1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update the boilerplate to current requirements as specified in MIL-PRF-38535. Editorial changes throughout. jak 07-01-22 Thomas M. Hess B Update boilerplate paragraphs to the current MIL-PRF-38535 requirements. - LTG 13-08-29 Thomas M. Hess REV S
2、HEET REV B B B B B B SHEET 15 16 17 18 19 20 REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Wanda L. Meadows DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING
3、IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A CHECKED BY Thomas J. Ricciuti APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 16-BIT BUS DRIVERS WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON DRAWING APPROVAL DATE 9
4、3-02-08 REVISION LEVEL B SIZE A CAGE CODE 67268 5962-92018 SHEET 1 OF 20 DSCC FORM 2233 APR 97 5962-E551-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92018 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-399
5、0 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in
6、the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 92018 01 M X A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device c
7、lass designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the M
8、IL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54ACT16240 16-bit bus driver with
9、 inverting three-state outputs, TTL compatible inputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compl
10、iant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X
11、See figure 1 48 Flat pack 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SI
12、ZE A 5962-92018 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range (VIN) -0.5 V dc to VCC+ 0.5 V dc DC output voltage range (VOUT) . -0.5 V dc to V
13、CC+ 0.5 V dc DC input clamp current (IIK) (VINVCC) 20 mA DC output clamp current (IOK) (VOUTVCC) 50 mA DC output current (IOUT) (VOUT= 0 to VCC) (per output) 50 mA DC VCCor GND current (ICC, IGND) (per pin) . 400 mA 3/ Storage temperature range (TSTG) . -65C to +150C Maximum power dissipation (PD) .
14、 500 mW Lead temperature (soldering, 10 seconds) +260C Thermal resistance, junction-to-case (JC) 9.9 C/W Junction temperature (TJ). +175C Case operating temperature range (TC) . -55C to +125C 1.4 Recommended operating conditions. 2/ 4/ 5/ Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Input volta
15、ge range (VIN) +0.0 V dc to VCCOutput voltage range (VOUT) . +0.0 V dc to VCCMaximum low level input voltage (VIL) 0.8 V Minimum high level input voltage (VIH) . 2.0 V Case operating temperature range (TC) . -55C to +125C Maximum input rise and fall rate (tr, tf): (10% to 90% of VIN, 90% to 10% of V
16、IN) 10 ns/V Maximum high level output current (IOH) -24 mA Maximum low level output current (IOL) 24 mA 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. The maximum junctio
17、n temperature may be exceeded for allowable short duration burn-in screening conditions in accordance with method 5004 of MIL-STD-883. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ For packages with multiple VCCand GND pins, this value represents the maximum total current flowing
18、 into or out of all VCCor GND pins. 4/ Unless otherwise specified the limits for the parameters listed herein shall apply over the full specified VCCand TCrecommended operating range. 5/ Unused or floating inputs should be held high or low. Provided by IHSNot for ResaleNo reproduction or networking
19、permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92018 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards
20、, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DE
21、PARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these
22、 documents are available online at http:/quicksearch.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094). 2.2 Non-Government publications. The following document(s) form a part of this document to the extent specified herein. Unless
23、otherwise specified, the issues of these documents cited in the solicitation or contract. JEDEC SOLID STATE TECHNOLOGY ASSOCIATION (JEDEC) JESD20 - Standard for Description of 54/74ACXXXXX and 54/74ACTXXXXX Advanced High-Speed CMOS Devices. JESD78 - IC Latch-Up Test. (Copies of these documents are a
24、vailable online at http:/www.jedec.org or from JEDEC Solid State Technology Association, 3103 North 10thStreet, Suite 240-S Arlington, VA 22201-2107). 2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes
25、precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, o
26、r as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B
27、 devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case
28、 outline shall be in accordance with 1.2.4 and figure 1 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Truth table. The truth table shall be as specified on figure 3. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 4. 3.2.
29、5 Ground bounce waveforms and test circuit. The ground bounce waveforms and test circuit shall be as specified on figure 5. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 6. Provided by IHSNot for ResaleNo reproduction or networki
30、ng permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92018 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein,
31、 the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
32、 tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the
33、option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certific
34、ation/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of c
35、ompliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
36、 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the
37、 requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3
38、.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device
39、 class M, DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assign
40、ment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 37 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92018 DLA LAND
41、 AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C 4.5 V VCC 5.5 V unless otherwise specified Device type and device class 3/ VCCGroup A su
42、bgroups Limits 4/ Unit Min Max High level output voltage 3006 VOH1For all inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.8 V For all other inputs VIN= VCCor GND IOH= -50 A All All 4.5 V 1, 2, 3 4.4 V VOH2For all inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.8 V For all o
43、ther inputs VIN= VCCor GND IOH= -50 A All All 5.5 V 1, 2, 3 5.4 VOH3For all inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.8 V For all other inputs VIN= VCCor GND IOH= -24 mA All All 4.5 V 1 3.94 2, 3 3.70 VOH4For all inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.8 V For
44、 all other inputs VIN= VCCor GND IOH= -24 mA All All 5.5 V 1 4.94 2, 3 4.70 VOH55/ For all inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.8 V For all other inputs VIN= VCCor GND IOH= -50 mA All All 5.5 V 1, 2, 3 3.85 Low level output voltage 3007 VOL1For all inputs affecting output und
45、er test VIN= VIH= 2.0 V or VIL= 0.8 V For all other inputs VIN= VCCor GND IOL= +50 A 4.5 V All All 1, 2, 3 0.1 V VOL2For all inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.8 V For all other inputs VIN= VCCor GND IOL= +50 A 5.5 V All All 1, 2, 3 0.1 VOL3For all inputs affecting output u
46、nder test VIN= VIH= 2.0 V or VIL= 0.8 V For all other inputs VIN= VCCor GND IOL= +24 mA 4.5 V All Q, V 1, 3 0.36 2 0.50 All M 1 0.36 2, 3 0.50 VOL4For all inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.8 V For all other inputs VIN= VCCor GND IOL= +24 mA 5.5 V All Q, V 1, 3 0.36 2 0.50
47、All M 1 0.36 2, 3 0.50 VOL55/ For all inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.8 V For all other inputs VIN= VCCor GND IOL= +50 mA 5.5 V All All 1, 2, 3 1.65 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from I
48、HS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92018 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C 4.5 V VCC 5.5 V unless otherwise specified VCCDevice type and device class 3/ Group A subgroups Limits 4/ Unit Min Max Three-state output leakage current high 3021 IOZHmG = VIH= 2.0 V or VIL= 0.8 V For all other inputs VIN= VCCor GND VOUT= 5.5 V 5.5 V All Q, V 1 0.5 A 2, 3 10.0 All M 1 0.5 2, 3 10.0 T
