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10、3#23#23#23#23#23#23#23;#23#23#23g49g82g89g72g80g69g72g85;#23#23#23;#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23;#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23;#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23;#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#2
11、3#23#23#23#23#23#23#23#23#23#23g49;#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23;#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23;#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23g38Authorized licensed use limited to: IHS Stephanie Dejesus. Downlo
12、aded on November 20, 2009 at 05:07 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Authorized licensed use limited to:
13、 IHS Stephanie Dejesus. Downloaded on November 20, 2009 at 05:07 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-ANSI
14、N323C-2009 American National Standard for Radiation Protection Instrumentation Test and Calibration Air Monitoring Instruments Sponsor National Committee on Radiation Instrumentation, N42 Accredited by the American National Standards Institute Secretariat Institute of Electrical and Electronics Engi
15、neers, Inc. Approved 21 May 2009 American National Standards Institute Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on November 20, 2009 at 05:07 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under
16、 license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Abstract: Test and calibration requirements for air monitoring instruments used for the detection and measurement of airborne radioactive substances are established. Keywords: calibration, radioactiv
17、e air monitoring, tests The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2009 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 6 November 2009. Printed in the United States of America. IEEE
18、is a registered trademark in the U.S. Patent +1-978-750-8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on November 20, 2
19、009 at 05:07 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Introduction This introduction is not part of ANSI N323C-
20、2009, American National Standard for Radiation Protection Instrumentation Test and CalibrationAir Monitoring Instruments. This standard is the responsibility of the Accredited American Standards Committee on Radiation Instrumentation, N42. The standard was approved by N42 letter ballot. Notice to us
21、ers Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the ap
22、plicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide varie
23、ty of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private use
24、rs, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigen
25、da, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance
26、 of amendments, corrigenda, or errata, visit the IEEE Standards Association Web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IE
27、EE-SA Web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. v Copyright 2009 IEEE. All rights
28、 reserved. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on November 20, 2009 at 05:07 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networkin
29、g permitted without license from IHS-,-,-Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter cover
30、ed by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into th
31、e legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determi
32、nation of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vi Copyright 2009 IEEE. All rights reserved. Authorized licensed use limited to: IHS Stephanie Deje
33、sus. Downloaded on November 20, 2009 at 05:07 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-vii Copyright 2009 IEEE.
34、 All rights reserved. Participants At the time it approved this standard, the Accredited Standards Committee on Radiation Instrumentation, N42, had the following membership: Michael P. Unterweger, Chair Louis Costrell, Deputy Chair William Ash, Administrative Secretary Organization Represented.Name
35、of Representative Bartlett Services . Morgan Cox Canberra .Markku Koskelo Chew, M.H . Jack M. Selby Commerce Dept, U.S. NIST.Michael P. Unterweger .Louis Costrell (Alt.) Consultant Frank X. Masse Department of Homeland Security.Peter Shebell Entergy-ANO . Ron Schwartz Health Physics Society .Sandy P
36、erle IEEE . Louis Costrell Anthony Spurgin (Alt.) Michael P. Unterweger (Alt.) International Medcom Don Sythe Lawrence Berkeley National Laboratory.Edward J. Lampo Lawrence Livermore National Laboratory Gary Johnson NASA, GSFC R. Sachidananda Babu Nuclear Regulatory Commission Cynthia Jones Nuclear
37、Standards Unlimited Al N. Tschaeche Oak Ridge National Laboratory Peter J. Chiaro, Jr. . Charles Britton (Alt.) ORTEC Ronald M. Keyser Pacific Northwest National Laboratory. Richard Kouzes Swinth AssociatesKenneth L. Swinth U.S. Army Edward Groeber U.S. Nuclear Regulatory Commission. Cynthia G. Jone
38、s Members-At-LargeErnesto Corte . Joseph C. McDonald Paul L. Phelps . Joseph Stencel Lee J. Wagner Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on November 20, 2009 at 05:07 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers
39、, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-At the time this standard was approved, Subcommittee N42.RPI had the following membership: Morgan Cox, Co-Chair Jack M. Selby, Co-Chair Dru Carson Peter J. Chiaro, Jr. Jac
40、k Cooley Leo Faust Edward Groeber Jerry Hiatt Mark D. Hoover Ron Keyser J. C. McDonald Robert Murphy Cheryl Olson Scott Rogers Michael P. Unterweger Ed Walker Chuan-Fu Wu At the time this standard was approved, the ANSI N323C Working Group had the following members: Michelle L. Johnson, Co-Chair Mar
41、k D. Hoover, Co-Chair L. Bryan Belvin Brent Blunt Morgan Cox Stephen A. Epperson Michael S. Ford Robert J. Ford John A. Glissmeyer Robert A. Kellner Timothy Martinson George J. Newton John C. Rodgers Johnafred M. Thomas James T. Voss viii Copyright 2009 IEEE. All rights reserved. Authorized licensed
42、 use limited to: IHS Stephanie Dejesus. Downloaded on November 20, 2009 at 05:07 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license fr
43、om IHS-,-,-Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 2 1.3 Special word usage 2 2. Relationship to other standards. 2 3. Definitions 3 4. Program elements . 6 4.1 Type testing . 6 4.2 Acceptance testing. 6 4.3 Initial calibration 7 4.4 Functional checks 7 4.5 Maintenance and recalibration. 8
44、4.6 Performance tests. 9 5. Air flow rate calibrations 10 6. Instrument calibrations . 10 6.1 Pre-calibration inspection 10 6.2 As-found readings 11 6.3 Electronic calibration. 11 6.4 Meters and chart recorders. 11 6.5 Background response verification . 12 6.6 Calibration of background subtraction 1
45、3 6.7 Alarm circuit verification. 13 6.8 Radiological calibration. 13 7. Additional calibration requirements for particulate and noble gas monitors 13 7.1 Alpha and beta particulate monitors 14 7.2 Keep-alive sources. 14 7.3 Noble gas monitors 14 8. Calibration for special conditions. 15 9. Faciliti
46、es, conditions, and equipment . 16 9.1 Calibration facility. 16 9.2 Test and calibration conditions 16 9.3 Calibration standards . 17 9.4 Maintenance of standards 17 9.5 Check sources 18 10. Documentation . 18 10.1 Facility documentation 18 10.2 Instrument documentation . 19 ix Copyright 2009 IEEE.
47、All rights reserved. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on November 20, 2009 at 05:07 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or
48、 networking permitted without license from IHS-,-,-x Copyright 2009 IEEE. All rights reserved. Annex A (informative) Summary of a life-cycle approach to instrument development and application 20 Annex B (informative) Flow rate meter calibrations 22 Annex C (informative) Bibliography 23 Authorized li
49、censed use limited to: IHS Stephanie Dejesus. Downloaded on November 20, 2009 at 05:07 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,
