDaleep C. MohlaWilliam J. MoylanMalcol
13、m V. ThadenGeoffrey O. ThompsonHoward L. WolfmanDon Wrightiv Copyright 2003 IEEE. All rights reserved.Also included is the following nonvoting IEEE-SA Standards Board liaison:Alan Cookson, NIST RepresentativeSatish K. Aggarwal, NRC RepresentativeSavoula AmanatidisIEEE Standards Managing EditorCopyri
14、ght 2003 IEEE. All rights reserved. vContents1. Overview 11.1 Scope 11.2 Purpose. 12. References 13. Testing equipment 23.1 Impulse generator 23.2 Wave shape 24. Specimen 34.1 Length 34.2 Electrode arrangement . 34.3 Sample terminations 35. Test procedures 35.1 Test temperature 35.2 Sample condition
15、ing 45.3 Basic Impulse Insulation Level (BIL) qualification tests 45.4 Impulse design test. 65.5 Switching impulse test. 85.6 Test reports 8Annex A (informative) Bibliography 9Copyright 2003 IEEE. All rights reserved. 1IEEE Standard Test Procedure for Impulse Voltage Tests on Insulated Conductors1.
16、OverviewInsulated conductors in service are subjected to voltage surges from lightning, switching, and other sources.These surges vary widely in wave shape, magnitude, and frequency of occurrence. Laboratory tests cannotduplicate the wide variety of surges met in service. Standard test procedures, h
17、owever, make it possible tocompare the impulse strength of different insulations measured by different laboratories, at different times.1.1 ScopeThis test procedure applies to both switching impulse and lightning impulse tests on cables or cable systemsincorporating laminated or extruded insulations
18、. The term laminated cable, as used in this procedure,includes high-pressure pipe cable, low-pressure gas-filled cable, self-contained liquid-filled cable, solid-paper cable, and other taped cable designs. A cable system is a cable with one or more accessories attached.This test procedure is not int
19、ended to replace any existing or future standards covering cable or cable acces-sories, impulse generators, impulse testing, or voltage measurements. It is intended to supplement such stan-dards by indicating specific procedures for a specific type of cable system or cable system component.This test
20、 procedure does not apply to cables or cable systems that utilize gas or gas spacers as the sole insu-lating medium. This test procedure applies to individual cable accessories only when referenced by the spe-cific accessory standard.1.2 PurposeThis test procedure is intended as a guide for impulse
21、testing of insulated conductors (cables) and cableswith accessories installed (cable systems). It can be used as a design or qualification test for cables or cablesystems.2. ReferencesThis standard shall be used in conjunction with the following standard. When the following standard issuperseded by
22、an approved revision, the revision shall apply. IEEEStd 82-2002 IEEE STANDARD TEST PROCEDURE FOR2 Copyright 2003 IEEE. All rights reserved.IEEE Std 4TM-1995, IEEE Standard Techniques for High-Voltage Testing.1,23. Testing equipment3.1 Impulse generatorThe impulse generator should have sufficient cap
23、acity to deliver the required wave shape and magnitude tothe test sample within the tolerances set.3.2 Wave shapeA standard 1.2/50 s wave shall be used for lightning impulses. When possible, a standard 250/2500 swave shall be used for switching impulses. These waves are defined fully in IEEE Std 4-1
24、995.3.2.1 Wave shape measurementA calibrated voltage divider and transient recorder or oscilloscope shall be used to observe and record theimpulse wave shape. The wave shape and magnitude shall be determined according to IEEE Std 4-1995. Thewave shape shall be determined first at reduced voltage wit
25、h the test sample connected to the test circuit.3.2.2 Lightning wave shape toleranceA wave within the following tolerances shall be used for lightning impulses:a) Wave front time: 1.2 0.36 sb) Wave time to half-value: 50 10 sc) Wave peak value: 3% of required magnitudeWhen test circuit constraints o
26、r a large capacitance of the test sample make it impractical to meet the light-ning impulse wave specifications above, a wave front time of up to 5 s may be used with mutual agreementof the parties involved.3.2.3 Switching wave shape tolerance A wave within the following tolerances shall be used for
27、 switching impulses:a) Wave time to peak: 250 50 sb) Wave time to half-value: 2500 1500 sc) Wave peak value: 3% of required magnitudeWhen test circuit constraints make it impractical to meet the switching impulse specifications above, a dif-ferent wave shape may be used with mutual agreement of the
28、parties involved.1The IEEE standards or products referred to in Clause 2 are trademarks owned by the Institute of Electrical and Electronics Engineers,Incorporated.2IEEE publications are available from the Institute of Electrical and Electronics Engineers, Inc. 445 Hoes Lane, P.O. Box 1331, Piscat-a
29、way, NJ 08855-1331, USA (http:/www.standards.ieee.org/).IEEEIMPULSE VOLTAGE TESTS ON INSULATED CONDUCTORS Std 82-2002Copyright 2003 IEEE. All rights reserved. 34. Specimen4.1 LengthA minimum cable length of 9 m between grounded ends of the test terminations, when no other accessoriesare involved or
30、as required by the specific cable standard, shall be provided. When other accessories areincluded in the test circuit, a minimum cable test length of 4.5 m between the ends of accessories, andbetween the accessories and grounded end of the test terminations, shall be provided. When testing accesso-r
31、ies only, shorter cable lengths are allowed (see specific accessory standard).4.2 Electrode arrangement4.2.1 Inner electrode The inner electrode consists of the cable conductor, including any conductive shielding.4.2.2 Outer electrodeThe outer grounded electrode depends upon the type of cable and vo
32、ltage rating.a) Shielded cables. Shielded cables, including those having external metallic coverings, shall be testedin their final construction, or as agreed upon between user and manufacturer.1) Pressurized cables and cable systems shall be tested at minimum recommended operating pres-sure, and wi
33、th the design filling medium, or as agreed between user and manufacturer.2) Other shielded cables shall be tested in air, at atmospheric pressure.3) Other specifications may require certain extruded cables to be tested in conduit.b) Nonshielded cables. Nonshielded cables (i.e., those having no exter
34、nal metallic or semiconductingcoverings over the insulation) shall be tested with the active length (test sample length) in conduc-tive water that serves as the outer electrode. As an alternative, the cable may be tested in air after ithas been prepared with semiconducting tape or paint and metal br
35、aid or mesh as an outer electrode.4.3 Sample terminationsIf a cable or joint is being evaluated, end preparations may be test terminals, such as water terminals or resis-tive terminals. If a cable system is being evaluated, the active length shall include at least one of each type ofcommercial termi
36、nation designated for use on the cable system.Preparation of test terminations should be conservative but adequate to ensure a test failure in the activelength of the cable or the cable accessory being tested.5. Test procedures5.1 Test temperatureThe temperature of the cable conductor shall be maint
37、ained at a constant value during the test. The tempera-ture of the cable conductor shall be set at the recommended maximum continuous operating temperature (+5C, 0 C) unless otherwise agreed upon. Other specifications may require individual cable system compo-nents to be tested at temperatures other
38、 than the maximum continuous operating temperature. Temperaturecontrol by conductor heating is preferred. External heating is allowed only by agreement between the par-ties. DC service application cable systems require conductor heating.IEEEStd 82-2002 IEEE STANDARD TEST PROCEDURE FOR4 Copyright 200
39、3 IEEE. All rights reserved.The conductor temperature may be determined either by direct measurement in a dummy cable, by directmeasurements in the test sample, or by calculation if the thermal resistance of the cable insulation is agreedupon by the parties. A dummy cable is identical to the test sa
40、mple and subjected to the same conditions,except that no voltage is applied. The dummy cable may be tested prior to the actual test samples.5.2 Sample conditioningBoth ends of the test sample conductor shall be connected to the impulse generator. A positive polarityimpulse of 50%, then 65%, and then
41、 80% of the intended test shall be applied to the conductor, with theouter electrode grounded. This conditioning procedure shall be repeated each time polarity is reversed, usingthe polarity of the impulse that will follow the conditioning. If agreed to by the parties involved, sample con-ditioning
42、may be eliminated, which creates a more severe test condition.5.3 Basic Impulse Insulation Level (BIL) qualification tests5.3.1 Test levelBIL levels for a voltage class are shown in Table 1 for reference purposes only. Not all cable types are avail-able in all voltage classes. Other withstand levels
43、 may be specified for some cable systems and cable acces-sories. Accessory BIL ratings may differ from these system BIL levels. A withstand level for a cable systemthat is different than the BIL value shown in Table 1 may be specified. In this case, the specified withstandlevel should be used as the
44、 BIL for the test in 5.3.Table 1System BIL LevelsVoltage class(kV phase-to-phase)BIL(kV)2.5 605.0 758.0 9515.0 11025.0 15035.0 20046.0 25069.0 35092.0 450115.0 550138.0 650161.0 750230.0 1050345.0 1300500.0 1550IEEEIMPULSE VOLTAGE TESTS ON INSULATED CONDUCTORS Std 82-2002Copyright 2003 IEEE. All rig
45、hts reserved. 5a) Positive polarity impulse applications. The initial positive polarity test impulse voltage shall beapplied to the sample at the BIL value (or specified withstand level) after conditioning according to5.2. This initial impulse shall be followed with nine more positive polarity impul
46、ses of the samevalue in rapid succession.b) Negative polarity impulse applications. Following the positive polarity impulse tests, the impulsegenerators polarity shall be changed. The sample shall be conditioned for negative polarity accord-ing to 5.2, and the first negative BIL wave shall be applie
47、d. The remaining nine negative polarityBIL impulses shall be applied in rapid succession. Figure 1 illustrates the proper procedure in aflowchart format.c) Time limitation. If the required BIL impulses described in Steps 15 of Figure 1 are not completedwithin 2 h, all of the BIL impulses shall be re
48、peated unless an alternate agreement is reachedbetween the parties involved.Figure 1Impulse BIL testIEEEStd 82-2002 IEEE STANDARD TEST PROCEDURE FOR6 Copyright 2003 IEEE. All rights reserved.5.3.2 Nonrated cablesInsulated conductors not designed for a specific voltage class shall be tested as descri
49、bed in 5.3.1, with theexception that the BIL value is assumed to be 25% of the anticipated impulse breakdown voltage.5.3.3 AccessoriesSome cable accessory standards require a different impulse BIL test procedure. Refer to the standard for thespecific accessory being tested.5.3.4 Dielectric failure A dielectric failure at a particular impulse level is indicated by a distinct change in wave shape during theimpulse test. 5.3.5 Dielectric integrity verificationA power frequency voltage withstand test shall be used to demonstrate the dielectric integri
