1、 EIA STANDARD TP-17C Temperature Life With or Without Electrical Load Test Procedure for Electrical Connectors and Sockets EIA-364-17C (Revision of EIA-364-17B) November 2011 Electronic Components Industry Association EIA-364-17C ANSI/EIA-364-17C-2011 (R2017) Approved: August 11, 2011 Reaffirmed: Fe
2、bruary 10, 2017 NOTICE EIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining
3、with minimum delay the proper product for his particular need. Existence of such Specifications and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Specifications and Publications, nor shall the existence of
4、 such Specifications and Publications preclude their voluntary use by those other than ECIA members, whether the Specification is to be used either domestically or internationally. Specifications and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI)
5、 patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Specification or Publication. This EIA Specification is considered to have International Standardization implications, but the International Elec
6、trotechnical Commission activity has not progressed to the point where a valid comparison between the EIA Specification and the IEC document can be made. This Specification does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the re
7、sponsibility of the user of this Specification to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use. (From Standards Proposal No. 5382.02, formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and
8、 Sockets Standards) Published by Electronic Components Industry Association 2017 EIA Standards & Technology Department 2214 Rock Hill Road, Suite 265 Herndon, VA 20170 PLEASE ! DONT VIOLATE THE LAW! This document is copyrighted by the ECIA and may not be reproduced without permission. Organizations
9、may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, contact: IHS 15 Inverness Way East Englewood, CO 80112-5704 or call USA and Canada (1-800-854-7179), International (303-397-7956) i CONTENTS Clause Page 1 Introduction . 1 1.1 Sc
10、ope . 1 1.2 Atmospheric pressure 1 2 Test resources 1 2.1 Equipment . 1 3 Test specimen 2 3.1 Description 2 3.2 Preparation 2 4 Test procedure . 2 4.1 Method A, without electrical load 2 4.2 Method B, with electrical load for connectors (superseded by method C) . 3 4.3 Method C, with electrical load
11、 3 4.4 Examination 4 5 Details to be specified . 4 6 Test documentation . 5 Table 1 Test chamber temperature without electrical load 2 2 Test time condition (duration) 3 ii (This page left blank) EIA-364-17C Page 1 TEST PROCEDURE No. 17C TEMPERATURE LIFE WITH OR WITHOUT ELECTRICAL LOAD TEST PROCEDUR
12、E FOR ELECTRICAL CONNECTORS AND SOCKETS (From EIA Standards Proposal No. 5156, formulated under the cognizance EIA CE-2.0 Committee on National Connector Standards, and previously published in EIA 364-17B.) 1 Introduction 1.1 Scope This standard establishes a test method to determine the ability of
13、an electrical connector and sockets to withstand elevated temperatures with or without electrical loading. 1.2 Atmospheric pressure This procedure for elevated temperature is performed at ambient (sea level) pressure. High altitude and space vacuum applications may require testing at reduced pressur
14、e as required by the referencing document. 2 Test resources 2.1 Equipment 2.1.1 Test Chamber (Applicable to all methods). A suitable air circulating chamber and equipment shall be used that will maintain, monitor and record the test temperature to the tolerance and for the duration specified in the
15、referencing document. The chamber size or capacity shall be such that the specimen under test shall be capable of dissipating the internally generated (I2R) specimen heat. 2.1.2 Current source (Applicable to Method C only) 2.1.3 Temperature monitoring equipment (Applicable to Method C only) EIA-364-
16、17C Page 2 3 Test specimen 3.1 Description The specimen shall consist of a fully assembled, mated with the specified number of contacts. Proper wire type, size, and preparation, sealing plugs, other hardware, and test boards shall be as specified in the referencing document. 3.2 Preparation 3.2.1 Un
17、less otherwise specified in the referencing document, the specimens, test boards, wires, and fixtures shall be normally positioned in the chamber so that there will be no restriction of the air flow. Unless otherwise specified in the referencing document, the specimens shall have the same size conta
18、cts wired in a series circuit when under electrical load. 3.2.2 For Method C, the test specimens shall be suitably fitted with temperature sensing device(s), wired and mounted as specified in the referencing document. See EIA-364-70 for further instructions on spacing requirements. 4 Test procedure
19、4.1 Method A, without electrical load The specimen shall be subjected to the chamber temperature, see table 1, and test duration, see table 2, as specified in the referencing document. Table 1 - Test chamber temperature conditions without electrical load Test condition Test chamber temperature (Maxi
20、mum operating temperature) C F 1 55 2 131 3.6 2 70 2 158 3.6 3 85 2 185 3.6 4 105 2 221 3.6 5 125 2 257 3.6 6 175 5 347 9 7 200 5 392 9 8 350 tolerance as specified 662 tolerance as specified 9 500 tolerance as specified 932 tolerance as specified 10 150 5 302 9 11 65 2 149 3.6 EIA-364-17C Page 3 4.
21、1.1 Test duration The duration shall be as specified in the referencing document, see table 2. Table 2 Test time condition (duration) Test time condition Hours A 96 B 250 C 500 D 1000 E 1500 F 2000 G 3000 H 5000 NOTE - Commonly used test durations for specimens are 250 hours, 500 hours, 1000 hours,
22、and 2000 hours. 4.2 Method B, with electrical load for connectors (superseded by method C) 4.3 Method C, with electrical load 4.3.1 The prepared specimen shall be placed in a chamber. The chamber temperature shall be set at 70% of the temperature selected from table 1. 4.3.2 Current shall be applied
23、 to all designated contacts and shall be increased until either the rated current of the contact or 100% of the temperature selected from table 1 has been reached by the specimen, whichever occurs first. 4.3.3 If the rated current is reached first, the temperature of the specimen shall be recorded.
24、The chamber temperature shall then be increased until the test temperature is reached by the specimen. The chamber temperature and the specimen temperature shall be recorded. The test shall then be performed with the rated current and test temperature as established for the duration chosen. 4.3.4 If
25、 the test temperature is reached prior to the rated current, the current shall be recorded. The chamber temperature and the specimen temperature shall be recorded. The test shall then be performed with the rated current and test temperature as established for the duration chosen. 4.3.4.1 If the spec
26、imen temperature exceeds the specified test temperature by 5% or more, the test sponsor shall be notified prior to continuing the test for further interpretation. EIA-364-17C Page 4 4.4 Examination Upon completion of the exposure, subsequent examinations or measurements shall be performed as specifi
27、ed in the referencing document. They may assess the following potential problem areas. Dimensional changes in excess of specified limits. Hardening or softening of dielectric materials in excess of specified limits. Opening of seals. Cracking or crazing or delamination of components or finishes. Fus
28、ing or seizure of mating specimens or components. Leakage of potting materials, as specified. Contact surface oxidation. Intermetallic growth. Contact stress relaxation. 5 Details to be specified The following details shall be specified in the referencing document: 5.1 Test method letter and conditi
29、on number, and temperature tolerance if applicable 5.2 Location of temperature sensing device(s), when applicable 5.3 Specimen description 5.4 Number of specimens to be tested 5.5 Length of test 5.6 Rated current and maximum operation temperature, method C only EIA-364-17C Page 5 6 Test documentatio
30、n Documentation shall contain the details specified in clause 5, with any exceptions, and the following: 6.1 Title of test 6.2 Test equipment used, and date of last and next calibration 6.3 Test procedure 6.4 Values and observations 6.4.1 Visual examination 6.4.2 Monitoring measurements as required
31、by the referencing document 6.4.3 Current required to maintain the specified internal temperature, method C only 6.5 Name of operator and start/finish date(s) of test EIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety, health or
32、technical reasons, please fill in the appropriate information below and mail or FAX to: Electronic Industries Alliance Technology Strategy & Standards Department Publications Office 2500 Wilson Blvd. Arlington, VA 22201 FAX: (703-875-8906) Document No.: Document Title: Submitters Name: Telephone No.
33、: FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: .Additional Remarks: Signature: Date: FOR EIA USE ONLY Responsible Committee: Chairman: Date comments forwarded
34、to Committee Chairman: Revision History Revision letter Project number Additions, changes and deletions C SP-5156 General revision. Superseded method B by method C. Electronic Components Industry Association 2214 Rock Hill Road, Suite 265 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.ecianow.org
