1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED D Device 01 inactive for new design. Change IILmax to -400 A. Delete IILmin. Delete min limits from all prop delays. Change power dissipation to 61 mW. Add vendor, FSCM: 04713. Complete document update. 85-09-27 N. A. HAUCK E Convert to military dr
2、awing format. Add LCC package. Add logic diagram. Change code ident. no. Remove vendors CAGE 34335, 07263, 27014. 87-10-09 R. P. EVANS F Update to reflect latest changes in format and requirements. Editorial changes throughout. - les 02-11-19 R. MONNIN G Make correction to paragraph 3.5. - ro 05-11-
3、08 R. MONNIN CURRENT CAGE CODE 67268 THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV G G G G G G G G G OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY W. A. DENICK DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY R. F. GONZALE
4、S COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY N. A. HAUCK AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 76-03-18 MICROCIRCUIT, DIGITAL, LOW POWER SCHOTTKY TTL, DECODERS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL
5、 G SIZE A CAGE CODE 14933 76005 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E014-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76005 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET
6、 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 76005 01 E
7、 X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54LS138 3 to 8 line decoder 1.2.2 Case outline(s). The case outline(s) are as desi
8、gnated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendi
9、x A. 1.3 Absolute maximum ratings. Supply voltage . -0.5 V dc to +7.0 V dc Input voltage range . -1.5 V dc at -18 mA to +7.0 V dc Storage temperature range -65C to +150C Maximum power dissipation (PD) 61 mW 1/ Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) S
10、ee MIL-STD-1835 Junction temperature (TJ) +175C 1.4 Recommended operating conditions. Supply voltage range (VCC) 4.5 V dc minimum to 5.5 V dc maximum Minimum high level input voltage (VIH) . 2.0 V dc Maximum low level input voltage (VIL) 0.7 V dc Case operating temperature range (TC) -55C to +125C _
11、 1/ Must withstand the added PDdue to short circuit test; e.g., IOS. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76005 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 3 DSCC FOR
12、M 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitatio
13、n or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFE
14、NSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Aven
15、ue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a speci
16、fic exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing
17、 (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow a
18、s documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PR
19、F-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2
20、.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherw
21、ise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each
22、subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76005 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical
23、performance characteristics. Test Symbol Conditions -55C TC +125C unless otherwise specified Group A subgroupsDevice type Limits Unit Min Max High level output voltage VOH VCC= 4.5 V, IOH= -400 A VIL= 0.7 V 1, 2, 3 All 2.5 V Low level output voltage VOL VCC= 4.5 V, IOL= 4 mA VIH= 2.0 V 1, 2, 3 All 0
24、.4 V Input clamp voltage VIC VCC= 4.5 V, IIN= -18 mA, TC= +25C 1 All -1.5 V High level input current IIH1 VCC= 5.5 V, VIH= 2.7 V 1, 2, 3 All 20 A IIH2 VCC= 5.5 V, VIH= 5.5 V 1, 2, 3 All 100 A Low level input current IIL VCC= 5.5 V, VIL= 0.4 V 1, 2, 3 All -400 A Short-circuit output current IOS VCC=
25、5.5 V 1/ 1, 2, 3 All -6 -130 mA Supply current ICCVCC= 5.5 V 1, 2, 3 All 10 mA Functional tests See 4.3.1c 7 All tPHL19 All 41 ns VCC= 5.0 V, RL= 2 k 5% CL= 15 pF 10% 10, 11 All 57 ns 9 All 46 Propagation delay time, high-to-low level, 2/ select to Y (two levels of delay) CL= 50 pF 10% 10, 11 All 64
26、 ns tPLH19 All 20 ns CL= 15 pF 10% 10, 11 All 28 ns 9 All 25 Propagation delay time, low-to-high level, 2/ select to Y (two levels of delay) CL= 50 pF 10% 10, 11 All 35 ns tPHL29 All 39 ns CL= 15 pF 10% 10, 11 All 55 ns 9 All 44 Propagation delay time, high-to-low level, 2/ select to Y (three levels
27、 of delay) CL= 50 pF 10% 10, 11 All 62 ns tPLH29 All 27 ns CL= 15 pF 10% 10, 11 All 38 ns 9 All 32 Propagation delay time, low-to-high level, 2/ select to Y (three levels of delay) CL= 50 pF 10% 10, 11 All 45 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networkin
28、g permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76005 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TC +125C unless otherwi
29、se specified Group A subgroupsDevice type Limits Unit Min Max tPHL39 All 32 ns VCC= 5.0 V, RL= 2 k 5% CL= 15 pF 10% 10, 11 All 45 ns 9 All 37 Propagation delay time, high-to-low level, 2/ enable to Y (two levels of delay) CL= 50 pF 10% 10, 11 All 53 ns tPLH39 All 18 ns CL= 15 pF 10% 10, 11 All 25 ns
30、 9 All 23 Propagation delay time, low-to-high level, 2/ enable to Y (two levels of delay) CL= 50 pF 10% 10, 11 All 32 ns tPHL49 All 38 ns CL= 15 pF 10% 10, 11 All 53 ns 9 All 43 Propagation delay time, high-to-low level, 2/ enable to Y (three levels of delay) CL= 50 pF 10% 10, 11 All 60 ns tPLH49 Al
31、l 26 ns CL= 15 pF 10% 10, 11 All 36 ns 9 All 31 Propagation delay time, low-to-high level, 2/ enable to Y (three levels of delay) CL= 50 pF 10% 10, 11 All 43 ns 1/ Not more than one output should be shorted at a time, and the duration of the short-circuit condition should not exceed one second. 2/ P
32、ropagation delay time testing may be performed using either CL= 15 pF or CL= 50 pF. However, the manufacturer must certify and guarantee that the microcircuits meet the switching test limits specified for a 50 pF load. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The p
33、art shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be
34、 replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
35、6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance a
36、s required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76005 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OH
37、IO 43218-3990 REVISION LEVEL G SHEET 6 DSCC FORM 2234 APR 97 Device type 01 Case outlines E, F 2 Terminal number Terminal symbols 1 A N/C 2 B A 3 C B 4 G2 A C 5 G2 B G2 A 6 G1 N/C 7 Y7 G2 B 8 GND G1 9 Y6 Y7 10 Y5 GND 11 Y4 N/C 12 Y3 Y6 13 Y2 Y5 14 Y1 Y4 15 Y0 Y3 16 VCC N/C 17 - - - Y2 18 - - - Y1 19
38、 - - - Y0 20 - - - VCCFIGURE 1. Terminal connections. INPUTS OUTPUTS ENABLE SELECT G1 G2 * C B A Y0 Y1 Y2 Y3 Y4 Y5 Y6 Y7 X H X X X H H H H H H H H L X X X X H H H H H H H H H L L L L L H H H H H H H H L L L H H L H H H H H H H L L H L H H L H H H H H H L L H H H H H L H H H H H L H L L H H H H L H H
39、 H H L H L H H H H H H L H H H L H H L H H H H H H L H H L H H H H H H H H H H L *G2 = G2 A + G2 B H = high level L = low level X = irelevant FIGURE 2. Truth table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 7
40、6005 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 7 DSCC FORM 2234 APR 97 FIGURE 3. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76005 DEFENSE SUPPLY CENTER COL
41、UMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 8 DSCC FORM 2234 APR 97 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to rev
42、iew the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Scree
43、ning. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall
44、be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method
45、 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conforman
46、ce inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, and 8 in table I, method 5005 of MIL-STD
47、-883 shall be omitted. c. Subgroup 7 shall include verification of the truth table. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The t
48、est circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,
