1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Correct VCC and VIH values for ground bounce noise tests. - cfs 97-04-24 Monica L. Poelking B Change the device name to reflect the Bus Hold feature, and adjust limits to characterize the performance of the optimized die. Editorial changes throug
2、hout. - cfs 98-06-11 Thomas M. Hess C Add ESDS paragraph 4.3.1. - cfs 98-06-25 Monica L. Poelking D Update boilerplate to MIL-PRF-38535 requirements. - LTG 07-06-21 Thomas M. Hess REV SHET REV D D D D SHEET 15 16 17 18 REV STATUS REV D D D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 1
3、1 12 13 14 PMIC N/A PREPARED BY Thomas M. Hess DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Thomas M. Hess COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking AND AGENCIES OF THE DEPARTMENT OF
4、 DEFENSE DRAWING APPROVAL DATE 95-11-09 MICROCIRCUIT, DIGITAL, ADVANCED BICMOS, 3.3 VOLT OCTAL TRANSPARENT D-TYPE LATCH WITH BUS HOLD, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-95831 SHEET 1 OF 18 DSCC FORM 2233 APR 97 5962-E
5、422-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95831 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents
6、two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assur
7、ance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 95831 01 Q R A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing num
8、ber 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA design
9、ator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54LVTH573 3.3 V ABT octal transparent D-type latch with bus hold, three-state outputs, TTL compatible inputs 1.2.3 Device cla
10、ss designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-3
11、8535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style R GDIP1-T20 20 Dual-in-line S GDFP2-F20 20 Flat pack 2 CQCC1-N20 20 Squa
12、re leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZ
13、E A 5962-95831 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +4.6 V dc DC input voltage range (VIN) -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) . -0.5
14、 V dc to +7.0 V dc 4/ DC output current (IOL) (per output) +96 mA DC output current (IOH) (per output). +48 mA DC input clamp current (IIK) (VIN 0.0 V) -50 mA DC output clamp current (IOK) (VOUT 0.0 V) -50 mA Maximum power dissipation (PD). 0.261 W 5/ Storage temperature range (TSTG). -65C to +150C
15、Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC). See MIL-STD-1835 Junction temperature (TJ) +175C 1.4 Recommended operating conditions. 2/ 3/ Supply voltage range (VCC) +2.7 V dc to +3.6 V dc Minimum high level input voltage (VIH). +2.0 V dc Maximum low level
16、 input voltage (VIL) +0.8 V dc Maximum input voltage (VIN) +5.5 V dc Maximum high level output current (IOH) -24 mA Maximum low level output current (IOL) +48 mA Maximum input rise or fall rate (t/v) (Outputs enabled) 10 ns/V Case operating temperature range (TC). -55C to +125C 2. APPLICABLE DOCUMEN
17、TS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENS
18、E SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List o
19、f Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 1
20、9111-5094.) 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herei
21、n shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output negative voltage ratings may be exceeded provided that the input and output clamp current ratings are observed. 5/ Power dissipation values are derived using the formula PD= VCCICC+ nV
22、OLIOL, where VCCand IOLare as specified in 1.4 above, ICCand VOLare as specified in table I herein, and n represents the total number of outputs. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95831 DEFENSE
23、SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersed
24、es applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Ma
25、nagement (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, constr
26、uction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 her
27、ein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce load circuit and waveforms. The ground boun
28、ce load circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein,
29、 the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
30、 tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the
31、option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certific
32、ation/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of c
33、ompliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
34、 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of
35、MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification o
36、f change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and t
37、he acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this draw
38、ing shall be in microcircuit group number 129 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95831 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D S
39、HEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.7 V VCC +3.6 V unless otherwise specified Device type VCCGroup A subgroups Limits 3/ Unit Min Max Negative input clamp voltage 3022 VIK-For inp
40、ut under test IIN= -18 mA All 2.7 V 1, 2, 3 -1.2 V High level output voltage 3006 VOH1For all inputs affecting outputs under test VIN= 2.0 V or 0.8 V IOH= -100 A All 2.7 V and 3.6 V 1, 2, 3 VCC-0.2 V VOH2For all inputs affecting outputs under test VIN= 2.0 V or 0.8 V IOH= -8 mA All 2.7 V 1, 2, 3 2.4
41、 VOH3For all inputs affecting outputs under test VIN= 2.0 V or 0.8 V IOH= -24 mA All 2.7 V and 3.6 V 1, 2, 3 2.0 Low level output voltage 3007 VOL1For all inputs affecting outputs under test VIN= 2.0 V or 0.8 V IOL= 100 A All 2.7 V 1, 2, 3 0.2 V VOL2For all inputs affecting outputs under test VIN= 2
42、.0 V or 0.8 V IOL= 24 mA All 2.7 V 1, 2, 3 0.5 VOL3For all inputs affecting outputs under test VIN= 2.0 V or 0.8 V IOL= 16 mA All 3.0 V 1, 2, 3 0.4 VOL4For all inputs affecting outputs under test VIN= 2.0 V or 0.8 V IOL= 32 mA All 3.0 V 1, 2, 3 0.5 VOL5For all inputs affecting outputs under test VIN
43、= 2.0 V or 0.8 V IOL= 48 mA All 3.0 V 1, 2, 3 0.55 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95831 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL
44、D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.7 V VCC +3.6 V unless otherwise specified Device type VCCGroup A subgroups Limits 3/ Unit Min Max Input current IIN1 4/ Input pi
45、ns For input under test VIN= 5.5 V All 0.0 V and 3.6 V 1, 2, 3 10.0 A IIN2 4/ Control pins For input under test VIN= VCCor GND All 3.6 V 1, 2, 3 1.0 IIN3 4/ Data inputs For input under test VIN= VCCAll 3.6 V 1, 2, 3 1.0 IIN4 4/ Data inputs For input under test VIN= 0.0 V All 3.6 V 1, 2, 3 -5.0 Input
46、 bus hold current IholdData inputs VIN= 0.8 V All 3.0 V 1, 2, 3 75.0 A IholdData inputs VIN= 2.0 V All 3.0 V 1, 2, 3 -75.0 Three-state output leakage current high 3021 IOZH 5/ 6/ VOUT= 3.0 V All 3.6 V 1, 2, 3 5.0 A Three-state output leakage current low 3020 IOZL 5/ 6/ VOUT= 0.5 V All 3.6 V 1, 2, 3
47、-5.0 A Three-state output leakage current power-up 3020 IOZPU 5/ 6/ VOUT= 0.5 V to 3.0 V OE = 0.0 V All 0.0 V and 1.5 V 1, 2, 3 100.0A Three-state output leakage current power-down 3020 IOZPD 5/ 6/ VOUT= 0.5 V to 3.0 V OE = 0.0 V All 0.0 V and 1.5 V 1, 2, 3 100.0A See footnotes at end of table. Prov
48、ided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95831 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.7 V VCC +3.6 V unless otherwise specified Device type VCCGroup A subgroups Limits 3/ Unit Min Max Quiescent supply current output high 3005 ICCHVIN= VCCor GND IOUT= 0.0 A All 3.
