1、Designation: F1812 15Standard Test Method forDetermining the Effect of an ESD Discharge on a MembraneSwitch or Printed Electronic Device1This standard is issued under the fixed designation F1812; the number immediately following the designation indicates the year oforiginal adoption or, in the case
2、of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method is used to determine the electrostaticdischarge (ESD) shielding effectivenes
3、s of a membrane switchassembly or printed electronic device. This test method may beused to test a membrane switch or printed electronic device todestruction, that is, to determine its maximum ESD shieldingeffectiveness, or it may be used to test the ability of amembrane switch or printed electronic
4、 device to withstand apredetermined level of exposure.1.2 The values stated in SI units are to be regarded as thestandard. The values given in parentheses are for informationonly.1.3 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is therespon
5、sibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use2. Terminology2.1 Definitions:2.1.1 discharge pulse countnumber of applied discharges.2.1.2 discharge pulse intervaltime duration between
6、 ap-plied voltage.2.1.3 ESD (electrostatic discharge) eventdetection of ap-plied charge at input/output (I/O) points.2.1.4 I/O pointsspecified conductive area, location, orcircuitry, typically all circuit paths, traces and wires.3. Significance and Use3.1 Nearly all electronic devices are susceptibl
7、e to possibledamage or degradation from ESD encountered in their operat-ing environments. The sensitivity of the equipment, the poten-tial consequences of a malfunction, and the expected environ-mental conditions all impact the level of ESD protectionneeded.3.2 ESD shielding effectiveness test may b
8、e destructive, andunits that have been tested should be considered unreliable forfuture use.4. Interferences4.1 The following parameters may affect the results of thistest:4.1.1 Temperature may affect the tendency of an ESD eventto occur,4.1.2 Relative humidity may affect the tendency of an ESDevent
9、 to occur,4.1.3 Barometric pressure may affect the tendency of anESD event to occur, and4.1.4 The composition of the work bench may influence thetest results.5. Apparatus5.1 Discharge Probe.5.2 ESD SimulatorCommercially available device for ap-plying required or specified voltages, monitoring for ES
10、Devent and selecting various voltage levels, and probes forcontact or air discharge.6. Procedure: Direct Application of Discharge6.1 Pretest Setup:6.1.1 Place switch on a nonconductive surface, or as speci-fied.6.1.2 If applicable, connect the ESD shield, ground trace, orground plane to earth ground
11、.6.1.3 Connect all circuitry pin inputs or outputs to the ESDgenerating devices ground.6.1.4 Ambient laboratory conditions to be within:6.1.4.1 Relative humidity 30 to 60 %,6.1.4.2 Temperature 15 to 35C, and6.1.4.3 Atmospheric pressure 680 to 1060 mbar or other-wise specified.6.2 In Process:6.2.1 Ac
12、cumulation of charge on the membrane switch orprinted electronic device must be dissipated between succes-sive tests.6.2.2 Set the initial voltage level to 2Kv. Set discharge pulseinterval as specified.1This test method is under the jurisdiction of ASTM Committee F01 onElectronics and is the direct
13、responsibility of Subcommittee F01.18 on PrintedElectronics.Current edition approved June 1, 2015. Published July 2015. Originally approvedin 1997. Last previous edition approved in 2009 as F1812-09. DOI: 10.1520/F1812-15.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshoh
14、ocken, PA 19428-2959. United States16.2.3 Place discharge tip perpendicular, and in contact, withswitch surface at the specified point.6.2.4 Trigger the ESD discharge and monitor.6.2.5 Check the ESD discharge event to I/O points.6.2.6 If no ESD event occurs, discharge accumulated volt-age on surface
15、 to earth ground.6.2.7 Reset and increase test voltage to next level inaccordance with Table 1 (or as specified). Repeat 6.2.3 6.3.6.3 If ESD discharge event is noted, report and terminatetest.6.4 Repeat 6.2.1 6.3 for other test points.7. Procedure: Air Gap Discharge7.1 Pretest Setup:7.1.1 Position
16、switch on a nonconductive surface, or asspecified.7.1.2 If applicable, connect the ESD shield, ground trace, orground plane to earth ground.7.1.3 Connect all circuitry pin in or outputs to the ESDgenerating devices ground.7.1.4 Ambient laboratory conditions to be within:7.1.4.1 Relative humidity to
17、be between 30 to 60 %,7.1.4.2 Temperature 15 to 35C, and7.1.4.3 Atmospheric Pressure 680 to 1060 mbar or other-wise specified.7.2 In Process:7.2.1 Set the initial voltage level to 2Kv. Set discharge pulseinterval as specified.7.2.2 Place contact air discharge tip 2 in. (50.8 mm) awayfrom, and perpen
18、dicular to switch surface at the specified point.7.2.3 Trigger the ESD discharge and monitor.7.2.4 Check for ESD discharge event at specified I/O points.7.3 If no ESD event occurs, discharge accumulated voltageon surface to earth ground.7.3.1 Reset and increase test voltage to next level inaccordanc
19、e with Table 1 ( or as specified). Repeat 7.2.1 7.4.7.4 If ESD discharge event is noted, report and terminatetest.7.5 Repeat 7.1.1 7.1.4 for other test points.8. Report8.1 Report the following information:8.1.1 Humidity,8.1.2 Temperature,8.1.3 Atmospheric pressure,8.1.4 Description of I/O points,8.1
20、.5 Description of apparatus,8.1.6 Description of test points,8.1.7 Description of unit under test (UUT),8.1.8 Maximum voltage data,8.1.9 Type of test (contact or air),8.1.10 Physical description of damage (if applicable),8.1.11 Date,8.1.12 Time,8.1.13 Operator,8.1.14 Discharge pulse count,8.1.15 Dis
21、charge pulse interval, and8.1.16 Description of probe.9. Precision and Bias9.1 PrecisionIt is not possible to specify the precision ofthe procedure in Test Method F1812 for measuring ESDbecause inter-laboratory studies have proven inconclusive dueto insufficient participating laboratories with the a
22、ppropriateequipment.9.2 BiasNo information can be presented on the bias ofthe procedure in Test Method F1812 for measuring ESDbecause no standard sample is available for this industry.10. Keywords10.1 ESD; membrane switch; printed electronic device;shieldingASTM International takes no position respe
23、cting the validity of any patent rights asserted in connection with any item mentionedin this standard. Users of this standard are expressly advised that determination of the validity of any such patent rights, and the riskof infringement of such rights, are entirely their own responsibility.This st
24、andard is subject to revision at any time by the responsible technical committee and must be reviewed every five years andif not revised, either reapproved or withdrawn. Your comments are invited either for revision of this standard or for additional standardsand should be addressed to ASTM Internat
25、ional Headquarters. Your comments will receive careful consideration at a meeting of theresponsible technical committee, which you may attend. If you feel that your comments have not received a fair hearing you shouldmake your views known to the ASTM Committee on Standards, at the address shown belo
26、w.This standard is copyrighted by ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959,United States. Individual reprints (single or multiple copies) of this standard may be obtained by contacting ASTM at the aboveaddress or at 610-832-9585 (phone), 610-832-9555 (
27、fax), or serviceastm.org (e-mail); or through the ASTM website(www.astm.org). Permission rights to photocopy the standard may also be secured from the Copyright Clearance Center, 222Rosewood Drive, Danvers, MA 01923, Tel: (978) 646-2600; http:/ 1 Voltage LevelsContact Air2Kv 2Kv4Kv 4Kv6Kv 8Kv8Kv 15KvF1812 152
