1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED B Changes IAW NOR 5962-R087-93. tjr 93-02-25 Monica L. Poelking C Add case outline Z. Update boilerplate to MIL-PRF-38535 requirements. jak 01-08-27 Thomas M. Hess D Update boilerplate to MIL-PRF-38535 requirements. - LTG 08-04-16 Thomas M. Hess Cu
2、rrent CAGE CODE is 67268 REV SHET REV SHET REV STATUS REV D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Greg A. Pitz DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Daniel A. DiCenzo COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil TH
3、IS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Nelson A. Hauck AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 87-05-12 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL BUFFER/LINE DRIVER WITH THREE- STATE OUTPUTS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL D SIZE A CAGE C
4、ODE 14933 5962-87551 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E305-08 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87551 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DS
5、CC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87551 01 L
6、 A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54AC241 Octal buffer/line driver with three-state outputs 02 54AC11241 Octal buffe
7、r/line driver with three-state outputs 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style L GDIP3-T24 or CDIP4-T24 24 Dual-in-line R GDIP1-T20 or CDIP4-T24 20 Dual-in-line S GDFP2-F20 or CDFP3-F20
8、 20 Flat pack Z GDFP1-G20 20 Flat pack with gull wing 2 CQCC1-N20 20 Square leadless chip carrier 3 CQCC1-N28 28 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range (VCC) -0.5 V dc to +6.0 V
9、dc 1/ DC Input voltage range (VIN) -0.5 V dc to VCC+ 0.5 V dc 1/ DC Output voltage range (VIN) . -0.5 V dc to VCC+ 0.5 V dc 1/ Clamp diode current. 20 mA DC output current (per pin) 50 mA DC VCCor GND current 100 mA Storage temperature range (TSTG) . -65C to +150C Maximum power dissipation (PD) . 50
10、0 mW Lead temperature (soldering, 10 seconds). +260C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +175C 2/ 1/ Unless otherwise specified, all voltages are referenced to GND. 2/ Maximum junction temperature shall not be exceeded except for allowable short dur
11、ation burn-in screening conditions in accordance with method 5004 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87551 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL
12、D SHEET 3 DSCC FORM 2234 APR 97 1.4 Recommended operating conditions. Supply voltage range (VCC) +3.0 V dc to +5.5 V dc 1/ Input voltage range (VIN) 0.0 V dc to VCCOutput voltage range (VOUT). 0.0 V dc to VCCCase operating temperature range (TC). -55C to +125C Input rise or fall times: Device type 0
13、1; Data inputs, VCC= 3.6 V, VCC= 5.5 V 0 to 8 ns/V Output enable inputs, VCC= 3.6 V, VCC= 5.5 V . 0 to 8 ns/V Device type 02; Data inputs, VCC= 3.6 V, VCC= 5.5 V 0 to 8 ns/V Output enable inputs, VCC= 3.6 V, VCC= 5.5 V . 0 to 5 ns/V 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, an
14、d handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Cir
15、cuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780
16、 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the ev
17、ent of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Operation from 2.0 V dc to 3.0 V dc is provid
18、ed for compatibility with data retention and battery backup systems. Data retention implies no input transitions and no stored data loss with the following conditions: VIH 70% VCC, VIL 30% VCC, VOH 70% VCC -20 A, VOL 30% VCC 20 A. Provided by IHSNot for ResaleNo reproduction or networking permitted
19、without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87551 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appe
20、ndix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML p
21、roduct in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or f
22、unction of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physi
23、cal dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specif
24、ied on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 4. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electr
25、ical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table
26、I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manu
27、facturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification
28、mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance s
29、ubmitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shal
30、l be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the
31、 manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87551 DEFEN
32、SE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Test conditions -55C TC +125C unless otherwise specified Group A subgroups Limits Min Max Unit VCC= 3.0 V 2.9 VCC= 4.5 V 4.4 VIN= VIHminimum
33、 or VILmaximum IOH= -50 A VCC= 5.5 V 5.4 VIN= VIHminimum or VILmaximum IOH= -4.0 mA VCC= 3.0 V 2.4 VCC= 4.5 V 3.7 VIN= VIHminimum or VILmaximum IOH= -24 mA VCC= 5.5 V 4.7 High-level output voltage VOH1/ VIN= VIHminimum or VILmaximum IOH= -50 mA VCC= 5.5 V 1, 2, 3 3.85 V VCC= 3.0 V 0.1 VCC= 4.5 V 0.1
34、 VIN= VIHminimum or VILmaximum IOH= 50 A VCC= 5.5 V 0.1 VIN= VIHminimum or VILmaximum IOH= 12 mA VCC= 3.0 V 0.5 VCC= 4.5 V 0.5 VIN= VIHminimum or VILmaximum IOH= 24 mA VCC= 5.5 V 0.5 Low-level output voltage VOL1/ VIN= VIHminimum or VILmaximum IOH= 50 mA VCC= 5.5 V 1, 2, 3 1.65 V VCC= 3.0 V 1, 2, 3
35、2.1 VCC= 4.5 V 1, 2, 3 3.15 High-level input voltage VIH2/ VCC= 5.5 V 1, 2, 3 3.85 V VCC= 3.0 V 1, 2, 3 0.9 VCC= 4.5 V 1, 2, 3 1.35 Low-level input voltage VIL2/ VCC= 5.5 V 1, 2, 3 1.65 V IILVIN= 0.0 V -1.0 Input leakage current IIHVIN= 5.5 V VCC= 5.5 V 1, 2, 3 1.0 A ICCH160 ICCL160 Quiescent curren
36、t ICCZVIN= VCCor GND VCC= 5.5 V 1, 2, 3 160 A IOZH10.0 Off-state output leakage current IOZLVIN= VIHminimum or VILmaximum VCC= 5.5 V VOUT= VCCor GND 1, 2, 3 -10.0 A Input capacitance CINSee 4.3.1c 4 8.0 pF Power dissipation capacitance CPD3/ See 4.3.1c 4 60.0 pF Functional tests Tested at VCC= 4.5 V
37、 and repeated at VCC= 5.5 V, see 4.3.1d 7, 8 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87551 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEE
38、T 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Test conditions -55C TC +125C unless otherwise specified Group A subgroups Limits Min Max Unit 9 1.0 10.0 VCC= 3.0 V 10, 11 1.0 11.5 9 1.0 8.0 tPHL4/ VCC= 4.5 V 10, 11 1.0 9.0 9 1.0 10.5 VCC= 3.0 V 10,
39、 11 1.0 12.2 9 1.0 8.5 Propagation delay time, mAn to mYn tPLH4/ CL= 50 pF RL= 500 See figure 4 VCC= 4.5 V 10, 11 1.0 9.5 ns 9 1.0 12.0 VCC= 3.0 V 10, 11 1.0 13.0 9 1.0 10.5 tPHZ4/ VCC= 4.5 V 10, 11 1.0 11.5 9 1.0 12.0 VCC= 3.0 V 10, 11 1.0 13.0 9 1.0 10.5 Output disable time, OE1, OE2 to mYn tPLZ4/
40、 CL= 50 pF RL= 500 See figure 4 VCC= 4.5 V 10, 11 1.0 11.5 ns 9 1.0 11.5 VCC= 3.0 V 10, 11 1.0 13.8 9 1.0 9.0 tPZH4/ VCC= 4.5 V 10, 11 1.0 10.0 9 1.0 11.5 VCC= 3.0 V 10, 11 1.0 13.0 9 1.0 9.0 Output enable time, OE1, OE2 to mYn tPZL4/ CL= 50 pF RL= 500 See figure 4 VCC= 4.5 V 10, 11 1.0 10.0 ns 1/ V
41、OHand VOLtests will be tested at VCC= 3.0 V and VCC= 4.5 V. VCC= 5.5 V tests are guaranteed, if not tested. Limits shown apply to operation at VCC= 3.3 V 0.3 V and VCC= 5.0 V 0.5 V. Transmission driving tests are performed at VCC= 5.5 V with a 2 ms duration maximum. 2/ The VIHand VILtests are not re
42、quired and shall be applied as forcing functions for the VOHand VOLtests. 3/ Power dissipation capacitance (CPD), determines the dynamic power consumption. PD= (CPD+ CL) VCC2 f+ICCVCC, and the dynamic current consumption (IS) is, IS= (CPD+ CL) VCC f + ICC. 4/ AC limits at VCC= 5.5 V are equal to lim
43、its at VCC= 4.5 V and guaranteed by testing at VCC= 4.5 V. Minimum ac limits are guaranteed for VCC= 5.5 V by guardbanding VCC= 4.5 V limits to 1.5 ns (minimum). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 596
44、2-87551 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 Device types 01 02 Case outlines R, S, Z, and 2 L 3 Terminal number Terminal symbol 1 OE1 1Y1 NC 2 1A1 2Y1 VCC3 4Y2 3Y1 4A1 4 2A1 4Y1 3A1 5 3Y2 GND 2A1 6 3A1 GND 1A1 7 2A2 GND OE1 8 4A1 GN
45、D NC 9 1Y2 1Y2 1Y1 10 GND 2Y2 2Y1 11 1A2 3Y2 3Y1 12 4Y1 4Y2 4Y1 13 2A2 OE2 GND 14 3Y1 4A2 GND 15 3A2 3A2 NC 16 2Y1 2A2 GND 17 4A2 1A2 GND 18 1Y1 VCC1Y2 19 OE2 VCC2Y2 20 VCC4A1 3Y2 21 3A1 4Y2 22 2A1 NC 23 1A1 OE2 24 OE1 4A2 25 3A2 26 2A2 27 1A2 28 VCCNC = No connection. FIGURE 1. Terminal connections
46、. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87551 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 Device types 01 and 02 Inputs Outputs OE1 OE2 mA
47、n mYn L H L L L H H H H L X Z H = High voltage level L = Low voltage level X = Irrelevant Z = High impedance FIGURE 2. Truth table. FIGURE 3. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-875
48、51 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 9 DSCC FORM 2234 APR 97 FIGURE 4. Switching waveforms and test circuit. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87551 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 10 DSCC FORM 2234 APR 97 NOTES: 1. Preferred method: When measuring tPHZand tPZH: VTEST= GND When measurin
