1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R252-94. 94-07-25 K. A. CottongimB Add case outlines T, U, Y, and Z. 98-02-23 K. A. CottongimC Added device type 02. Updated table I for the addition of RadHard limits for the device type 02. Updated paragraph
2、4.3.5 to add the RadHard requirements. Redrew entire document. -sld. 02-06-21 Raymond Monnin D Add paragraph 1.5 and note 2. Table I, IINripple current, subgroups 2 and 3 for nonRHA device types 01 and 02; delete device type 02. Add a new line for nonRHA device type 02, subgroups 2 and 3 with a maxi
3、mum limit of 80 mAp-p. IINripple current for the RHA device type 02, subgroups 1, 2, 3; change the maximum limit from 75 mAp-p to 120 mAp-p. Table 1 add new note 2 for enhanced low dose rate effects (renumber remaining notes in sequence). Paragraph 4.3.5.a, add enhanced low dose rate effects.06-11-3
4、0 Raymond Monnin E Added radiation hardened levels P and L . -sld 07-06-04 Robert M. HeberF Added footnote 1 to table II, under group C end-point electricals. Updated drawing paragraphs. -sld 09-10-15 Charles F. Saffle G Table I, VTLINEtest, change min/max limits 400 and 500 to max only limits of 50
5、0 and 600, respectively (2 places each). Table I, TTLINEtest, delete the minimum limits and remove the “+“ from the max limits (4 places each). Table I, note 9, change “greater than 10 microseconds“ to “is equal to 100 microseconds 20%“. Figure 2, note 1, last line, correct (pin 11) to (pin 12). -gz
6、 10-09-23 Charles F. Saffle REV SHEET REV G G SHEET 15 16 REV STATUS REV G G G G G G G G G G G G G G OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Steve L. Duncan DLA LAND AND MARITIME STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael Jones COLUMBUS, OHIO 43218-3990 http:/www.
7、dscc.dla.mil/ THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, 15 VOLT, DUAL CHANNEL, DC-DC CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 94-05-27 AMSC N/A REVISION LEVEL G SIZE A CAGE CODE 67268 5962-9319
8、3 SHEET 1 OF 16 DSCC FORM 2233 APR 97 5962-E481-10 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93193 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE
9、 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance level
10、s are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 93193 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2
11、.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device types. The device types identify the circuit function as follows: Device
12、 type Generic number Circuit function 01 MFL2815D DC-DC converter, 65 W, 15 V outputs 02 SMFL2815D DC-DC converter, 65 W, 15 V outputs 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requireme
13、nts of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space ap
14、plications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possibl
15、e limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requiremen
16、ts of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the
17、 manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93193 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION L
18、EVEL G SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style T See figure 1 12 Tabbed flange mount, lead formed up U See figure 1 12 Flange mount, lead formed down X See fig
19、ure 1 12 Flange mount, short lead Y See figure 1 12 Tabbed flange mount, short lead Z See figure 1 12 Tabbed flange mount, lead formed down 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage range (VIN) -0.5 V dc to +50 V dc Powe
20、r dissipation (PD): Device types 01and 02 (non-RHA) . 16 W Device type 02 (RHA level R) . 18 W Lead soldering temperature (10 seconds) . +300C Storage temperature range -65C to +150C 1.4 Recommended operating conditions. Input voltage range (VIN) +16 V dc to +40 V dc Output power . 65 W Case operati
21、ng temperature range (TC) -55C to +125C 1.5 Radiation features. Maximum total dose available (dose rate = 9 rad(Si)/s): Device type 02 100 krad (Si) 2/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of
22、 this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 -
23、Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https
24、:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes prec
25、edence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect re
26、liability. 2/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition C, tested at 9 rad(Si)/s. Pro
27、vided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93193 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item per
28、formance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device cla
29、ss. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the devi
30、ce for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal con
31、nections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electri
32、cal test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of devices. Marking of devices shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in
33、 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality confo
34、rmance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made availa
35、ble to the preparing activity (DLA Land and Maritime-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime-VA shall affirm
36、 that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspe
37、ction. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordanc
38、e with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Mariti
39、me-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b.
40、 Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STA
41、NDARD MICROCIRCUIT DRAWING SIZE A 5962-93193 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ -55C TC+125C VIN= 28 V dc 0.5 V dc no external sync, CL= 0 unless otherwise specif
42、ied Group A subgroups Device types Limits Unit Min Max Output voltage VOUT IOUT= 2.17 A dc, (main) 1 01,02 +14.85 +15.15 V 2,3+14.55 +15.45P,L,R 1,2,3 02+14.10 +15.90IOUT= 2.17 A dc, (dual) 1 01,02 -14.77 -15.23 2,3-14.47 -15.53P,L,R 1,2,3 02-14.02 -15.90Output current 3/ IOUT VIN= 16 V, 28 V, and 4
43、0 V dc, sum of both outputs 1,2,3 01,02 0.0 4.34 A P,L,R 1,2,3 020.0 4.34VOUTripple voltage VRIPIOUT= 2.17 A, (main) B.W. = 10 kHz to 2 MHz 1 01,02 100 mVp-p 2,3150P,L,R 1,2,3 02175IOUT= 2.17 A, (dual) B.W. = 10 kHz to 2 MHz 1 01,02 100 2,3150P,L,R 1,2,3 02175VOUTline regulation VRLINEIOUT= 2.17 A,
44、(main) VIN =16 V dc to 40 V dc 1,2,3 01,02 50 mV P,L,R 1,2,3 02 100 IOUT= 2.17 A, (dual) VIN =16 V dc to 40 V dc 1,2,3 01,02 100 P,L,R 1,2,3 02 150 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT D
45、RAWING SIZE A 5962-93193 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55C TC+125C VIN= 28 V dc 0.5 V dc no external sync, CL= 0 unless otherwise specified Grou
46、p A subgroups Device types Limits Unit Min Max VOUTload regulation VRLOADIOUT= 0 to 2.17 A, (main) 1,2,3 01,02 50 mV P,L,R 1,2,3 02 100 IOUT= 0 to 2.17 A, (dual) 1,2,3 01,02 150 P,L,R 1,2,3 02 250 Input current IINIOUT= 0 A, Inhibit 1 (pin 4) = 0 1,2,3 01,02 14 mA P,L,R 1,2,3 0217IOUT= 0 A, Inhibit
47、2 (pin12) = 0 1,2,3 01,02 70 P,L,R 1,2,3 0290IOUT= 0 A, Inhibit 1 (pin 4) and inhibit 2 (pin 12) = open 1,2,3 01,02 100 P,L,R 1,2,3 02130IINripple current IRIPIOUT= 2.17 A, B.W. = 10 kHz to 10 MHz 1 01,02 45 mAp-p 2,3 01502,3 0280P,L,R 1,2,3 02120Efficiency Eff IOUT= 2.17 A 1 01 84 % 0282 2,3 0182 0
48、280 P,L,R 1,2,3 0279 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93193 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55C TC+125C VIN= 28 V dc 0.5 V dc no external sync, CL= 0
