1、BSI Standards PublicationPhotovoltaic devicesPart 8: Measurement of spectral responsivityof a photovoltaic (PV) deviceBS EN 60904-8:2014National forewordThis British Standard is the UK implementation of EN 60904-8:2014. It is identical to IEC 60904-8:2014. It supersedes BS EN 60904-8:1998 which is w
2、ithdrawn.The UK participation in its preparation was entrusted to TechnicalCommittee GEL/82, Photovoltaic Energy Systems.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions ofa cont
3、ract. Users are responsible for its correct application. The British Standards Institution 2014.Published by BSI Standards Limited 2014ISBN 978 0 580 79766 8ICS 27.160Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was published under the authori
4、ty of theStandards Policy and Strategy Committee on 31 October 2014.Amendments issued since publicationDate Text affectedBRITISH STANDARDBS EN 60904-8:2014EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 60904-8 August 2014 ICS 27.160 Supersedes EN 60904-8:1998 English Version Photovoltaic devic
5、es - Part 8: Measurement of spectral responsivity of a photovoltaic (PV) device (IEC 60904-8:2014) Dispositifs photovoltaques - Partie 8: Mesure de la sensibilit spectrale dun dispositif photovoltaque (PV) (CEI 60904-8:2014) Photovoltaische Einrichtungen - Teil 8: Messung der spektralen Empfindlichk
6、eit einer photovoltaischen (PV-)Einrichtung (IEC 60904-8:2014) This European Standard was approved by CENELEC on 2014-06-12. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standar
7、d without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in
8、any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croati
9、a, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey
10、 and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2014 CENELEC All rights of exploitation in any form and b
11、y any means reserved worldwide for CENELEC Members. Ref. No. EN 60904-8:2014 E BS EN 60904-8:2014EN 60904-8:2014 - 2 - Foreword The text of document 82/822/FDIS, future edition 3 of IEC 60904-8, prepared by IEC/TC 82 “Solar photovoltaic energy systems“ was submitted to the IEC-CENELEC parallel vote
12、and approved by CENELEC as EN 60904-8:2014. The following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2015-03-12 latest date by which the national standards conflicting with the do
13、cument have to be withdrawn (dow) 2017-06-12 This document supersedes EN 60904-8:1998. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights.
14、 Endorsement notice The text of the International Standard IEC 60904-8:2014 was approved by CENELEC as a European Standard without any modification. BS EN 60904-8:2014- 3 - EN 60904-8:2014 Annex ZA (normative) Normative references to international publications with their corresponding European publi
15、cations The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
16、 NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here: www.cenelec.eu Publication Year Title EN/HD Year
17、 IEC 60904-3 - Photovoltaic devices - Part 3: Measurement principles for terrestrial photovoltaic (PV) solar devices with reference spectral irradiance data EN 60904-3 - IEC 60904-7 - Photovoltaic devices - Part 7: Computation of the spectral mismatch correction for measurements of photovoltaic devi
18、ces EN 60904-7 - IEC 60904-9 - Photovoltaic devices - Part 9: Solar simulator performance requirements EN 60904-9 - IEC 61215 - Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval EN 61215 - IEC 61646 - Thin-film terrestrial photovoltaic (PV) modules -
19、Design qualification and type approval EN 61646 - IEC/TS 61836 - Solar photovoltaic energy systems - Terms, definitions and symbols CLC/TS 61836 - ISO/IEC 17025 - General requirements for the competence of testing and calibration laboratories EN ISO/IEC 17025 - BS EN 60904-8:2014 2 IEC 60904-8:2014
20、IEC 2014 CONTENTS 1 Scope 6 2 Normative references 6 3 Marking . 6 4 Testing 7 4.1 General 7 4.2 Special considerations . 7 4.3 Measurement under white bias light . 7 4.4 Applying a bias voltage to the device under test . 7 5 General description of spectral responsivity measurement . 7 6 Apparatus 9
21、 6.1 General 9 6.2 Monochromatic light source . 11 6.3 PV device holder and temperature control 12 6.4 PV device contacts 12 6.5 Bias light 12 6.6 DC measurements . 12 6.7 AC measurements in the presence of bias light 13 6.8 Reference device . 13 7 Measurement of spectral responsivity using a consta
22、nt light source 13 7.1 General method with a grating monochromator or filter wheel 13 7.2 Measurement of the reference device for setup calibration . 13 7.3 Measurement of the device under test . 14 7.4 Calculation of spectral responsivity 15 7.5 Simplifications . 16 8 Measurement of spectral respon
23、sivity under pulsed light . 16 8.1 Additional apparatus 16 8.2 Test procedure . 17 9 Measurements of series-connected modules . 17 9.1 General 17 9.2 Additional apparatus 17 9.3 Test procedure . 17 9.4 Calculation of spectral responsivity 20 10 Report . 20 Figure 1 Example block diagram of a differe
24、ntial spectral responsivity measuring instrument using a continuous light source and a grating monochromator . 10 Figure 2 Example block diagram of a differential spectral responsivity measuring instrument using a continuous light source and bandpass filters . 11 Figure 3 Example block diagram of a
25、spectral responsivity measuring instrument using a pulsed light source and bandpass filters . 17 Figure 4 Example of the measurement setup for the differential spectral responsivity measurement of a target cell in a PV module, where the supplemental bias light is applied on all the cells in the modu
26、le other than the target cell . 18 BS EN 60904-8:2014IEC 60904-8:2014 IEC 2014 3 Figure 5 Example of the measurement setup for the differential spectral responsivity measurement of a target cell in a PV module, where the supplemental bias light is applied on all the cells in a string of the module o
27、ther than the target cell . 19 Figure 6 Determination of the bias voltage Vbto set the voltage across the target cell to the short-circuit condition (see 9.3) . 19 BS EN 60904-8:2014 6 IEC 60904-8:2014 IEC 2014 PHOTOVOLTAIC DEVICES Part 8: Measurement of spectral responsivity of a photovoltaic (PV)
28、device 1 Scope This International Standard specifies the requirements for the measurement of the spectral responsivity of both linear and non-linear photovoltaic devices. It is only applicable to single-junction devices. The spectral responsivity of a photovoltaic device is used in cell development
29、and cell analysis, as it provides a measure of recombination and other processes occurring inside the semiconductor or cell material system. The spectral responsivity of a photovoltaic device is used for the correction of the spectral mismatch if a PV device is calibrated in a setup where the measur
30、ement spectrum is different from the reference spectral irradiance data given in IEC 60904-3 and a reference device with a different spectral responsivity to the device under test is used. This procedure is given in IEC 60904-7. 2 Normative references The following documents, in whole or in part, ar
31、e normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60904-3, Photovoltaic devices Part 3: Measurement p
32、rinciples for terrestrial photovoltaic (PV) solar devices with reference spectral irradiance data IEC 60904-7, Photovoltaic devices Part 7: Computation of the spectral mismatch correction for measurements of photovoltaic devices IEC 60904-9, Photovoltaic devices Part 9: Solar simulator performance r
33、equirements IEC 61215, Crystalline silicon terrestrial photovoltaic (PV) modules Design qualification and type approval IEC 61646, Thin-film terrestrial photovoltaic (PV) modules Design qualification and type approval IEC/TS 61836, Solar photovoltaic energy systems Terms, definitions and symbols ISO
34、/IEC 17025, General requirements for the competence of testing and calibration laboratories 3 Marking Each photovoltaic device should carry a clear and indelible marking. This marking should be cross-referenced against: name, monogram or symbol of the manufacturer; base material and type of photovol
35、taic device; BS EN 60904-8:2014IEC 60904-8:2014 IEC 2014 7 type number or identification, if available; serial number, if applicable. When the photovoltaic devices to be tested are prototypes of a new design and not from production, this fact shall be noted in the test report (see Clause 10). 4 Test
36、ing 4.1 General The photovoltaic device shall be subjected to one of the procedures for spectral responsivity measurements defined in Clauses 7 to 9. 4.2 Special considerations Preconditioning Before beginning the measurements, the device under test shall be stabilized (if necessary) by an appropria
37、te light soaking test procedure, as specified in IEC 61215 or IEC 61646. Different photovoltaic technologies may require different pre-conditioning procedures. 4.3 Measurement under white bias light The procedures in Clause 7 and 9 require a white bias light being applied to the device under test du
38、ring the determination of spectral responsivity. Under bias light conditions, not the spectral responsivity but rather the differential spectral responsivity is measured. The spectral responsivity can be determined from the differential spectral responsivity by taking the non-linearity into account
39、based on a series of differential spectral responsivity measurements at bias light levels generating short-circuit currents in the device ranging from 5 % to 110 % of that at standard test conditions (see Clause 5). Most crystalline silicon solar cells have a differential spectral responsivity at a
40、bias light generating 30 % to 40 % of their short-circuit current at standard test conditions that is identical to the spectral responsivity at standard test conditions. Therefore, the measurement should be performed with such bias light levels if the non-linearity of a crystalline silicon PV device
41、 is not determined. If the non-linearity is confirmed to be negligible, i.e. the differential spectral responsivity is constant within the irradiance range of interest, the differential spectral responsivity at a specific bias light level may be used. For details see Clause 5. 4.4 Applying a bias vo
42、ltage to the device under test Generally, the spectral responsivity of a photovoltaic device is measured at short-circuit conditions (zero bias voltage) of the photovoltaic device and used for the purposes of cell analysis and calculating the spectral mismatch. In order to measure the spectral respo
43、nsivity of the specimen under a specific voltage, a bias voltage may need to be applied. The bias voltage of the device shall be controlled by an external voltage source. If a bias voltage is applied it shall be specified in the report. 5 General description of spectral responsivity measurement The
44、spectral responsivity of a photovoltaic (PV) device is measured by irradiating it by means of a narrow-bandwidth light source at a series of different wavelengths covering its responsivity range, and measuring the short-circuit current and monochromatic irradiance at each of these wavelengths (formu
45、la 1), or short-circuit current and monochromatic light beam power (formula 2). The first type of measurement results in the spectral irradiance responsivity with the unit A/Wm2. In order to determine the spectral responsivity as defined in IEC/TS 61836 this needs to be divided by the area of the de
46、vice under test whereas the second type results directly in the spectral responsivity in the unit A/W. BS EN 60904-8:2014 8 IEC 60904-8:2014 IEC 2014 In order to determine the output current of the device, the bias light as well as the monochromatic light should irradiate the entire area of the devi
47、ce uniformly. It is important to illuminate effectively the entire area of the device, as light not directly falling onto the active area may also contribute to the measured signal. If the spectral responsivity is used for the calculation of the spectral mismatch correction according to IEC 60904-7
48、the illuminated area during the measurement of the spectral responsivity should be identical to that during the measurement of the current-voltage characteristics. This is normally the entire device area. If not it should be suitably delimitated by an aperture. In case the area of the device is larg
49、er than the respective beam sizes the latter should be scanned appropriately across the entire device area to provide a uniform illumination. If both beams are scanned, the scanning should be synchronous with the bias light always illuminating a spot larger than the monochromatic light. The temperature of the device should be controlled. The current density of the device under test at each wavelength is divided by the respective irradiances to give spectral responsivity. s() = Isc(
