NF C26-235-2-1998 Electrical insulating materials Methods of test for the hydrolytic stability Part 2 moulded thermosets 《电绝缘材料 水解稳定性试验方法 第2部分 模制热固塑料》.pdf

相关资源

IRS 70778-2-2018 Recommendations for determining the carrying capacity and fatigue risks of existing metallic railway bridges.pdf

IRS 70712-2018 Rail defects.pdf

IRS 50596-6-2018 Conditions for coding intermodal loading units in combined transport combined transport lines and wagons.pdf

IRS 50596-5-2018 Transport of road vehicles on wagons-Technical Organisation-Conveyance of semi-trailers with P coding or N coding on recess wagons.pdf

IESNA TM-23-2017 Lighting Control Protocols.pdf

IESNA RP-2-2017 Recommended Practice for Retail Lighting.pdf

ITU-R RAPPORT M 766-2 FRENCH-1990 Feasibility of frequency sharing between the GPS and other services《全球定位系统和其他服务之间的频率共享的可行性》.pdf

ITU-R RAPPORT M 763-3 FRENCH-1990 Signal level variation due to multipath effects and blockage by ship-s superstructure in maritime mobile-satellite service lin.pdf

ITU-R RAPPORT M 739-1 FRENCH-1986 Interference due to intermodulation products in the land mobile service between 25 and 100 MHz《由于互调产物在陆地移动服务25和100 MHz之间产生的干扰》.pdf

ITU-R RAPPORT M 319-7 FRENCH-1990 Characteristics of equipment and principles governing the assignment of frequency channels between 25 and 100 MHz for land mob.pdf

猜你喜欢

EN 60749-4-2017 en Semiconductor devices - Mechanical and climatic test methods - Part 4 Damp heat steady state highly accelerated stress test (HAST).pdf

EN 60749-40-2011 en Semiconductor devices - Mechanical and climatic test methods - Part 40 Board level drop test method using a strain gauge《半导体器件 机械和气候试验方法 第40部分 使用应变仪的板级跌落试验方法》.pdf

EN 60749-42-2014 en Semiconductor devices - Mechanical and climatic test methods - Part 42 Temperature and humidity storage.pdf

EN 60749-43-2017 en Semiconductor devices - Mechanical and climatic test methods - Part 43 Guidelines for IC reliability qualification plans.pdf

EN 60749-44-2016 en Semiconductor devices - Mechanical and climatic test methods - Part 44 Neutron beam irradiated single event effect (SEE) test method for semiconductor devices.pdf

EN 60749-5-2017 en Semiconductor devices - Mechanical and climatic test methods - Part 5 Steady-state temperature humidity bias life test.pdf

EN 60749-6-2002 en Semiconductor Devices Mechanical and Climatic Test Methods Part 6 Storage at High Temperature《半导体器件 机械和气候试验方法 第6部分 高温下储存 部分替代EN 60749-1999+A1-2000+A2-2001 IEC 60.pdf

EN 60749-6-2017 en Semiconductor devices - Mechanical and climatic test methods - Part 6 Storage at high temperature.pdf

EN 60749-7-2011 en Semiconductor devices - Mechanical and climatic test methods - Part 7 Internal moisture content measurement and the analysis of other residual gases《半导体器件 机械和气候试.pdf