DLA SMD-5962-77035-1977 MICROCIRCUITS DIGITAL CMOS 4-BIT LATCH 4-TO-16 LINE DECODER《4-16行译码器 4比特锁存器 氧化物半导体数字微型电路》.pdf

上传人:confusegate185 文档编号:698585 上传时间:2019-01-02 格式:PDF 页数:10 大小:339.96KB
下载 相关 举报
DLA SMD-5962-77035-1977 MICROCIRCUITS DIGITAL CMOS 4-BIT LATCH 4-TO-16 LINE DECODER《4-16行译码器 4比特锁存器 氧化物半导体数字微型电路》.pdf_第1页
第1页 / 共10页
DLA SMD-5962-77035-1977 MICROCIRCUITS DIGITAL CMOS 4-BIT LATCH 4-TO-16 LINE DECODER《4-16行译码器 4比特锁存器 氧化物半导体数字微型电路》.pdf_第2页
第2页 / 共10页
DLA SMD-5962-77035-1977 MICROCIRCUITS DIGITAL CMOS 4-BIT LATCH 4-TO-16 LINE DECODER《4-16行译码器 4比特锁存器 氧化物半导体数字微型电路》.pdf_第3页
第3页 / 共10页
DLA SMD-5962-77035-1977 MICROCIRCUITS DIGITAL CMOS 4-BIT LATCH 4-TO-16 LINE DECODER《4-16行译码器 4比特锁存器 氧化物半导体数字微型电路》.pdf_第4页
第4页 / 共10页
DLA SMD-5962-77035-1977 MICROCIRCUITS DIGITAL CMOS 4-BIT LATCH 4-TO-16 LINE DECODER《4-16行译码器 4比特锁存器 氧化物半导体数字微型电路》.pdf_第5页
第5页 / 共10页
点击查看更多>>
资源描述

1、I REVISIONS LT R DE SCRIPTION DATE APPROVED Prepared in accordance with MIL-STD-100 PPEPARED BY qriginal Date of Drawing ./SA 77 26 September 1977 / 41 14933 REY Sel ec ted i tem drawl ng DEffNSf ELECTROMICS SUPPLY CENTER OAYTOll. OHIO TITLE licrocircuits. Oigi tal, CioS. =-dit Latch, 4-to-16 Line 2

2、ecoder DWQ NO* 77035 PAQE 1 OF i9 Licensed by Information Handling ServicesI DEFENSE ELIETRONICS SUPPLY CEWTCI 9999996 0322802 2T5 1 1. SCOPE 1 1.1 w. This drawing describes the requirments for monolithic silicon, 4-bit latch/4 to 16 line decoder microcircuits. ! assurance for procurement of inicruc

3、ircui ts in accordance with i4IL-M-3851. This drawing provides for a level of microcircuit quality and reliability 1.2 Part number. The complete part number shall be as shown in the following example: I SIZE CODE IDENT. NO. OWG NO. A 1 14933 ?;“is 7T i i Lead finish Case out1 ine Drawl nq number Dev

4、ice cype I 1 (1.2.1-l (1.2.2) (3.3) 1.2.1 Device type. The device type snall identify the circuit function as follows: Oev i ce type Generic nuniber Circuit U1 (see 6.6) 4 bit latch/4 to 16 line decoder 1.2.2 Case outline. The case outline shall be as designated in MIL-M-38510, appendix C and as f 0

5、1 1 ows : Outline letter Case outline REV !?AGE L J 2 0-3 (24 pin, 1/2“ X 1-1/4“ duai-in-line) F- (24 pin, 1/4“ X 3/8“, flat pack) 1.3 Absolute maximum ratings. Supply witage range- - - - - - - - - - - - - - - - - Input voltage range - - - - - - - - - - - - - - - - - Maximum power dissipation, PD i/

6、- - - - - - - - - - - Lead temperature (soldering 13 seconds) - - - - - - - 4.5 Vdc to +d Vdc -U.5 to V9, 4.5 Vdc 5 rnWdc gi +3clU0c I Storage temperature range - - - - - - - - - - - - - - -65C to +15UC U.UY“C/mW for flat pack - -( .Lii“V/na far dual-in-line Thermai resistance, junction to case - -

7、- - - - - - Junction tenperature- - - - - - - - - - - - - - - - - TJ = +175C 1 .a Recommended operatina conditions. Supply voltage- - - - - - - - - - - - - - - - - - - - +3 Vdc to + 18 Vdc Minimum high level input voltage- - - - - - - - - - - +3.5 Vdc Maximum low level input vol tage - - - - - - - -

8、 - - - +1 .S Ydc Ambient operating temperature range - - - - - - - - - -55C to +12“C - i/ - 2/ Yust withstand the added ?o due to short circuit conditions (e.g. losi at one output for 5 seconds. For TA = +UD ta i25*C, derate iineary at I2 mI“C to 200 m4. I Licensed by Information Handling Services2.

9、 APPLICABLE DOCUMENTS 2.1 The following documents, of the issue in effect on date of invitation for bids or request for proposal, fonn a part of this drawing to tne extent specified herein. SPECIFICATION DEfEHSI ELICTRONICS SUPPIY CEYTEII !I IL ITARY SlZE I G3DE IDENT. NO. DWG NO. 77035 4 I 14933 I

10、I.IIL-I-3851U - i4ictucircui ts, General Specification for. ! S TAN DAR0 1 PAGE 3 A E/ iIILITARY MIL-STD-383 - Test !.lethods and Procedures for Microelectronics. (Copies of specifications. standards, drawings, and publications required by supp iers in connec- tion with specific procurement function

11、s should be obtained fran the procuring activity or as directed by the contracting officer.) 3. REQUIREMENTS 3.1 Detail specification. The individual item requirenents shall be in accordance with 3.2 Desiqn. construction, and physical diinensions. The design, construction, and physical MIL-;4-38510,

12、 and as specified herein. dimensions shall be as specified in MIL4.1-38510 and herein. 3.2.1 Design documentation. The design documentation shall be in accordance with MIL41-38510 and, unless otherwise specified in the Contract or purchase order, shall be retained by the rnanu- facturer but be avail

13、able for review by the procuring activity or contractor upon request. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3. 3.2.4 Case outlines. The case outlines :hall be in accordance with 1.2.2. 3.3 Lead material and finish. Lead material and finish shall

14、be in accordance with MIL-M-38510. 3.4 El ectrical performance Characteristics. The electrical performance characteristics are as Truth table. The truth table shall be as specified on figure 2. specified in table I and apply over the full recommended ambient operating temperature range, un- less cth

15、erwise specified. in accordance with 1.2 herein. used. 3.5 Marking. Marking shall De in accordance with 14IL-N-38510 except the part number shall be The M38510/XXX part number, and the “JAN“ or “J“ mark shall not be 3.5 Product assurance reauireients. :licrocircui ts fwnisned under this drawing shal

16、l have been subjected to, and DasSe9 51 I t% requircW?*ts, tests. and insoections detailed herein including screening, und qua: i ty cniormncs inspection rcqui rcrnents. Licensed by Information Handling ServicesW b 0122804 078 I c Test Symbol - High-level output voltage i/ VOH VoD = 5 V; 10 v; s Y;

17、Vo = 0.5 or 4.5 V 1.0 or 9.0 V i.5 or 13.5 Y Voo = 5 Y; vo = 4.5 or 5.0 v lu v; 9.0 or 1.0 V 15 V 13.5 or 1.5 V L Lou-level output vol tage 1/ O1 o1 High-level input vol tage i/ Output drive current (source P-channel 1/ VIH Out?ut drive current (sink) N-channel L/ I 1 Functional tests i/ I$ in Input

18、 capacitance 21 Oui escent current L/ 1 i9D I 1 i DEFFNSE ILECT40ilCS SUPP1Y CEWTLR OAYTOi, JHIO Device Condit ions VD3 = 3 v; vin = 0.3 Y 0.5 v 5 Y; 10 v; 0.10 v 15 J; 0.15 Y O1 VD0 = 5 Y; vo = 2.5 v 5 Y; 4.6 Y 10 v; 9.s v 15 Y; 13.5 V o1 VUD = 5 Y; vo = 0.4 v 10 4; 0.5 i 15 Y; 1.5 v o1 See 4.4.1 !

19、cl I ci Vin = o, TA = 25C U1 15 7 - SIZE 1 CODE IDEN. VO.1 DWG 90. i 14933 I Limits Units - - I d-7 .05 I . . u5 .os - v - - 1.5 V 3.0 4.0 2w ! I 200 ! : r ! PAGE J Licensed by Information Handling Services= 99b 0322805 TO4 _ -.- - i I - 1/ Test is part of subgroups A-1. A-?, and A-3. 2/ Test is par

20、t of subgroups A-1 only. 3/ Test is part of subgroups A-9, A-10, and u percent 7C tests at 25C :Ji th 10 percent PUA, hinh aiid low temperature DC tests, and Fcrecning. Screeriing shy the customer dt al l times. 2.4.1 Grccc ti ins9erti:)n. :!-3up A i?s:cction ,6411 cons:; ,)t cl!e :est sutgroups 3cd

21、 iTPD valiies shom n tarile I f 7ietho3 SOO5 sf :IL-CTQ-283 (clas; jid 3s +r-icwr: a. Test5 ;hall 3e J -:?citicq I :lble i!. I). c. r. :gbgt-S33; 1, 3, I;. 3nti .j of 331 ! .i n?tio, Si, 7 tests rfirient XI verify :ni !rut? :an!.:. t I l i i ! I I ! I I I ! I Licensed by Information Handling Service

22、sI i ! I I I I I I i i 1 ! i 1 ! YIL-Si 1-083 tes: requirements Interim electrical parameters Fi na1 electrical test paraneters Group A te;t requi tements (twthod %c5 Groups C and D end point el ectrir.il parameters (nietho 1 5005) Additional electric.11 sub- (pre biirn-in) (method 5004, 3.1.8) (met

23、hod SU04, 3.1.14) groups for group V periodic i nspecti ans !+ Subgroups 11 - l* 2, 3, 9 1, 2, 3, 7, 9 1, i, 3 10. I I 1 4.4.2 Group B inspection. 4.4.3 Group C and group U inspection. In group O inspection, each inspection lot shall be subjected to the Group C and group O inspections shall De as sp

24、ecified in test subgroups and LTPD valges shoiJn in table IIb of method 5005 of MIL-STD-883, class B. method 5005 of I.111-STO-883, class B. dance with MIL-#-3859. and group D insprction. 1 The frequency of testing and the sample site shall be in act?! Generic test datd (.5) ;nay be used to satisfy

25、the requirements for groun ! * POA applies to subgroup 1 (see 4.3). - i/ Subgroups per method 5005, Table i. 5. PACKAGI?lG 5.1 Packaaiqg rc?quirc-?+:c:;. ;he requir3eqts fur -,a-,zaging SAI 2. ,i accordance with Y IL -M -3 i35 1 U. 1 6. :JOTES 5.1 Notes. Only 6.4 of :?e notes speciiert in Y!L-!J-J83

26、13 ih: 1 nr;lj ta this drawing. f 1 f SIZE I U3GE !bENT. NO WG NO. i - , .,“3 c- Licensed by Information Handling Services M 9999996 0322809 65T M 6.2 Intended use. Microcircuits confoming to this drawing are intended for use when military specifications ao not exist and qualified military devices t

27、hat will perfom the required function are not available for 0G-i application. This drwing is intended exclusively to prevent the prolif- eration of unnecessary duplicate specifications, drawings and stock catalog listings. When a military specification exists and the product covered by this drawing

28、has been qualified for listing on OPL-38510, this drawing becanes obsolete and vil1 not be used for new design. product shall be the preferred item for all applications. The QPL-38510 6.3 Ordering data. The contract or order should specify the fowing: a. Complete part number (see 1.2). b. Requiremen

29、ts for delivery of one copy of the quality conformance inspection data pertinent to the device inspection lot to be supplied with each shipment by the device manufacturer. if applicable. c. Requirement for certificate of compliance, if appicable. d. Requirements for notification of change of product

30、 or process to procuring activity, e. Requirements for packaging and packing. f. Requirements for carrier, special lead lengths or lead fonning, if applicable. These if appl icable. requi rements shall not affect the part number. requirements will not apply to direct shipment to the Goverment. Unles

31、s otherwise specified, these 6.4 Replaceability. Replaceability is determined as follows: Microcircuits coverod by this drawiq will replace the same generic device covered by contractor prepared specification or drawing. 6.5 Generic test data. Generic test data my be used to satisfy the requirements

32、 of 4.4.3. Generic test data is define4 as test data from devices manufxtured during the same time period, by means of the same production technique, materials, controls and design, and in the same micro- circuit group (see 3.1.3(h) of 4!:-:4-385l0) as the deliverable devices. be interpreted as cove

33、ring a maximum span of 180 days between the generic test sample fabrication and the fabrication of deliverable devices. period of not less than 36 months from the date of shipment. The same time period shall lhe vendor is required to retain generic data for a Licensed by Information Handling Service

34、sI i I l I i I I 1 ! I I ! DfFtNSE ELECTROAICS SUPPLY CENTER OAYTON, O110 6.6 Suggested source($) of supply. 2/ - A 14933 I li131 AEJ I PAGE U PART iWlER FSCM VENDOR TYPE NLFilJER 171J t I I l I I77035012X I l714 I CD4514BK/J I VEtiDOR FSCM NUMBER O471 3 l714 VENDOR NAHE ANO ADDRESS Motorol a, Incor

35、porated Semiconductor Products Division Integrated Circuits Center P. O. Box ZU906 Phoenix, AZ S36 RCA Corporation Solid State Division Route 202 Somerville, K) W76 CAUTION. DO NOT USE THIS NWuER FOR ITEM PROCUREMENT. ITEMS PROCURED TO THE SIMILAR -TYPE ONLY MAY NOT SATISFY THE VERFORMANCE REQUIRNNT

36、S OF THIS DRAWING. Fot additional suggested sources of supply or assistance in the use of this drawing contact JESC-EC, 15U7 Wilmington Pike, Dayton. Ohio 45444 or telephone 513-296-5375. I SIZE I CODE IDENT. NO.1 DWG NO. I I OIIC SRY UA I rr ?b l i l i i i I I c.:. I ! I I 1 I I I I I , i Licensed by Information Handling Services

展开阅读全文
相关资源
猜你喜欢
相关搜索

当前位置:首页 > 标准规范 > 国际标准 > 其他

copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:苏ICP备17064731号-1