1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes to test conditions in table I. Change code ident. no. from 14933 to 67268. Editorial changes throughout. 87-11-24 R. P. Evans B Add generic part number 1691A. Changes to table I. Editorial changes throughout. 94-10-05 M. A. Frye C Update
2、to current requirements. Editorial changes throughout. drw 03-07-10 Raymond Monnin D Sheet 10, correction to figure 3, test circuit. Editorial changes throughout. - drw 05-07-06 Raymond Monnin E Correction to the E package descriptive designator paragraph 1.2.2. drw 06-05-01 Raymond Monnin THE ORIGI
3、NAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED REV SHET REV SHET REV STATUS REV E E D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Donald R. Osborne DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY D. A. DiCenzo COLUMBUS, OHIO 4
4、3218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY N. A. Hauck MICROCIRCUIT, LINEAR, RS-422/RS-423 LINE AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 86-12-31 DRIVER, MONOLITHIC SILICON AMSC N/A REVISION LEVEL E SIZE A CAGE CODE 67268
5、5962-86721 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E424-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86721 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FORM 22
6、34 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-86721 01 E A Drawing
7、 number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type. The device type identifies the circuit function as follows: Device type Generic number Circuit function 01 26LS30, 1691A Dual differential RS-422 party line/quad single ended RS-423 line driver 1.2.2 Cas
8、e outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish
9、is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range (VCC). -0.5 V dc to +7.0 V dc Supply voltage range (VEE) . +0.5 V dc to -7.0 V dc Input voltage range. -1.5 V dc to +15.0 V dc Storage temperature range. -65C to +150C Maximum power dissipation (PD) 1/ 5
10、00 mW Lead temperature (soldering, 4 seconds) . +260C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA). 90C/W Junction temperature (TJ) . +175C 1.4 Recommended operating conditions. EIA RS-422 connection: Mode voltage. 0.76 V Supply voltage rang
11、e (VCC) . +4.5 V dc to +5.5 V dc Supply voltage (VEE) GND EIA RS-423 connection: Mode voltage. 2.0 V Supply voltage range (VCC) . +4.75 V dc to +5.5 V dc Supply voltage range (VEE) -4.75 V dc to -5.5 V dc Minimum high-level input voltage (VIH) 2.0 V dc Maximum low-level input voltage (VIL) 0.8 Vdc A
12、mbient operating temperature range -55C to +125C 1/ Must withstand the added PDdue to short circuit test (e.g., ISA/ISB).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86721 DEFENSE SUPPLY CENTER COLUMBUS CO
13、LUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the iss
14、ues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standa
15、rd Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from
16、the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however,
17、supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this dra
18、wing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity a
19、pproval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A
20、“Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case ou
21、tlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table and logic diagram. The truth table and logic diagram shall be as specified on figure 2. 3.3 Electrical performance characteris
22、tics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The elec
23、trical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN num
24、ber is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C
25、” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86721 DEFENSE SUPPLY CE
26、NTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max EIA RS-422 Connection, mode voltage 0.76 V 1/ 2/ D
27、ifferential output voltage VORL= Infinity VIN= 2.0 V 1, 2, 3 01 6.0 V VA, BOV VIN= 0.8 V -6.0 Differential output voltage VTRL= 100 VIN= 2.0 V 1, 2, 3 01 2.0 V VA, BTV VIN= 0.8 V -2.0 Common mode offset voltage VOS, OSV RL= 100 1, 2, 3 01 3.0 V Differential in diffl output voltage |VT|-| TV | RL= 10
28、0 1, 2, 3 01 0.4 V Differential in common mode offset voltage |VOS|-| OSV | RL= 100 1, 2, 3 01 0.4 V |VT- TV| VSSRL= 100 1, 2, 3 01 4.0 V Output voltage common mode range VCMRVENABLE= 2.4 V 3/ 1, 2, 3 01 10 V Output leakage current IXAVCC= 0 V VCMR= 10 V 1, 2, 3 01 100 A IXBVCMR= -10 V -100 Off-stat
29、e output current IOXVCC= +5.5 V VCMR= 10 V 1, 2, 3 01 100 A (high impedance) VCMR= -10 V -100 Output short circuit current ISA, ISBVIN= 2.4 V, VOB= 6.0 V 1, 2, 3 01 10 150 mA 4/ VCC= +5.5 V VOA= 0 V -10 -150 VIN= 2.4 V, VOB= 0 V 1, 2, 3 01 -10 -150 VCC= +5.5 V VOA= 6.0 V 10 150 Supply current ICCVIN
30、= 0.4 V, Vcc= +5.5 V 1, 2, 3 01 30 mA Input high voltage VIH5/ 1, 2, 3 01 2.0 V Input low voltage VIL5/ 1, 2, 3 01 0.8 V See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86721 DE
31、FENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min MaxInput high current IIHVC
32、C= +5.5 V VIN= 2.4 V 1, 2, 3 01 40 A VIN= 15 V 100 Input low current IILVCC= +5.5 V, VIN= 0.4 V 1, 2, 3 01 -200 A Input clamp voltage VICIIN= -12 mA, VCC= +4.5 V 1, 2, 3 01 -1.5 V Functional tests FT See 4.3.1.c 7, 8 01 Differential output rise and fall time 6/ tr, tFRL= 100, TA= +25C, CL= 500 pF, V
33、CC= 5.0 V, VEE= GND, See figure 3 9 01 250 ns Output propagation delay time 6/ tPDH, tPDLRL= 100, TA= +25C, CL= 500 pF, VCC= 5.0 V, VEE= GND, See figure 3 9 01 200 ns Output enable to output time 6/ tLZ, tZHRL= 100, TA= +25C, CL= 500 pF, VCC= 5.0 V, 9 01 300 ns tHZ, tZLCC= 0 pF, VEE= GND, See figure
34、 3 350 EIA RS-423 Connection, mode voltage 2.0 V Output voltage VOVIN= 2.0 V 1, 2 01 4.0 6.0 V 3 3.9 6.0 OV VIN= 0.4 V 1, 2 01 -4.0 -6.0 RL= Infinity, |VCC| = |VEE| = 4.75 V 3 -3.9 -6.0 Output voltage 7/ VTVIN= 2.4 V 1, 2, 3 01 3.6 V TV RL= 450, |VCC| = |VEE| = 4.75 V VIN= 0.4 V -3.6 Output unbalanc
35、e 7/ |VT|-| TV | RL= 450, |VCC| = |VEE| 1, 2, 3 01 0.4 V Output leakage power off IX+VOUT= 6.0 V 1, 2, 3 01 100 A IX-|VCC| = |VEE| = 0 V VOUT= -6.0 V -100 Output short circuit current 4/ IS+VIN= 2.4 V 1, 2, 3 01 -20 -150 A IS- VOUT= 0 V, VCC= 5.5 V VEE= -5.5 V VIN= 0.4 V 20 150 See footnotes at end
36、of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86721 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characte
37、ristics - continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min MaxPositive supply current ICCVIN= 0.4 V, RL= Infinity, |VCC| = |VEE| = 5.5 V 1, 2, 3 01 30 mA Negative supply current IEEVIN= 0.4 V, RL= Infinity, |VCC| = |VEE| = 5.5 V
38、 1, 2, 3 01 -22 mA Input clamp voltage VICIIN= -12 mA, VCC= +4.75 V, VEE= -5.5 V 8/ 1, 2, 3 01 -1.5 V Input high voltage VIH9/ 1, 2, 3 01 2.0 V Input low voltage VIL9/ 1, 2, 3 01 0.8 V Input high current IIH|VCC| = |VEE| = 5.5 V, VIN= 2.4 V 1, 2, 3 01 40 A VCC= 5.5 V, VEE= -5.0 V, VIN= 15 V 100 Inpu
39、t low current IIL|VCC| = |VEE| = 5.5 V, VIN= 0.4 V 1, 2, 3 01 -200 A Functional tests FT See 4.3.1.c 7, 8 01 Rise and fall time tr, tfTA= +25C, VCC= 5.0 V, VEE= -5.0 V 9 01 300 ns RL= 450, CL= 500 pF, CC= 0 pF, See figure 3 VCC= +4.75 V to +5.5 V, VEE= -4.75 V to -5.5 V 10, 11 6/ 375 Output propagat
40、ion delay time tPDH, tPDLTA= +25C, VCC= 5.0 V, VEE= -5.0 V 9 01 300 ns RL= 450, CL= 500 pF, CC= 0 pF, See figure 3 VCC= +4.75 V to +5.5 V, VEE= -4.75 V to -5.5 V 10, 11 6/ 375 1/ RLconnected between each output and its complement. 2/ Measurements for ATE loads are for single-ended conditions. 3/ VCM
41、Ris guaranteed by tested parameters IXA, IXBand IOX. 4/ Not more than one output should be shorted at a time. Duration of short circuit test should not exceed one second. 5/ Input thresholds are tested during DC tests and may be done in combination with testing of other DC parameters. 6/ This parame
42、ter is guaranteed, but not tested. 7/ This parameter is tested by forcing an equivalent current. 8/ The VICparameter in the RS423 mode is guaranteed by the tested VICparameter in the RS422 mode. 9/ Input thresholds are tested during DC tests and may be done in combination with testing of other DC pa
43、rameters. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86721 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outlines E, F 2 Term
44、inal number Terminal symbol 1 VCCNC 2 INPUT A VCC3 INPUT/ B ENABLE INPUT A 4 MODE INPUT/ B ENABLE 5 GND MODE 6 INPUT/ C ENABLE NC 7 INPUT D GND 8 VEEINPUT/ C ENABLE 9 SLEW RATE CONTROL D INPUT D 10 OUTPUT D VEE11 OUTPUT C NC 12 SLEW RATE CONTROL C SLEW RATE CONTROL D 13 SLEW RATE CONTROL B OUTPUT D
45、14 OUTPUT B OUTPUT C 15 OUTPUT A SLEW RATE CONTROL C 16 SLEW RATE CONTROL A NC 17 - - - SLEW RATE CONTROL B 18 - - - OUTPUT B 19 - - - OUTPUT A 20 - - - SLEW RATE CONTROL A FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,
46、-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86721 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 Inputs Outputs Mode A(D) B(C) A(D) B(C) 0 0 0 0 1 0 0 1 Z Z 0 1 0 1 0 0 1 1 Z Z 1 0 0 0 0 1 0 1 0 1 1 1 0 1 0 1 1 1 1 1 0 = low level 1 = high le
47、vel Z = high impedance FIGURE 2. Truth table and logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86721 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 9 DSCC FOR
48、M 2234 APR 97 NOTE: Current probe is the easiest way to display a differential waveform. FIGURE 3. AC test circuits and waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86721 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 10 DSCC FORM 2234 APR 97 FIGURE 3. AC test circuits and waveforms - continued. Provided by IHSNot for ResaleNo reproduction or networking
