NF C93-702-1991 Electronic components Printed boards Test methods 《电子元件 印刷电路板 试验方法》.pdf

上传人:brainfellow396 文档编号:999667 上传时间:2019-03-18 格式:PDF 页数:67 大小:2.56MB
下载 相关 举报
NF C93-702-1991 Electronic components Printed boards Test methods 《电子元件 印刷电路板 试验方法》.pdf_第1页
第1页 / 共67页
NF C93-702-1991 Electronic components Printed boards Test methods 《电子元件 印刷电路板 试验方法》.pdf_第2页
第2页 / 共67页
NF C93-702-1991 Electronic components Printed boards Test methods 《电子元件 印刷电路板 试验方法》.pdf_第3页
第3页 / 共67页
NF C93-702-1991 Electronic components Printed boards Test methods 《电子元件 印刷电路板 试验方法》.pdf_第4页
第4页 / 共67页
NF C93-702-1991 Electronic components Printed boards Test methods 《电子元件 印刷电路板 试验方法》.pdf_第5页
第5页 / 共67页
点击查看更多>>
资源描述
展开阅读全文
相关资源
猜你喜欢
  • DIN EN 60749-33-2004 Semiconductor devices - Mechanical and climatic test methods - Part 33 Accelerated moisture resistance - Unbiased autoclave (IEC 60749-33 2004) German version .pdf DIN EN 60749-33-2004 Semiconductor devices - Mechanical and climatic test methods - Part 33 Accelerated moisture resistance - Unbiased autoclave (IEC 60749-33 2004) German version .pdf
  • DIN EN 60749-34-2011 Semiconductor devices - Mechanical and climatic test methods - Part 34 Power cycling (IEC 60749-34 2010) German version EN 60749-34 2010《半导体器件 机械和气候试验方法 第34部分 .pdf DIN EN 60749-34-2011 Semiconductor devices - Mechanical and climatic test methods - Part 34 Power cycling (IEC 60749-34 2010) German version EN 60749-34 2010《半导体器件 机械和气候试验方法 第34部分 .pdf
  • DIN EN 60749-35-2007 Semiconductor devices - Mechanical and climatic test methods - Part 35 Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35 2006) G.pdf DIN EN 60749-35-2007 Semiconductor devices - Mechanical and climatic test methods - Part 35 Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35 2006) G.pdf
  • DIN EN 60749-36-2003 Semiconductor devices - Mechanical and climatic test methods - Part 36 Acceleration steady state (IEC 60749-36 2003) German version EN 60749-36 2003《半导体器件 机械和气.pdf DIN EN 60749-36-2003 Semiconductor devices - Mechanical and climatic test methods - Part 36 Acceleration steady state (IEC 60749-36 2003) German version EN 60749-36 2003《半导体器件 机械和气.pdf
  • DIN EN 60749-37-2008 Semiconductor devices - Mechanical and climatic test methods - Part 37 Board level drop test method using an accelerometer (IEC 60749-37 2008) German version E.pdf DIN EN 60749-37-2008 Semiconductor devices - Mechanical and climatic test methods - Part 37 Board level drop test method using an accelerometer (IEC 60749-37 2008) German version E.pdf
  • DIN EN 60749-38-2008 Semiconductor devices - Mechanical and climatic test methods - Part 38 Soft error test method for semiconductor devices with memory (IEC 60749-38 2008) German .pdf DIN EN 60749-38-2008 Semiconductor devices - Mechanical and climatic test methods - Part 38 Soft error test method for semiconductor devices with memory (IEC 60749-38 2008) German .pdf
  • DIN EN 60749-39-2007 Semiconductor devices - Mechanical and climatic test methods - Part 39 Measurement of moisture diffusivity and water solubility in organic materials used for s.pdf DIN EN 60749-39-2007 Semiconductor devices - Mechanical and climatic test methods - Part 39 Measurement of moisture diffusivity and water solubility in organic materials used for s.pdf
  • DIN EN 60749-4-2017 Semiconductor devices - Mechanical and climatic test methods - Part 4 Damp heat steady state highly accelerated stress test (HAST) (IEC 60749-4 2017) German ver.pdf DIN EN 60749-4-2017 Semiconductor devices - Mechanical and climatic test methods - Part 4 Damp heat steady state highly accelerated stress test (HAST) (IEC 60749-4 2017) German ver.pdf
  • DIN EN 60749-40-2012 Semiconductor devices - Mechanical and climatic test methods - Part 40 Board level drop test method using a strain gauge (IEC 60749-40 2011) German version EN .pdf DIN EN 60749-40-2012 Semiconductor devices - Mechanical and climatic test methods - Part 40 Board level drop test method using a strain gauge (IEC 60749-40 2011) German version EN .pdf
  • 相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > 其他

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1