1、IEEE Std 1226.3-1998IEEE Std 1226.3-1998IEEE ABBET IEEE Standard for Software Interface for Resource Management forA Broad-Based Environment for Test(ABBET)IEEE Standards Coordinating Committee 20Sponsored by the IEEE Standards Coordinating Committee 20 onInformation Technology2 June 1998 SH94610The
2、 Institute of Electrical and Electronics Engineers, Inc.345 East 47th Street, New York, NY 10017-2394, USACopyright 1998 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 1998. Printed in the United States of America.ISBN 0-7381-0180-X No part of this publi
3、cation may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher.IEEE Std 1226.3-1998IEEE ABBET IEEE Standard for Software Interfacefor Resource Management forA Broad-Based Environment for Test(ABBET)SponsorIEEE Standards Coo
4、rdinating Committee 20Approved 19 March 1998IEEE-SA Standards BoardAbstract: The services needed to access and manage descriptive information about resources inan automatic test system (ATS) are covered. This information includes data about the automatictest equipment (ATE) instruments, switching, a
5、nd the test subject adapter. This standard is a com-ponent of the ABBET set of standards.Keywords: A Broad-Based Environment for Test (ABBET), automatic test equipment, automatictest system, resource managementIEEE Standards documents are developed within the IEEE Societies and the Standards Coordi-
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15、ee, please contactCopyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA;(508) 750-8400. Permission to photocopy portions of any individual standard for educational class-room use can also be obtained through the Copyright Clearance Center.Note: Attention is called t
16、o the possibility that implementation of this standard mayrequire use of subject matter covered by patent rights. By publication of this standard,no position is taken with respect to the existence or validity of any patent rights inconnection therewith. The IEEE shall not be responsible for identify
17、ing patents forwhich a license may be required by an IEEE standard or for conducting inquiries intothe legal validity or scope of those patents that are brought to its attention.Copyright 1998 IEEE. All rights reserved. iiiIntroductionThis introduction is not part of IEEE Std 1226.3-1998, IEEE Stand
18、ard for Software Interface for Resource Managementfor A Broad-Based Environment for Test (ABBET).In the course of developing IEEE Std 1226-1993, A Broad-Based Environment for Test (ABBET), it wasdetermined that multiple standards would be required to define the various ABBET functions and interfaces
19、.These standards consist of the Overview and Architecture Standard, numbered 1226, and a set of relatedcomponent standards, numbered 1226.1 through 1226.x. This component standard, numbered 1226.3, docu-ments the software interfaces defined by ABBET to test equipment configuration information.At the
20、 February, 1991, ABBET meeting, it was decided to document the automatic test equipment (ATE)system and instrument control in a single component standard. Deliberations subsequent to that meeting,however, revealed that combining the groups of interfaces into a single component standard would forceim
21、plementations of the instrumentation interfaces to conform to a subset of that standard. Therefore, it wasconcluded that the interface groups should be documented in separate component standards, and that thesestandards would naturally divide at the interface between Test Equipment Description Langu
22、age (TEDL)and Resource Description Language (RDL). At the Scottsdale, Arizona, meeting in May, 1991, this decisionwas changed, as it was decided to create three component standards for the ATE system layer: one for theresource management interfaces (referencing TEDL and RDL), one for the instrument
23、interfaces (referenc-ing SCPI, CIIL, etc.), and one for the instrument control bus interfaces (referencing IEEE 488, VXI, Ether-net, etc.).This standard is intended to document the interfaces to services to ATE descriptive information that wouldallow bridging the gap between an ABBET ATLAS level tes
24、t procedure and an ATE (referred to in this stan-dard as “ATE interface services”).iv Copyright 1998 IEEE. All rights reserved.ParticipantsAt the time this standard was completed, the ABBET Subcommittee of the IEEE Standards CoordinatingCommittee (SCC20) had the following membership:In addition, the
25、 following people made significant contributions to this document:Guy AdamFabio AngeliJames D. BakerJean-Yves BarbierDarrell BartzAnne BautistaAldo BernalMichael BlairGreg BowmanJoanne BuckleyToni BunsenMichael CarpenterE. Elaine CasharAlexander CherfasRichard D. ChurcherGregory W. DarnellBernard Da
26、thyDanny C. DavisHal DavisJose DeLaCruzBernd DinklageBernard DugasJerome ElishaKeith EllisMichael T. EllisPaul ErathAnthony FitzpatrickWilliam Brit FrankMichael GolasRoger S. GoldbergArnold M. GreenspanJay GroveJoel GuerraWes HandArthur HannGary L. HardenburgRobert G. HayesLeonard HaynesBill Heather
27、John E. HeiserShankar HemmadyAshley HulmeUlla JacobsonPatrick JohnsonAndrew JoskowskiAl KaraliusMark KaufmanLars-Olov LarssonHans LecluyseRobert Loretz, Jr.Michael LougueRichard MaguireMichael A. MalesichMichael S. MartinGayle MatysekMark McCooeyRobert L. McGarveyHarry McGuckinScott MillerJames M. M
28、illsMukund U. ModiWilliam P. NeblettDavid L. NicholsHans ObermeierLeslie A. OrlidgeEd PerkinsJean PouillyN. RamachandranWilliam E. ReevesBill RodriquezDavid RoggendorffDavid RollinceEric SacherHoward SavageHelmut ScheibenzuberRick SchippangMichael L. SeaveyJohn W. SheppardLee A. ShombertWilliam R. S
29、impsonButch SneadeJoseph J. StancoJack TaylorKirk D. ThompsonJanette TuttleJorg UrbanKenneth VanJ. Richard WegerDaniel H. WeissWilliam A. WhitakerWill W. YoungJehuda ZieglerMaria BosticDez CassJack CrossRobert J. CurryDavid L. DawsonRon DeBlancJohn GoddardChris GorringeT. Winston GriffinGary HinkleG
30、lenn LaflinJohn LeutheRafael MartinezCharles MorrisRon TaylorMark J. ThullenCopyright 1998 IEEE. All rights reserved. vThe following persons were on the balloting committee:When the IEEE-SA Standards Board approved this standard on 19 March 1998, it had the followingmembership:Richard J. Holleman, C
31、hair Donald N. Heirman, Vice ChairJudith Gorman, Secretary*Member EmeritusGuy AdamJames D. BakerJean-Yves BarbierJeffrey S. BarkleyAnne F. BautistaMichael BlairGreg BowmanAlan L. BridgesDavid M. BrooksTheodor CalinE. Elaine CasharCharles R. ChildressRichard D. ChurcherGeorge A. ClariusJames E. Cottr
32、ellFred L. CoxRobert J. CurryGregory W. DarnellBernard DathyDanny C. DavisSomnath DebBernd DinklageHorst D. EyWilliam Brit FrankAlfred S. GilmanArthur H. GreenbergArnold M. GreenspanGary L. HardenburgRobert G. HayesJohn E. HeiserJ. Luis HernandezCatherine HogansAshley HulmePaul B. KneseScott A. Kotl
33、erJames L. LewisRichard J. MaguireMichael A. MalesichMichael S. MartinRafael MartinezGayle MatysekRobert L. McGarveyThomas J. McGrathDouglas W. McNabbJames M. MillsMukund U. ModiCharles MorrisJames NagyRichard E. NeeseDavid L. NicholsHans ObermeierLeslie A. OrlidgeRichard J. PatrickDave PawsonDennis
34、 C. PetersonAlain PlassartJean PouillyWilliam E. ReevesDavid RoggendorffEric SacherHoward SavageMichael L. SeaveyJohn W. SheppardWilliam R. SimpsonPhilip T. SmithJoseph J. StancoRobert StasonisJoseph L. StautbergKirk D ThompsonLouis Y. UngarJ. Richard WegerDaniel H. WeissWilliam A. WhitakerRonald T.
35、 WolfeWerner K. WolzWill W. YoungRobert W. ZimbardiSatish K. AggarwalClyde R. CampJames T. CarloGary R. EngmannHarold E. EpsteinJay Forster*Thomas F. GarrityRuben D. GarzonJames H. GurneyJim D. IsaakLowell G. JohnsonRobert KennellyE. G. “Al” KienerJoseph L. Koepfinger*Stephen R. LambertJim Logotheti
36、sDonald C. LoughryL. Bruce McClungLouis-Franois PauRonald C. PetersenGerald H. PetersonJohn B. PoseyGary S. RobinsonHans E. WeinrichDonald W. Zipsevi Copyright 1998 IEEE. All rights reserved.Contents1. Overview 11.1 Scope 11.2 Purpose . 11.3 Application . 12. References 23. Definitions and acronyms
37、23.1 Definitions . 23.2 Acronyms . 54. Description . 54.1 Objectives 54.2 Overview 54.3 Relationship to ABBET architecture . 64.4 Relationship to reference documents . 95. Conformance 95.1 Minimum resource management interface functionality . 95.2 Subsets . 95.3 Extensions 95.4 Approach for implemen
38、tation of subsets . 105.5 Approach for implementation of extensions 106. Specification 116.1 Conventions . 116.2 Virtual resource management services 136.3 Test equipment configuration management services . 266.4 Real resource management services 32Annex A (informative) Examples . 47Annex B (informa
39、tive) Object-oriented analysis 62Annex C (normative) Interface Definition Language (IDL) specification 71Annex D (informative) Bibliography . 86Annex E (informative) Test foundation framework . 87Copyright 1998 IEEE. All rights reserved. 1IEEE ABBET IEEE Standard for Software Interface for Resource
40、Management for A Broad-Based Environment for Test (ABBET)1. OverviewThe set of standards called “A Broad-Based Environment for Test (ABBET)” was developed to serve as astandards set for product testing. ABBET specifies a comprehensive environment for integrating designdata, test strategies and requi
41、rements, test procedures, test results management, and test system implementa-tions.1.1 ScopeThis standard is a component of the ABBET set of standards and covers the services needed to access andmanage descriptive information about resources in an automatic test system (ATS). This informationinclud
42、es data about the automatic test equipment (ATE) instruments, switching, and the test subject to ATEadapter.1.2 PurposeThis standard has a dual purpose. The first purpose is to define the interfaces to services that obtain descrip-tive capability and control information about an ATS. The second purp
43、ose is to define the interfaces to ser-vices that perform virtual and real resource management.1.3 ApplicationThis standard is primarily intended for use by ATS customers, ATE system developers and maintainers, andtest program set (TPS) developers and maintainers. This standard will also be of inter
44、est to ABBET tooldevelopers and test instrument developers.IEEEStd 1226.3-1998 IEEE STANDARD FOR SOFTWARE INTERFACE FOR RESOURCE 2 Copyright 1998 IEEE. All rights reserved.2. ReferencesThis standard shall be used in conjunction with the following publications. When the following standardsare superse
45、ded by an approved revision, the revision will be considered for incorporation into this standard. 1Additional documents used in the development of this standard are listed in Annex D.IEEE Std 100-1996, IEEE Standard Dictionary of Electrical and Electronic Terms. 2IEEE Std 716-1995, IEEE Standard Te
46、st Language for All SystemsCommon/Abbreviated Test Languagefor All Systems (C/ATLAS).IEEE Std 1226-1993, IEEE Trial-Use Standard for A Broad-Based Environment for Test (ABBET) Over-view and Architecture.OMG CORBA/IIOP Revision 2.1, The Common Object Request Broker: Architecture and Specification. 3I
47、EEE P1226/D15.3, Draft Standard for A Broad-Based Environment for Test (ABBET) Overview andArchitecture. 4IEEE P1226.4/D2.1, Draft Standard for Software Interface for Instrument Drivers for A Broad-Based Envi-ronment for Test (ABBET), 15 May 1996.IEEE P1226.11/D4.1, Draft Standard for Test Resource
48、Information for A Broad-Based Environment forTest (ABBET), 15 May 1998.3. Definitions and acronyms3.1 DefinitionsIEEE Std 1226-1993 provides a complete glossary with definitions of all the terms used in the ABBET set ofstandards and guides. A clear understanding of the following terms with respect t
49、o an ATE system is partic-ularly important in order to understand this ABBET component standard.3.1.1 allocate: The process of identifying a resource for a particular task and making it unavailable to otherusers. The allocate process can occur during or prior to test execution. If a virtual resource is involved, theprocess of physical mapping is also included. Contrast: deallocate.3.1.2 automatic test equipment (ATE): Test, measurement, diagnostic, and automation equipment thatexecutes a sequence of manual or automated instructions that performs tests of function
