1、JEDEC STANDARD Vibration, Variable Frequency JESD22-B103B (Revision of JESD22-B103-A, July 1989) JUNE 2002, Reaffirmed: June 2006, September 2010 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION NOTICE JEDEC standards and publications contain material that has been prepared, reviewed, and approved through t
2、he JEDEC Board of Directors level and subsequently reviewed and approved by the JEDEC legal counsel. JEDEC standards and publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement
3、of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for use by those other than JEDEC members, whether the standard is to be used either domestically or internationally. JEDEC standards and publications are adopted without regard to whether or no
4、t their adoption may involve patents or articles, materials, or processes. By such action JEDEC does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the JEDEC standards or publications. The information included in JEDEC standards and publi
5、cations represents a sound approach to product specification and application, principally from the solid state device manufacturer viewpoint. Within the JEDEC organization there are procedures whereby a JEDEC standard or publication may be further processed and ultimately become an ANSI standard. No
6、 claims to be in conformance with this standard may be made unless all requirements stated in the standard are met. Inquiries, comments, and suggestions relative to the content of this JEDEC standard or publication should be addressed to JEDEC at the address below, or refer to www.jedec.org under St
7、andards and Documents for alternative contact information. Published by JEDEC Solid State Technology Association 2010 3103 North 10th Street Suite 240 South Arlington, VA 22201-2107 This document may be downloaded free of charge; however JEDEC retains the copyright on this material. By downloading t
8、his file the individual agrees not to charge for or resell the resulting material. PRICE: Contact JEDEC Printed in the U.S.A. All rights reserved PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by JEDEC and may not be reproduced without permission. Organizations may obtain permission to r
9、eproduce a limited number of copies through entering into a license agreement. For information, contact: JEDEC Solid State Technology Association 3103 North 10th Street Suite 240 South Arlington, VA 22201-2107 or refer to www.jedec.org under Standards and Documents for alternative contact informatio
10、n. JEDEC Standard No. 22B103B -i- Test Method B103B (Revision of B103-A) VIBRATION, VARIABLE FREQUENCY Foreword The variable frequency vibration test is performed to determine the effect of vibration, within a specified frequency range, on the internal structural elements. JEDEC Standard No. 22B103B
11、 Test Method B103B -ii- (Revision of B103-A) JEDEC Standard No. 22-B103B Page 1 Test Method B103B (Revision of B103-A) VIBRATION, VARIABLE FREQUENCY (From JEDEC Board Ballot, JCB-02-32, formulated under the cognizance of the JC-14.1 Subcommittee on Reliability Test Methods for Packaged Devices.) 1 S
12、cope This method is intended to evaluate component(s) for use in electrical equipment. It is intended to determine the ability of the component(s) to withstand moderate to severe vibration as a result of motion produced by transportation or field operation. Vibration of this type may disturb operati
13、ng characteristics, particularly if the repetitive stress causes fatigue. This is a destructive test intended for component qualification. It is normally applicable to cavity-type packages. 2 Apparatus Apparatus for this test shall include equipment capable of providing the required variable frequen
14、cy vibration at the specified levels and the necessary optical and electrical equipment for post-test measurements. 3 Terms and definitions 3.1 RMS acceleration The root mean square average of the acceleration interval of the dynamic motion. 3.2 Peak acceleration The maximum of the acceleration inte
15、rval of the dynamic motion. 3.3 Logarithmic sweep Continuously varying the frequency in a manner such that within any portion of the frequency range, a fixed number of decades is traversed in a fixed length of time. 3.4 Octave A measurement of the spacing of frequency characterized by a doubling of
16、frequency. The number of octaves, N, between two frequencies, f1f2, is given by N=(log f2/f1 ) / log 2. 3.5 Decade A measurement of the spacing of frequency characterized by a tenfold increase of frequency. The number of decades, D, between two frequencies, f1f2, is given by D= (log f2/f1) / log 10.
17、 JEDEC Standard No. 22-B103B Page 2 Test Method B103B (Revision of B103-A) 3 Terms and definitions (contd) 3.6 Decibel measurement of PSD, dB A measurement of the ratio R of one level of power spectral density, s1, relative to another reference level, s2, given by the formula R = 20 log (s1 / s2) /
18、log 10. R=6dB is approximately a doubling of power spectral density from one level to another. 3.7 Power spectral density, PSD A measurement of the intensity of acceleration power per unit frequency, in units of G squared per Hz. 3.8 Service condition The designation of the severity of test used to
19、evaluate a component. 3.9 Velocity change The integral of the acceleration interval of the dynamic motion over the interval. 3.10 Cavity package A component that has the device located within the cavity of the package body. 3.11 Peak-peak displacement The maximum difference between highest and lowes
20、t values of the displacement of the dynamic motion interval. 3.12 Gaussian random vibration Vibration characterized by having acceleration and frequency values over an interval of time which occur in a stochastic manner, with the acceleration values following a normal (Gaussian) probability density
21、function and frequency values following a uniform distribution. 4 Procedure 4.1 Component selection Components subjected to the test will be randomly selected and typical of production. The component shall be rigidly mounted or restrained by its case with suitable protection for the leads. If compon
22、ent rework, burn in or other stressful process is to be considered, then such a process or processes should be applied to the component(s) prior to vibration test. Use of such processes in the test hardware preparation will be documented in the test results. JEDEC Standard No. 22-B103B Page 3 Test M
23、ethod B103B (Revision of B103-A) 4.2 Required stress application - swept sine test 4.2.1 Mounting the component The device case shall be rigidly fastened on the vibration platform and the leads adequately secured to avoid excessive lead resonance. The components will be mounted in such a manner so t
24、hat they experience the full-specified vibration level at the component. 4.2.2 Vibration application Vibration will be applied to the component outer surface casing or leads in a manner to simulate expected vibration during processing and packaged shipment. The devices shall be vibrated with simple
25、harmonic motion corresponding to the test levels shown in Table 1. At least one service condition must be designated. Each test level will include simple harmonic motion of continuously swept frequency with the indicated peak-peak displacement below the crossover frequency, and indicated peak accele
26、ration above the crossover frequency. A tolerance level of +/- 10% on the test being performed, either displacement or acceleration, is allowed. The test frequency range is from the indicated minimum frequency to the indicated maximum test frequency. A complete sweep of the test frequency range, fro
27、m the minimum to maximum and return to the minimum frequency, shall be traversed in a logarithmic manner, in 4 minutes. The sweep rate is 1 decade/minute. This complete sweep shall be performed 4 times in each of the orientations X, Y, and Z (total of 12 times). If there are no significant stress se
28、nsitivities of the component under test in a particular frequency range (for examples, in the lower frequency ranges, or in a region of an uncontrollable fixture resonance), then that portion of the frequency sweep may be deleted from the stress application with full documentation of the reasons for
29、 the test exception and extent of the portion(s) of the sweep test deleted. Table 1 Component test levels Service condition Peak acceleration (G) Displacement pk-pk (in / mm) Cross-over frequency (Hz) Min. / Max. frequency (Hz) 1 20 0.060 / 1.5 80 20 / 2000 2 10 0.040 / 1.0 70 10 / 1000 3 3 0.030 /
30、0.75 45 5 / 500 4 1 0.020 / 0.5 31 5 / 500 5 0.3 0.010 / 0.25 24 5 / 500 6 0.1 0.005 / 0.125 20 5 / 500 7 0.01 0.001 / 0.039 14 5 / 500 8 0.001 0.0005 / 0.0127 6.2 5 / 500 4.3 Optional stress application - Random vibration test 4.3.1 Mounting component The device case shall be rigidly fastened on th
31、e vibration platform and the leads adequately secured to avoid excessive lead resonance. The components will be mounted in such a manner so that they experience the full-specified vibration level at the component. JEDEC Standard No. 22-B103B Page 4 Test Method B103B (Revision of B103-A) 4.3 Optional
32、 stress application - Random vibration test (contd) 4.3.2 Vibration application Vibration will be applied to the components outer surface casing or leads in a manner to simulate expected vibration during processing and packaged shipment. The devices shall be vibrated with Gaussian random vibration c
33、orresponding one of the service conditions with associated overall test level as shown in Table 2. Details of the power spectral density PSD functions for these test levels are given in Tables 3 - 6 as breakpoints of the curves. Tables 3 - 6 are plotted out in the curves found in Figure 1. In genera
34、l, Component test levels A, B and C represent shipping conditions for the component, with condition A being the most extreme. Test conditions D - I represent various levels of application vibrations to which a component can be exposed. Condition D is the most severe. Selection of the appropriate tes
35、t condition should be based on the actual shipping or application condition requirement for the component. The vibration will be applied for 30 minutes in each of 3 orthogonal axes, for every service condition. At least one service condition must be designated, and subjected to the required test lev
36、el for a minimum of 90 minutes in total, to complete all three axes. Table 2 Overall measures of random vibration test levels Service condition RMS acceleration (G) RMS velocity (in/sec) RMS displacement(in) 6* RMS displacement, or 3 sigma pk-pk displacement (in) A 6.27 29.0 0.926 5.55 B 3.10 13.2 0
37、.426 2.56 C 1.24 5.22 0.178 1.07 D 1.11 1.64 0.0310 0.186 E 0.686 0.703 0.00543 0.0326 F 0.416 0.425 0.00355 0.0213 G 0.246 0.215 0.00171 0.0102 H 0.123 0.113 0.000832 0.00499 I 0.0626 0.0589 0.000395 0.002237 4.3.3 Test tolerances The PSD test level will be applied within a tolerance +/- 6 dB of th
38、e nominal values at any frequency, and with an overall tolerance on the RMS acceleration levels of +/- 10%, employing suitable averaging technique. If there are no significant stress sensitivities of the component under test in a particular frequency range (for examples, in the lower frequency range
39、s, or in a region of an uncontrollable fixture resonance), then that portion of the PSD spectrum may be deleted from the stress application with full documentation of the reasons for the test exception and extent of the portion(s) of the PSD spectrum deleted. JEDEC Standard No. 22-B103B Page 5 Test
40、Method B103B (Revision of B103-A) 4.3 Optional stress application - Random vibration test (contd) Table 3 Frequency breakpoints of power spectral density of component test levels A, B, C Service condition A Service condition B Service condition C Frequency (Hz) PSD level, G squared/Hz PSD level, G s
41、quared/Hz PSD level, G squared/Hz 2 0.01 0.003 0.001 4 1 0.2 0.03 8 1 0.2 0.03 40 0.1 0.02 0.003 50 0.3 0.08 0.013 70 0.3 0.08 0.013 200 0.03 0.008 0.001 500 0.01 0.003 0.001 Table 4 Frequency breakpoints of power spectral density of component test level D Service condition D Frequency (Hz) PSD Leve
42、l, G squared / Hz 3 0.0001 6 0.003 40 0.003 50 0.013 70 0.013 200 0.001 500 0.001 Table 5 Frequency breakpoints of power spectral density of component test levels E, F Service Condition E Service Condition F Frequency (Hz) PSD Level, G squared / Hz PSD Level, G squared / Hz 5 0.00002 0.00001 17 0.00
43、1 0.0004 40 0.001 0.0004 50 0.01 0.003 60 0.01 0.003 70 0.001 0.0004 150 0.001 0.0004 200 0.0005 0.0002 500 0.0005 0.0002 JEDEC Standard No. 22-B103B Page 6 Test Method B103B (Revision of B103-A) 4.3 Optional stress application - Random vibration test (contd) Table 6 Frequency breakpoints of power s
44、pectral density of component test levels G, H, I. Service Condition G Service Condition H Service Condition I Frequency (Hz) PSD Level, G squared / Hz PSD Level, G squared / Hz PSD Level, G squared / Hz 5 0.000002 0.0000005 0.0000001 17 0.0001 0.0000022 0.000005 40 0.0001 0.0000022 0.000005 50 0.000
45、8 0.0003 0.0001 60 0.0008 0.0003 0.0001 70 0.0001 0.0000022 0.000005 500 0.00001 0.0000022 0.000005 Figure 1 Random vibration tests, power spectral density 4.4 Measurements Hermeticity tests, if applicable, visual examination and electrical measurements (consisting of parametric and functional tests
46、) shall be performed. JEDEC Standard No. 22-B103B Page 7 Test Method B103B (Revision of B103-A) 5 Failure Criteria A component shall be defined as a failure if hermeticity requirements cannot be demonstrated, if parametric limits are exceeded or if functionality cannot be demonstrated under the cond
47、itions specified in the applicable procurement document. Mechanical damage, such as cracking, chipping or breaking of the package will also be considered a failure provided such damage was not caused by fixturing or handling and the damage is critical to component performance in the specific applica
48、tion. 6 Summary The following details shall be specified in the applicable procurement document: a) Test service condition, for each test performed. b) Electrical measurements and results. c) Sample size and accept number. d) Disposition of failures. e) Hermetic leak rate (if applicable). f) Descrip
49、tion of mounting fixture, how component was supported, any pressure applied to component. g) Description of component, and if applicable, component pre-test stress history. h) Description of any exceptions to stress application, reason for need for exception, and description of reason(s) why omission of the stress application will not materially affect test outcome. JEDEC Standard No. 22-B103B Page 8 Test Method B103B (Revision of B103-A) Rev. 9/02 Standard Improvement Form JEDEC -(6%The purpose of this form is to provide the Technical Committees
