1、BRITISH STANDARD BS EN 60947-5-4:2003 Low-voltage switchgear and controlgear Part 5-4: Control circuit devices and switching elements Method of assessing the performance of low-energy contacts Special tests The European Standard EN 60947-5-4:2003 has the status of a British Standard ICS 29.130.20 BS
2、 EN 60947-5-4:2003 This British Standard was published under the authority of the Standards Policy and Strategy Committee on 18 December 2003 BSI 18 December 2003 ISBN 0 580 43145 2 National foreword This British Standard is the official English language version of EN 60947-5-4:2003. It is identical
3、 with IEC 60947-5-4:2002. It supersedes BS EN 60947-5-4:1997 which is withdrawn. The UK participation in its preparation was entrusted by Technical Committee PEL/17, Switchgear, controlgear and HV-LV co-ordination, to Subcommittee PEL/17/2, Low-voltage switchgear and controlgear, which has the respo
4、nsibility to: A list of organizations represented on this subcommittee can be obtained on request to its secretary. Cross-references The British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the section entitled
5、“International Standards Correspondence Index”, or by using the “Search” facility of the BSI Electronic Catalogue or of British Standards Online. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance wit
6、h a British Standard does not of itself confer immunity from legal obligations. aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related internat
7、ional and European developments and promulgate them in the UK. Summary of pages This document comprises a front cover, an inside front cover, the EN title page, pages 2 to 25 and a back cover. The BSI copyright notice displayed in this document indicates when the document was last issued. Amendments
8、 issued since publication Amd. No. Date CommentsEUROPEAN STANDARD EN 60947-5-4 NORME EUROPENNE EUROPISCHE NORM December 2003 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secret
9、ariat: rue de Stassart 35, B - 1050 Brussels 2003 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60947-5-4:2003 E ICS 29.130.20 Supersedes EN 60947-5-4:1997English version Low-voltage switchgear and controlgear Part 5-4: Control
10、circuit devices and switching elements - Method of assessing the performance of low-energy contacts - Special tests (IEC 60947-5-4:2002) Appareillage basse tension Partie 5-4: Appareils et lments de commutation pour circuits de commande - Mthode dvaluation des performances des contacts basse nergie
11、- Essais spciaux (CEI 60947-5-4:2002) Niederspannungsschaltgerte Teil 5-4: Steuergerte und Schaltelemente - Verfahren zur Abschtzung der Leistungsfhigkeit von Schwachstromkontakten - Besondere Prfungen (IEC 60947-5-4:2002) This European Standard was approved by CENELEC on 2003-12-01. CENELEC members
12、 are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application
13、to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has
14、the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Lithuania, Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Swede
15、n, Switzerland and United Kingdom. EN 64907-5-4:0230 - - 2 Foreword The text of the International Standard IEC 60947-5-4:2002, prepared by SC 17B, Low-voltage switchgear and controlgear, of IEC TC 17, Switchgear and controlgear, was submitted to the Unique Acceptance Procedure and was approved by CE
16、NELEC as EN 60947-5-4 on 2003-12-01. This European Standard supersedes EN 60947-5-4:1997. The following dates were fixed: - latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2004-12-01 - latest date by which t
17、he national standards conflicting with the EN have to be withdrawn (dow) 2006-12-01 Annexes designated “normative“ are part of the body of the standard. In this standard, Annexes A and ZA are normative. Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard I
18、EC 60947-5-4:2002 was approved by CENELEC as a European Standard without any modification. _ Page2 EN6094754:2003069-74-54 IEC:2002 3 CONTENTS INTRODUCTION.4 1 Scope and object5 2 Normative references.5 3 Definitions and list of symbols used6 3.1 Definitions.6 3.2 List of symbols used8 4 General pri
19、nciples9 5 General test method.10 6 General characteristics.11 6.1 Measurement methods11 6.2 Sequences of operations.12 6.3 Electrical characteristics14 6.4 Characteristics of operation.15 7 Characterization of defects.16 7.1 Basic method16 7.2 Monitoring the load (figure 3) 16 8 Ambient conditions
20、.16 8.1 Normal conditions.16 8.2 Preconditioning .17 8.3 Particular conditions17 9 Methods of reporting17 9.1 Failure criterion.17 9.2 Reporting the failure rate.17 10 Information to be provided in the test report .19 Annex A (normative) Information to be supplied by the manufacturer.21 Bibliorgaphy
21、 42Fiugre1 F ucntinoal diagramo f thet estin gequipmtne 01 Fiugre2 T ypicalt estc ircuitf or theb asicm ethdo . 11 Fiugre3 T estc irciuf torm ointoring a loda 21 Fiugre 4 S equentail diagramw ihtl oad-siwcthignc ontcast 31 Fiugre5 Sequentaild iagram wihtoutl oda-sctiwhignc ontcast. 41TableoC 1 eiffc
22、ine tK cfort a ime-terminated test 02Page3 EN6094754:2003 60947-5-4 IEC:2002 3 TNOCENTS INTRODTCUOIN. 41 Scpoa endjbo cet.5. 2 roNmtaiv e referecnse. 5 3 feDiniitonsa ndsil tofs ymslob used 6 3.1feD iniitons.6 3.2 Listo fs ymbolsu sed 8 4 Gerenal principlse.9. 5 Gerenal sett methdo. 01 6 Gerenal chr
23、acateristcis. 11 6.1M esarumetne mehtods 11 6.2S equcnese of opretaiosn. 21 6.3E lcertcila chracaretistcis 41 6.4C hracateristcis of opreation. 51 7 Chracaterization of defects. 61 7.1B asic method 61 7.2 Monitorignt h eload( figur e3) 61 8 Amibent conditoisn .61 8.1roN mal conditions. 61 8.P 2recid
24、nooitnnig . 71 8.P 3articluar idnocoitns 71 9 Methods of reropting 71 9.1F ailrue critreoin. 71 9.2 Reportingt hf eailurer ate. 71 10 fnIormtaio ntob ep rovided in thet estr eport . 91AnnexA (nromative) Informtaoit no bes uppleidb y them anufactrure. 12Bibliography25 Figure 1 Functional diagram of t
25、he testing equipment 10 Figure 2 Typical test circuit for the basic method .11 Figure 3 Test circuit for monitoring a load 12 Figure 4 Sequential diagram with load-switching contacts13 Figure 5 Sequential diagram without load-switching contacts.14 Table 1 Coefficient K cfor a time-terminated test20
26、Pa3eg E3002:4574906N 069-74-54 IEC:2020 3 TNOCENTS FOREWODR. 5 TNIRODTCUOIN. 91 Scpo e and jbocet1 1 2 roNmtaiv e referecnse. 11 3 feDiniitosna ndsil tofs ymslob used 31 3.1feD iniitons. 31 3.2 Listo fs ymbolsu sed 71 4 Gerenal principlse1 9 5 Gerenal set t methdo. 12 6 Gerenal chracateristcis. 32 6
27、.1M esarumetne mehtods 32 6.2S equcnese of opretaiosn. 52 6.3E lcertcila chracaretiscits 92 6.4C hracateristcis of opreaiton. 13 7 Chracaterization of defecst. 33 7.1B asic method 33 7.2 Monitorignt h eload( figur e3) 33 8 Amibent conditoisn .33 8.1roN mal conditions. 33 8.P 2recidnooitnnig . 53 8.P
28、 3articluar idnocoitns 53 9 Methods of reropting 53 9.1F ailrue critreoin. 53 9.2 Reportingt hf eailurer ate. 53 10 fnIormtaio ntob ep rovided in thet estr eport . 93AnnexA (nromative) Informtaoit no bes uppleidb y them anufactrure. 34 Annex ZA (normative) Normative references to international publi
29、cations with their corresponding European publications .24 Bibliorgaphy 94Fiugre1 F ucntinoal diagramo f thet estin gequipmtne 12 Fiugre2 T ypicalt esc tircuitf or theb asicm ethdo . 32 Fiugre3 T estc irciuf torm ointoring a loda 52 Fiugre 4 S equentail diagramw ihtl oad-siwcthignc ontcast 72 Fiugre
30、5 Sequentaild iagram wihtoutl oda-sctiwhignc oncatst. 92TableoC 1 eiffcine tK cfort a ime-etrminated test 14069-74-54 IEC:2002 4 INTRODUCTION Control switches may not be suitable for use at very low voltages and therefore it is recommended to seek the advice of the manufacturer concerning any applic
31、ation with a low value of operational voltage, for example, below 100 V a.c. or d.c. (see IEC 60947-5-1, note 2 of 4.3.1.1). However, the development of electronic systems and programmable controllers in industrial processes increases the use of switching elements in low-voltage circuit control. It
32、is thus necessary to define how predictional behaviour of contacts in this area should be established (with an acceptable confidence level), by using precise conventional testing methods, down to specified values (such as 24 V, 1 mA; 5 V, 10 mA). Page4 EN6094754:2003069-74-54 IEC:2002 5 LOW-VOLTAGE
33、SWITCHGEAR AND CONTROLGEAR Part 5-4: Control circuit devices and switching elements Method of assessing the performance of low-energy contacts Special tests 1 Scope and object This part of IEC 60947 applies to separable contacts used in the utilization area considered, such as switching elements for
34、 control circuits. This standard takes into consideration two rated voltage areas: a) above (and including) 10 V (typically 24 V) where contacts are used for switching loads with possible electrical erosion, such as programmable controller inputs; b) below 10 V (typically 5 V) with negligible electr
35、ical erosion, such as electronic circuits. This standard does not apply to contacts used in the very low energy area of measurement, for example, sensor or thermocouple systems. The object of this standard is to propose a method of assessing the performances of low energy contacts giving useful defi
36、nitions; general principles of test methods which are to monitor and record the behaviour of contacts at each operation; functional bases for the definition of a general testing equipment; preferred test values; particular conditions for testing contacts intended for specific applications (such as s
37、witching of PC inputs); information to be given in the test report; interpretation and presentation of the rest results. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated
38、 references, the latest edition of the referenced document (including any amendments) applies. IEC 60068-1:1988, Environmental testing Part 1: General and guidance Amendment 1 (1992) IEC 60068-2 (all parts), Environmental testing Part 2: Tests IEC 60605-6:1997, Equipment reliability testing Part 6:
39、Tests for the validity of the constant failure rate or constant failure intensity assumptions Page5 EN6094754:2003069-74-54 IEC:2002 6 IEC 60947-1:1999, Low-voltage switchgear and controlgear Part 1: General rules 1Amendment 1 (2000) Amendment 2 (2001) IEC 60947-5-1:1997, Low-voltage switchgear and
40、controlgear Part 5-1: Control circuit devices and switching elements Electromechanical control-circuit devices 2Amendment 1 (1999) Amendment 2 (1999) IEC 61131-2:1992, Programmable controllers Part 2: Equipment requirements and tests 3 Definitions and list of symbols used 3.1 Definitions For the pur
41、pose of this part of IEC 60947, the following definitions apply. In this standard the term “time interval” is expressed as the “number of operating cycles”, as appropriate in definitions. 3.1.1 reliability probability that an item can perform a required function, under given conditions, for a given
42、time interval (t 1 , t 2 ) NOTE 1 It is generally assumed that the item is in a state to perform this required function at the beginning of the time interval. NOTE 2 The term “reliability” is also used to denote the reliability performance quantified by this probability (see IEV 191-02-06). IEV 191-
43、12-01 3.1.2 contact reliability probability that a contact can perform a required function, under given conditions, for a given number of operating cycles 3.1.3 failure termination of the ability of an item to perform a required function NOTE 1 After a failure the item has a fault. NOTE 2 “Failure”
44、is an event, as distinguished from “fault”, which is a state. NOTE 3 This concept as defined does not apply to items consisting of software only. IEV 191-04-01 1A consolidated version of this standard exists. 2A consolidated version of this standard exists. Page6 EN6094754:2003069-74-54 IEC:2002 7 3
45、.1.4 defect non-fulfilment of an intended requirement or an expectation for an entity, including one concerned with safety NOTE The requirement or expectation should be reasonable under the existing circumstances. 3.1.5 observed failure rate obfor a stated period in the life of an item, ratio of the
46、 total number of failures in a sample to cumulated observed number of cycles on that sample. The observed failure rate is to be associated with particular and stated numbers of operating cycles (or summation of operating cycles) in the life of the item and with stated conditions 3.1.6 assessed failu
47、re rate cfailure rate of an item determined by a limiting value or values of the confidence interval associated with a stated confidence level, based on the same data as the observed failure rate of nominally identical items NOTE 1 The source of the data should be stated. NOTE 2 Results can be accum
48、ulated (combined) only when all conditions are similar. NOTE 3 The assumed underlaying distribution of failures against time should be stated. NOTE 4 It should be stated whether a one-side or a two-side interval is being used. NOTE 5 Where only one limiting value is given, this is usually the upper
49、limit. 3.1.7 constant failure rate period that period, if any, in the life of a non-repaired item during which the failure rate is approx- imately constant IEV 191-10-09 NOTE In reliability engineering, it is often assumed that the failure rate is constant, that is that the times to failure are distributed exponentially. 3.1
