1、BS EN12668-2:2010ICS 19.100NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBRITISH STANDARDNon-destructive testing Characterizationand verification ofultrasonic examinationequipmentPart 2: ProbesThis British Standardwas published under theauthority of the StandardsPolicy and St
2、rategyCommittee on 28 February2010 BSI 2010ISBN 978 0 580 58074 1Amendments/corrigenda issued since publicationDate CommentsBS EN 12668-2:2010National forewordThis British Standard is the UK implementation of EN 12668-2:2010. Itsupersedes BS EN 12668-2:2001 which is withdrawn.The UK participation in
3、 its preparation was entrusted to TechnicalCommittee WEE/46, Non-destructive testing.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisionsof a contract. Users are responsible for its
4、correct application.Compliance with a British Standard cannot confer immunityfrom legal obligations.BS EN 12668-2:2010EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 12668-2 February 2010 ICS 19.100 Supersedes EN 12668-2:2001English Version Non-destructive testing - Characterization and verific
5、ation of ultrasonic examination equipment - Part 2: Probes Essais non destructifs - Caractrisation et vrification de lappareillage de contrle par ultrasons - Partie 2: Traducteurs Zerstrungsfreie Prfung - Charakterisierung und Verifizierung der Ultraschall-Prfausrstung - Teil 2: Prfkpfe This Europea
6、n Standard was approved by CEN on 25 December 2009. CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references con
7、cerning such national standards may be obtained on application to the CEN Management Centre or to any CEN member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CEN member into its
8、own language and notified to the CEN Management Centre has the same status as the official versions. CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Lat
9、via, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Kingdom. EUROPEAN COMMITTEE FOR STANDARDIZATION COMIT EUROPEN DE NORMALISATION EUROPISCHES KOMITEE FR NORMUNG Management Centre: Avenue Marnix 17, B-1000 Bruss
10、els 2010 CEN All rights of exploitation in any form and by any means reserved worldwide for CEN national Members. Ref. No. EN 12668-2:2010: EBS EN 12668-2:2010EN 12668-2:2010 (E) 2 Contents Page Foreword 41 Scope 52 Normative references 53 Terms and definitions .54 General requirements for complianc
11、e .75 Technical specification for probes 76 Test equipment . 116.1 Electronic equipment . 116.2 Test blocks and other equipment . 117 Performance requirements for probes . 147.1 Physical aspects . 147.1.1 Method . 147.1.2 Acceptance criterion 147.2 Radio frequency pulse shape 147.2.1 Method . 147.2.
12、2 Acceptance criterion 147.3 Pulse spectrum and bandwidth . 147.3.1 Method . 147.3.2 Acceptance criteria . 157.4 Relative pulse-echo sensitivity . 157.4.1 Method . 157.4.2 Acceptance criterion 157.5 Distance-amplitude curve 157.5.1 Method . 157.5.2 Acceptance criterion 167.6 Electrical impedance 177
13、.6.1 Method . 177.6.2 Acceptance criteria . 177.7 Beam parameters for immersion probes . 177.7.1 General . 177.7.2 Beam profile measurements performed directly on the beam . 187.7.3 Beam profile measurements made using an automated scanning system 207.8 Beam parameters for contact, straight-beam, si
14、ngle transducer probes . 217.8.1 General . 217.8.2 Beam divergence and side lobes 227.8.3 Squint angle and offset 237.8.4 Focal distance (near field length) 237.8.5 Focal width 247.8.6 Focal length . 247.9 Beam parameters for contact angle-beam single transducer probes. 257.9.1 General . 257.9.2 Ind
15、ex point . 257.9.3 Beam angle and beam divergence 257.9.4 Squint angle and offset 267.9.5 Focal distance (near field length) 277.9.6 Focal width 287.9.7 Focal length . 287.10 Beam parameters for contact, straight beam, dual-element probes . 297.10.1 General . 297.10.2 Cross talk . 297.10.3 Distance
16、to sensitivity maximum (focal distance) 297.10.4 Axial sensitivity range (focal length) 29BS EN 12668-2:2010EN 12668-2:2010 (E) 3 7.10.5 Lateral sensitivity range (focal width) . 307.11 Beam parameters for contact angle beam, dual-element probes 307.11.1 General 307.11.2 Cross talk . 317.11.3 Index
17、point 317.11.4 Beam angle and profiles . 317.11.5 Distance to sensitivity maximum (focal distance) . 327.11.6 Axial sensitivity range (focal length) . 327.11.7 Lateral sensitivity range (focal width) . 32Annex A (normative) Calculation of near field length of non-focusing probes 45A.1 General 45A.2
18、Straight beam probes 45A.3 Angle beam probes . 46Annex B (informative) Calibration block for angle-beam probes . 48Bibliography 52BS EN 12668-2:2010EN 12668-2:2010 (E) 4 Foreword This document (EN 12668-2:2010) has been prepared by Technical Committee CEN/TC 138 “Non-destructive testing”, the secret
19、ariat of which is held by AFNOR. This European Standard shall be given the status of a national standard, either by publication of an identical text or by endorsement, at the latest by August 2010, and conflicting national standards shall be withdrawn at the latest by August 2010. Attention is drawn
20、 to the possibility that some of the elements of this document may be the subject of patent rights. CEN and/or CENELEC shall not be held responsible for identifying any or all such patent rights. This document supersedes EN 12668-2:2001. EN 12668, Non-destructive testing Characterization and verific
21、ation of ultrasonic examination equipment, consists of the following parts: Part 1: Instruments Part 2: Probes Part 3: Combined equipment Annex A is normative. Annex B is informative. According to the CEN/CENELEC Internal Regulations, the national standards organizations of the following countries a
22、re bound to implement this European Standard: Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, S
23、pain, Sweden, Switzerland and the United Kingdom. BS EN 12668-2:2010EN 12668-2:2010 (E) 5 1 Scope This European Standard covers probes used for ultrasonic non-destructive examination in the following categories with centre frequencies in the range 0,5 MHz to 15 MHz, focusing and without focusing mea
24、ns: a) single or dual transducer contact probes generating compressional or shear waves; b) single transducer immersion probes. Where material-dependent ultrasonic values are specified in this document they are based on steels having a sound velocity of (5 920 50) m/s for longitudinal waves, and (3
25、255 30) m/s for transverse waves. Periodic tests for probes are not included in this document. Routine tests for the verification of probes using on-site methods are given in EN 12668-3. If parameters in addition to those specified in EN 12668-3 are to be verified during the probes life time, as agr
26、eed upon by the contracting parties, the methods of verification for these additional parameters should be selected from those given in this document. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edit
27、ion cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. EN 1330-4:2010, Non-destructive testing Terminology Part 4: Terms used in ultrasonic testing EN 12668-1, Non-destructive testing Characterization and verification of ultrasoni
28、c examination equipment Part 1: Instruments EN ISO 79631), Non-destructive testing Ultrasonic testing Specification for calibration block n 2 (ISO 7963:1985) 3 Terms and definitions For the purposes of this document, the terms and definitions given in EN 1330-4:2010 and the following apply. 3.1 dead
29、 zone depth of the zone immediately beneath the coupling surface of the work piece, in which it is not possible to detect a given reflector 3.2 focal distance near field length point on the acoustical axis where the acoustic pressure is at its maximum 3.3 horizontal plane of a sound beam plane perpe
30、ndicular to the vertical plane of the sound beam including the acoustical axis in the material 1) Under preparation. BS EN 12668-2:2010EN 12668-2:2010 (E) 6 3.4 operating frequency focentre frequency arithmetic mean of upper and lower cut-off frequency 2olufff+= (1) NOTE In the frequency spectrum of
31、 an echo the upper and lower cut-off-frequencies are determined at -6 dB compared to the maximum amplitude. 3.5 peak-to-peak amplitude h maximum deviation between the largest positive and the largest negative cycles of the pulse NOTE See Figure 1. 3.6 probe data sheet sheet containing the informatio
32、n required by this standard NOTE The data sheet need not necessarily be a test certificate of performance. 3.7 pulse duration time interval over which the modulus of the unrectified pulse amplitude exceeds 10 % of its maximum amplitude, as shown in Figure 1 3.8 reference side reference side is the r
33、ight side of an angle beam probe looking in the direction of the beam, unless otherwise specified by the manufacturer 3.9 relative bandwidth frelratio of the difference between the upper and lower cut-off frequencies fuand fland the centre frequency fofrel= (fu- fl)/fo 100 % NOTE The relative bandwi
34、dth is expressed in percent (%). 3.10 squint angle for straight-beam probes deviation between the axis of the beam and a perpendicular to the coupling surface at the emission point NOTE 1 See Figure 2. angle between the sides of the probe housing and the measured beam axis, projected onto the plane
35、of the probe face NOTE 2 See Figure 3. 3.11 vertical plane of a sound beam plane in which the sound beam axis in the probe wedge and the sound beam axis in the inspected component both lie BS EN 12668-2:2010EN 12668-2:2010 (E) 7 4 General requirements for compliance An ultrasonic probe complies with
36、 this standard if it satisfies the following conditions: a) the probe shall comply with Clause 7; b) either a declaration of conformity, issued by a manufacturer operating a certified quality management system, or issued by an organization operating an accredited test laboratory shall be available;
37、NOTE It is recommended that the certification is carried out in accordance with EN ISO 9001, or that the accreditation is carried out in accordance with EN ISO/IEC 17025. c) the probe shall be clearly marked to identify the manufacturer, and carry a unique serial number, showing operating frequency,
38、 transducer size, angle, or a permanent reference number from which this information can be traced; d) a technical specification (data sheet) for the appropriate type and series of probe which defines the performance criteria in accordance with Clause 5 shall be available. The quality of probes will
39、 be assured in one of the following ways: e) by issuing a declaration of conformity based on statistical analysis where a number of identical probes are manufactured under a quality management system. The manufacturer shall supply a data sheet which includes the values of the specified parameters wi
40、th tolerances; f) by issuing a declaration of conformity quoting the results of measurements made on each probe. 5 Technical specification for probes Table 1 gives the list of information to be reported in a data sheet for all probes within the scope of this standard (I = Information, M = Measuremen
41、t, C = Calculation). The data sheet shall also contain information concerning the ultrasonic instrument used for the test, its settings and coupling conditions, etc. The operating temperature range of the probe, and any special conditions for storage or protection during transport shall also be stat
42、ed in the data sheet. For probes intended for use at elevated temperatures, the manufacturer shall provide information on the maximum operating temperature in relation to the time of use, and the effect of temperature on the sensitivity and on the beam angle. BS EN 12668-2:2010EN 12668-2:2010 (E) 8
43、Table 1 List of information to be given in a data sheet Category of probe Contact Immersion Straight beam Angle beam StraightInformation Compressional Shear Compressional Shear Compressional to be given Single Double Single Single Double Single Double Single non-f. focus. non-f. focus. non-f. non-f.
44、 focus. non-f. focus. non-f. focus. non-f. focus. non-f. focus. Manufacturers name I I I I I I I I I I I I I I I Type of probe I I I I I I I I I I I I I I I Weight and size of probe I I I I I I I I I I I I I I I Type of connectors I I I I I I I I I I I I I I I TR connectors interchangeable? I I I I
45、I I Material of transducers I I I I I I I I I I I I I I I Shape and size of transducers I I I I I I I I I I I I I I I Material of wedge, delay I I I I I I I I I I I I Material of wear plate I Wear allowance I I I I I I I I I I I I I = Information; M = Measurement; C = Calculation. continued BS EN 12
46、668-2:2010EN 12668-2:2010 (E) 9 Table 1 (continued) Category of probe Contact Immersion Straight beam Angle beam StraightParameters to be Compressional Shear Compressional Shear Compressional measured or calculated Single Double Single Single Double Single Double Single non-f. focus. non-f. focus. n
47、on-f. non-f. focus. non-f. focus. non-f. focus. non-f. focus. non-f. focus. Cross talk damping M M M M M M Pulse shape (time and frequency) M M M M M M M M M M M M M M M Centre frequency, band width M M M M M M M M M M M M M M M Pulse-echo sensitivity M M M M M M M M M M M M M M M Distance-amplitude
48、 curve M,C M,C M,C M,C M,C M,C M,C M,C M,C M,C M,C M,C M,C M,C M,C Impedance, static capacitance M M M M M M M M M M M M M M M I = Information; M = Measurement; C = Calculation; M,C = Measurement or calculation. continued BS EN 12668-2:2010EN 12668-2:2010 (E) 10 Table 1 (end) Category of probe Conta
49、ct Immersion Straight beam Angle beam StraightParameters to be Compressional Shear Compressional Shear Compressional measured or calculated Single Double Single Single Double Single Double Single non-f. focus. non-f. focus. non-f. non-f. focus. non-f. focus. non-f. focus. non-f. focus. non-f. focus. Probe index M M M M M M M M Beam angle M M M M M M M M Angles of divergence M M
