1、SMD-5962-90778 59 m 9999996 0011913 9 m REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED REV SHEET REV SHEET 15 16 17 REV STATUS OF SHEETS PMIC NIA STANDARDIZED MILITARY DRAWING d THIS DAAUING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTI.1ENT OF DEFENSE AMSC N/A PREPARED BY
2、I DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 MICROCIRCUITS, DIGITAL, FAST, CMOS, DUAL ODD-PARITY GENEFATOR/CHECKERS, TTL COMPATIBLE, MONOLITHIC SILICON DRAWING APPROVAL D 92-04-21 5962-90798 REVISION LEVEL I SHEET OF l7 )ESC FORM 193 JUL 91 DISTRIBUTION STATEMENT A. Approved for public rel
3、ease; distribution is unlimited. 5962-El 03 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-59b2-90798 59 W 9999996 00119L4 O W I 1. SCOPE 1.1 Scope. this drawing forms a part of a one part - one part number documentation system (see 6.6 herein).
4、 TWO product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifytng Number (PIN). Device class M microcircuits re
5、present non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“. available, a choice of radiation hardness assurance (RHA) levels are reflected in the PIN. When I 1.2 m. The PIN shall be as shown in
6、the following example: - X L M - - 5962 90798 - o1 - I I I I I I I I I I I I Lead Case Device Devi ce RHA Federal stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) czsiynator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (
7、RHA) designator. Device classes M, B, and S RHA marked devices shall meet the Device classes Q and V RHA MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. marked devices shall meet the MIL-1-38535 spesified RHA levels and shall be marked with the appropriate R
8、HA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) shall identify the circuit function as follows: Device type Generic nuhber Circuit function o1 54FCT480 High-speed, dual 8-bit parity generator/checker, TTL compatible 02 54FCT480A High-speed, dual 8-bit p
9、arity generator/checker, TTL compatible 03 54FCT480B High-speed, dual 8-bit parity generator/checker, TTL compatible inputs inputs inputs 1.2.3 Device class designator. The device class designator shall be a single letter identifying the product assurance level as follows: Device class Device requir
10、ements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Q or V Certification and qualification to MIL-M-38510 Certification and qualification to MIL-1-38535 1.2.4 Case outline(s). For device classes 11, B,
11、and S, case outline(s) shall meet the requirements in appendix C For device classes (;I and V, case outline(s) shall meet the requirements of of MIL-M-38510 and as listed below. MIL-1-38535, appendix C of MIL-M-38510, and as listed below. Outline letter Case outline L D-9 (24-lead, 1.280“ x .310“ x
12、.200“), dual-in-line package STANDARDIZED I SIZE 5962-90798 MILITARY DRAWING A I DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 I I REVISION LEVEL I SHEET DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-90778 59 9
13、979996 OOL19L5 2 W 1.2.5 Lead finish. The lead finish shall be as specified in MIL-M-38510 for classes M, 6, and S or MIL-1-38535 for classes Q and V. Finish letter “X“ shall not be marked on the microcircuit or its packaging. for use in specifications when lead finishes A, 8, and C are considered a
14、cceptable and interchangeable without preference. The “X“ designation is 1.3 1.4 Absolute maximum ratinqs. I/ Supply voltage range (V c) I/ - - - - - - - DC input voltage range i/ - 1 - - - - - - - - DC output voltage range 2/- - - - - - - - - - DC input diode current (IIK) - - - - - - - - DC output
15、 diode current (per pin) (IOK) - - - DC output source or sink current - - - - - - DC Vcc or GND current - - - - - - - - - - - - Storage temperature range - - - - - - - - - - I,laximum power dissipation (PD) I/ - - - - - - Lead temperature (soldering, 10 seconds)- - - Thermal resistance, junction-to-
16、case (OJc)- - Junction temperature (TJ) - - - - - - - - - - Recommended operatinq conditions. -0.5 V dc to +7.0 V dc -0.5 V dc to Vcc + 0.5 V dc -0.5 V dc to Vcc t 0.5 V dc -20 mA -50 mA i100 mA I100 mA -65OC to +15OoC 500 mW +3OO0C See MIL-M-38510, appendix C +175“C Supply voltage range (Vc 1 - - -
17、 - - - - - - input tow voltage range LI,) - - - - - - - - Input high voltage range (VIH) - - - - - - - - 1.5 Diqital logic testing for device classes Q and V. Fault coverage measurement of manufacturing +4.5 V dc to +5.5 V dc 0.8 V dc 2.0 V dc Case operating temperature range (TC)- - - - - -55OC to
18、+125C logic tests (MIL-STD-883, test method 5012) - XX percent $1 - I/ All voltages are referenced to GND. - 21 For Vcc 6.5 V dc, the upper bound is limited to Vcc. - 3/ !lust withstand the added PD due to short circuit test; e.g., Ios. - 4/ Values will be added when they become available. STANDARDI
19、ZED SIZE 5962-90798 MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL SHEET DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-59b2-90798 59 9999996 001L9Lb 4 m 2. APPLICABLE DOCUMENTS 2.1 G
20、overnment specifications, standards, bulletin, and handbook. Unless otherwise specified, the following specifications, standards, bulletin, and handbook of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of
21、this drawing to the extent specified herein. SPECIFICATIONS MILITARY MIL-M-38510 MIL-1-38535 STANDARDS MILITARY MIL-STD-480 MIL-STD-883 BULLETIN MILITARY MI L-BUL-103 HANDBOOK IIILITARY - Microcircuits, General Specification for. - Integrated Circuits, Manufacturing, G-ieral Specification for. - Con
22、figuration Control-En5 .iieering Changes, Deviations and blaivers. - Test Methods and Procer!i:res for Microelectronics. - List of Standardized Military Drawings (SMDs). MIL-HDBK-780 - Standardized Military Drawings. (Copies of the specifications, standards, bulletin, and handbook required by manufa
23、cturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing shall
24、 take precedence. 3. REQUIREMENTS 3.1 The individual item requirements for device class M shall be in accordance with 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ and as specified herein. The individual item requirements for device class
25、es B and S shall be in accordance with MIL-M-38510 and as Specified herein. included in this SMD. MIL-1-38535, the device manufacturers Quality Management (QM) plan, and as specified herein. Item requirements. For device classes B and S, a full electrical characterization table for each device type
26、shall be The individual item requirements for device classes Q and V shall be in accordance with 3.2 Desiqn, construction, and physic-al dinimsions. The design, construction, and physical dimensions shall be as specified in MIL-M-38510 for device classes M, 5, and S and MIL-1-38535 for device classe
27、s Q and V and herein. I I 3.2.1 Case outlineW. The case outlinek) shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. 3.2-3 Truth table. 3.2.4 Logic diagram. The terminal connections shall be as specified on figure 1. The truth table shall be as specified on figure 2. The logic dia
28、gram shall be as specified on figure 3. 3.3 Electrical perf ormance characteri st i cs and posti rradiat ion parameter 1 i mi ts. Un less otherui se specified I herein, the electrical performance characteristics and postirradiation paramewr linifs are as specified in table I and shall apply over the
29、 full case operating temperature range. STANDARDIZED SIZE 5962-90798 MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL SHEET I DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5762-90798 5
30、9 9999996 ROLLT37 b I 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in table I. 3.5 Markinq. The part shall be marked with the PIN listed in 1.2 herein. Marking for device class M s
31、hall be in accordance with MIL-STD-883 (see 3.1 herein). NIL-BUL-103. Q and V shall be in accordance with MIL-1-38535. Certification/compliance mark. In addition, the manufacturers PIN may also be marked as listed in Marking for device classes B and s shall be in accordance with MIL-M-38510. Marking
32、 for device classes 3.5.1 The compliance mark for device class M shall be a “CI as required in MIL-STD-883 (see 3.1 herein). in MIL-M-38510. The certification mark for device classes B and S shall be a “J“ or “JAN“ as required The certification mark for device classes Q and V shall be a “QML“ as req
33、uired in MIL-1-38535. 3.6 Certificate of compliance. For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-BUL-103 (see 6.7.3 herein). classes Q and V, a certificate of compliance shall be required from a QM
34、L-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.7.2 herein). listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device class M the requirements of MIL-STD-883 (see 3.1 herein), or for device classe
35、s Q and V, the requirements of MIL-1-38535 and the requirements herein. For device The certificate of compliance submitted to DESC-ECS prior to 3.7 Certificate of conformance. A certificate of conformance as required for device class M in MIL-STD-883 (see 3.1 herein) or device classes B and S in MIL
36、-M-38510 or for device classes Q and V in MIL-1-38535 shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of chanue for device class M. For device class M, notification to DESC-ECS of change of product (see 6.2 herein) involving devices acquired to this drawi
37、ng is required for any change as defined in MIL-STD-480. 3.9 Verification and review for device class i-1. For device class Il, DESC, DESCs agent, and the acquiring activity Offshore documentation retain the option to review the manufacturers facility and applicable required documentation. shall be
38、made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device classes M, 6, and S. Device classes M, 8, and S devices covered by this drawing shall be in microcircuit group number 40 (see MIL-M-38510, appendix E). 3.11 Serialization for device class S. All devic
39、e class S devices shall be serialized in accordance with MI L-M-385 1 O. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. For device class 1.1, sampling and inspection procedures shall be in accordance with section 4 of MIL-11-38510 to the extent specified in MIL-STD-883 (see 3.1 herein)
40、. sampling and inspection procedures shall be in accordance with MIL-M-38510 and method 5G5 of MIL-STO-883, except as modified herein. MIL-1-38535 and the device manufacturers QM plan. For device classes B and S, For device classes Q and V, sampling and inspection procedures shall be in accordance w
41、ith 4.2 Screening. For device class N, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. For device classes 6 and S, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted
42、 on all devices prior to qualification and quality conformance inspection. For device classes Q and V, screening shall be in accordance with MIL-1-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. REVISION LEVEL 5962-90798 SHEET 5 DESC FORM 19
43、3A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- SMD-5762-90798 57 9777996 0011918 8 LIL 1,2,3 Vcc = 5.5 V, VIN = GND STANDARDIZED SIZE MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL 5962-90798 SHEET
44、6 TABLE I. Electrical performance characteristics. Test Symbol I Condi ti ons I Group A -55C I TC 5 +125“C I I unless otherwise specified I I I l I subgroups 4.5 v 5 vcc 5 5.5 v Devi ce type Unit Lin Min 4.3 2.4 tS Max 0.2 All High level output voltage IOH ivcc = 4.5 v, IIOH = -300 PAI 1,2,3 IVIL =
45、0.8 v, I I I I IIOH = -12 MA I I I -I I I Low level output voltage All 0.5 I I Il IIK IVcc = 4.5 V, IIN = -18 mA -1.2 5.0 All All Input clamp voltage LIH IVcc = 5.5 v, VIN = 5.5 v 1 1,2,3 High level input Low level input current Short circuit output current Quiescent power supply current (CMOS input
46、s) Quiescent power supply current (TTL inputs) current Dynamic power supply current -5.0 All All All -60 1.5 I 0.2 V or V 2 5.3 V, LccQ O Hz, Vcc =?.5 V 2.0 mA = 5.5 v, vcc = 5.5 v icita If:“= O Hz, - 2/ All All 0.35 iA/MHz - mA s 0.2 V or VIN i: 5.3 V, CCD IVIN I- 3/ - 5.5 V, outputs open, one bit
47、lk EY.5 MHz, 50% duty cycle I I I 22.75 See footnotes at end of table. DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-59b2-90798 59 W 999999b 00119L9 T TABLE I. Electrical performance characteristics - Continued. I I I Grou
48、p A I Device ubgroups I type 4 I All I Conditions I I I I Symbol 1 -55OC 5 T -C t125“C 4.5 v 5 VECC 5.5 v unless otherwise specified cIN ISee 4.4.1 I Test Lir Min tc Max 10 Input capacitance I I I I 4 I All 7,8 I All 9,10,11 I O1 12 Output capacitance I I I I ISee 4.4.ld Functional tests Propagation
49、 delay time, An to ODDn 17.0 tpLH1 ICL = 50 pF minimum, IRL = 50M1, ISee figure 4 - 5/ 1.5 1.5 I 9,10,11 I 02 I 9.5 I I I I I 9,10,11 I 03 9,10,11 I O1 9,10,11 I 02 9,10,11 I 03 I 1.5 7.0 1.5 16.0 1.5 9.0 6.6 1.5 1.5 1.5 Propagation dew time, An to ERR I I I I 9,10,11 I O1 9,10,11 I 02 9,10,11 I 03 tPLH2 17.0 9.0 7.0 1.5 I I I I 9,10,11 I O1 9,10,11 I 02 9,10,11 I 03 I 20.0 1.5 1.5 1.5 tPHL2 10.5 8.1 See footnotes at end of table. STANDARDIZ
