DLA SMD-5962-89556 REV B-2010 MICROCIRCUIT DIGITAL ADVANCED CMOS OCTAL D-TYPE LATCH WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update boilerplate to MIL-PRF-38535 requirements. Editorial changes throughout. - jak 03-06-10 Thomas M. Hess B Update test condition for High level output voltage (VOH) and Low level output voltage (VOL) in table I. Update boilerplate paragraphs

2、 to current MIL-PRF-38535 requirements. - MAA 10-04-12 Thomas M. Hess REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Marcia B. Kelleher DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STA

3、NDARD MICROCIRCUIT DRAWING CHECKED BY Ray Monnin THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL D-TYPE LATCH WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON DRA

4、WING APPROVAL DATE 89-03-07 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-89556 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E267-10 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLU

5、MBUS, OHIO 43218-3990 SIZE A 5962-89556 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The

6、 complete PIN is as shown in the following example: 5962-89556 01 R A Drawing number Device type Case outline Lead finish (see 1.2.1) (see 1.2.2) (see 1.2.3) 1.2.1 Device types. The device types identify the circuit function as follows: Device type Generic number Circuit function 01 54ACT563 Octal D

7、-type latch with three-state outputs, TTL compatible inputs 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style R GDIP1-T20 or CDIP2-T20 20 Dual-in-line S GDFP2-F20 or CDFP3-F20 20 Flat pack 2 CQCC1-N2

8、0 20 Leadless-chip-carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 SIZE A

9、5962-89556 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ Supply voltage range (VCC) -0.5 V dc to +6.0 V dc DC input voltage range (VIN) -0.5 V dc to VCC+ 0.5 V dc DC output voltage range (VOUT) . -0.5 V dc to VCC+ 0.5 V dc Clamp diode current (IIK, IOK) . 20 mA D

10、C output current (per pin) (IOUT) . 50 mA DC VCCor GND current (ICC, IGND) . 100 mA Storage temperature range (TSTG) . -65C to +150C Maximum power dissipation (PD) 500 mW Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature

11、(TJ) +175C 3/ 1.4 Recommended operating conditions. 1/ Supply voltage range (VCC) +4.5 V dc minimum to 5.5 V dc maximum Input voltage range (VIN) 0.0 V dc to VCCOutput voltage range (VOUT) . 0.0 V dc to VCCCase operating temperature range (TC) . -55C to +125C Input rise or fall time rate (t/V): VCC=

12、 4.5 V or VCC= 5.5 V 0 to 8 ns/V Minimum setup time, Dn to LE (ts): TC= +25C, VCC= 4.5 V 3.5 ns TC= -55C to +125C, VCC= 4.5 V . 4.5 ns Minimum hold time, Dn to LE (th): VCC= 4.5 V 1.5 ns Minimum pulse width, LE (tw): VCC= 4.5 V 5.0 ns 1/ Stresses above the absolute maximum rating may cause permanent

13、 damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise specified, all voltages are referenced to ground. 3/ Maximum junction temperature shall not be exceeded except for allowable short duration burn-in screening conditions

14、 in accordance with method 5004 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 SIZE A 5962-89556 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2.

15、 APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. D

16、EPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL

17、-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.

18、) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREME

19、NTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer o

20、r a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) p

21、lan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML

22、flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The te

23、rminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as speci

24、fied on figure 4. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 SIZE A 5962-89556 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical performance chara

25、cteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The e

26、lectrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN

27、number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator

28、 “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-H

29、DBK-103 and QML-38535 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A c

30、ertificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC,

31、DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without lic

32、ense from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 SIZE A 5962-89556 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions -55C TC +125C 4.5 V VC

33、C 5.5 V unless otherwise specified Group A subgroups Limits 2/ Unit Min Max High-level output voltage 3006 VOH3/ VIH= 2.0 V or VIL= 0.8 V IOH= -50 A VCC= 4.5 V 1, 2, 3 4.4 V VCC= 5.5 V 5.4 VIH= 2.0 V or VIL= 0.8 V IOH= -24 mA VCC= 4.5 V 3.7 VCC= 5.5 V 4.7 VIH= 2.0 V or VIL= 0.8 V IOH= -50 mA VCC= 5.

34、5 V 3.85 Low-level output voltage 3007 VOL3/ VIH= 2.0 V or VIL= 0.8 V IOL= +50 A VCC= 4.5 V 1, 2, 3 0.1 V VCC= 5.5 V 0.1 VIH= 2.0 V or VIL= 0.8 V IOL= +24 mA VCC= 4.5 V 0.5 VCC= 5.5 V 0.5 VIH= 2.0 V or VIL= 0.8 V IOL= +50 mA VCC= 5.5 V 1.65 High-level input voltage VIH4/ VCC= 4.5 V 1, 2, 3 2.0 V VCC

35、= 5.5 V 2.0 Low-level input voltage VIL4/ VCC= 4.5 V 1, 2, 3 0.8 V VCC= 5.5 V 0.8 Input leakage current low 3009 IILVIN= 0.0 V VCC= 5.5 V 1, 2, 3 -1.0 A Input leakage current high 3010 IIHVIN= 5.5 V VCC= 5.5 V 1, 2, 3 1.0 Quiescent supply current delta, TTL input levels 3005 ICC5/ VCC= 5.5 V For inp

36、ut under test, VIN= VCC- 2.1 V For all other inputs, VIN= VCCor GND 1, 2, 3 1.6 mA Quiescent supply current 3005 ICCHVIN= VCCor GND VCC= 5.5 V IOUT= 0.0 mA 1, 2, 3 160 A ICCL160 ICCZ160 Three-state output leakage current high 3021 IOZH VIN= VCCor GND VCC= 5.5 V VOUT= 5.5 V or 0.0 V 1, 2, 3 10.0 A Th

37、ree-state output leakage current low 3020 IOZL -10.0 Input capacitance 3012 CINSee 4.3.1c 4 8.0 pF Power dissipation capacitance CPD6/ See 4.3.1c 4 60.0 pF Functional tests 3014 Tested at VCC= 4.5 V and repeated at VCC= 5.5 V, see 4.3.1d 7, 8 L H See footnotes at end of table. Provided by IHSNot for

38、 ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 SIZE A 5962-89556 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test and MIL-

39、STD-883 test method 1/ Symbol Test conditions -55C TC +125C 4.5 V VCC 5.5 V unless otherwise specified Group A subgroups Limits 2/ Unit Min Max Propagation delay time, Dn to On 3003 tPHL17/ VCC= 4.5 V CL= 50 pF RL= 500 See figure 4 9 1.0 10.0 ns 10, 11 1.0 12.0 tPLH17/ 9 1.0 11.5 10, 11 1.0 14.5 Pro

40、pagation delay time, LE to On 3003 tPHL27/ 9 1.0 9.5 10, 11 1.0 11.5 tPLH27/ 9 1.0 10.0 10, 11 1.0 12.5 Propagation delay time, output enable, OE to On 3003 tPZH7/ 9 1.0 9.0 10, 11 1.0 11.5 tPZL7/ 9 1.0 9.0 10, 11 1.0 11.0 Propagation delay time, output disable, OE to On 3003 tPHZ7/ 9 1.0 10.5 10, 1

41、1 1.0 12.0 tPLZ7/ 9 1.0 8.0 10, 11 1.0 9.5 1/ For tests not listed in the referenced MIL-STD-883 (e.g. CPD), utilize the general test procedure under the conditions listed herein. All inputs and outputs shall be tested, as applicable, to the tests in table I herein. 2/ For negative and positive volt

42、age and current values, the sign designates the potential difference in reference to GND and the direction of current flow, respectively; and the absolute value of the magnitude, not the sign, is relative to the minimum and maximum limits, as applicable, listed herein. 3/ VOHand VOLshall be tested a

43、t VCC= 4.5 V. VOHand VOLare guaranteed, if not tested, for VCC= 5.5 V. Limits shown apply to operation at VCC= 5.0 V 0.5 V. Transmission driving tests are performed at VCC= 5.5 V with a 2 ms duration maximum. 4/ VIHand VILtests are not required, and shall be applied as forcing functions for VOHand V

44、OLtests. 5/ This test may be performed either one input at a time (preferred method) or with all input pins simultaneously at VIN= VCC- 2.1 V (alternate method). Classes Q and V shall use the preferred method. When the test is performed using the alternate test method, the maximum limits are equal t

45、o the number of inputs at a high TTL input level times 1.6 mA; and the preferred method and limits are guaranteed. 6/ Power dissipation capacitance (CPD) determines the no load dynamic power consumption, PD= (CPD+ CL) (VCCx VCC)f + (ICCx VCC) + (n x d x ICCx VCC). The dynamic current consumption, IS

46、= (CPD+ CL)VCCf + ICC+ n x d x ICC. For both PDand IS, n is the number of device inputs at TTL levels, f is the frequency of the input signal, and d is the duty cycle of the input signal. 7/ AC limits at VCC= 5.5 V are equal to limits at VCC= 4.5 V and guaranteed by testing at VCC= 4.5 V. The minimu

47、m ac limits are guaranteed for VCC= 5.5 V by guard banding the VCC= 4.5 V limits to 1.5 ns minimum. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 SIZE A 5962-895

48、56 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Case outlines R, S, and 2 Terminal number Terminal symbol 1 OEnullnullnullnull2 D03 D14 D2 5 D36 D47 D5 8 D69 D710 GND 11 LE 12 O7nullnullnullnull13 O6nullnullnullnull14 O5nullnullnullnull15 O4nullnullnullnull16 O3nullnullnullnull17 O2nullnullnullnull18 O1nullnullnullnull19 O0nullnullnullnull20 VCCFIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,

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