1、EMC IC modellingPart 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) (IEC 62433-2:2017)BS EN 62433-2:2017BSI Standards PublicationWB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 624
2、33-2 May 2017 ICS 31.200; 33.100.10 Supersedes EN 62433-2:2010 English Version EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) (IEC 62433-2:2017) Modles de circuits intgrs pour la CEM - Partie 2: Modles de circuits int
3、grs pour la simulation du comportement lors de perturbations lectromagntiques - Modlisation des missions conduites (ICEM-CE) (IEC 62433-2:2017) EMV-IC-Modellierung - Teil 2: Modelle integrierter Schaltungen fr die Simulation des Verhaltens bei elektromagnetischer Beeinflussung - Modellierung leitung
4、sgefhrter Aussendungen (ICEM-CE) (IEC 62433-2:2017) This European Standard was approved by CENELEC on 2017-03-03. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without a
5、ny alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other l
6、anguage made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
7、the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey an
8、d the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2017 CENELEC All rights of exploitation in any form and by a
9、ny means reserved worldwide for CENELEC Members. Ref. No. EN 62433-2:2017 E National forewordThis British Standard is the UK implementation of EN 62433-2:2017. It is identical to IEC 62433-2:2017. It supersedes BS EN 62433-2:2010, which is withdrawn.The UK participation in its preparation was entrus
10、ted to Technical Committee EPL/47, Semiconductors.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. The British
11、Standards Institution 2017 Published by BSI Standards Limited 2017ISBN 978 0 580 89669 9ICS 31.200; 33.100.10Compliance with a British Standard cannot confer immunity from legal obligations. This British Standard was published under the authority of the Standards Policy and Strategy Committee on 30
12、November 2017.Amendments/corrigenda issued since publicationDate Text affectedBRITISH STANDARDBS EN 62433-2:2017EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 62433-2 May 2017 ICS 31.200; 33.100.10 Supersedes EN 62433-2:2010 English Version EMC IC modelling - Part 2: Models of integrated circu
13、its for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) (IEC 62433-2:2017) Modles de circuits intgrs pour la CEM - Partie 2: Modles de circuits intgrs pour la simulation du comportement lors de perturbations lectromagntiques - Modlisation des missions conduites (ICEM-CE) (IEC 62
14、433-2:2017) EMV-IC-Modellierung - Teil 2: Modelle integrierter Schaltungen fr die Simulation des Verhaltens bei elektromagnetischer Beeinflussung - Modellierung leitungsgefhrter Aussendungen (ICEM-CE) (IEC 62433-2:2017) This European Standard was approved by CENELEC on 2017-03-03. CENELEC members ar
15、e bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to
16、the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Manag
17、ement Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ire
18、land, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europi
19、sches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN 62433-2:2017 E BS EN 62433-2:2017EN 62433-2:2017 2 European foreword Th
20、e text of document 47A/999/FDIS, future edition 2 of IEC 62433-2, prepared by SC 47A “Integrated circuits“, of IEC/TC 47 “Semiconductor devices“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 62433-2:2017. The following dates are fixed: latest date by which the document
21、 has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2017-12-03 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2020-03-03 This document supersedes EN 62433-2:2010. Attention is drawn to
22、 the possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 62433-2:2017 was approved by CENELEC as a Eur
23、opean Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 61967 NOTE Harmonized in EN 61967 series. IEC 61967-4 NOTE Harmonized as EN 61967-4. BS EN 62433-2:2017EN 62433-2:2017 2 European foreword The tex
24、t of document 47A/999/FDIS, future edition 2 of IEC 62433-2, prepared by SC 47A “Integrated circuits“, of IEC/TC 47 “Semiconductor devices“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 62433-2:2017. The following dates are fixed: latest date by which the document has
25、to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2017-12-03 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2020-03-03 This document supersedes EN 62433-2:2010. Attention is drawn to the
26、possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 62433-2:2017 was approved by CENELEC as a European
27、 Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 61967 NOTE Harmonized in EN 61967 series. IEC 61967-4 NOTE Harmonized as EN 61967-4. EN 62433-2:2017 3 Annex ZA (normative) Normative references to int
28、ernational publications with their corresponding European publications The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition
29、 of the referenced document (including any amendments) applies. NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is a
30、vailable here: www.cenelec.eu. Publication Year Title EN/HD Year IEC/TS 62433-1 2011 EMC IC modelling - Part 1: General modelling framework - - CISPR 17 - Methods of measurement of the suppression characteristics of passive EMC filtering devices EN 55017 - BS EN 62433-2:2017This page deliberately le
31、ft blank 2 IEC 62433-2:2017 IEC 2017 CONTENTS FOREWORD . 7 1 Scope 9 2 Normative references 9 3 Terms, definitions, abbreviations and conventions . 9 3.1 Terms and definitions 9 3.2 Abbreviations 11 3.3 Conventions 11 4 Philosophy . 11 4.1 General . 11 4.2 Conducted emission from core activity (digi
32、tal culprit) . 12 4.3 Conducted emission from I/O activity 12 4.4 Data exchange format . 12 5 ICEM-CE basic components 13 5.1 General . 13 5.2 Internal Activity (IA) 13 5.2.1 General . 13 5.2.2 Examples of IA 14 5.3 Passive Distribution Network (PDN) 14 5.3.1 General . 14 5.3.2 Examples of PDN 15 6
33、IC macro-models . 16 6.1 Types of IC macro-models 16 6.2 General IC macro-model . 16 6.3 Block-based IC macro-model 17 6.3.1 Block component . 17 6.3.2 Inter-Block Coupling component (IBC) . 18 6.3.3 Block-based IC macro-model structure 19 6.4 Sub-model-based IC macro-model 21 6.4.1 Sub-model compon
34、ent . 21 6.4.2 Sub-model-based IC macro-model structure 22 7 CEML format . 23 7.1 General . 23 7.2 CEML structure . 24 7.3 Global keywords . 24 7.4 Header section 24 7.5 Lead definitions 25 7.6 SPICE macro-models 26 7.7 Validity section . 28 7.7.1 General . 28 7.7.2 Attribute definitions 29 7.8 PDN
35、31 7.8.1 General . 31 7.8.2 Attribute definitions 32 7.8.3 Description 36 7.9 IBC . 40 7.9.1 General . 40 2 IEC 62433-2:2017 IEC 2017 CONTENTS FOREWORD . 7 1 Scope 9 2 Normative references 9 3 Terms, definitions, abbreviations and conventions . 9 3.1 Terms and definitions 9 3.2 Abbreviations 11 3.3
36、Conventions 11 4 Philosophy . 11 4.1 General . 11 4.2 Conducted emission from core activity (digital culprit) . 12 4.3 Conducted emission from I/O activity 12 4.4 Data exchange format . 12 5 ICEM-CE basic components 13 5.1 General . 13 5.2 Internal Activity (IA) 13 5.2.1 General . 13 5.2.2 Examples
37、of IA 14 5.3 Passive Distribution Network (PDN) 14 5.3.1 General . 14 5.3.2 Examples of PDN 15 6 IC macro-models . 16 6.1 Types of IC macro-models 16 6.2 General IC macro-model . 16 6.3 Block-based IC macro-model 17 6.3.1 Block component . 17 6.3.2 Inter-Block Coupling component (IBC) . 18 6.3.3 Blo
38、ck-based IC macro-model structure 19 6.4 Sub-model-based IC macro-model 21 6.4.1 Sub-model component . 21 6.4.2 Sub-model-based IC macro-model structure 22 7 CEML format . 23 7.1 General . 23 7.2 CEML structure . 24 7.3 Global keywords . 24 7.4 Header section 24 7.5 Lead definitions 25 7.6 SPICE mac
39、ro-models 26 7.7 Validity section . 28 7.7.1 General . 28 7.7.2 Attribute definitions 29 7.8 PDN 31 7.8.1 General . 31 7.8.2 Attribute definitions 32 7.8.3 Description 36 7.9 IBC . 40 7.9.1 General . 40 BS EN 62433-2:2017IEC 62433-2:2017 IEC 2017 3 7.9.2 Attribute definitions 40 7.10 IA 42 7.10.1 Ge
40、neral . 42 7.10.2 Attribute definitions 42 7.10.3 Description 46 8 Requirements for parameter extraction 47 8.1 General . 47 8.2 Environmental extraction constraints . 47 8.3 IA parameter extraction . 47 8.4 PDN parameter extraction . 47 8.5 IBC parameter extraction 48 Annex A (normative) Preliminar
41、y definitions for XML representation 49 A.1 XML basics . 49 A.1.1 XML declaration . 49 A.1.2 Basic elements 49 A.1.3 Root element . 49 A.1.4 Comments . 50 A.1.5 Line terminations . 50 A.1.6 Element hierarchy 50 A.1.7 Element attributes . 50 A.2 Keyword requirements 50 A.2.1 General . 50 A.2.2 Keywor
42、d characters . 51 A.2.3 Keyword syntax . 51 A.2.4 File structure . 51 A.2.5 Values . 53 Annex B (normative) CEML valid keywords and usage . 56 B.1 Root element keywords . 56 B.2 File header keywords 57 B.3 Validity section keywords 58 B.4 Global keywords . 59 B.5 Lead Keyword . 59 B.6 Lead_definitio
43、ns section attributes 60 B.7 Macromodels section attributes . 60 B.8 Pdn section keywords . 61 B.8.1 Lead element keywords . 61 B.8.2 Netlist section keywords 63 B.9 Ibc section keywords . 63 B.9.1 Lead element keywords . 63 B.9.2 Netlist section keywords 65 B.10 Ia section keywords 65 B.10.1 Lead e
44、lement keywords . 65 B.10.2 Voltage section keywords 66 B.10.3 Current section keywords 68 Annex C (informative) Example of ICEM-CE macro-model in CEML format 70 C.1 General . 70 C.2 PDN and IBC sub-model . 70 C.3 IA sub-model 71 BS EN 62433-2:2017IEC 62433-2:2017 IEC 2017 3 7.9.2 Attribute definiti
45、ons 40 7.10 IA 42 7.10.1 General . 42 7.10.2 Attribute definitions 42 7.10.3 Description 46 8 Requirements for parameter extraction 47 8.1 General . 47 8.2 Environmental extraction constraints . 47 8.3 IA parameter extraction . 47 8.4 PDN parameter extraction . 47 8.5 IBC parameter extraction 48 Ann
46、ex A (normative) Preliminary definitions for XML representation 49 A.1 XML basics . 49 A.1.1 XML declaration . 49 A.1.2 Basic elements 49 A.1.3 Root element . 49 A.1.4 Comments . 50 A.1.5 Line terminations . 50 A.1.6 Element hierarchy 50 A.1.7 Element attributes . 50 A.2 Keyword requirements 50 A.2.
47、1 General . 50 A.2.2 Keyword characters . 51 A.2.3 Keyword syntax . 51 A.2.4 File structure . 51 A.2.5 Values . 53 Annex B (normative) CEML valid keywords and usage . 56 B.1 Root element keywords . 56 B.2 File header keywords 57 B.3 Validity section keywords 58 B.4 Global keywords . 59 B.5 Lead Keyw
48、ord . 59 B.6 Lead_definitions section attributes 60 B.7 Macromodels section attributes . 60 B.8 Pdn section keywords . 61 B.8.1 Lead element keywords . 61 B.8.2 Netlist section keywords 63 B.9 Ibc section keywords . 63 B.9.1 Lead element keywords . 63 B.9.2 Netlist section keywords 65 B.10 Ia sectio
49、n keywords 65 B.10.1 Lead element keywords . 65 B.10.2 Voltage section keywords 66 B.10.3 Current section keywords 68 Annex C (informative) Example of ICEM-CE macro-model in CEML format 70 C.1 General . 70 C.2 PDN and IBC sub-model . 70 C.3 IA sub-model 71 4 IEC 62433-2:2017 IEC 2017 C.4 Frequency domain ICEM-CE in CEML . 73 C.5 Time domain ICEM-CE in CEML . 75 Annex D (informative) Conversions between parameter types 77 D.1 General . 77 D.2 Conversion for one-port PDN 77 D.3 Conversion for two-port P
