1、Designation:D733107 Designation: D7331 11Standard Practice forSewn Products Marker Data Interchange1This standard is issued under the fixed designation D7331; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of last revisio
2、n. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This practice describes a format for transferring marker data from a CAD marker software system to another or to a CAMsoftware sys
3、tem.1.2 This practice does not support curve interpolation or definitions. All curves are represented by discrete vectors and aredependent on the resolution of the CAD software.1.3 This practice is concerned in limiting differences when processing the same data on different CAD systems.1.4 This prac
4、tice is not intended to represent the dimension relationships between pattern pieces or between pattern sizes, orthe correspondence between 2D or 3D sewn product pattern piece geometries.1.5This practice does not specify the file format for the marker data exchange.1.6A consistent XML implementation
5、 of this practice is recommended.1.71.5 The file format for the marker data exchange file defined by this standard complies with the XML format.1.5.1 The XML schema describing marker data exchange standard XML structure is presented in an ASTM adjunct.21.6 This standard does not purport to address a
6、ll of the safety concerns, if any, associated with its use. It is the responsibilityof the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatorylimitations prior to use.2. Referenced Documents2.1 ASTM Standards:3D6963 Terminology Rel
7、ating to Sewn Products Automation2.2 ASTM Adjuncts: ASTM Adjunct:2XML Schema3. Terminology3.1 For all terminology related to Sewn Products Automation, see Terminology D6963.3.2 The following terms are relevant to this standard: drill hole, grainline, line, notch, style.3.3 The following terms are ne
8、w terms related to Sewn Products Automation:3.3.1 absolute pattern matching, nnesting specification where thea nested piece position match point shall have a specifiedposition in regard to a repeat line. See Fig. 1.3.3.2 bundle, nset of nested pieces that are intended to be processed together becaus
9、e they are issued from the same gradedstyle and are parts of the same end users product.3.3.2.1 DiscussionAll bundle pieces are to be cut on the same material.3.3.3 bundle group, nset of bundles that are used to define constraints.3.3.3.1 DiscussionAbundle may be part of several bundle groups for se
10、veral different constraints. Example: pockets from thejacket and the trousers of a suit may have a mutual rotation constraint.3.3.4 constraint, ndescription of the behavior that one or several nested piece of the marker should follow during markerprocessing.1This practice is under the jurisdiction o
11、f ASTM Committee D13 on Textiles and is the direct responsibility of Subcommittee D13.66 on Sewn Product Automation.Current edition approved Dec. 1, 2007. Published January 2008. DOI: 10.1520/D7331-07.Current edition approved Jan. 15, 2011. Published March 2011. Originally approved in 2007. Last pre
12、vious edition approved in 2007 as D7331-07. DOI:10.1520/D7331-11.2For referenced ASTM standards, visit the ASTM website, www.astm.org, or contact ASTM Customer Service at serviceastm.org. For Annual Book of ASTM Standardsvolume information, refer to the standards Document Summary page on the ASTM we
13、bsite.2Available from ASTM International Headquarters. Order Adjunct Number ADJD7331A. Original adjunct produced in 2007. Adjunct last revised in 2011.3For referenced ASTM standards, visit the ASTM website, www.astm.org, or contact ASTM Customer Service at serviceastm.org. For Annual Book of ASTM St
14、andardsvolume information, refer to the standards Document Summary page on the ASTM website.1This document is not an ASTM standard and is intended only to provide the user of an ASTM standard an indication of what changes have been made to the previous version. Becauseit may not be technically possi
15、ble to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current versionof the standard as published by ASTM is to be considered the official document.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, Wes
16、t Conshohocken, PA 19428-2959, United States.3.3.5 effciency, narea of the produced pieces located on the up side of the fabric, including blocking, versus area of themarker, defined by its length and its width.3.3.5.1 DiscussionPieces area inside fusing blocks is considered when calculating efficie
17、ncy. Fusing blocks area is notconsidered.3.3.6 fabric category, nidentifies the category to which the fabric belongs.3.3.6.1 DiscussionThe category allows the definition of fabric groups that will be used for pattern matching constraintsdefinitions.3.3.7 fabric type, ncharacteristic of a pattern pie
18、ce used to identify the material type the piece has to be made of.3.3.8 flipfive star pattern, ntransformation of a geometry that gives the symmetry of the graded piece geometry either acrossthe X axis or across the Y axis or across both, that is equivalent to a 180 degrees rotation.3.3.8.1Discussio
19、nThe X and Y axis to consider are those from the graded piece referential. motif on a plaid fabric wherethe center of the pattern unit cell has the same role as its four corners.3.3.9 graded pieceflip, nexplicit description of one or more specific sizes of a pattern piece, and related information us
20、ed toproduce it. transformation of a geometry that gives the symmetry of the sized piece geometry either across the X axis or acrossthe Y axis or across both, that is equivalent to a 180 degrees rotation. See Fig. 2.3.3.9.1 DiscussionThe X and Y axis to consider are those from the sized piece refere
21、ntial.3.3.10 graded piece repetitiongeometry to nest, ninstance of a graded piece in a graded style. geometry of a sized pieceor a nested piece used for nesting operation.3.3.10.1 DiscussionA graded piece may have several graded piece repetitions if its geometry is repeated several times in thegrade
22、d style. A graded piece repetition can be:3.3.10.2unflippedthe repetition geometry is the graded piece geometry.3.3.10.3X flippedthe repetition geometry is obtained by an X flip of the graded piece geometry.3.3.10.4Y flippedthe repetition geometry is obtained by a Y flip of the graded piece geometry
23、.3.3.10.5XY flippedthe repetition geometry is obtained by a Y flip and an X flip of the graded piece geometry. Geometry tonest is computed from geometry to produce with spacing added if it exists.3.3.11 geometry to produce, ngeometry of a sized piece or a nested piece used when cutting the marker.3.
24、3.11.1 DiscussionGeometry to produce is computed from reference geometry, enhanced with production processing suchas notch insertion and blocking.3.3.12 graded piece, nexplicit description of one or more specific sizes of a pattern piece, and related information used toproduce it.3.3.13 graded style
25、, nexplicit description of one or more specific sizes of a style, and related information used for production.3.3.11.13.3.13.1 DiscussionA graded style is composed of graded pieces.FIG. 1 Absolute MatchingFIG. 2 Unflipped and Flipped GeometriesD7331 1123.3.123.3.14 marker, nmain object that can be e
26、xchanged using this practice and that contains all the theoretical information neededto process nesting and production of a set of nested pieces on a flat material.3.3.13markerOrder3.3.15 marker order, nset of data containing all necessary information to nest a set of bundles.3.3.143.3.16 match poin
27、t, nspecific point on the geometry of a piece used to achieve absolute pattern matching or relative patternmatching.3.3.17 material, ndescription of the material structure. It includes material geometric information and optional repeat linesdescription.3.3.153.3.18 mutual constraint, nconstraint tha
28、t applies to several nested pieces in such way that all these nested pieces must respectthis constraint in the same way.3.3.163.3.19 nested piece, nthe smallest entity that can be nested. Can be nested or not.3.3.16.13.3.19.1 DiscussionA nested piece is an instance of a gradedsized piece repetition
29、and contains geometrical description andpositioning parameters.3.3.173.3.20 pattern piece, ndesign level description of an elementary part of a sewn product.3.3.17.13.3.20.1 DiscussionThe Pattern piece is a design entity, not suited for production. It is not included in the marker.3.3.183.3.21 plaid
30、 fabric, nfabric which has repeat lines in both the X and Y directions.3.3.193.3.22 plot line, ninternal line intended to be plot.3.3.20repeat line3.3.23 primary repeat line, nline that is a characteristic of a structured fabric and that is periodically repeated at a knownincrement throughout the wh
31、ole material.3.3.20.1particular repeat line from which can be defined other parallel repeat lines.3.3.23.1 DiscussionAn X repeat line is parallel to the X axis and is repeated along the Y direction. Similarly, a Y repeat lineis parallel to the Y axis and is repeated along the X direction.3.3.21There
32、 are at most two primary repeat lines on a fabric.3.3.24 reference geometry, ngeometrical description of the graded shape issued from the original CAD system using its owngrading engine, without any other computation associated to the production.3.3.25 relative pattern matching, nnesting specificati
33、on where nested pieces positions are mutually constrained to have thesame offset (non-symmetrical matching) or opposite offset (symmetrical matching) in regard to a repeat line.nesting specificationwhere nested pieces match point positions are mutually constrained to have the same offset (non-symmet
34、rical matching) oropposite offset (symmetrical matching) in regard to a repeat line. See Fig. 3.3.3.26 repeat line, nline that is a characteristic of a structured fabric and that is periodically repeated at a known incrementthroughout the whole material. See Fig. 43.3.22.FIG. 3 Relative MatchingD733
35、1 1133.3.26.1 DiscussionAn X repeat line is parallel to the X axis and is repeated along the Y direction. Similarly, a Y repeat lineis parallel to the Y axis and is repeated along the X direction.3.3.27 shrinkage, ndimensional reduction that a material will undergo in the part of the processing that
36、 will follow the cuttingphase.3.3.22.13.3.27.1 DiscussionTwo-dimensional anisotropic shrinkage is modeled by two one-dimensional coefficients (X shrinkage andY shrinkage) that represent respectively the reduction factor that will later apply along each of the X and Y directions.3.3.233.3.28 sized pi
37、ece, nrepresentation of a graded piece in a specific size.3.3.29 sized piece repetition, ninstance of a sized piece in a graded style.3.3.29.1 DiscussionA sized piece may have several sized piece repetitions if its geometry is repeated several times in thegraded style. A sized piece repetition can b
38、e:3.3.29.2 unflippedthe repetition geometry is the sized piece geometry.3.3.29.3 X flippedthe repetition geometry is obtained by an X flip of the sized piece geometry.3.3.29.4 Y flippedthe repetition geometry is obtained by a Y flip of the sized piece geometry.3.3.29.5 XY flippedthe repetition geome
39、try is obtained by a Y flip and an X flip of the sized piece geometry.3.3.30 splice mark, ngeometrical information requested to start the spreading process over again at correct position after ithas been interrupted due to material physical defect processing.3.3.243.3.31 split, noperation that cuts
40、a piece in two sub parts at marker processing time.3.3.253.3.32 symmetric pair, nset of two gradedsized piece repetitions or nested pieces that differ only by one X or Y flip one fromthe other and that may ask to be symmetrically processed.3.3.25.13.3.32.1 DiscussionBoth sleeves of a shirt are often
41、 part of a symmetric pair. Symmetric pairs are often issued fromdouble X or double Y gradedsized piece repetitions.3.3.263.3.33 tilt, nangular tolerance within which a nested piece is allowed to be rotated around its otherwise specifiedposition.3.3.273.3.34 waste, narea of unused material versus tot
42、al material area.4. Summary of Practice4.1 This practice represents a marker containing:4.1.1 The description of the material used for production,4.1.2 The quantities of pieces that are to be nested and to be produced,4.1.3 The description of piece geometries,4.1.4 The description of nesting constra
43、ints, and4.1.5 The description of piece positions.5. Significance and Use5.1 This practice is intended to allow marker data exchange between nesting software or CAM systems.5.2 The pieces description, exported by a CAD system, is dedicated to CAM systems.6. General Structure6.1 This practice defines
44、 a tree-based structure composed of elements.FIG. 4 Example of Striped Fabric Described Using X Repeat LinesD7331 1146.2 Full description is available in an XML Schema file appended to this practice, where elements as referenced in 6.1 aremapped to XML elements or XML attributes.6.3 The root element
45、 of this tree structure is the Marker.6.4 UnitsThis practice allows for information to be exchanged using the international metric system or using the Imperialsystem. Only one measure system can be used throughout the whole Marker Data Exchange file.6.4.1 If using metric system:6.4.1.1 Angles are ex
46、pressed in degrees, with an optional decimal part introduced by a dot.6.4.1.2 Lengths, positions and distances are expressed in centimeters, with an optional decimal part introduced by a dot.6.4.1.3 Surfaces are expressed in square centimeters, with an optional decimal part introduced by a dot.6.4.2
47、 If using Imperial system:6.4.2.1 Angles are expressed in degrees, with an optional decimal part introduced by a dot.6.4.2.2 Lengths, positions and distances are expressed in inches, with an optional decimal part introduced by a dot.6.4.2.3 Surfaces are expressed in square inches, with an optional d
48、ecimal part introduced by a dot.7. Marker Marker (see Fig. 5)47.1 schemaVersionVersion number of the schema used to create the marker.7.2 MarkerNameName of the marker concerned by this practice.7.27.3 MarkerlnformationInformation about marker generation.7.2.17.3.1 userName(optional) Name of the user
49、 who generated the marker file.7.2.27.3.2 creationDate(optional) Creation date of the marker.7.2.37.3.3 modificationDate(optional) Date of the last marker modification.7.2.47.3.4 platform(optional) Vendor name of the application that generated the marker file.7.2.57.3.5 application(optional) Application name that generated the marker file.7.2.67.3.6 applicationVersion(optional) Version of the application that generated the marker file.7.37.4 Marker Attributes:7.3.17.4.1 unitsValue is either “Metric” o
