1、DESC-DWG-7732 57 W 7777775 003472 4 W 7-52- a 7 LTR DESCRIPTION DATE (YR-MO-DA) APPROVED AMSC NIA I I SHEET 1 OF 11 - A U 5. GOViWNMINT PRINTING OfFKt: 1987 -74.l1/16091 I DESC FORM 193 5962-El431 SEP 87 DISTRIBUTION STATEMENT A. Approved for public release; dislrlbullon is unlimiled. Provided by IH
2、SNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE MILITARY DRAWING A 5962-89732 DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVU SHEET STANDARDIZED DAYTON, OHIO 45444 2 SC FORM 193A *I U S.QOVERHMENTPWHTINQ OmCE 1wb550.547 NEP 87 1, SCOPE 1.1 SCO e. This drawing
3、 describes device requirements for class B microcircuits in accordance rith l. e.g., 10s. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-2. APPLICABLE DOCUMENTS 2.1 Government s ecification, standard, and bulletin, Unless otherwise specified, the fo
4、llowing jpecification, standPard, and bulletin of the issue lfsted in that issue of the Department of Defense index of Specffications and Standards specified in the solicitation, form a part of this drawing to the extent specified herein. SPECIFICATION MILITARY MIL-M-38510 - Microcircuits, General S
5、pecification for. STANDARD MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. BULLETIN MI LI TARY MIL-BUL-103 - List of Standardized Military Drawings (SMDs). (Copies of the specification, standard, and bulletin required by manufacturers in connection with specific acquisition
6、functions should be obtained from the contracting activity or as directed by :he contracting activity .I *eferences cited herein, the text of this drawing shall take precedence. 2.2 Order of precedence. 3. REQUSREIIENTS 3.1 Item re uirements. The individual item requirements shall be in accordance w
7、ith 1.2.1 of IIL-STDXB, “rovisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ ind as specified herein. In the event of a conflict between the text of this drawing and the 3.2 Design, construction, and physical dimensions. The design, construction, and physical limensio
8、ns shall be as specified in MIL-M-38510 and herein. 3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.2 Truth table. The truth table shall be as specified on figure 2. 3.2.3 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.4 Case outli
9、nes. The case outlines shall be in accordance with 1.2.2 herein. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the e-xtrica ierformance characteristics are as specified in table I and apply over the full case operating ;emperature range. The electrical test requireme
10、nts shall be the subgroups ipecified in table II. The electrical tests for each subgroup are described in table I. Marking shall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall ie markd the part number listed in 1.2 herein. In addition, the manufacturers part number iay also be ma
11、rked as listed in MIL-BUL-103 (see 6.6 herein). 3.4 Electrical test requirements. 3.5 Markin . SIZE A 5962-89732 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYON, OHIO 45444 3 Provided by IHSNot for ResaleNo reproduction or networking permitted without licen
12、se from IHS-,-,-. TABLE I. Electrical performance characteristics. I Test I Symbo Iigh level output IVOH vol tage I I I I ,ow level output I VOL vol tage I I nput clamp voltage iVIK I igh level input (1 IH current v ow level input IIIL , current “- I igh impedence output IOZH current i I hort crcuit
13、 output 110s current I Conditions I Device -55C 5.3 Y, I All 1 1, 2, 3 I I 1.5 I m4 I uieccent ower suppi Ibcc Ivcc = 5.5 v, VIN = 3.4 v g/ c.urrent ITTL inputdi. I 1 I I I I current I lone bit toggling, 50% duty cycle, I I I I I Mnz I I I I I I All I 1, 2, 3 I I 2.0 I m4 I ynamic ower supply ICCD l
14、Vcc = 5.5 V, En = GND, I All I 21 I I 0.25 I m9/ 1 I I I I IV1 2 5.3 V or VIN i 0.2 V, I iouYputs open See footnotes at end of table. SIZE A 5962-89732 STANDARDIZED MILITARY DRAWING SHEET DEFENSE EiWNICS SUPPLY CENTER FEVICIOIJ LEVEL I DAWN, OHIO 45444 4 * U S QOVERNMENT pRKITK(G OFFICE 1061)-5Y).51
15、7 DESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TABLE I. Electrical performance characteristics - Continued. STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 Conditions -55C TC +125OC I VCC =-
16、5.0 v dc *IO% I Test I I I I unless otherwise specified I I I SIZE A 5962-89732 REVICION LEVEL SHEET 5 Total power supply Ice Vcc = 5.5 Y, IVIN 5.3 V IVIN 5 0.2 V IVIN = 3.4 V IVIN = GND loutputs open, I or If1 = 10 MHz, lone bit toggling, 7 IUEA = OEB = GND I 0 I or current I I I 150% duty cycle, I
17、 I I I I I I I I i Input capacitance ICIN fSee 4.3.1 I I I Output capacitance COUT :See 4.3.1 I I I I Functional tests I ISee 4.3.ld I I I Propagation delay itpLH, i CL = 50 PF, time, Dn to On QHL I RL 2 500n, 5/ I i see figure 4- Out ut enable time, all other inputs at Vcc or GND. - - 3/ This param
18、eter is not directly testable, but is derived for use in total power supply calculations. DH = Duty cycle for TTL inputs high NT = Number of TTL inputs at DH fI = Input frequency in MHz NI = Number of inputs at fI - 51 The minimum limits are guaranteed, if not tested, to the limits specif.2d in tabl
19、e I. DESC FORM 193A t U. S. GOVERNMENT PRIMIN0 OFFCC 1888-548-KU SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-t SIZE MILITARY DRAWING 4 A 5962-89732 DEFENSE ELECTlWNfCs SUPPLY GENTER w SHEET STANDARDIZED c- DAYTON, OHIO 45444 6 I. I Device
20、types O1 and 02 I I ICase outlines1 R, S, 2 i I I I - I Terminal I Terminal I I number I symbol I I 1 I EA I 2 1 DAO I I I I 3 I OB0 I 4 I DAI I 5 I OB1 I I I f-t-7 6 I DA2 i 7 I OB2 I 8 I DA3 I 9 I OB3 I i I I I I 10 I I 11 I I 12 I I 13 I I 14 I I 1s I I 16 I I 17 I I 18 I I 19 I I 20 I I GND D 83
21、 OA3 D B2 OA2 D B1 OA 1 DEO OAO OEB “cc FIGURE 1. Terminal connections. i I I I I I I I I I I I - Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DESC-DWG-7732 57 M 7777775 0011178 5 W IHILIXi Z i IlII I H = High voltage level L = Low vol tage 1 eve1
22、 X = Irrelevant Z = High impedence FIGURE 2. Truth table. I 1 OE B OAO D O OA I DB i OA2 D2 OA3 D3 FIGURE 3. Logic diagram, STANDARDIZED SIZE 5962-89732 MILITARY DRAWING A DEFENSE UECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYTON, OHIO 45444 7 DESC FORM 193A ii U. S. GOVERNMENT PRINTING OFFICE: 1
23、888-549-9M SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-+u 7.Q V RL = Loa :A I 5962-89732 DEFENSE UECTRONICS SUPPLYr CE“ DAYMN, OHIO 4544% RMsK)N LEVEL *U SMENTF?dMTlNQCfFkSElbW iC FORM: h93R iP 87 Provided by IHSNot for ResaleNo reproducti
24、on or networking permitted without license from IHS-,-,-3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer n order to be listed as an approved source of supply in MIL-BUL-103 (see 6.6 herein). The ertificate of compliance submitted to DESC-ECS prior to l
25、isting as an approved source of supply ,hall affirm that the manufacturers product meets the requirements of MIL-STD-883 (see 3.1 herein) ind the requirements herein. lerein) shall be providecl with each lot of microcircuits delivered to this drawing. 3.7 Certificate of conformance. A certificate of
26、 conformance as required in MIL-STD-883 (see 3.1 3.8 Notification of change. Notification of change to DESC-ECS shall be required in accordance iith MIL-STD-885 ( see 3.1 herein) . 3.9 Verification and review. DESC, DESCs agent, and the acquiring activity retain the option to ,eview the manufacturer
27、s facfl ity and applicable required documentation. ;hall be made available onshore at the option of the reviewer. Offshore documentation 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with ,ection 4 of MIL-M-38510 to the extent
28、specified in MIL-STD-883 (see 3.1 herein). 4.2 Screenin . Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be onducte -a-+ on a devices prior to quality conformance inspection. The following additional criteria hall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) T
29、est condition A, By Cy or D using the circuit submitted with the certificate of compliance (see 3.6 herein). (2) TA = +125OC, minimum. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the
30、 discretion of the manufacturer. b. 4.3 Quality conformance inspection. iethod 5005 of MIL - STD 883 including groups A, By Cy and D inspections. riteria shall apply. 4.3.1 Group A inspection. Quality conformance inspection shall be in accordance with The following additional a. Tests shall be as sp
31、ecified in table II herein. b. c. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. Subgroup 4 (CIJ and COUT measurements) shall be measured only initially and after process or design changes which m.qy affect capacitance. Test all applicable pins on 5 devices with zero fail
32、ures. d. Subgroups 7 and 8 tests shall verify the truth table as specified on figure 2. SIZE A 5962-89732 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYTON, OHIO 45444 9 Provided by IHSNot for ResaleNo reproduction or networking permitted without license fro
33、m IHS-,-,-6.2 Re laceabilit . Microcircuits covered by this drawing will replace the same generic device covered -se-y y a contractor-prepared specification or drawing. 3 STANDARDIZES) SIZE MILITARY DRAWING A 5962-89732 4 OWENSE ELECTRNICS SUPPLY CENTER LEVEI, SHEET DAYMN, OHi 45444 1 TABLE II. Elec
34、trical test requirements. I I I I MIL-STO-883 test requirements I Subgraups I I I (per method I I I 5005, table I) I I I I I I Interim electrical parameters I - I (method 5004) I I I I I I .I I IGroup A test requirements I I I IGroups C and D end-point I I I electrical parameters I 1, 2, 3 I I (meth
35、od 50051 I I I I I IFinal electrical test parameters I 1*, 2, 3, 7, I I (method 5004) I 8, 9, 10, 11 I I 1, 2, 3, 4, 7,: I (method 5005) I 8, 9, 10, 11 I * PA applies to subgraup 1. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Stea
36、dy-state life test canditions, method 1005 of MIL-STD-883. (1) Test condition A, 8, C, ar D using the circuit submitted with the certificate of compl iance (see 3.6 herd n) , (2) TA ti +125C, minimum, (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 10
37、5.1 Packaging .requirements. The requirements for packaging shall be in accordance with MIl-M-38biO. I 6. NQTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use when military specifications do not exist and qualified military devices that will perform the required func
38、tion are nat available for OEM application. When a military Specification exists and the product covered by this drawing has been qualified for listing on QPL-38510, the device specified herein will be inactivated and will not be used for new design. The QPL-38510 product shall be the preferred item
39、 for all applications. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- 6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated ith the users of record for the individual documents. ccordance with MIL-STD-481 usin
40、g DD Form 1693, Engineering Change Proposal (Short Form). #hen a system application requires configuration control and the applicable SMD. irawingc. ESC-ECS, telephone (513) 296-6022. This coordination will be accomplished in 6.4 Record of users. Military and industry users shall inform Defense Elec
41、tronics Supply Center record of users and this list will be used for coordination and distribution of changes to the Users of the drawing covering microelectronics devices (FSC 5962) should contact DESC will maintain SIZE A STANDARDIZED 6.5 Comments. Comments on this drawing should be directed to DE
42、SC-ECS, Dayton, Ohio 45444, or el epho73C3- 296-5375. 5962-89732 6.6 Approved source of supply. An approved source of supply is listed in MIL-BUL-103. Additional The vendor listed in MIL-BUL-103 has ources will be added to MIL-BUL-103 as they become available. greed to this drawing and a certificate
43、 of compliance (see 3.6 herein) has been submitted to and ccepted by.DESC-ECS. nd is current only to the date of the last action of this document. The approved source of supply listed below is for information purposes only MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 I I Mil
44、itary drawing I part number I I I 5962-8973201RX I I 5962-8973201SX I I I 5962-8973202RX I 5962-89732012X REVISION LEVEL SHEET 11 I I 5962-8973202SX I I 5962-89732022X I I I Vendor I Vendor I CAGE I similar part I number I number i/ I I -1 v - 61772 I IDT54FCT241DB I 75569 I P54PCT241DMB I 61772 I I
45、DT54FCT241EB I 75569 I P54PCT241FMB I I I 61772 I IDT54FCT241LB I 75569 I P54PCT241LMB I 61772 I IDT54FCT241ADB I 75569 I P54PCT241ADMB I 61772 1 IDT54FCT241AEB I 75569 I P54PCT241AFMB i - 61772 I IDT54FCT241ALB I 75569 I P54PCT241ALMB I l/ Caution. Do not use this number for item - acquisition. may
46、 not satisfy the performance requirements of this drawing. Items acquired to this number Vendor CAGE number 61772 75569 Vendor name and address Integrated Device Techno1 ogy 3236 Scott Boulevard Santa Clara, CA 95052 Performance Semiconductor Corporation 610 East Weddell Drive Sunnyvale, CA 94089 DESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-
