1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update to reflect latest changes in format and requirements. Editorial changes throughout.les 04-10-20 Raymond Monnin THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV A A A A A A A A A A A A OF SHEETS SH
2、EET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Larry T. Gauder DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Thanh V. Nguyen COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking MICROCIRCUI
3、T, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY, TTL, 10- BIT AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-03-29 BUFFER/LINE DRIVER, MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-92090 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E426-04 Provided by IHSNot for Res
4、aleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92090 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class level
5、s consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in
6、 the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 92090 01 M K A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device
7、classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-
8、RHA device. 1.2.2 Device type. The device type identifies the circuit function as follows: Device type Generic number Circuit function 01 54F827 10-bit buffer/line driver 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows:
9、 Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outlines. The case outlines a
10、re as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style K GDFP2-T24 or CDFP3-T24 24 dual-in-line L GDIP3-T24 or CDIP4-T24 24 flat 3 CQCC1-N28 28 square chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device c
11、lasses Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92090 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FOR
12、M 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range -0.5 V dc to +7.0 V dc DC input current range -30 mA to +5.0 mA Voltage applied to a disabled three-state output range . -0.5 V dc to +5.5 V dc Voltage applied to any output in the
13、 high state -0.5 V dc to VCCCurrent into any output in the low state . 96 mA Storage temperature range -65C to +150C Maximum power dissipation (PD) 2/ 450 mW 2/ Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) +175C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835
14、 1.4 Recommended operating conditions. Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Minimum high level input voltage (VIH) 2.0 V dc Maximum low level input voltage (VIL) 0.8 V dc Maximum input clamp current (IIK) -18 mA Maximum high level output current (IOH) . -12 mA Maximum low level output c
15、urrent (IOL) +48 mA Case operating temperature range (TC) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the
16、issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Sta
17、ndard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil or from the
18、 Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, sup
19、ersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Maximum power dissipation is defi
20、ned as VCCx ICC, and must withstand the added PDdue to short-circuit test e.g., IOS. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92090 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEV
21、EL A SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM
22、plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, co
23、nstruction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal conne
24、ctions shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figu
25、re 4. 3.3 Electrical performance characteristics and post-irradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and post-irradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4
26、Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked.
27、For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in acco
28、rdance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a
29、“C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
30、compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product
31、meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M
32、in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any cha
33、nge that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the
34、 option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 09 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-S
35、TANDARD MICROCIRCUIT DRAWING SIZE A 5962-92090 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C +4.5 V VCC +5.5 V Group A subgroups Device type Limits Unit unl
36、ess otherwise specified Min Max High level output voltage VOHVCC= 4.5 V, IOH = -3 mA 1, 2, 3 All 2.4 V VIL= 0.8 V, IOH= -12 mA 2.0 Low level output voltage VOLVIH= 2.0 V IOL = 48 mA 1, 2, 3 All 0.55 V Input clamp voltage VICVCC= 4.5 V IIN = -18 mA 1, 2, 3 All -1.2 V High level input current IIH1VCC=
37、 5.5 V VIN= 7.0 V 1, 2, 3 All 100 A IIH2VIN= 2.7 V 20 Low level input current IILIN= 0.5 V 1, 2, 3 All -0.6 mA Off-state output leakage IOZHVOUT= 2.7 V 50 A current IOZLOUT= 0.5 V -50 Short-circuit output current IOSVOUT= 0.0 V 1/ 1, 2, 3 All -100 -225 mA Supply current ICCHOutputs high 1, 2, 3 All
38、45 mA ICCLOutputs low 90 CCZOutputs disabled 60 Functional tests See 4.4.1b, VCC= 4.5 V and 5.5 V 2/ 7, 8 All Propagation delay time, tPLHRL= 500, VCC = 5.0 V 9 All 1.0 5.5 ns Dnto OnCL= 50 pF VCC= 4.5 V, 5.5 V 10, 11 1.0 7.5 tPHLSee figure 4 VCC= 5.0 V 9 All 1.5 5.5 ns VCC= 4.5 V, 5.5 V 10, 11 1.5
39、7.0 Output enable time, tPZHCC= 5.0 V 9 All 3.0 9.0 ns OE to OnVCC= 4.5 V, 5.5 V 10, 11 2.5 10 tPZLCC= 5.0 V 9 All 3.5 11.5 ns VCC= 4.5 V, 5.5 V 10, 11 3.0 12.5 Output disable time, tPHZCC= 5.0 V 9 All 1.5 8.0 ns OE to OnVCC= 4.5 V, 5.5 V 10, 11 1.5 9.0 tPLZ CC= 5.0 V 9 All 1.0 8.0 ns VCC= 4.5 V, 5.
40、5 V 10, 11 1.0 9.0 1/ Not more than one output shall be shorted at a time, and the duration of the short-circuit should not exceed one second. 2/ Functional test shall be conducted at input test conditions of GND VIL VOLand VOH VIH VCC. Provided by IHSNot for ResaleNo reproduction or networking perm
41、itted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92090 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 Device type 01 Case outlines K and L 3 Terminal number Terminal symbol 1 OE1NC 2 D0OE13 D1D04 D2 15 D3 26 D4D37 D
42、5 48 D6NC 9 D7D510 D8 611 D9 712 GND D813 OE2D914 O9GND 15 O8NC 16 O7OE217 O6O918 O5 819 O4 720 O3O621 O2 522 O1NC 23 O0O424 VCC 325 - - - O226 - - - O127 - - - O028 - - - VCCFIGURE 1. Terminal connections. Inputs Outputs Function OE DnOnZ L H H Transparent L L L TransparentH X Z High Z H = High vol
43、tage level. Z = High impedance. L = Low voltage level. X = Immaterial. FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92090 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REV
44、ISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 FIGURE 3. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92090 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSC
45、C FORM 2234 APR 97 FIGURE 4. Test circuit and switching waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92090 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC
46、FORM 2234 APR 97 NOTES: 1. CLincludes probe and jig capacitance. 2. All input pulses have the following characteristics: PRR = 1 MHz, tr= tf 2.5 ns, duty cycle = 50%. FIGURE 4. Test circuit and switching waveforms - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted with
47、out license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92090 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 10 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in ac
48、cordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shal
