1、DEFENSE LOGISTICS AGENCY DEFENSE SUPPLY CENTER, COLUMBUS 3990 EAST BROAD STREET COLUMBUS, OH 43216-5000 IN REPLY REFER TO DSCC-VAC (Mr. Miesse(614) 692-0543 (DSN 850) SEP 2 3 m6 SUBJECT: Notice of Revision (NOR) 5962-R214-96 for Standard Microcircuit Drawing - (SMD) 5962-90515 Military/Industry Dist
2、ribution The enclosed NOR is approved for use effective as of the date of the NOR. In accordance with MIL-STD-100 SMD holders should, as a minimum, handwrite those changes described in the NOR to sheet 1 of the subject SMD. After completion, the NOR should be attached to the subject SMD for future r
3、eference. Those companies who were listed as approved sources of supply prior to this action have agreed to actions taken on devices for which they had previously provided DSCC a certificate of compliance. This is evidenced by an existing active current certificate of compliance on file at DSCC with
4、 a DSCC record of verbal coordination. The certificate of compliance for these devices is considered concurrence with the new revision unless DSCC is otherwise notified. If you have comments or questions, please contact Mr. Bernard Miesse at (614) 692-0543 (DSN 850). 1 Encl MONICA L. POELKING Chief,
5、 Custom Microelectronics Team Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-NOTICE OF REVISION (NOR) THIS REVISION DESCRIBED BELOW HAS BEEN AUTHORIZED FOR THE DOCUMENT LISTED. ?ubiic repciting burden fw this dieciion is estimated to average 2 hours
6、 perrespaise induding the time fw Ewewing insbudions searching existing data sources gatherin and mainiainin the data needed and completing and revimng ihe coilec add llC1l. Revisions description colum; add IlChanges in accordance with NOR 5962-R214-96Ir. Revisions date colm; add 1196-09-0311. Revis
7、ion level block; change W to TI. Rev status of sheets; for sheet 1, 6, 7, 8, 12 change to 18C11. Table I, Conditions; delete #IR1 = 50062, R2 = 50062,ii. Revision level block: add lrC1l. Sheet 6: I 9. TITLE OF DOCUMENT 10. REVISION LEITER a. CURRENT b. NEW C - MICROCIRCUIT, DIGITAL, CMOS, 8-BIT PIPE
8、LINE REGISTER, MONOLITHIC SILICON . B Sheet 7: Table I, Conditions; delete IIR1 = 50062, R2 = 500Q,11. Revision level block; add lrC1l. Sheet 8: Table I, Conditions; delete “RI = 5000, R2 = 50062,11. Revision level block; add 18C11. 11. ECP NO. NIA See continuation sheet. b. ACTIVITY AUTHORIZED TO A
9、PPROVE CHANGE FOR GOVERNMENT 14. THIS SECTION FOR GOVERNMENT USE ONLY a. I X I (1) Existing document supplemented by the NOR may be used in manufacture. c. TYPED NAME (First, Middle Initial, Last) (2) Revised document must be received before manufacturer may incorporate this change. U b. REVISION CO
10、MPLETED (Signature) Bernard J. Miesse c. DATE SIGNED (YYMMDD) 96-09-03 DSCC-VAC I Monica L. Poelking I d. TITLE Chief, Custom Microelectronics 15a. ACTIVITY ACCOMPLISHING REVISION DSCC-VAC DD Form 1695, APR 92 e. SIGNATURE Monica L. Poelking f. DATE SIGNED (YYMMDD) I 96-09-03 Provided by IHSNot for
11、ResaleNo reproduction or networking permitted without license from IHS-,-,- SMD-5962-705L5 REV C 7999996 0089430 629 Test Symbol PLH I tS2 .- Test Symbol + E tPHZ1 tS3 tPHZ2 tS4 tPZL1 tS5 tPZL2 tS6 tPZH 1 tS7 tPZH2 tH 1 tPW1 tH2 tPW2 A. C. Test Load Circuit -_- I I I I I I I I I I I I I I I I I INCL
12、UDES STRAY Ann JIG CAPACITANCE Test Head Capacitance Revision levei block; add llCll. Vth 1.5 V 3.5 v 0.0 v 3.5 v 0.0 v 1.5V CL = 50pF IOH = -6mA IoL = 13 mA Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-NOTICE OF REVISION (NOR) (See MIL-STD-480 fo
13、r instructions) This revision described below has been authorized for the document listed. DATE (YW“) Form Approved OMB NO. 0704-0188 921 031 27 Defense Electronics Supply Center Dayton, Ohio 45444-5277 1. ORIGINATOR HA14E AND AWRESS 4. CAGECODE 5. wcu13ENTNo. 2. CAGC)DE 3. WM NO. I 67268 15962-9051
14、5 6. TITLE OF i“EIcT MICROCIRCUIT, DIGITAL, CMOS, 8-BIT PIPELINE REGISTER, MONOLITHIC SILICON I No registered users 9. CONFIGURATION ITM (OR SYSrm) TO WHICH ECP APPLIES 10. MSRIPTIOH OF REVISION Sheet 1: Revisions ltr column: add “B“ Revisions description column: add “Changes in accordance with NOR
15、5962-R165-92“. Revisions date column: add “92-03-27“. Sheet 2: 1.2.2 Case outlines. Add Outline letter “3“, and Case outline “C-4 (28-terminal, ,460“ x .460“ x .loo“) square chip carrier package“. Sheet 9: FIGURE 1. Terminal connections: Change Case outlines from: “X“ to: “X and 3“. 11. MIS SECTION
16、FOR GVERMiT USE ONLY a. CHECK ONE IXJEXISTING DOCUMENT SUPPLEMENTED 1 J CUSTODIAN OF MASTER DOCUMENT BY THIS NOR MAY BE USED IN MANUFACTURE. MAY INCORPORATE THIS CHANGE. FURNISH REVISED DOCUMENT TO: 1 J REVISED DOCUMENT MUST BE RECEIVED BEFORE MANUFACTURER SHALL MAKE ABOVE REVISION AND b. ACTIVITY A
17、UTHORIZED TO APPROVE DATE (YYMMDD) 92/03/27 CHANGE FOR GOVERNMENT DESC-ECC DATE (YYMMDD) DESC-ECC 92/03/ 27 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-E- NOTICE OF REVISION (NOR) (See MIL-STD-400 for instructions) This. i-cvision described blow
18、has been authorized for the docuriient iisted. 7 SMD-5962-905l15 REV B 59 W 9999996 OOLL877 9 W DATE (YYMMDD) Form Approved OMB No. 0704-0188 91/09/24 1. ORIGINATOR NAME AND ADDRESS 2. CAGE COO Defense Electronics Supply Center 67268 Dayton, Ohio 45444-5277 4. CAGE CODE 67268 6. TITLE OF DOCUHENT 7.
19、 REVISION LETTER I.1ICROCI RCUI TI DI GI TAL, CMOS 8-EI T PI PEL1 NE REGI STER, MONOLITH 1C SIL I CON (Current) Initial 3. NOR NO. 5962-R012-91 5. DOCUMENT NO. 5962-90515 (New) A 9. CONFIGURATION ITEM (OR SYSTEM) TO UHICIl ECP APPLIES b. ACTIVITY AUTHORIZED TO APPROVE CHANGE FOR GOVERNMENT DESC -ECC
20、 10. DESCRIPTION OF REVISIOM Sheet 1: Revisions ltr column; add “A“ Revisions description column; add “Changes in accordance r-iith NOR 5962-R012-91“. Revisions date column; add “91 -09-24“. DATE (YYMMDD) 91 /09/24 Sheet 11: Figure 3 - PCLK (Serial Shift; (D7 - Dg disabled) block: enter an “X“. 12.
21、ACTIVITY ACCOIIPLISHING REVISION DESC-ECC DATE (YYMMDD) T/Q9/24 -1PLETED (Signature) I / Previous editions are obsolete. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-1 LTR DESCRIPTION DATE (YR-MO-M) APPROVED DEFENSE ELECTAONm SUPPLY CENTER DAN, OH
22、IO 45444 ORUSEBYALLDEPARTMENTS DEPARTMENT OF DEFENCE AMSC NIA DESC FORM 193 AND AGENCIES OF THE 2 OCTOBER 1990 A 67268 5962-SWIf LEVU SHEET 1 OF 16 *O.S. GMnWNl PRINTIM OifKf: I907 - 748-12916091 I SEP 87 5962-El838 DISTRIBUTION STATEMENT A. Approved lor public release; dlslrlbulion Is unlimited. -
23、Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-f i SCOPE 1 k.2 Part number. Fke cmpkete pwt nuniber shall be as chawn iri Ehe ?olwh example: x T 0.utPine letter t 1-3 Abco.lute maximuin ratltigc. I Srrgpl$ wlkap SIEQUT M110 4M44 h V. Sa GQVERNdEIYJ
24、PRINnHGOFFICE WBa -549.901 OE56 FORM 193A SEF 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-. 1.4 Reconirrended operating conditions. Supply voltdge range (Vcc)- - - - - - - - - - - - - - - - Miniinum input hiyh voltage (VI,)- - - - - - - - - -
25、- - - heximum input low voTtaye (VIL) - - - - - - - - - - - - - Case operasting temperature range (TC)- - - - - - - - - - 4.5 V dc to 5.5 V dc 2.0 V dc 0.8 V dc -55C to +125C i!. APPLICABLE DKUbiENTS 2.1 Government specification, standard, and bulletin. Unless otherwise specified, the ollowiny speci
26、fication, standard, and bulletin ot the issue listed in that issue of the lepartnient of Defense Index of Specifications and Standards specified in the solicitation, form a ,art of this drawing to the extent specified herein. SP ECIF I CAT I Oh MILITARY MI L-fil-38510 - Microcircuits, General Specif
27、ication for, STANDAKD Fi1 LI TA kY WI L-STO-883 - Test Methods and Procedures for Microelectronics. WLLETIN RI LITARY . MIL-IAJL-10 - Li st of Standardized bli li tary Drawings (SblD s). (Lopies of the specification, standard, and bulletin required by manufacturers in connection iith specific acquis
28、ition functions should be obtained from the contracting activity or as irected by the contracting activity. 1 eferetices cited herein, the text of this drawing shall take precedence. 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the 3. REQUIREbENTS 3.1 Item
29、 requirements. The individual item requirements shall be in accordance with 1.2.1 of IIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ nd as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical i
30、ine n s i an erein. 3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.2 Block diagram. 3.L.3 Truth tdble. 3.2.4 Lase outlines. The case outlines shall be in accordance with 1.2.2 herein. The block diagram shall be as specified on figure 2. The truth table sh
31、all be as specified on figure 3. size 5962-90515 STANDARDIZED MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET I DAYTON, OHIO 45444 h U. C. GOVW4UENT PRIITit4G OFFICE 1988-549-9LM DESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted with
32、out license from IHS-,-,-3.3 flectrical performdnce characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENT
33、ER DAYTON. OHIO 45444 3.4 flectrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrfcal tests for each subgroup are described in table I, I SIZE 5962-90515 A REVISION LEVEL A 3.5 Markiny. Markiny shall be in accordance with t.111-STD-883
34、(see 3.1 herein). he part shall In addition, the manufacturers part number be markm the part number listed in 1.2 herein. may also be marked as listed in ML-BUL-103 (see 6.6 herein). I 5.6 Gertificate of compliance, A certificate of compliance shall be required from a iiidnufacturer in order to be f
35、isted as an approved source of supply in MIL-BUL-103 see 6-6 herein). The certificate of compliance submitted to DESC-ECC prior to listing as an approved source of supply shall affin that the manufacturers product meets the requirements of MIL-STD-885 (see 3.1 herein) and the requirements herein. 3.
36、7 Certificilte of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.1 her- each lot of microcircuits delivered to this drawing. 3.8 Wotification of change. Notification of change to DESG-ECC sha71 be required in accordance with MIL-STU-883 (see 3.1 herein). 3.9 Verification
37、 and review. DES, DESCs agent, and the acquiring activfty retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation chal be made available onshore at the option of the reviewer. I I 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection
38、. Sampling and inspection procedures shall be in accordance with section 4 of NIL-M-38510 to the extent specified in MIL-STD-883 (see 3.1 herein). I 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be criteria shall apply: conducted on alT devices prior to q
39、uality conformance inspection. The following additional I I a. Burn-in test, method 1015 of MIL-STD-883. (11 Test condition A, By Cy or D using the circuit submitted with the certificate of compliance (see 3.6 herein). 1 (2) TA F +125C, minimum. I b. Interim and final electrical test parameters shal
40、l be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Qualty conformance inspection shall be in accordance with method -groups A, 8, C, and D inspections, The folJowing
41、additional criteria shall apply, I I 1 1 U. S GOVERNUENT PRItffIIG OFFICE 1W -549.901 DESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TABLE I. Electrical performance characteristics. Test 1 Symbol i Conditions i Group A i Limits
42、 /Unit I -55C TC +125OC I subgroups171 I I unless oTherwTse specified I I Min I Max I II I I I I I I I I I I I VIN = VIH IIOH = -15 nA I I I II I il il I IDO-07, SDO, I 12.4 1 I I I II I I IIOH = -3.0 mA I I I I I II I I I I I I IVcc = 4.5 v, IY0-Y, I 1,2,3 I 10.5 I V IIOL = 24 riA I I I I IvIN = VI
43、H II I I I II 71 I I I IDO-D, SDO, I I 10.5 I I I 110 = 8.0 m4 I II I I I I I II I I I I I I IVcc = 4.5 Y, IIN = -18 mA I 1,2,3 I 1-1.2 I v I I I I I I I I I I I I I II I I I I II 71 I I IVIN = 0.4 V I I 1-5.0 I l I I I I I I I I I I I I I I I II I I II 71 I IVIN = 5.5 V I I Il0 I I I I I I il I I I
44、 I I 115 1 UA I I IVcc = 5.5 V I II 71 I I I I l I I I II I I I II -1 I I I I 110s ivcc = 5.5 v, IYO - Y7 1,2,3 1-60 I I mA IvOUT = 0 L/ I I I I I I I I I I I I I 1,2,3 1-20 I I I II I I I IDO - D7,SD0 I I I Output high vol taye I VOH IVCC = 4.5 v, Io-7, I 1,2,3 12.4 I 1 V II 1“ VIL I 1 VOL I I“ VIL
45、 * Output low voltage Input clamp voltage pc I IVcc = 5.5 Y IVIN = O V I 1,2,3 I 1-10 I UA Input low current IIIL IVCC = 5.5 v IVIN = 2.7 v I 1,2,3 I 15.0 I pA Input high current I IIH Out yt off-state current 110 IVOUT = 2.4 V i 1,2,3 I (Righ impedance) I I I I IvOUT = 5.5 v I I 120 I F20 t ?OUT =
46、O I I I I I I I I /IOU Ivcc = 5.5 v iV0u-r = 0.4 V i 1,2,3 i 1-15 i I I 1 I I Output short-circuit cu rre ri t See footnozes at end of table. STAN DARD I Z ED SIZE MILITARY DRAWING A 5962-90515 SHEET DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL I 5 ZU S GOVFIiMEtlT PRltnlNG OF
47、FICF 19RJ-519.504 DESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- I 1 TABLE I. Electrical performance characteristics - Continued. Dynamic supply current g/ Input capaci tdnce Output capacitance 1/0 port capacitance I Functonal
48、 tests I Propagation delay from PCLK t otpt Yx Propayation delay from Moae to SO Propagation delay SDI to SOO Propayation delay DCLK to SDO I x to PCLK setup time Hode to PCLK setup time I I 1 1 I Symbol I Conditions I Group A I Limits IUnSt I -55C f +125OC I subgroup sI I I unless otherwise specifi
49、ed I I Min I Rax I I l I I I I I l i -i- ICQ IVcc = 5.5 V, VOUT = open, 1,2,3 i1.S mA III I I 1 /VIN = Vcc or O V I I I I I I I I I l l ill I I I I I ILCD IVcc 5.5 V, f 10 MHz, i i,2,3 i i400 i ,A/ I I MHz/ I bit lunused inputs are at Vcc I I lor GND I 1 I1 I I I I I 1 I I I I I IVCC = 5.0 V, f I 1.0 fVlHZ
