1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes are in accordance with the notice of revision 5962-R019-94. - tvn 93-11-02 Monica L. Poelking B Changes are in accordance with the notice of revision 5962-R090-94. - tvn 94-03-29 Monica L. Poelking C Changes are in accordance with the not
2、ice of revision 5962-R020-96. - bjm 96-10-28 Monica L. Poelking D Incorporate the previous notice of revisions. Update the boilerplate to the current requirements of MIL-PRF-38535. - jak 08-02-27 Thomas M. Hess E Add footnote 10/ for test condition of total power supply current (ICCT) to table I. -
3、LTG 10-05-14 Thomas M. Hess REV SHET REV E E E SHEET 15 16 17 REV STATUS REV E E E E E E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING
4、 THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A CHECKED BY Thomas J. Ricciuti APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, FAST CMOS, OCTAL D-TYPE FLIP-FLOP WITH ASYNCHRONOUS MASTER RESET, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLT
5、AGE SWING, MONOLITHIC SILICONDRAWING APPROVAL DATE 93-03-23 REVISION LEVEL E SIZE A CAGE CODE 67268 5962-92215 SHEET 1 OF 17 DSCC FORM 2233 APR 97 5962-E297-10 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-
6、92215 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case
7、 outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 92215 01 M R A Federal stock class designa
8、tor RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Leadfinish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate
9、RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic
10、number Circuit function 01, 02 54FCT273T Octal D-type flip-flop with asynchronous master reset, TTL compatible inputs and limited output voltage swing 03, 04 54FCT273AT Octal D-type flip-flop with asynchronous master reset, TTL compatible inputs and limited output voltage swing05, 06 54FCT273CT Octa
11、l D-type flip-flop with asynchronous master reset, TTL compatible inputs and limited output voltage swing 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-cer
12、tification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline lett
13、er Descriptive designator Terminals Package style R GDIP1-T20 or CDIP2-T20 20 Dual-in-line S GDFP2-F20 or CDFP3-T20 20 Flat pack 2 CQCC1-N20 20 Leadless-chip-carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device
14、 class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92215 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ S
15、upply voltage range (VCC) . -0.5 V dc to +7.0 V dc DC input voltage range (VIN) -0.5 V dc to VCC+ 0.5 V dc 4/ DC output voltage range (VOUT) -0.5 V dc to VCC+ 0.5 V dc 4/ DC input clamp current (IIK) (VIN= -0.5 V) . -20 mA DC output clamp current (IOK) (VOUT-0.5 V and +7.0 V) . 20 mA DC output sourc
16、e current (IOH) (per output) -30 mA DC output sink current (IOL) (per output) . +70 mA DC VCCcurrent (ICC) . 260 mA Ground current (IGND) +550 mA Storage temperature range (TSTG) -65C to +150C Case temperature under bias (TBIAS) -65C to +135C Maximum power dissipation (PD) 500 mW Lead temperature (s
17、oldering, 10 seconds) . +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Junction temperature (TJ) . +175C 1.4 Recommended operating conditions. 2/ 3/ Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Input voltage range (VIN) +0.0 V dc to VCCOutput voltage range (VOUT) . +0.0 V dc t
18、o VCCMaximum low level input voltage (VIL) . 0.8 V Minimum high level input voltage (VIH) . 2.0 V Case operating temperature range (TC) . -55C to +125C Maximum input rise or fall rate (t/V): (from VIN= 0.3 V to 2.7 V, 2.7 V to 0.3 V) 5 ns/V Maximum high level output current (IOH): Device types 01, 0
19、3, and 05 . -6 mA Device types 02, 04, and 06 . -12 mA Maximum low level output current (IOL) 32 mA 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise not
20、ed, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ For VCC 6.5 V, the upper limit on the range is limited to 7.0 V. Provided by IHSNot for ResaleNo reproduction or netw
21、orking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92215 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specific
22、ation, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits Manufacturing, General Specif
23、ication for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (
24、Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the refer
25、ences cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in a
26、ccordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance wi
27、th MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and h
28、erein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diag
29、ram shall be as specified on figure 3. 3.2.5 Ground bounce load circuit and waveforms. The ground bounce load circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.3 Electrica
30、l performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requi
31、rements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92215 DEF
32、ENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible
33、 due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accor
34、dance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compli
35、ance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed
36、as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 an
37、d herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microci
38、rcuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device c
39、lass M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device
40、class M. Device class M devices covered by this drawing shall be in microcircuit group number 38 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92215 DEFENSE SUPPLY CENTER CO
41、LUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified Devicetype VCCGroup A subgroups Limits 3/ Unit Min
42、 Max High level output voltage 3006 VOH14/ For all inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.8 V For all other inputs VIN= VCCor GND IOH= -300 A 01, 03,05 4.5 V 1, 2, 3 2.7 VCC-0.5 V 02, 04,06 3.0 VCC-0.5VOH2For all inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.8 VF
43、or all other inputs VIN= VCCor GND IOH= -6 mA 01, 03,05 4.5 V 1, 2, 3 2.4 VCC-0.5 V IOH= -12 mA 2.0 VCC-0.5IOH= -12 mA 02, 04,06 2.4 VCC-0.5Low level output voltage 3007 VOL14/ For all inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.8 V For all other inputs VIN= VCCor GND IOL= 300 A All
44、 4.5 V 1, 2, 3 0.20 V VOL2For all inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.8 V For all other inputs VIN= VCCor GND IOL= 32 mA All 4.5 V 1, 2, 3 0.55 V Negative input clamp voltage 3022 VIC-For input under test, IIN= -18 mA 01, 03,05 4.5 V 1, 2, 3 -1.2 V For input under test, IIN=
45、 -15 mA 02, 04,06 -1.3 Input current high 3010 IIHFor input under test VIN= VCCFor all other inputs VIN= VCCor GND 01, 03,05 5.5 V 1, 2 1.0 A 3 5.0 02, 04,06 1, 2 1.0 3 5.0 Input current low 3009 IILFor input under test VIN= GND For all other inputs VIN= VCCor GND 01, 03,05 5.5 V 1, 2 -1.0 A 3 -5.0
46、02, 04,06 1, 2 -1.0 3 -5.0 Input capacitance 3012 CIN5/ See 4.4.1c TC= +25C All GND 4 10 pF Output capacitance 3012 COUT5/ See 4.4.1c TC= +25C All GND 4 12 pF Short circuit output current 3005 IOS6/ For all inputs, VIN= VCCor GND VOUT= GND All 5.5 V 1, 2, 3 -60 -225 mA Dynamic power supply current I
47、CCD4/ 7/ Outputs open All 5.5 V 4, 5, 6 0.25 mA/ MHzBitSee footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92215 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LE
48、VEL E SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified Device type VCCGroup A subgroups Limits 3/ Unit Min Max Quiescent supply current delta, TTL input level 3005 ICC8/ For input under test VIN= VCC- 2.1 V For all other inputs VIN= VCCor GND All 5.5 V 1, 2, 3 2.0 mA Quiescent supply current, output high 3005 ICCHFor all other inputs, VIN = VCCor GND All 5.5 V 1, 2, 3 1.5 mA Quiescent supply current, output low 3005
