1、SMD-59b2-92212 REV A 9999996 0090041 35L = IN RWY REFER TO: DSCC-VAC DEFENSE LOGISTICS AGENCY DEFENSE SUPPLY CENTER, COLUMBUS 3990 EAST BROAD STREET COLUMBUS, OH 432163000 NOV O 7 SWECT: Notice of Revision (NOR) 5962-R27-96 for Standard Microcircuit Drawing (SMD) 5%2-922iZ Militaryhdustry Distributi
2、on The enclosed NOR is approved for use effective as of the date of the NOR. in accordance with MIL-STD-100 SMD holders should, as a minimum, handwrite those changes described in the NOR to sheet 1 of the subject SMD. After completion, the NOR should be attached to the subject SMD for future referen
3、ce. Those companies who were listed as approved sources of supply prior to this action have agreed to actions taken on devices for which they had previously provided DSCC a certificate of compliance. This is evidenced by an existing active current certificate of compliance on file at DSCC with a DSC
4、C record of verbal coordination. The certificate of compliance for these devices is considered concurrence with the new revision unless DSCC is otherwise notified. If you have comments or questions, please contact Mr. Bernard Miesse at (614) 692-0543 SN 850). 1 Encl MONICA L. POELKING J Chief, Custo
5、m Microelectronics Team Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-922L2 REV A 9999996 0090042 298 NOTICE OF REVISION (NOR) THIS REVISION DESCRIBED BELOW HAS BEEN AUTHORIZED FOR THE DOCUMENT LISTED. . . -. . . - (WMMDD) Form Approved 96
6、-09-30 OMB NO. 0704-0188 3990 East Broad Street Columbus, OH 43216-5000 I. TYPED NAME (First, Middle Initial, Last) UMK nporti burdi fa his dlecai is -led to average z hair0 per mspwse induding me for rwiewing instnictions. searching existing data uwms ialhecin and maintaini Send mrments regardin th
7、is burden estimate M any oxts i2i8 Je%on Dams Hi hway. Suite 1204. Arlington. VA 222024302. and lo the Omce of Management and Budget. a erwotk Reduction P ect 07Z6DE 1. ORIGINATOR Defense Supply Center, Columbus 2. PROCURING No. 3. DODAAC 6. NOR NO. 5962-R227-96 7. CAGE CODE 67268 14. THIS SECTION F
8、OR GOVERNMENT USE ONLY 8. DOCUMENT NO. 5962-9221 2 b. ACTIVIT I. TITLE OF DOCUMENT 10. REVISION LETTER a. CURRENT MICROCIRCUITS, DIGITAL, FAST CMOS, QUAD DUAL-PORT REGISTER, TTL COMPATIBLE, LIMITED OUTPUT VOLTAGE SWING, b. NEW MONOLITHIC SILICON Initial A 11. ECP NO. NIA X DD Form 1695, APR 92 Previ
9、ous editions are obsolete. (1) Existing document supplemented by the NOR may be used in manufacture. (2) Revised document must be received before manufacturer may incorporate this change. (3) Custodian of master document shall make above revision and furnish revised document. AUTHORIZED TO APPROVE C
10、HANGE FOR GOVERNMENT c. TYPED NAME (Firsf, Middle Initial, Last) DSCC-VAC Monica L. Poelking d. TITLE e. SIGNATURE Chief, Custom Microelectronics Monica L. Poelking b. REVISION COMPLETED (Signature) 15a. ACTIVITY ACCOMPLISHING REVISION DSCC-VAC Bernard J. Miesse f. DATE SIGNED (YYMMDD) 96-09-30 c. D
11、ATE SIGNED (YYMMDD) 96-09-30 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-LTR DESCRI PTION DATE (YR-MO-DA) APPROVED PMIC N/A REV SHEET REV SHEET STANDARDIZED MILITARY DRAWIE 15 16 17 THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS SIZE A AND
12、AGENCIES OF THE DEPARTMENT OF DEFENSE CAGE CODE 5962-9221 2 67268 AHSC PREPARED BY Joseph A. Kerby CHECKE0 BY Thomas J. Ricciuti APPROVED BY Monica L. Poelking DRAWING APPROVAL DATE 93-06-01 REVISION LEVEL DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 MICROCIRCUITS, DIGITAL, FAST CMOS, COMPAT
13、IBLE, LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON QUAD DUAL-PORT REGISTER, TTL tUHM 1Y3 JUL 91 DISTRIBUTION STATEMENT A. Approved for pub1 ic release: distribution is un1 imited. 5962-E214-93 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5
14、9b2-92212 m b 0042119 07T STANDARDIZED MILITARY DBAWING DEFENSE ELECTBONICS SUPPLY CENTEB DAYTON, OHIO 45444 I. SCOPE 1.1 Scope. This drawing forms a part of a one part - one part nuher documentation system (see 6.6 herein). Two xoduct assurance classes consisting of military high reliability (devic
15、e classes 6, Q, and M) and space application device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the Part ir Identifying Nunber (PIN). Device class i4 microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STO-883
16、, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“. When ivailable, a choice of radiation hardness assurance (RHA) levels are reflected in the PIN. 1.2 m. The PIN shall be as shown in the following example: 5962 - 92212 o1 M E T Lead I Case T I Devi ce (See 1.2.3
17、) I Devi ce I RHA I Federa 1 stock class designator type class out1 ine finish designator (See 1.2.1) (See 1.2.2) designator (See 1.2.4) (See 1.2.5) I Drawing number 1.2.1 RHA desianator. Device classes M, 6, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marke
18、d with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-1-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA devi ce. 1.2.2 Device tm(s1. The device type(s) shall identify the circuit function
19、 as follows: Device type Generic nuhr Circuit function 01, 02 54FCT399T Quad dual-port register, TTL conpatible inputs, limited output voltage swing 03, 04 54FCT399AT Quad dual-port register, TTL conpatible inputs, limited output voltage swing 05, 06 Quad dual-port register, TTL compatible inputs, l
20、imited output voltage swing 54FCT399CT SIZE 5962-92212 A REVISION LEVEL SHEET 2 1.2.3 Device class designator. The device class designator shall be a single letter identifying the product assurance level as follows: Device class Devi ce reau irements documentation M Vendor self-certification to the
21、requirements for non-JAN class 6 microcircuits in accordance with 1.2.1 of MIL-STO-883 E or S Q or V Certification and qualification to MIL-M-38510 Certification and qualification to MIL-1-38535 1.2.4 Case outline(s1. The case outline(s) shall be as designated in MIL-STD-1835, and as follows: Outlin
22、e letter Descri Dt ive des i anat or Temi na 1s Packaae style E F 2 GDIP1-T16 or COIP2-Fl6 16 Dual -in- 1 ine GDFP2-Fl6 or GOFP3-Fl6 16 Flat pack CQCC1-N20 20 Lead less-ch i p-carrier 1.2.5 Lead finish. The lead finish shall be as specified in MIL-M-38510 for classes M, B. and S or MIL-1-38535 for c
23、lasses Q and V. Finish letter “X“ shall not be marked on the microcircuit or its packaging. The “X“ designation is for use in specifications when lead finishes A, 6, and C are considered acceptable and interchangeable without preference. Provided by IHSNot for ResaleNo reproduction or networking per
24、mitted without license from IHS-,-,-SMD-59b2-922L2 b 0042320 91 STANDARD1 Z ED MILITARY DR$KCNG DEFENSE ELECTRONICS SUPPLY CWTX DAYTON. OHIO 45444 1.3 Absolute maximum ratinqs. I/ 2/ 31 Supply voltage range (V ) - - - - - - - - - - - - - - - - - - OC input voltage range f6 ,) - - - - - - - - - - - -
25、 - - - - - OC output voltage range T) - - - - - - - - - - - - - - - - OC input claw current (I (V , - -0.5 V) - - - - - - - - - OC output claw current (1 K) (4 = -0.5 V and +7.0 V) - - - OC output source current (P Hl p8lToutput - - - - - - - - - - OC output sink current (IoL? per output - - - - - -
26、 - - - - - DC V current (I ) - - - - - - - - - - - - - - - - - - - - DC g I 12/ s to CP I th Minim hold time, comn select high or low from c1ock;I i2J S from CP I iiinim clock i tw pul se wtdth, CP high and I iZJ 1 ow I TABLE I. Electrical performance characteristics - Continued. Test conditions -55
27、C 5 TC d +125OC 4.5 v v s 5.5 v unless otherwigk specified 2J Devi ce 1 “cc + 01,02 I 4.5 I 2E.L- 01,oz I 4.5 v 03,04 1 03,04 05.06 1 _f_ OLo2 I 4-5 “ 03 , 04 I I 2Y.L- 01,oz I 4.5 v O3lo4 I 05.06 I I Group A kubgroups 9,10,11 9,10,11 9,10,11 9.10.11 Limits 3J Hin Max +I iJ For tests not listed in t
28、he referenced MIL-STO-883 (e.g. AICC), utilize the general test procedure of 883 under the conditions listed herein. ZJ Each input/output, as applicable shall be tested at the specified tenperature, for the specified limits, to the tests in table I herein. Output terminals not designated shall be hi
29、gh level logic, low level logic, or open, with the exception of the I tests, for which the output terminal(s) shall be open. When performing these tests, the current me$ and the absolute value of the magnitude. not the sign, is relative to the minimum and maximum limits, as applicable, listed herein
30、. All devices shall meet or exceed the limits specified in table I at 4.5 V s Vcc 5 5.5 V. 4/ This parameter is guaranteed, if not tested, to the limits specified in table I. 51 This test is required only for Group A testing, see 4.4.1 herein. 6/ Not more than one output should be shorted at a time.
31、 The duration of the short circuit test should not exceed one second. and AI Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SUD-5962-922L2 m 9999996 0042327 346 m STbnLMBDIZED MILITARY DRAWING DEFENSE ELEclR0NK.S SUPPLY CENTER DAYTON, OHIO 45444 TAB
32、LE I. Electrical performance characteristics - Continued. Icm nay be verified by the following equation: ICCT - ICC - DN*J fCp/2 +fiNi ICCD = where I device duty cycle = 50 percent: fIN z 1 MHz; tr, tf - 3 ns 11.0 ns. For input signal generators the 3.0 ns limit may be increased up to 10 ns, as need
33、ed, Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-59b2-922l12 m 9999996 O042333 677 m STANDARDIZED SIZE MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL u- OUTPUT 5962-92212 SHEET 14 DATA INPUT /- )it TIMIN
34、G INPUT COMMON cT%a SELECT I NPUT 3. ov I I sv o. ov 3. ov I. sv OL 3. ov I. 5v 0. ov 3.0V I * 5v o. ov 3, ov I * 5v o. ov 3.QV I. sv o. ov - - - INPUT PULSE WIDTH iiIGH AND LOW Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-59b2-922L2 = b 00423
35、32 503 TO pu?“!d the 8tlYput under test. Each device manufacturer shall test product on the fixtures they currently use. When a new fixture is used, the device manufacturer shall inform DESC-EC of this change and test the 5 devices on both the new and old test fixtures. The device manufacturer shall
36、 then submit to DESC-EC data from testing on both fixtures, that shall include, all neasured peak values for each device tested and detailed oscilloscope plots for each VoLe,h:gv, V o8P;t and ?#Y output under test.“ a#ect cabhance. C and C MHz. For CIN and COuT!test a?YTapplicable pins on five devic
37、es with zero failures. d. For device class M, subgroups 7 and 8 tests shall be sufficient to verify the truth table in figure 2 herein. The test vectors used to verify the truth table shall, at a minimum, test all functions of each input and output. All possible input to output logic patterns per fu
38、nction shall be guaranteed, if not tested, to the truth table in figure 2, herein. For device classes 6 and S, subgroups 7 and 8 tests shall be sufficient to verify the truth table as approved by the qualifying activity. For device classes Q and V, subgroups 7 and 8 shall include verifying the funct
39、ionality of the device: these tests shall have been fault graded in accordance with MIL-STO-883, test method 5012 (see 1.5 herein). 4.4.2 GWD B inswction. The group B inspection end-point electrical parameters shall be as specified in table II herein. Class S steady-state life (accelerated) shall be
40、 conducted using test condition 0 of method 1005 of MIL-STD- 883. For device class S steady-state life tests, the test circuit shall be submitted to and approved by the qua 1 i fyi ng activity . herein. I The device manufacturer will submit to DESC-EC data that shall include, all measured peak value
41、s and V from one sample part per function. The plot shall contain the waveforms of both a swi c c. C and C shall be measured only for initial qualification and after process or design changes which may shall be measured between the designated terminal and GND at a frequency of 1 I 4.4.3 Group C insp
42、ection. The group C inspection end-point electrical parameters shall be as specified in table II 4.4.3.1 Additional criteria for device classes M and B. Steady-state life test conditions, method 1005 of MIL-STO-883: a. Test condition A, B, C or O. For device class M, the test circuit shall be mainta
43、ined by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. For device class 6, the test circuit shall be submitted to the qualifying activity. For device classes M and B, the test circuit shall specify the inputs, o
44、utputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015. b. TA - +125OC, minim. c. Test duration: 1,000 hours, except as permitted by mthod 1005 of MIL-STD-883. 4.4.3.2 Additional criteria for device classes Q and V. The steady-state life tes
45、t duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturers QM plan in accordance with MIL-1-36535. The burn-in test circuit shall be maintained under document revision level control of the device manufacturers TRB in accordance with MI
46、L-1-38535 and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015. 4.4.4 Group O inspection. Group D inspection shall
47、 be in accordance with table IV of method 5005 of MIL-STO-883. End-point electrical parameters shall be as specified in table II herein. I SIZE 5962-92212 A REVISION LEVEL SHEET I I I 18 )ESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from I
48、HS-,-,-SMD-5762-92212 rn b OOq213b 159 rn 4.4.5 Grou E ins ection. Group E inspection is required only for parts intended to be marked as radiation hardness arein. RIM levels for device classes EI, S, Q, and V shall be M, D. R, and H and for device class M shall be M and D. a. End-point electrical p
49、arameters shall be as specified in table II herein. b. For device classes Ml E. and S, the devices shall be subjected to radiation hardness assured tests as specified in MIL-M-38510 for the RHA level being tested. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as specified in MIL-M-38535 for the RHA
