1、 EIA STANDARD TP-25D PROBE DAMAGE TEST PROCEDURE FOR ELECTRICAL CONNECTORS EIA-364-25D (Revision of EIA-364-25C) NOVEMBER 2010 EIA Standards Electronic Components Association ANSI/EIA-364-25D-2010 Approved: November 18, 2010 EIA-364-25DNOTICE EIA Engineering Standards and Publications are designed t
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3、 Standards and Publications shall not in any respect preclude any member or nonmember of EIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than EIA membe
4、rs, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by EIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, EIA does not assume any liability to any patent owner, nor does it assume an
5、y obligation whatever to parties adopting the Standard or Publication. This standard is based upon the major technical content of International Electrotechnical Commission standard 512-8, test 16a, probe damage, 1993-01. There are known differences between this standard and the IEC standard. This St
6、andard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its
7、 use. (From Standards Proposal No. 5200-A-1 formulated under the cognizance of the CE-2.0 National Connector and Socket Standards Committee) Published by: ELECTRONIC COMPONENTS ASSOCIATION 2010 EIA Standards and Technology Department 2500 Wilson Boulevard Suite 310 Arlington, VA 22201 PRICE: Please
8、call: Global Engineering Documents, USA and Canada (1-800-854-7179) http:/ All rights reserved Printed in U.S.A. PLEASE ! DONT VIOLATE THE LAW! This document is copyrighted by the EIA and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of c
9、opies through entering into a license agreement. For information, contact: Global Engineering Documents 15 Inverness Way East Englewood, CO 80112-5704 or call USA and Canada (1-800-854-7179), International (303-397-7956) i CONTENTS Clause Page 1 Introduction . 1 1.1 Scope . 1 2 Test resources 1 2.1
10、Equipment . 1 3 Test specimen 1 3.1 Description 1 3.2 Preparation 2 4 Test procedure . 2 5 Details to be specified . 2 6 Test documentation . 3 Figure 1 Test probe fixture 4 2 Collet type holding device for contacts tested outside the connector . 5 3 Apparatus for testing nonremovable socket contact
11、s within the connector 6 ii (This page left blank) EIA-364-25D Page 1 1 TEST PROCEDURE No. 25D PROBE DAMAGE TEST PROCEDURE FOR ELECTRICAL CONNECTORS (From EIA Standards Proposal No. 5200, formulated under the cognizance EIA CE-2.0 Committee on National Connector Standards, and was previously publish
12、ed in EIA-364 as TP-25C.) 1 Introduction 1.1 Scope This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts as well. This test is to simulate a form of field a
13、buse of contacts during test by inserting probes into socket contacts. The purpose of this test is as follows: to simulate probing of socket contacts while installed in the connector for non-removable contacts and for removable contacts while outside of the connector housing; to verify performance c
14、haracteristics of the socket contacts have not been adversely impacted as may be specified in the referencing document (i.e. engagement and separation forces). 2 Test resources 2.1 Equipment The equipment required to perform the test shall be a probe damage tool similar to that shown in figure 1 and
15、 mounting fixtures similar to that shown in figures 2 and 3. The test pin shall be as shown in figure 1 and shall be of hardened steel or tungsten carbide and have a polished surface containing a 0.15 micrometer (6 microinches) to 0.25 micrometer (10 microinches) finish. 3 Test specimen 3.1 Descript
16、ion 3.1.1 The specimen shall consist of one socket contact assembled in its connector housing for non-removable contacts or the socket contact only for contacts that are removable from the connector housing, unless otherwise specified in the referencing document. 3.1.2 The specimen may be wired as r
17、equired by the referencing document. 3.1.3 Wires required for other tests may be terminated to the contacts. EIA-364-25D Page 2 2 3.2 Preparation 3.2.1 Crimp or other removable contacts shall use a suitable collet type holding device, as shown in figure 2, unless otherwise specified in the referenci
18、ng document. Non-removable socket contacts shall be tested in their connector housing, as shown in figure 3. 3.2.2 The collet type holding device shall not support the contact in any way that interferes with the free rotation of the test probe fixture. The collet device shall grip the contact on the
19、 contact crimp barrel, or the termination end of the contact (e.g. wrap-type terminations, solder-tail, compliant pin, etc.) with the contact shoulder flush against the collet device. The collet shall not interfere with the socket spring member under test. 4 Test procedure 4.1 The connector or the c
20、ollet device with the socket contacts fixed in place shall be mounted in a horizontal position to a rotating fixture to allow 360 hand rotation during test; see figures 2 and 3. 4.2 The probe damage tool, see figure 1, shall be inserted into the contact to a “B” dimension depth as illustrated in fig
21、ure 1. The “B” dimension shall be both 1/2 and 3/4 of socket bore minimum depth specified in the referencing document. The amount the socket contact is recessed from the front of the housing shall be added to probe length “B” when a connector holding device is used. Unless otherwise specified in the
22、 referencing document the tolerance on the “B” dimension shall be minus 0 millimeter (0 inch) plus 0.127 millimeter (0.005 inch). 4.3 When the test setup is in conformance with 4.2.1 and 4.2.2 the fixture shall be slowly rotated once through 360 at a uniform rate of no less than a 5 second rotation
23、and no more than a 15 second rotation, unless otherwise specified in the referencing document, with the probe damage tool inserted in the contact so that the force is applied uniformly to the inside diameter of the socket. The test shall be repeated so that both insertion depths (i.e., 1/2 and 3/4)
24、are tested. 5 Details to be specified The following details shall be specified in the referencing document: 5.1 Initial and final examination or measurement 5.2 Mounting of specimen, see clause 4. The collet device shall be defined in the referencing document 5.3 Number and size of samples to be tes
25、ted 5.4 Probe depth dimension 5.5 Number of 360 rotations indicated in 4.2.3 if other than one EIA-364-25D Page 3 3 6 Test documentation Documentation shall contain the details specified in clause 5, with any exceptions, and the following: 6.1 Title of test 6.2 Sample description, including fixturin
26、g 6.3 Test equipment used, and date of last and next calibration 6.4 Test procedure 6.5 Values and observations 6.6 Name of operator and start/finish date(s) of test EIA-364-25D Page 4 4 Contact size Diameter, A (1 0.13) millimeter (1 0.0005) inch Moment 10% meter-newton (inch-pound) 4/0 12.70 (0.50
27、0) 0.904 (8) 2/0 10.31 (0.406) 0.904 (8) 0 9.07 (0.357) 0.904 (8) 2 7.19 (0.283) 0.452 (4) 4 5.72 (0.225) 0.452 (4) 6 4.52 (0.178) 0.452 (4) 8 3.61 (0.142) 0.452 (4) 10 3.18 (0.125) 0.226 (2) 12 2.39 (0.094) 0.226 (2) 16 1.588 (0.0625) 0.226 (2) 20 1.02 (0.040) 0.056 (0.5) 22 0.76 (0.030) 0.014 (0.1
28、25) 23 0.69 (0.027) 0.014 (0.125) 24 0.64 (0.025) 0.014 (0.125) NOTES 1 Fulcrum point for calculating moment, centimeter-kilogram (inch-pound) 2 The values for distances and weight may vary. The product of the weight and distance shall be equal to the moment specified above. 3 The weight and its sha
29、pe may vary. Figure 1 - Test probe fixture EIA-364-25D Page 5 5 NOTE Collet to be mounted in device similar to lathe chuck. Capable of quick engage and release. Figure 2 Collet type holding device for contacts tested outside the connector Tool butts against contact rear shoulder Probe damage tool Pr
30、obe damage tool Socket contact Collet Socket contact Collet Contact before test Contact under test EIA-364-25D Page 6 6 Figure 3 - Apparatus for testing nonremovable socket contacts within the connector Connector mounting fixture Bearing mounted rotating device Contact wire Connector under test Tool
31、 rests against insert face Test probe fixture EIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety, health or technical reasons, please fill in the appropriate information below and mail or FAX to: Electronic Industries Alliance Te
32、chnology Strategy & Standards Department Publications Office 2500 Wilson Blvd. Arlington, VA 22201 FAX: (703-875-8906) Document No.: Document Title: Submitters Name: Telephone No.: FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revision: Problem Area: a. Clause Number and /or Drawin
33、g: b. Recommended Changes: c. Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR EIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Revision History Revision letter Project number Additions, changes and deletions D SP-5200 Revised paragraph 1.1, 2.1, 3.1.1, 3.2, 4.2, and 4.3, 5.1, 5.4, 6.6 and figure 2. Delete paragraph 4.1 and 4.3. 2 Electronic Components Association 2500 Wilson Boulevard, Suite 310 * Arlington, VA 22201 * tel 703-907-8021 * fax 703-875-8908 www.ecaus.org
