1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Updated drawing to reflect MIL-H-38534 processing. Editorial changes throughout. 91-12-10 Alan Barone B Correct paragraphs 1.3 and 4.3.1.b. Correct table II. Update drawing boilerplate. 02-02-13 Raymond Monnin C Update drawing. -gz 07-01-09 Josep
2、h Rodenbeck THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. CURRENT CAGE CODE 67268 REV SHEET REV SHEET REV STATUS REV C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Donald R. Osborne DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY D
3、an DiCenzo POST OFFICE BOX 3990 COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Nelson A. Hauck MICROCIRCUIT, HYBRID, LINEAR, WIDE BAND POWER OPERATIONAL AMPLIFIER, THICK FILM AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL
4、 DATE 85-10-21 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 14933 85089 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E130-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85089 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS,
5、 OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents one product assurance class, class H (high reliability) and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). 1.2 PIN. The PIN
6、 shall be as shown in the following example: 85089 01 Y X Drawing number Device type Case outline Lead finish (see 1.2.1) (see 1.2.2) (see 1.2.3) 1.2.1 Device type(s). The device type(s) shall identify the circuit function as follows: Device type Generic number Circuit function 01 LH0101A, FLH0101AK
7、 Power operational amplifier 02 LH0101, FLH01010K Power operational amplifier 1.2.2 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style Y See figure 1 8 Metal base flange mount (TO-3) 1.2.3 Lead fin
8、ish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. Supply voltage (VS) 22 V dc Input voltage range 20 V dc but VS Power dissipation (PD) 1/ 5 W Power dissipation (PD) 2/ 62 W Differential input voltage 40 V dc but VSPeak output current (50 ms pulse). 5 A Outpu
9、t short circuit duration 3/ Continuous Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds). +300C Thermal resistance: Junction-to-case (JC). 2C/W Junction-to-ambient (JA) 25C/W Junction temperature (TJ) +150C 1.4 Recommended operating conditions. Ambient operating temper
10、ature range (TA) -55C to +125C 1/ TA= +25C. Derate linearly at 25C/W to zero at 150C. 2/ TC= +25C. Derate linearly at 2C/W to zero at 150C. 3/ TA= +25C, RSC= 0.35. Rating applies as long as package power dissipation is not exceeded. Provided by IHSNot for ResaleNo reproduction or networking permitte
11、d without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85089 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, an
12、d handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENS
13、E STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are
14、 available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the refere
15、nces cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device class H shall be i
16、n accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for applicable device class. The manufacturer may eliminate, modify or optimize the tests and insp
17、ections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physica
18、l dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
19、 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85089 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics. Unless oth
20、erwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests f
21、or each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general
22、performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all
23、 parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall b
24、e required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conforman
25、ce as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) pla
26、n. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The te
27、st circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with th
28、e intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the disc
29、retion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85089 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical perform
30、ance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max 01 3 1 02 10 01 7 Input offset voltage VIO 2,3 02 15 mV 01 300 1 02 1000 pA 01 300 Input bias current IIB 2,3 02 1000 nA 01 75 1 02 250 pA 01 75 Input offset cur
31、rent IIO 2,3 02 250 nA Large signal voltage gain AVOL VO= 10 V, RL= 10, TA= +25C 1 All 50 V/mV RSC= 0, AV= 1, RL= 100, TA= +25C 1 All 11.7 Output voltage swing VORSC= 0, AV= 1, RL= 10, TA= +25C 1 All 11 V Common mode rejection ratio CMRR VIN= 10 V, TA= +25C 1 All 85 dB See footnotes at end of table.
32、 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85089 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Cont
33、inued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max 5 V VS 15 V, TA= +25C 1 All 85 +5 V +VS +15 V, -VS= -15 V, TA= +25C 1 All 80 Power supply rejection ratio PSRR 5 V -VS -15 V, +VS= +15 V, TA= +25C 1 All 80 dB Supply current IS
34、 TA= +25C 1 All 35 mA Slew rate SR RL= 10, AV= 1, TA= +25C1 All 7.5 V/s Gain-bandwidth product SR RL= , AV= 1, TA= +25C1 All 4 MHz 1/ Unless otherwise specified, VS= 15 V and VCM= 0 V. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIR
35、CUIT DRAWING SIZE A 85089 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 Case outline X. Millimeters Inches Symbol Min Max Min MaxA 38.33 39.35 1.509 1.549 B 22.35 23.50 .880 .925 B1 19.30 19.69 .760 .775 C 8.76 10.03 .345 .395 D 0.92 1.12 .03
36、6 .044 E 2.16 2.66 .085 .105 F 40 BSC 40 BSCF1 80 BSC 80 BSCG 12.57 12.83 .495 .505 H 29.90 30.40 1.177 1.197 J 14.96 15.22 .589 .599 K 5.59 7.11 .220 .280 Q 3.89 4.04 .153 .159 R 24.89 25.91 .980 1.020 NOTES: 1. Leads in true position within 0.010 inch (0.25 mm) R at MMC at seating plane. 2. The U.
37、 S. preferred system of measurement is the metric SI. This case outline was originally designed using inch-pound units of measurement, in the event of conflict between the metric and inch-pound units, the inch-pound shall take precedence. 3. Pin numbers are for reference and may not be marked on pac
38、kage. FIGURE 1. Case outline(s). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85089 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Case ou
39、tline X Terminal number Terminal symbol 1 2 3 4 5 6 7 8 Case +Current limit (ISC+) +VS Feedback (See note) -VIN+VIN-VS-Current limit (ISC-) Output NOTE: 1. Pin 4 is electrically connected internally. No connection should be made to pin. FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo
40、 reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85089 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in
41、accordance with MIL-PRF-38534, group A test table) Interim electrical parameters - Final electrical parameters 1*, 2, 3 Group A test requirements 1, 2, 3 Group C end-point electrical parameters 1, 2, 3 * PDA applies to subgroup 1. 4.3 Conformance and periodic inspections. Conformance inspection (CI)
42、 and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, 8, 9, 10, and 11 sh
43、all be omitted. 4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534. 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. Ste
44、ady-state life test, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify
45、 the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1005 of MIL-STD-883. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4
46、.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38534. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS
47、-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85089 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 10 DSCC FORM 2234 APR 97 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipme
48、nt), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated as specified in MIL-PRF-38534. 6.4 Record of users. Military and industrial users shall infor
