1、Designation: E3125 17Standard Test Method forEvaluating the Point-to-Point Distance MeasurementPerformance of Spherical Coordinate 3D Imaging Systemsin the Medium Range1This standard is issued under the fixed designation E3125; the number immediately following the designation indicates the year ofor
2、iginal adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method covers the performance evaluation oflaser-ba
3、sed, scanning, time-of-flight, single-detector 3D imag-ing systems in the medium-range and provides a basis forcomparisons among such systems. This standard best applies tospherical coordinate 3D imaging systems that are capable ofproducing a point cloud representation of an object of interest.In pa
4、rticular, this standard establishes requirements and testprocedures for evaluating the derived-point to derived-pointdistance measurement performance throughout the work vol-ume of these systems. Although the tests described in thisstandard may be used for non-spherical coordinate 3D imagingsystems,
5、 the test method may not necessarily be sensitive to theerror sources within those instruments.1.2 System performance is evaluated by comparing mea-sured distance errors between pairs of derived-points to themanufacturer-specified, maximum permissible errors (MPEs).In this standard, a derived-point
6、is a point computed usingmultiple measured points on the target surface (such as thecenter of a sphere). In the remainder of this standard, the termpoint-to-point distance refers to the distance between twoderived-points.1.3 The term “medium-range” refers to systems that arecapable of operating with
7、in at least a portion of the ranges from2 m to 150 m. The term “time-of-flight systems” includesphase-based, pulsed, and chirped systems. The word “stan-dard” in this document refers to a documentary standard inaccordance with Terminology E284.1.4 This test method may be used once to evaluate theIns
8、trument Under Test (IUT) for a given set of conditions or itmay be used multiple times to assess the performance of theIUT for various conditions (for example, surface reflectancefactors, environmental conditions).1.5 SI units are used for all calculations and results in thisstandard.1.6 This test m
9、ethod is not intended to replace morein-depth methods used for instrument calibration orcompensation, and specific measurement applications mayrequire other tests and analyses.1.7 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsib
10、ility of the user of this standard to establish appro-priate safety, health, and environmental practices and deter-mine the applicability of regulatory limitations prior to use.Some aspects of the safe use of 3D imaging systems arediscussed in Practice E2641.1.8 This international standard was devel
11、oped in accor-dance with internationally recognized principles on standard-ization established in the Decision on Principles for theDevelopment of International Standards, Guides and Recom-mendations issued by the World Trade Organization TechnicalBarriers to Trade (TBT) Committee.2. Referenced Docu
12、ments2.1 ASTM Standards:2E284 Terminology of AppearanceE1164 Practice for Obtaining Spectrometric Data for Object-Color EvaluationE1331 Test Method for Reflectance Factor and Color bySpectrophotometry Using Hemispherical GeometryE2544 Terminology for Three-Dimensional (3D) ImagingSystemsE2641 Practi
13、ce for Best Practices for SafeApplication of 3DImaging TechnologyE2919 Test Method for Evaluating the Performance ofSystems that Measure Static, Six Degrees of Freedom(6DOF), Pose1This test method is under the jurisdiction of ASTM Committee E57 on 3DImaging Systems and is the direct responsibility o
14、f Subcommittee E57.02 on TestMethods.Current edition approved Oct. 1, 2017. Published December 2017. DOI:10.1520/E3125-17.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, ref
15、er to the standards Document Summary page onthe ASTM website.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United StatesThis international standard was developed in accordance with internationally recognized principles on standardization establis
16、hed in the Decision on Principles for theDevelopment of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.1E2938 Test Method for Evaluating the Relative-Range Mea-surement Performance of 3D Imaging Systems in theMed
17、ium Range2.2 ASME Standards:3ASME B89.4.19-2006 Performance Evaluation of Laser-Based Spherical Coordinate Measurement SystemsASME B89.7.3.1-2001 Guidelines for Decision Rules: Con-sidering Measurement Uncertainty in Determining Con-formance to SpecificationsASME Y14.5-2009 Dimensioning and Toleranc
18、ing2.3 ISO Standards:4ISO 1:2016 Geometrical product specifications (GPS)Standard reference temperature for the specification ofgeometrical and dimensional propertiesISO 10360-10:2016 Geometrical product specifications(GPS)Acceptance and reverification tests for coordinatemeasuring systems (CMS)Part
19、 10: Laser trackers formeasuring point-to-point distances2.4 JCGM Standards:JCGM 100:2008 Evaluation of measurement dataGuide tothe expression of uncertainty in measurement (GUM), 1steditionJCGM 200:2012 International vocabulary of metrologyBasic and general concepts and associated terms (VIM),3rd e
20、dition3. Terminology3.1 Definitions:3.1.1 3D imaging system, na non-contact measurementinstrument used to produce a 3D representation (for example,a point cloud) of an object or a site. E2544-11a 3.23.1.1.1 DiscussionSome examples of a 3D imaging sys-tem are laser scanners (also known as LADARs or L
21、IDARs orlaser radars), optical range cameras (also known as flashLIDARs or 3D range cameras), triangulation-based systemssuch as those using pattern projectors or lasers, and othersystems based on interferometry.3.1.1.2 DiscussionIn general, the information gathered bya 3D imaging system is a collec
22、tion of n-tuples, where eachn-tuple can include but is not limited to spherical or Cartesiancoordinates, return signal strength, color, time stamp, identifier,polarization, and multiple range returns.3.1.1.3 Discussion3D imaging systems are used to mea-sure from relatively small scale objects (for e
23、xample, coin,statue, manufactured part, human body) to larger scale objectsor sites (for example, terrain features, buildings, bridges, dams,towns, archeological sites).3.1.2 beam width, nthe extent of the irradiance distribu-tion in a cross section of a laser beam (in a direction orthogonalto its p
24、ropagation path). E2544-11a 3.23.1.3 calibration, noperation that, under specifiedconditions, in a first step, establishes a relation between thequantity values with measurement uncertainties provided bymeasurement standards and corresponding indications withassociated measurement uncertainties and,
25、 in a second step,uses this information to establish a relation for obtaining ameasurement result from an indication. JCGM 200:2012(VIM) 2.393.1.4 combined standard uncertainty, nstandard uncer-tainty of the result of a measurement when that result isobtained from the values of a number of other qua
26、ntities, equalto the positive square root of a sum of terms, the terms beingthe variances or covariances of these other quantities weightedaccording to how the measurement result varies with changesin these quantities. JCGM 100:2008 (GUM) 2.3.43.1.5 coverage factor, nnumerical factor used as a multi
27、-plier of the combined standard uncertainty in order to obtain anexpanded uncertainty. JCGM 100:2008 (GUM) 2.3.63.1.5.1 DiscussionA coverage factor, k, is typically in therange 2 to 3.3.1.6 diffuse reflectance factor, nthe ratio of the fluxreflected at all angles within the hemisphere bounded by the
28、plane of measurement except in the direction of the specularreflection angle, to the flux reflected from the perfect reflectingdiffuser under the same geometric and spectral conditions ofmeasurement. E284-13b 4.13.1.6.1 DiscussionThe size of the specular reflectionangle depends on the instrument and
29、 the measurement condi-tions used. For its precise definition the make and model of theinstrument or the aperture angle or aperture solid angle of thespecularly reflected beam should be specified.3.1.7 documentary standard, ndocument, arrived at byopen consensus procedures, specifying necessary deta
30、ils of amethod of measurement, definitions of terms, or other practicalmatters to be standardized. E284-13b 4.13.1.8 expanded measurement uncertainty (expandeduncertainty), nproduct of a combined standard measurementuncertainty and a factor larger than the number one. JCGM200:2012 (VIM) 2.353.1.9 li
31、miting conditions, nmanufacturers specified limitson the environmental, utility, and other conditions withinwhich an instrument may be operated safely and withoutdamage. ASME B89.4.19-2006 43.1.9.1 DiscussionManufacturers performance specifica-tions are not assured over the limiting conditions.3.1.1
32、0 maximum permissible measurement error (maximumpermissible error), nextreme value of measurement error,with respect to a known reference quantity value, permitted byspecifications or regulations for a given measurement, measur-ing instrument, or measuring system. JCGM 200:2012 (VIM) 4.263.1.10.1 Di
33、scussionUsually, the term “maximum permis-sible errors” or “limits of error” is used where there are twoextreme values.3.1.10.2 DiscussionThe term “tolerance” should not beused to designate maximum permissible error.3Available from American Society of Mechanical Engineers (ASME), ASMEInternational H
34、eadquarters, Two Park Ave., New York, NY 10016-5990, http:/www.asme.org.4Available from American National Standards Institute (ANSI), 25 W. 43rd St.,4th Floor, New York, NY 10036, http:/www.ansi.org.E3125 1723.1.11 measurand, nquantity intended to be measured.JCGM 200:2012 (VIM) 2.33.1.11.1 Discussi
35、onThe specification of a measurand re-quires knowledge of the kind of quantity, description of thestate of the phenomenon, body, or substance carrying thequantity, including any relevant component, and the chemicalentities involved.3.1.11.2 DiscussionIn the second edition of the VIM andin IEC 60050-
36、300:2001, the measurand is defined as theparticular quantity subject to measurement.3.1.11.3 DiscussionThe measurement, including the mea-suring system and the conditions under which the measurementis carried out, might change the phenomenon, body, or sub-stance such that the quantity being measured
37、 may differ fromthe measurand as defined. In this case, adequate correction isnecessary.Example 1: The length of a steel rod in equilibrium withthe ambient Celsius temperature of 23 C will be differentfrom the length at the specified temperature of 20 C, whichis the measurand. In this case, a correc
38、tion is necessary.3.1.12 measurement error, nmeasured quantity value mi-nus a reference quantity value. JCGM 200:2012 (VIM) 2.163.1.12.1 DiscussionThe concept of measurement errorcan be used both a) when there is a single reference quantityvalue to refer to, which occurs if a calibration is made bym
39、eans of a measurement standard with a measured quantityvalue having a negligible measurement uncertainty or if aconventional quantity value is given, in which case themeasurement error is known, and b) if a measurand is supposedto be represented by a unique true quantity value or a set of truequanti
40、ty values of negligible range, in which case the measure-ment error is not known.3.1.12.2 DiscussionMeasurement error should not be con-fused with production error or mistake.3.1.13 measurement precision, ncloseness of agreementbetween indications or measured quantity values obtained byreplicate mea
41、surements on the same or similar objects underspecified conditions. JCGM 200:2012 (VIM) 2.153.1.14 measurement repeatability, nmeasurement preci-sion under a set of repeatability conditions of measurement.JCGM 200:2012 (VIM) 2.213.1.14.1 DiscussionSee also 3.1.13, measurementprecision, and 3.1.21, r
42、epeatability condition of measurement.3.1.15 measurement uncertainty, nnon-negative param-eter characterizing the dispersion of the quantity values beingattributed to a measurand, based on the information used.JCGM 200:2012 (VIM) 2.263.1.15.1 DiscussionMeasurement uncertainty includescomponents aris
43、ing from systematic effects, such as compo-nents associated with corrections and the assigned quantityvalues of measurement standards, as well as the definitionaluncertainty. Sometimes estimated systematic effects are notcorrected for but, instead, associated measurement uncertaintycomponents are in
44、corporated.3.1.15.2 DiscussionThe parameter may be, for example, astandard deviation called standard measurement uncertainty (ora specified multiple of it), or the half-width of an interval,having a stated coverage probability.3.1.15.3 DiscussionMeasurement uncertainty comprises,in general, many com
45、ponents. Some of these may be evaluatedby Type A evaluation of measurement uncertainty from thestatistical distribution of the quantity values from series ofmeasurements and can be characterized by standard deviations.The other components, which may be evaluated by Type Bevaluation of measurement un
46、certainty, can also be character-ized by standard deviations, evaluated from probability densityfunctions based on experience or other information.3.1.15.4 DiscussionIn general, for a given set ofinformation, it is understood that the measurement uncertaintyis associated with a stated quantity value
47、 attributed to themeasurand. A modification of this value results in a modifica-tion of the associated uncertainty.3.1.16 point cloud, na collection of data points in 3Dspace (frequently in the hundreds of thousands), for example asobtained using a 3D imaging system. E2544-11a 3.23.1.16.1 Discussion
48、The distance between points is gener-ally non-uniform and hence all three coordinates (Cartesian orspherical) for each point must be specifically encoded.3.1.17 rated conditions, nmanufacturer-specified limitson the environmental, utility, and other conditions withinwhich the manufacturers performan
49、ce specifications are guar-anteed at the time of installation of the instrument. ASMEB89.4.19-2006 - 43.1.18 reference length, ncalibrated value of the distancebetween two points in space at the time and conditions when atest is performed. ASME B89.4.19-2006 43.1.19 reflectance, nratio of the reflected radiant or lumi-nous flux to the incident flux in the given conditions. E284-13b 4.13.1.19.1 DiscussionThe term reflectance is often used in ageneral sense or as an abbreviation for reflectance fa
