1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update the boilerplate to current requirements as specified in MIL-PRF-38535. jak 07-05-30 Thomas M. Hess B Update boilerplate paragraphs to the current MIL-PRF-38535 requirements. - LTG 13-07-25 Thomas M. Hess REV SHEET REV B B SHEET 15 16 REV S
2、TATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Thanh V. Nguyen DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIE
3、S OF THE DEPARTMENT OF DEFENSE AMSC N/A CHECKED BY Thanh V. Nguyen APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, OCTAL BUS TRANSCEIVER WITH NONINVERTING THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON DRAWING APPROVAL DATE 94-04-26 REVISION LEVEL B SIZE
4、A CAGE CODE 67268 5962-94618 SHEET 1 OF 16 DSCC FORM 2233 APR 97 5962-E478-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94618 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSC
5、C FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN)
6、. When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 94618 01 Q R A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.
7、2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s)
8、identify the circuit function as follows: Device type Generic number Circuit function 01 54ABT623A Octal bus transceiver with noninverting three-state outputs, TTL compatible inputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level
9、as follows: Device class Device requirements documentation Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style R GDIP1-T20 or CDIP2-T20 20 Du
10、al-in-line S GDFP2-F20 or CDFP3-F20 20 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICR
11、OCIRCUIT DRAWING SIZE A 5962-94618 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range (I/O ports) (VIN) . -0.5 V dc to +5.5 V dc 4/ DC input vol
12、tage range (except I/O ports) (VIN) . -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) . -0.5 V dc to +5.5 V dc 4/ DC output current (IOL) (per output) . +96 mA DC input clamp current (IIK) (VIN= 0.0 V) -18 mA DC output clamp current (IOK) (VOUT= 0.0 V) -50 mA Storage temperature range (TSTG
13、) . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +175C Maximum power dissipation (PD) 500 mW 1.4 Recommended operating conditions. 2/ 3/ Supply voltage range (VCC) . +4.5 V dc to +5.5 V dc Input vo
14、ltage range (VIN) . +0.0 V dc to VCC Output voltage range (VOUT) +0.0 V dc to VCCMaximum low level input voltage (VIL). 0.8 V Minimum high level input voltage (VIH) 2.0 V Maximum high level output current (IOH) . -24 mA Maximum low level output current (IOL) . +48 mA Maximum input rise and fall rate
15、 (t/V) . 5 ns/V Case operating temperature range (TC) -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced
16、to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output negative voltage ratings may be exceeded provided that the input clamp current rating is observed. Provided by IHSNot for Resale
17、No reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94618 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The foll
18、owing specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing,
19、 General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcirc
20、uit Drawings. (Copies of these documents are available online at http:/quicksearch.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094). 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the refe
21、rences cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in
22、accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 3.2 Design, construction, and physical dimensions. The design, construction, an
23、d physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth ta
24、ble shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce waveforms and test circuit. The ground bounce waveforms and test circuit shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching w
25、aveforms and test circuit shall be as specified on figure 5. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply
26、 over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted withou
27、t license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94618 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For pa
28、ckages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance
29、 with MIL-PRF-38535. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufactu
30、rer in order to supply to the requirements of this drawing (see 6.6.1 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requ
31、irements of MIL-PRF-38535 and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 shall be provided with each lot of microcircuits delivered to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted
32、without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94618 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.
33、5 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max High level output voltage 3006 VOHFor all inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.8 V IOH= -3 mA 4.5 V 1, 2, 3 2.5 V 5.0 V 1, 2, 3 3.0 V IOH= -24 mA 4.5 V 1, 2, 3 2.0 V Low level output voltage
34、 3007 VOLFor all inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.8 V IOL= +48 mA 4.5 V 1, 2, 3 0.55 V Negative input clamp voltage 3022 VIC-For input under test IIN= -18 mA 4.5 V 1, 2, 3 -1.2 V Input current high 3010 IIH4/ For input under test VIN= VCCControl inputs 5.5 V 1, 2, 3 1.0 A
35、 A or B ports 100.0 Input current low 3009 IIL4/ For input under test VIN= GND Control inputs 5.5 V 1, 2, 3 -1.0 A A or B ports -100.0 Three-state output leakage current high 3021 IOZH5/ 6/ For control inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.8 V VOUT= 2.7 V 5.5 V 1, 2, 3 10.0 A
36、Three-state output leakage current low 3020 IOZL5/ 6/ For control inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.8 V VOUT= 0.5 V 5.5 V 1, 2, 3 -10.0 A Off-state leakage current IOFFFor input or output under test VIN= VOUT= 4.5 V All other pins at 0.0 V 0.0 V 1 100 A High-state leakage
37、current ICEXFor output under test VOUT= 5.5 V Outputs at high logic state 5.5 V 1, 2, 3 50 A Output current 3011 IO7/ VOUT= 2.5 V 5.5 V 1, 2, 3 -50 -180 mA Quiescent supply current delta, TTL input level ICC8/ For input under test VIN= 3.4 V For all other inputs VIN= VCCor GND Data inputs, outputs e
38、nabled 5.5 V 1, 2, 3 1.5 mA Data inputs, outputs disabled 5.5 V 1, 2, 3 50 A Control inputs 5.5 V 1, 2, 3 1.5 mA Quiescent supply current, output high 3005 ICCHFor all inputs, VIN= VCCor GND IOUT= 0 A A or B ports 5.5 V 1, 2, 3 250 A Quiescent supply current, output low 3005 ICCL5.5 V 1, 2, 3 30 mA
39、Quiescent supply current, output disabled 3005 ICCZ5.5 V 1, 2, 3 250 A Input capacitance 3012 CINTC= +25C See 4.4.1b Control inputs 5.0 V 4 8.5 pF I/O capacitance 3012 CI/OA or B ports 5.0 V 4 17.5 pF See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted
40、 without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94618 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C T
41、C +125C +4.5 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max Low level ground bounce noise VOLP9/ VIH= 3.0 V, VIL= 0.0 V TA= +25C See figure 4 See 4.4.1d 5.0 V 4 1100 mV VOLV9/ 5.0 V 4 -1450 mV High level VCCbounce noise VOHP9/ 5.0 V 4 1500 mV VOHV9/ 5.0 V 4 -400
42、mV Functional tests 3014 10/ VIL= 0.8 V, VIH= 2.0 V Verify output VOSee 4.4.1c 4.5 V 7, 8 L H 5.5 V 7, 8 L H Propagation delay time, An to Bn or Bn to An 3003 tPLH11/ CL= 50 pF minimum RL= 500 See figure 5 5.0 V 9 1.0 3.4 ns 4.5 V and 5.5 V 10, 11 1.0 4.0 tPHL11/ CL= 50 pF minimum RL= 500 See figure
43、 5 5.0 V 9 1.0 3.4 ns 4.5 V and 5.5 V 10, 11 0.8 4.1 Propagation delay time, output enable, OEBA to An 3003 tPZH111/ CL= 50 pF minimum RL= 500 See figure 5 5.0 V 9 1.5 4.4 ns 4.5 V and 5.5 V 10, 11 1.2 5.4 tPZL111/ CL= 50 pF minimum RL= 500 See figure 5 5.0 V 9 1.5 5.8 ns 4.5 V and 5.5 V 10, 11 1.5
44、6.8 Propagation delay time, output enable, OEAB to Bn 3003 tPZH211/ CL= 50 pF minimum RL= 500 See figure 5 5.0 V 9 1.7 5.9 ns 4.5 V and 5.5 V 10, 11 1.2 6.8 tPZL211/ CL= 50 pF minimum RL= 500 See figure 5 5.0 V 9 1.7 5.6 ns 4.5 V and 5.5 V 10, 11 1.7 6.5 Propagation delay time, output disable, OEBA
45、to An 3003 tPHZ111/ CL= 50 pF minimum RL= 500 See figure 5 5.0 V 9 1.7 5.4 ns 4.5 V and 5.5 V 10, 11 1.7 7.1 tPLZ111/ CL= 50 pF minimum RL= 500 See figure 5 5.0 V 9 1.7 5.9 ns 4.5 V and 5.5 V 10, 11 1.5 7.1 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking per
46、mitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94618 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/
47、-55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max Propagation delay time, output disable, OEAB to Bn 3003 tPHZ211/ CL= 50 pF minimum RL= 500 See figure 5 5.0 V 9 1.5 5.6 ns 4.5 V and 5.5 V 10, 11 1.5 6.8 tPLZ211/ CL= 50 pF minimum RL= 500 See figu
48、re 5 5.0 V 9 1.3 5.2 ns 4.5 V and 5.5 V 10, 11 1.3 5.8 1/ For tests not listed in the referenced MIL-STD-883 (e.g. ICC), utilize the general test procedure under the conditions listed herein. All inputs and outputs shall be tested, as applicable, to the tests in table I herein. 2/ Each input/output, as applicable, shall be tested at the specified temperature, for the specified limits, to the tests in table I herein. Output terminals not designated shall be high level logic, low level logic, or open, except for all ICCand ICCte
