1、BRITISH STANDARD CONFIRMED JUNE 1999 BS QC 300203:1985 IEC 384-15-1 QC 300203 Incorporating Amendment No. 1 Specification for Harmonized system of quality assessment for electronic componentsBSQC300203:1985 BSI 04-2000 ISBN 0 580 34761 3 Amendments issued since publication Amd. No. Date of issue Com
2、ments 5947 September 1988 Indicated by a sideline in the marginBSQC300203:1985 BSI 04-2000 i Contents Page National foreword ii Introduction 1 Section 1. General data 1.1 Recommended method(s) of mounting 3 1.2 Dimensions 3 1.3 Ratings and characteristics 3 1.4 Related documents 4 1.5 Marking 4 1.6
3、Ordering information 4 1.7 Certified records of released lots 5 1.8 Additional information 5 1.9 Additional or increased severities or requirements to those specified in the generic and/or sectional specification 5 Section 2. Inspection requirements 2.1 Procedures 6 Table I 3 Table IIA Values of cap
4、acitance and of voltage-related to case sizes 3 Table IIB Characteristics at high and low temperature 4 Table IIC Impedance at. Hz (if applicable) 4 Table III Other characteristics 5 Table IV 6BSQC300203:1985 ii BSI 04-2000 National foreword This Part of this British Standard has been prepared under
5、 the direction of the Electronic Components Standards Committee. It is identical with IEC Publication384-15-1: “Fixed capacitors for use in electronic equipment. Blank detail specification: Fixed tantalum capacitors with non-solid electrolyte and foil electrode. Assessment level E” published by the
6、International Electrotechnical Commission (IEC). Terminology and conventions. The text of the International Standard has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards.
7、 Cross-references. The British Standard which implements IEC Publications QC001001:1986 and QC001002:1986 is BS9000: “General requirements for a system for electronic components of assessed quality” Part3:1987 “Specification for national implementation of the IECQ basic rules and rules of procedure”
8、. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BSQC 300200. Detail specification layout. In the event of conflict between the requirements of this specification and the provisions of BS9000 th
9、e latter shall take precedence except that the front page layout will be in accordance with PD9004:1986 “BS9000, CECC and IECQ UK administrative guide.” Circular Letter No.15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are re
10、sponsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International Standard Corresponding British Standard IEC 384-1:1982 QC 300000:1982 BS QC 300000:1983. Fixed capacitors for use in electronic equipment. Generic spec
11、ification (Identical) IEC 384-15:1982 IEC 300200:1982 BS QC 300200:1983. Sectional specification: Fixed tantalum capacitors with non-solid or solid electrolyte (Identical) IEC 410:1973 BS 6001: Sampling procedures for inspection by attributes Part 1:1972: Specification for sampling plans indexed by
12、acceptable quality level (AQL) for lot-by-lot inspection (Technically equivalent) Summary of pages This document comprises a front cover, an inside front cover, pagesi andii, pages1 to13 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. T
13、his will be indicated in the amendment table on the inside front cover.BSQC300203:1985 BSI 04-2000 1 Introduction Blank detail specification A blank detail specification is a supplementary document to the Sectional Specification and contains requirements for style and layout and minimum content of d
14、etail specifications. Detail specifications not complying with these requirements may not be considered as being in accordance with IEC specifications nor shall they so be described. In the preparation of detail specifications the content of Sub-clause1.4 of the sectional specification shall be take
15、n into account. The numbers between brackets on the first page correspond to the following information which shall be inserted in the position indicated. Identification of the detail specification 1 The “International Electrotechnical Commission” or the National Standards Organization under whose au
16、thority the detail specification is drafted. 2 The IEC or National Standards number of the detail specification, date of issue and any further information required by the national system. 3 The number and issue number of the IEC or national Generic Specification. 4 The IEC number of the blank detail
17、 specification. Identification of the capacitor 5 A short description of the type of capacitor. 6 Information on typical construction (when applicable). NOTEWhen the capacitor is not designed for use in printed board applications, this shall be clearly stated in the detail specification in this posi
18、tion. 7 Outline drawing with main dimensions which are of importance for interchangeability and/or reference to the national or international documents for outlines. Alternatively, this drawing may be given in an appendix to the detail specification. 8 Application or group of applications covered an
19、d/or assessment level. NOTEThe assessment level(s) to be used in a detail specification shall be selected from the sectional specification, Sub-clause3.5.4. This implies that one blank detail specification may be used in combination with several assessment levels, provided the grouping of the tests
20、does not change. 9 Reference data on the most important properties, to allow comparison between the various capacitor types.BSQC300203:1985 2 BSI 04-2000 1 IEC 384-15-1-XXX QC 300203-XXX 2 ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: IEC 384-15-1 QC 300203 4 3 FIXED TANTALUM CAPACIT
21、ORSWITH NON-SOLID ELECTROLYTE AND FOILELECTRODE WITH LEAD ORTAG TERMINATIONS (Sub-family 1) 5 Outline drawing: (seeTable I) (. angle projection) 7 Typical construction: 6 Assessment level(s): E 8 (Other shapes are permitted within thedimensionsgiven) Performance grade: Information on the availabilit
22、y of components qualified to this detail specification is given in the Qualified Products List. 9BSQC300203:1985 BSI 04-2000 3 Section 1. General data 1.1 Recommended method(s) of mounting (to be inserted) (See Sub-clause1.4.2 of IEC Publication384-15) 1.2 Dimensions Table I 1.3 Ratings and characte
23、ristics Table IIA Values of capacitance and of voltage-related to case sizes Case size reference Dimensions (in millimetres or inches and millimetres) L H d . NOTE 1When there is no case size reference, Table I may be omitted and the dimensions shall be given in Table IIA, which then becomes Table I
24、. NOTE 2The dimensions shall be given as maximum dimensions or as nominal dimensions with a tolerance. NOTE 3Other presentations of the above information may be necessary, but the above presentation should be followed as much as possible. Capacitance range (seeTable IIA) Tolerance on rated capacitan
25、ce Rated voltage (seeTable IIA) Category voltage (if applicable) (seeTable IIA) Climatic category Rated temperature Variation of capacitance with temperature (seeTable IIB) Tangent of loss angle (seeTable IIB) Leakage current (seeTable IIB) Impedance (if applicable) (seeTable IIC) Reverse voltage (i
26、f required) Rated voltage Category voltage a Case size Case size Case size Case size Rated capacitance (in 4F) a If different from the rated voltage.BSQC300203:1985 4 BSI 04-2000 Table IIB Characteristics at high and low temperature Table IIC Impedance at. . . Hz (ifapplicable) 1.4 Related documents
27、 1.5 Marking The marking of the capacitor and the packing shall be in accordance with the requirements of IECPublication384-15, Sub-clause1.6. NOTEThe details of the marking of the component and packing shall be given in full in the detail specification. 1.6 Ordering information Orders for capacitor
28、s covered by this specification shall contain, in clear or in coded form, the following minimum information: a) Rated capacitance. b) Tolerance on rated capacitance. c) Rated d.c. voltage. d) Number and issue reference of the detail specification and style reference. U R C R Capacitance change Maxim
29、um values Tan $ Impedance (100/120 Hz) Leakage current (%) (%) (7) (4A) (V) (4F) A R B A b 20 C B b A 20 C R B a A= Lower category temperature B= Upper category temperature R= Rated temperature a Measured with category voltage b If applicable Case size Impedance (7) 1 2 3 4 Generic specification: IE
30、C Publication 384-1:1982: Fixed Capacitors for Use in Electronic Equipment. Part 1: Generic Specification. Sectional specification: IEC Publication 384-15:1982: Part 15: Sectional Specification: Fixed Tantalum Capacitors with Non-solid or Solid Electrolyte.BSQC300203:1985 BSI 04-2000 5 1.7 Certified
31、 records of released lots Required/not required. 1.8 Additional information (not for inspection purposes) 1.9 Additional or increased severities or requirements to those specified in the generic and/or sectional specification NOTEAdditions or increased requirements should be specified only when esse
32、ntial. Table III Other characteristics This table is to be used for defining characteristics which are additional to or more severe than those given in the sectional specification.BSQC300203:1985 6 BSI 04-2000 Section 2. Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval, the pr
33、ocedures shall be in accordance with the Sectional Specification, IEC Publication384-15, Sub-clause3.4. 2.1.2 For Quality Conformance Inspection, the test schedule (Table IV) includes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by Sub-clause3.5.1 o
34、f the Sectional Specification. Table IV NOTE 1Sub-clause numbers of tests and performance requirements refer to the Sectional Specification, IEC Publication384-15 and Section1 of this specification. NOTE 2Inspection Levels and AQLs are selected from IEC Publication 410: Sampling Plans and Procedures
35、 for Inspection by Attributes. NOTE 3In this table: p = periodicity (in months) n = sample size c = acceptance criterion (permitted number of defectives) D = destructive ND = non-destructive IL = inspection level IEC Publication 410 AQL = acceptable quality level Sub-clause number and Test (see Note
36、 1) D or ND Conditions of test (seeNote1) IL AQL Performance requirements (see Note 1) (see Note 2) Group A inspection (lot-by-lot) Sub-group A1 ND S-4 2.5% 4.1 Visual examination As in 4.1 Legible marking and as specified in 1.5 of this specification 4.1 Dimensions (gauging) As specified in Table I
37、 of this specification Sub-group A2 ND II 1.0% 4.2.1 Leakage current Protective resistance: . . . 7 u . . . 4A, see Table IIB 4.2.2 Capacitance Frequency:. . . Hz Within specified tolerance 4.2.3 Tangent of loss angle Frequency:. . . Hz u . . ., see Table IIB 4.2.4 Impedance (ifapplicable) Frequency
38、:. . . Hz u . . . 7, see Table IIC BSQC300203:1985 BSI 04-2000 7 Table IV Sub-clause number and Test (see Note 1) D or ND Conditions of test (seeNote1) IL AQL Performance requirements (see Note 1) (see Note 2) Group B inspection (lot-by-lot) Sub-group B1 D S-3 2.5% 4.5 Solderability Without ageing M
39、ethod:. . . Good tinning as evidenced by free flowing of the solder with wetting of the terminations or solder shall flow within. . . s, as applicable Sub-group B2 ND S-3 2.5% 4.15 Characteristics at highand low temperature (ifrequired) The capacitors shall be measured at each temperature step Step
40、1:20 C Leakage current Capacitance For use as referencevalue Tangent of loss angle Impedance a(at same frequency as Step2) Step 2: Lower category temperature Capacitance u . . .% b Tangent of loss angle a u . . . b Impedance a u . . . b Step 3: Rated temperature Leakage current u . . . 4A b Capacita
41、nce u . . .% b Tangent of loss angle a u . . . b Step 4: Upper category temperature Leakage current u . . . 4A b Capacitance u . . .% b Tangent of loss angle a u . . . b a If applicable. b See Table IIB. %C C - %C C - %C C -BSQC300203:1985 8 BSI 04-2000 Table IV Sub-clause number and Test (see Note
42、1) D or ND Conditions of test (seeNote 1) Sample size and criterion of acceptability (seeNote 3) Performance requirements (see Note 1) p n c Group C inspection (periodic) Sub-group C1A D 6 9 1 Part of sample of Sub-group C1 4.3.1 Initial measurement Capacitance 4.3 Robustness of terminations Visual
43、examination No visible damage and no leakage of electrolyte 4.4 Resistance to solderingheat Method:. . . 4.4.2 Final measurements Visual examination No visible damage and no leakage of electrolyte Legible marking Sub-group C1B D 6 18 1 Other part of sample of Sub-group C1 4.6.1 Initial measurement C
44、apacitance 4.6 Rapid change of temperature A= Lower category temperature B= Upper category temperature Five cycles Duration t = 30 min Recovery: 16 h 4.6.3 Final measurements Leakage current u . . . 4A, see Table IIB Capacitance u . . .% of value measured in 4 6.1 Tangent of loss angle u . . .,see T
45、able IIB 4.7 Vibration Method of mounting see1.1 of this specification Procedure B4 Frequency range: . . .Hz to. . .Hz Amplitude:. . .mm or acceleration:. . .m/s 2 (whichever is the less severe) Duration:. . .h 4.7.2 Final inspection Visual examination No visible damage and no leakage of electrolyte
46、 %C C -BSQC300203:1985 BSI 04-2000 9 Table IV Sub-clause number and Test (see Note 1) D or ND Conditions of test (seeNote1) Sample size and criterion of acceptability (see Note 3) Performance requirements (see Note 1) p n c Sub-group C1B (contd) 4.8 Bump (or shock, see4.9) Method of mounting: see1.1
47、 of this specification Number of bumps:. . . Acceleration: 390 m/s 2 Duration of pulse: 6 ms 4.9 Shock (or bump, see4.8) Method of mounting see:1.1 of this specification Acceleration:. . .m/s 2 Duration of pulse:. . .ms 4.8.2 or 4.9.2 Final measurements Visual examination No visible damage and no le
48、akage of electrolyte Sub-group C1 D 6 27 1 Combined sample of specimens of Sub-groups C1A and C1B 4.10 Climatic sequence 4.10.1 Initial measurement Capacitance 4.10.2 Dry heat Temperature: upper category temperature Duration: 16 h Visual examination No visible damage and no leakage of electrolyte 4.
49、10.3 Damp heat, cyclic, Test Db, firstcycle 4.10.4 Cold Temperature: lower category temperature Duration: 2 h Visual examination No visible damage and no leakage of electrolyte 4.10.5 Low air pressure (ifrequired bythe detail specification) Air pressure: 8.5 kPa (85 mbar) 4.10.5.3 Intermediate measurement Visual examination No breakdown, flashoveror harmful deformation of the case 4.10.6 Damp heat, cyclic, Test Db, remaining cycle
