GOST R 50346-1992 Non ionic surface-active agents obtained from ethylene oxide and mixed non-ionic surface-active agents Determination of cloud point《环氧乙烷制成的非离子式表面活性剂 以及混合非离子式表面活性剂.pdf

上传人:inwarn120 文档编号:776183 上传时间:2019-01-23 格式:PDF 页数:11 大小:467.87KB
下载 相关 举报
GOST R 50346-1992 Non ionic surface-active agents obtained from ethylene oxide and mixed non-ionic surface-active agents Determination of cloud point《环氧乙烷制成的非离子式表面活性剂 以及混合非离子式表面活性剂.pdf_第1页
第1页 / 共11页
GOST R 50346-1992 Non ionic surface-active agents obtained from ethylene oxide and mixed non-ionic surface-active agents Determination of cloud point《环氧乙烷制成的非离子式表面活性剂 以及混合非离子式表面活性剂.pdf_第2页
第2页 / 共11页
GOST R 50346-1992 Non ionic surface-active agents obtained from ethylene oxide and mixed non-ionic surface-active agents Determination of cloud point《环氧乙烷制成的非离子式表面活性剂 以及混合非离子式表面活性剂.pdf_第3页
第3页 / 共11页
GOST R 50346-1992 Non ionic surface-active agents obtained from ethylene oxide and mixed non-ionic surface-active agents Determination of cloud point《环氧乙烷制成的非离子式表面活性剂 以及混合非离子式表面活性剂.pdf_第4页
第4页 / 共11页
GOST R 50346-1992 Non ionic surface-active agents obtained from ethylene oxide and mixed non-ionic surface-active agents Determination of cloud point《环氧乙烷制成的非离子式表面活性剂 以及混合非离子式表面活性剂.pdf_第5页
第5页 / 共11页
点击查看更多>>
资源描述

展开阅读全文
相关资源
猜你喜欢
  • DIN EN 60749-19-2011 Semiconductor devices - Mechanical and climatic test methods - Part 19 Die shear strength (IEC 60749-19 2003 + A1 2010) German version EN 60749-19 2003 + A1 20.pdf DIN EN 60749-19-2011 Semiconductor devices - Mechanical and climatic test methods - Part 19 Die shear strength (IEC 60749-19 2003 + A1 2010) German version EN 60749-19 2003 + A1 20.pdf
  • DIN EN 60749-2-2003 Semiconductor devices - Mechanical and climatic test methods - Part 2 Low air pressure (IEC 60749-2 2002) German version EN 60749-2 2002《半导体器件 机械和气候试验方法 第2部分 低气.pdf DIN EN 60749-2-2003 Semiconductor devices - Mechanical and climatic test methods - Part 2 Low air pressure (IEC 60749-2 2002) German version EN 60749-2 2002《半导体器件 机械和气候试验方法 第2部分 低气.pdf
  • DIN EN 60749-20-1-2009 Semiconductor devices - Mechanical and climatic test methods - Part 20-1 Handling packing labelling and shipping of surface-mount devices sensitive to the co.pdf DIN EN 60749-20-1-2009 Semiconductor devices - Mechanical and climatic test methods - Part 20-1 Handling packing labelling and shipping of surface-mount devices sensitive to the co.pdf
  • DIN EN 60749-20-2010 Semiconductor devices - Mechanical and climatic test methods - Part 20 Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering.pdf DIN EN 60749-20-2010 Semiconductor devices - Mechanical and climatic test methods - Part 20 Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering.pdf
  • DIN EN 60749-21-2012 Semiconductor devices - Mechanical and climatic test methods - Part 21 Solderability (IEC 60749-21 2011) German version EN 60749-21 2011《半导体设备 机械和气候试验方法 第21部分 .pdf DIN EN 60749-21-2012 Semiconductor devices - Mechanical and climatic test methods - Part 21 Solderability (IEC 60749-21 2011) German version EN 60749-21 2011《半导体设备 机械和气候试验方法 第21部分 .pdf
  • DIN EN 60749-22-2003 Semiconductor devices - Mechanical and climatic test methods - Part 22 Bond strength (IEC 60749-22 200 + Corr 1 2003) German version EN 60749-22 2003《半导体器件 机械和.pdf DIN EN 60749-22-2003 Semiconductor devices - Mechanical and climatic test methods - Part 22 Bond strength (IEC 60749-22 200 + Corr 1 2003) German version EN 60749-22 2003《半导体器件 机械和.pdf
  • DIN EN 60749-23-2011 Semiconductor devices - Mechanical and climatic test methods - Part 23 High temperature operating life (IEC 60749-23 2004 + A1 2011) German version EN 60749-23.pdf DIN EN 60749-23-2011 Semiconductor devices - Mechanical and climatic test methods - Part 23 High temperature operating life (IEC 60749-23 2004 + A1 2011) German version EN 60749-23.pdf
  • DIN EN 60749-24-2004 Semiconductor devices - Mechanical and climatic test methods - Part 24 Accelerated moisture resistance - Unbiased HAST (IEC 60749-24 2004) German version EN 60.pdf DIN EN 60749-24-2004 Semiconductor devices - Mechanical and climatic test methods - Part 24 Accelerated moisture resistance - Unbiased HAST (IEC 60749-24 2004) German version EN 60.pdf
  • DIN EN 60749-25-2004 Semiconductor devices - Mechanical and climatic test methods - Part 25 Temperature cycling (IEC 60749-25 2003) German version EN 60749-25 2003《半导体器件 机械和气候试验方法 .pdf DIN EN 60749-25-2004 Semiconductor devices - Mechanical and climatic test methods - Part 25 Temperature cycling (IEC 60749-25 2003) German version EN 60749-25 2003《半导体器件 机械和气候试验方法 .pdf
  • 相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > GOST

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1