DLA SMD-5962-90977 REV B-2000 MICROCIRCUIT HYBRID LINEAR WIDEBAND LOW DISTORTION OPERATIONAL AMPLIFIER《操作放大器 轻度失真 宽频直线式混合微型电路》.pdf

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1、REVISIONSLTR DESCRIPTION DATE (YR-MO-DA) APPROVEDA Changes in accordance with NOR 5962-R247-97. 97-03-13 K. A. CottongimB Changes to table I. Delete CAGE code 62839. Add CAGE code1HBD3.00-05-24 Raymond MonninTHE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED.REVSHEETREVSHEETREV STATUS REV BBB

2、BBBBBBBOF SHEETS SHET 12345678910PMIC N/A PREPARED BY Gary ZahnDEFENSE SUPPLY CENTER COLUMBUSSTANDARDMICROCIRCUITDRAWINGCHECKED BYMichael C. JonesPOST OFFICE BOX 3990COLUMBUS, OHIO 43216-5000THIS DRAWING ISAVAILABLEFOR USE BY ALLDEPARTMENTSAPPROVED BYD. M. CoolMICROCIRCUIT, HYBRID, LINEAR,WIDEBAND,

3、LOW DISTORTION,OPERATIONAL AMPLIFIER AND AGENCIES OF THEDEPARTMENT OF DEFENSEDRAWING APPROVAL DATE92-02-18AMSC N/AREVISION LEVELBSIZEACAGE CODE672685962-90977SHEET1 OF 10DSCC FORM 2233APR 97 5962-E285-00DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSN

4、ot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90977DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELBSHEET2DSCC FORM 2234APR 971. SCOPE1.1 Scope. This drawing documents five product assurance classes, class

5、 D (lowest reliability), class E, (exceptions), classG (lowered high reliability), class H (high reliability), and class K, (highest reliability) and a choice of case outlines and leadfinishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of

6、radiationhardness assurance levels are reflected in the PIN.1.2 PIN. The PIN shall be as shown in the following example:5962 - 90977 01 H X X G7EG7E G7EG7E G7EG7EG7EG7E G7EG7E G7EG7EG7E G7E G7E G7E G7E G7E Federal RHA Device Device Case Leadstock class designator type class outline finishdesignator

7、(see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3)/ Drawing number1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHAlevels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA dev

8、ice.1.2.2 Device type(s). The device type(s) identify the circuit function as follows:Device type Generic number 1/ Circuit function01 CLC207A, KH207A Wideband, low distortion, operational amplifier1.2.3 Device class designator. This device class designator shall be a single letter identifying the p

9、roduct assurance level asfollows:Device class Device performance documentationD, E, G, H, or K Certification and qualification to MIL-PRF-385341.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:Outline letter Descriptive designator Terminals Package styleX Se

10、e figure 1 12 Can package1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.1/ The CLC207A is inactive for new design.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90977DEFENSE SUPPLY CEN

11、TER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELBSHEET3DSCC FORM 2234APR 971.3 Absolute maximum ratings.Supply voltage (G72VCC) G7220 V dcDifferential input voltage. G723 V dcCommon-mode input voltage . G72(G7EVCCG7E - 5 V)Output current G72150 mAStorage temperature range -65G71C to +150G71CLead

12、temperature (soldering, 10 seconds) +300G71CJunction temperature (TJ) +175G71CPower dissipation (PD) . 1/Thermal resistance, case-to-ambient (G54CA) 65G71C/W 2/Thermal resistance, junction-to-case:G54JC (circuit) . 17.5G71C/W 3/G54JC (output). 100G71C/W 4/1.4 Recommended operating conditions.Supply

13、voltage range G725 V dc to G7215 V dcGain range +7 to +50; -1 to -50Common-mode input voltage . (G7EVCCG7E - 5 V)Output current G72100 mAAmbient operating temperature range (TA) . -55G71C to +125G71C2. APPLICABLE DOCUMENTS2.1 Government specification, standards, and handbooks. The following specific

14、ation, standards, and handbooks form apart of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed inthe issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in thesolicitati

15、on.SPECIFICATIONDEPARTMENT OF DEFENSEMIL-PRF-38534 - Hybrid Microcircuits, General Specification for.STANDARDSDEPARTMENT OF DEFENSEMIL-STD-883 - Test Method Standard Microcircuits.MIL-STD-1835 - Interface Standard for Microcircuit Case Outlines.HANDBOOKSDEPARTMENT OF DEFENSEMIL-HDBK-103 - List of St

16、andard Microcircuit Drawings (SMDs).MIL-HDBK-780 - Standard Microcircuit Drawings.(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the StandardizationDocument Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)1/ The power d

17、issipation can be determined based on the application and junction temperature verified to be TJ G64 +175G71Cand using the thermal resistance values given.2/ Still air, no heat sink.3/ Thermal resistance of circuit; Pcircuit = 2(VCC) ICC.4/ Thermal resistance of output transistors; Poutput = VCE(IE)

18、 x (% duty cycle).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90977DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELBSHEET4DSCC FORM 2234APR 972.2 Order of precedence. In the event of a co

19、nflict between the text of this drawing and the references cited herein, the textof this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless aspecific exemption has been obtained.3. REQUIREMENTS3.1 Item requirements. The individual item perf

20、ormance requirements for device classes D, E, G, H, and K shall be inaccordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or asdesignated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class.

21、 Therefore, the tests and inspections herein may not be performed for the applicable device class (see MIL-PRF-38534). Furthermore, the manufacturer may take exceptions or use alternate methods to the tests and inspections herein and notperform them. However, the performance requirements as defined

22、in MIL-PRF-38534 shall be met for the applicable deviceclass.3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specifiedin MIL-PRF-38534 and herein.3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and f

23、igure 1.3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics areas specified in table I and shall apply over the full specified operating temper

24、ature range.3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electricaltests for each subgroup are defined in table I.3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be mark

25、edwith the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked in MIL-HDBK-103 andQML-38534.3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device describedherein shall maintain the electrical test dat

26、a (variables format) from the initial quality conformance inspection group A lotsample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and forthose which, if any, are guaranteed. This data shall be maintained under document revision lev

27、el control by the manufacturerand be made available to the preparing activity (DSCC-VA) upon request.3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to thisdrawing. The certificate of compliance (original copy) submitted to DSCC-VA

28、shall affirm that the manufacturers product meetsthe performance requirements of MIL-PRF-38534 and herein.3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot ofmicrocircuits delivered to this drawing.4. QUALITY ASSURANCE PROVISION

29、S4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or asmodified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect theform, fit, or function as described herein.Provided by IHSNot for Res

30、aleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90977DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELBSHEET5DSCC FORM 2234APR 97TABLE I. Electrical performance characteristics.LimitsTest Symbol Conditions 1/-55G71C G6

31、4 TAG64 +125G71Cunless otherwise specifiedGroup AsubgroupsDevicetypeMin MaxUnit4,6 140Small signal bandwidth(-3 dB bandwidth)SSBW VOUT 35 MHz5,6010.8dBGain flatness rolloff GFR f = 70 MHz 4,5,6 01 0.8 dB4 2Linear phase deviation 2/ LDP f 100 kHz 7,8A,8B 01 -157 dBm(1 Hz)Integrated noise 2/ INV f = 5

32、 MHz to 150 MHz 7,8A,8B 01 38 G50V1,3 8.0Input offset voltage VIO20111.0mVInput offset voltagetemperature coefficient 2/G27VIO-G27T1,2,3 01 25 G50V/G71C1,2 G7215+ Input bias current +IIB Input resistance is 100G3A301G72 25G50A+ Input bias currenttemperature coefficient 2/G27G0EIIB-G27T1,2,3 01 100 n

33、A/G71C1 G72102 G7225- Input bias current -IIB Input resistance is 100G3A301G7222G50A- Input bias currenttemperature coefficient 2/G27G10IIB-G27T1,2,3 01 150 nA/G71CPower supply rejection ratio PSRR G27VCC = 1 V1,2,3 01 55 dBCommon mode rejectionratio 2/CMRR G27VCM = 1 V4,5,6 01 50 dB1,3 G7227Supply

34、current ICC No load201G7229mA1/ Unless otherwise specified, RL = 200 ohms, RF = 2,000 ohms, G72VCC = G7215 V, AV = +20.2/ Parameter shall be tested as part of device initial characterization and after design and process changes, which will affectthis parameter. Parameter shall be guaranteed to the l

35、imits specified in table I for all lots not specifically tested.3/ dBc is a standard reference for a signal referenced to a carrier signal level.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90977DEFENSE SUPPLY

36、 CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELBSHEET7DSCC FORM 2234APR 97Case outline X.Millimeters Inches NotesSymbolMin Max Min MaxA 3.76 4.60 0.148 0.181G87b 0.41 0.48 0.016 0.019G87D 15.11 15.44 0.595 0.608G87D1 13.84 14.10 0.545 0.555e 10.16 BSC 0.400 BSC 5e1 5.08 BSC 0.200 BSC 5e2 2.5

37、4 BSC 0.100 BSC 5F 0.76 0.030k 0.66 0.91 0.026 0.036 4k1 0.66 0.91 0.026 0.036 4L 7.87 8.64 0.310 0.340G4245G71 BSC 45G71 BSC 5NOTES:1. Dimensions are in inches.2. Metric equivalents are given for general information only.3. The product may be measured by direct methods or by gauge.4. Measured from

38、the maximum diameter of the product.5. Leads having a maximum diameter .019 (0.48 mm) measured in gauging plane .054 (1.37 mm) +.001 (0.03 mm), -.000(0.00 mm) below the base plane of the product shall be within .007 (0.18 mm) of their true position relative to amaximum width tab.FIGURE 1. Case outli

39、ne(s).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90977DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELBSHEET8DSCC FORM 2234APR 97Device type 01Case outline XTerminal number Terminal symb

40、ol1+VCC (supply voltage)2 No connection3 Ground (case)4 No connection5-VIN6+VIN7 Ground (case)8Rf (internal feedback)9-VCC (supply voltage)10 -VCC (collector supply)11 VOUT12 +VCC (collector supply)NOTE: Pin 8 provides access to a 2 kG3A resistor which can be connected to theoutput or left open if a

41、n external feedback resistor is desired.FIGURE 2. Terminal connections.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90977DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELBSHEET9DSCC FORM 22

42、34APR 97TABLE II. Electrical test requirements.MIL-PRF-38534 test requirements Subgroups(in accordance withMIL-PRF-38534, group A test table)Interim electrical parameters 1Final electrical parameters 1*,2,3,4,7Group A test requirements 1,2,3,4,5,6,7,8A,8BGroup C end-point electricalparameters1End-po

43、int electrical parameters for radiation hardness assurance (RHA) devicesNot applicable* PDA applies to subgroup 1. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:a. Burn-in test, method 1015 of MIL-STD-883.(1) Test condition A, B, C,

44、 or D. The test circuit shall be maintained by the manufacturer under document revision levelcontrol and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuitshall specify the inputs, outputs, biases, and power dissipation, as applicable, in accorda

45、nce with the intentspecified in test method 1015 of MIL-STD-883.(2) TAas specified in accordance with table I of method 1015 of MIL-STD-883.b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parametertests prior to burn-in are optional

46、 at the discretion of the manufacturer.4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordancewith MIL-PRF-38534 and as specified herein.4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and a

47、s follows:a. Tests shall be as specified in table II herein.b. Subgroups 9, 10, and 11 shall be omitted.4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDA

48、RDMICROCIRCUIT DRAWINGSIZEA5962-90977DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELBSHEET10DSCC FORM 2234APR 974.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows:a. End-point electrical parameters shall be as specified in table II herein.b. Steady-state life test, method 1005 of MIL-STD-883.(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision levelcontrol and shall be made avail

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