1、AMSC N/A FSC 5910 MIL-PRF-20M 27 February 2012 SUPERSEDING MIL-PRF-20L 13 July 2009 PERFORMANCE SPECIFICATION CAPACITOR, FIXED, CERAMIC DIELECTRIC, (TEMPERATURE COMPENSATING), ESTABLISHED RELIABILITY AND NON-ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR This specification is approved for use by
2、 all Departments and Agencies of the Department of Defense. 1. SCOPE 1.1 Scope. This specification covers the general requirements for established reliability (ER) and non-ER, temperature compensating, fixed capacitors for use primarily where compensation is necessary for circuit applications due to
3、 temperature changes, in bypass and coupling applications. Capacitors meeting the ER requirements specified herein have a failure rate level (FRL) ranging from 1.0 percent per 1,000 hours to 0.00l percent per 1,000 hours. These failure rate levels are established at a 90-percent confidence level bas
4、ed on the life test parameters specified and are maintained at a 10-percent producers risk. An acceleration factor of 8:1 has been used to relate the life test data at 200 percent of rated voltage at the applicable high test temperature to the rated voltage at the applicable high test temperature. A
5、 part per million (ppm) quality system is used for documenting and reporting the average outgoing quality of ER capacitors supplied to this specification. Statistical process control (SPC) techniques are required in the manufacturing process to minimize variation in production of ER capacitors suppl
6、ied to the requirements of this specification. 1.2 Classification. 1.2.1 Part or Identifying Number (PIN). The PIN is in the following form and as specified (see 3.1): CCR75 CH 1R0 C M V ER Style (1.2.1.1) Characteristic (1.2.1.2) Capacitance value (1.2.1.3) Capacitance tolerance (1.2.1.4) Product l
7、evel designator (1.2.1.5) Standoff option (1.2.1.6) CC75 CH 1R0 C NON-ER Style (1.2.1.1) Characteristic (1.2.1.2) Capacitance value (1.2.1.3) Capacitance tolerance (1.2.1.4) Comments, suggestions, or questions on this document should be addressed to DLA Land and Maritime, ATTN: VAT, Post Office Box
8、3990, Columbus, OH 43218-3990, or e-mailed to capacitorfilterdla.mil. Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at https:/assist.daps.dla.mil. INCH-POUND Provided by IHSNot for ResaleNo reproduction or netwo
9、rking permitted without license from IHS-,-,-MIL-PRF-20M 2 1.2.1.1 Style. The style is identified by either the three-letter symbol “CCR“ (ER parts) or by the two-letter symbol “CC“ (non-ER parts) followed by a two-digit number. The letters identify temperature compensating, ceramic dielectric, fixe
10、d capacitors, and the number identifies the shape and dimensions of the capacitor. 1.2.1.2 Characteristic. The characteristic is identified by a two-letter symbol in accordance with table I. The first letter identifies the nominal temperature coefficient; the second letter identifies the approximate
11、 tolerance envelope for the temperature coefficient (G = 30 ppm/C; H = 60 ppm/C; J = 120 ppm/C; and K = 250 ppm/C) (see figure 1 and 6.5). TABLE I. Characteristic. Symbol Nominal temperature coefficient CG 0 30 ppm/C CH 0 60 ppm/C CJ 0 120 ppm/C CK 0 250 ppm/C CX Not practically measurable 1.2.1.3 C
12、apacitance. The nominal capacitance value expressed in picofarads (pF) is identified by a three-digit number; the first two digits represent significant figures and the last digit specifies the number of zeros to follow. When the nominal value is less than 10 pF, the letter “R“ indicates the decimal
13、 point and the succeeding digit(s) of the group represent significant figure(s). For example, 1R0 indicates 1.0 pF; R75 indicates 0.75 pF; and 0R5 indicates 0.5 pF. 1.2.1.4 Capacitance tolerance. The capacitance tolerance is identified by a single letter in accordance with table II. TABLE II. Capaci
14、tance tolerance. Symbol Capacitance tolerance B 0.1 pF C 0.25 pF D 0.5 pF F 1/ 1 percent G 1/ 2 percent J 5 percent K 10 percent 1/ For nominal capacitance of 10 pF or less, the capacitance tolerances are 1.0 pF (F) and 2.0 pF (G). 1.2.1.5 Product level designator. The product level designation in p
15、ercent per 1,000 hours is identified by a single letter in accordance with table III. This is also known as the failure rate level (FRL). TABLE III. Product level designator. Symbol Product level (percent per 1,000 hours) M P R S 1.0 0.1 0.01 0.001 Provided by IHSNot for ResaleNo reproduction or net
16、working permitted without license from IHS-,-,-MIL-PRF-20M 3 1.2.1.6 Standoff option. When applicable (see 3.1), the symbol “V“ indicates the standoff mounting configuration. FIGURE 1. Tolerance envelopes. 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sec
17、tions 3 and 4 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must m
18、eet all specified requirements documents cited in sections 3 and 4 of this specification, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications. standards. and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specif
19、ied herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract (See 6.2). DEPARTMENT OF DEFENSE SPECIFICATIONS (See Supplement 1 for list of associated specification sheets.) Provided by IHSNot for ResaleNo reproduction or networking permitted w
20、ithout license from IHS-,-,-MIL-PRF-20M 4 DEPARTMENT OF DEFENSE STANDARDS MIL-STD-202 - Test Method Standard Electronic and Electrical Component Parts. MIL-STD-690 - Failure Rate Sampling Plans and Procedures. MIL-STD-790 - Established Reliability and High Reliability Qualified Products List (QPL) S
21、ystems for Electrical, Electronic, and Fiber Optic Parts Specifications. MIL-STD-810 - Environmental Engineering Considerations and Laboratory Tests. MIL-STD-1285 - Marking of Electrical and Electronic Parts. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/
22、or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Non-Government publications. The following documents form a part of this document to the extent specified herein. Unless otherwise specified, the issues of the documents are those cite
23、d in the solicitation or contract. TECHAMERICA EIA-554-1 - Assessment of Average Outgoing Quality Levels in Parts Per Million (ppm). EIA 557 - Statistical Process Control Systems. (Copies of these documents are available from http:/www.techamerica.org/ or TechAmerica, 601 Pennsylvania Ave., NW, Nort
24、h Building, Ste.600, Washington DC, 20004-2650.) 2.4 Order of precedence. Unless otherwise noted herein or in the contract, in the event of a conflict between the text of this document and the references cited herein (except for related specification sheets), the text of this document takes preceden
25、ce. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Specification sheets. The individual item requirements shall be as specified herein and in accordance with the applicable specification sheets. In the
26、event of any conflict between requirements of this specification and the specification sheet, the latter shall govern. 3.2 Qualification. Capacitors and retainers furnished under this specification shall be products that are authorized by the qualifying activity for listing on the applicable qualifi
27、ed products list (QPL) before contract award (see 4.4 and 6.3). Authorized distributors that are approved to MIL-STD-790 distributor requirements by QPL manufacturers are listed in the QPL. 3.3 Qualified Products List (QPL) system. The manufacturer shall establish and maintain a QPL system for parts
28、 covered by this specification. Requirements for this system are specified in MIL-STD-690 and MIL-STD-790. In addition, the manufacturer shall establish a Statistical Process Control (SPC) and Part Per Million (PPM) system which meets the requirements of 3.3.1 and 3.3.2, respectively. 3.3.1 SPC syst
29、em. As part of the overall MIL-STD-790 QPL system, the manufacturer shall establish a SPC system that meets the requirements of EIA 557. Typical manufacturing processes for application of a SPC include, but are not limited to the following: Application of termination, assembly, chip firing, green ch
30、ip assembly, dielectric material manufacture, and packaging. 3.3.2 PPM system. As part of the overall MIL-STD-790 QPL system, the manufacturer shall establish a PPM system for assessing the average outgoing quality of lots in accordance with EIA-554-1. Data exclusion, in accordance with EIA-554-1, m
31、ay be used with approval of the qualifying activity. The PPM system shall identify the PPM rate at the end of each month and shall be based on a six month moving average. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-20M 5 3.4 Material. The
32、 material shall be as specified herein. However, when a definite material is not specified, a material shall be used that will enable the capacitors to meet the performance requirements of this specification. Acceptance or approval of any constituent material shall not be construed as a guarantee of
33、 the acceptance of the finished product. 3.4.1 Insulating and impregnating compounds. Insulating and impregnating compounds, including resins, varnishes, waxes, and the like, shall be suitable for each particular application. Compounds shall preserve the electrical characteristics of the insulation
34、to which they are used. 3.5 Interface and physical dimensions. Capacitors shall meet the interface requirements and physical dimensions specified (see 3.1). 3.5.1 Case. Each capacitor shall be effectively sealed against the entry of moisture. When a molded case is specified (see 3.1), the capacitor
35、element shall be enclosed via transfer molding or the use of a pre-formed case. When a conformal (dipped) case is specified (see 3.1), the capacitor element shall be enclosed within insulating resin, plastic, or ceramic. 3.5.2 Connections. Electrical connections shall not depend on wires, lugs, term
36、inals, and the like, that are clamped between a metallic member and an insulating material other than the ceramic material. Such connections shall be soldered or shall be clamped between metallic members. 3.5.2.1 Pure tin. The use of pure tin, as an underplate or final finish, is prohibited both int
37、ernally and externally. Tin content of capacitor components and solder shall not exceed 97 percent, by mass. Tin shall be alloyed with a minimum of 3 percent lead, by mass (see 6.8). Use of lead-free high temperature solder for internal connections requires approval by the qualifying activity. The t
38、in content of lead-free high temperature solders shall not exceed 97 percent by mass. 3.5.2.2 Solder dip (retinning). The manufacturer may solder dip/retin the leads of product supplied to this specification, provided that the solder dip process has been approved by the qualifying activity using the
39、 requirements of appendix A of this specification. 3.6 Thermal shock and voltage conditioning (ER parts only). When tested as specified in 4.7.2, capacitors shall withstand the extremes of high and low temperature without visible damage and meet the following requirements: a. Dielectric withstanding
40、 voltage (DWV) (at +25C): Shall be as specified in 3.9. Not applicable if optional voltage conditioning was performed at or above 300 percent of rated voltage. b. Insulation resistance (at +25C): Shall not be less than the value shown on figure 2. NOTE: This step may be skipped if +125C IR is perfor
41、med with +25C limits. c. Insulation resistance (at +125C): Shall not be less than the value shown on figure 2. d. Capacitance (at +25C): Shall be within the tolerance specified (see 3.1). e. Dissipation factor (at +25C): Shall not exceed the initial requirement (see 3.8). Provided by IHSNot for Resa
42、leNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-20M 6 FIGURE 2. Insulation resistance versus capacitance. 3.7 Capacitance. When measured as specified in 4.7.3, the capacitance shall be within the specified tolerance (see 3.1). 3.8 Dissipation factor. When determined as
43、 specified in 4.7.4, the dissipation factor shall not exceed the percent specified on figure 3. Due to the limitations of measuring equipment, capacitances of less than 30 pF appear to have a high dissipation factor, as shown in figure 3. 3.9 Dielectric withstanding voltage. When tested as specified
44、 in 4.7.5, capacitors shall withstand the dc potential without damage or breakdown. 3.10 Barometric pressure (reduced) (qualification only). When tested as specified in 4.7.6, capacitors shall withstand the dc potential without flashover. 3.11 Insulation resistance. When measured as specified in 4.7
45、.7, the insulation resistance at +25C shall be not less than the value specified in figure 2. 3.12 Temperature coefficient and capacitance drift (see 4.7.8). 3.12.1 Temperature coefficient. Unless otherwise specified (see 3.1), the capacitor-temperature curve shall lie within the tolerance envelope
46、as shown in figure 1 (see 6.5). The temperature coefficient in ppm/C can be calculated with the following equation: Temperature coefficient (ppm/C) = C2 C1 X 106C1(T2 T1) where: C2 = Capacitance at test temperature C1 = Capacitance at +25C T2 = Test temperature T1 = +25C Provided by IHSNot for Resal
47、eNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-20M 7 3.12.2 Capacitance drift. The capacitance drift shall be within 0.2 percent or 0.05 pF, whichever is greater. FIGURE 3. Maximum dissipation factor values. 3.13 Shock, specified pulse. When capacitors are tested as sp
48、ecified in 4.7.9, there shall be no momentary or intermittent contact of 0.5 millisecond (ms) or greater duration, open-circuiting or short-circuiting, or other evidence of mechanical damage. 3.14 Vibration, high frequency. When capacitors are tested as specified in 4.7.10, there shall be no momenta
49、ry or intermittent contact of 0.5 ms or greater duration, open-circuiting or short-circuiting, or other evidence of mechanical damage; and capacitors shall meet the following requirements: a. Capacitance: Shall not change more than 2.0 percent or 0.5 pF (0.25 pF for values less than 10 pF), whichever is greater, from the initial value as measured in 4.7.3. b. Dissipation f
