1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Make changes to the RIN, GBWP, and CLSG tests as specified under Table I. Changes in accordance with N.O.R. 5962-R163-93. 93-05-20 M. A. FRYE B Drawing updated to reflect current requirements. Redrawn. - ro 01-03-15 R. MONNIN C Update boilerplate
2、 paragraphs to current MIL-PRF-38535 requirements. - ro 10-02-03 C. SAFFLE REV SHET REV SHET REV STATUS REV C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY RICK C. OFFICER DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT D
3、RAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY CHARLES E. BESORE APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, HIGH CURRENT, HIGH SPEED, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON DRAWING APPROVAL DATE 92-12-16 AMSC N/A REVISION LE
4、VEL C SIZE A CAGE CODE 67268 5962-89721 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E173-10 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89621 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION
5、LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following exampl
6、e: 5962-89721 01 G X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 HA-2529 Uncompensated high slew rate, high output current, opera
7、tional amplifier 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style G MACY1-X8 8 Can P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead f
8、inish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Voltage between +VSand VSterminals . 40 V dc Differential input voltage . 15 V dc Voltage at either input terminal . +VSand VSPeak output current (10 % duty cycle) 90 mA Maxim power dissipation (PD): Case G 670 mW 1/ C
9、ase P 710 mW 2/ Case 2 . 1350 mW 3/ Junction temperature (TJ) . +175C/W Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) . +275C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case G 148C/W Case P 140C/W Ca
10、se 2 . 74C/W _ 1/ Derate linearly above TA= +75C at 6.7 mW/C. 2/ Derate linearly above TA= +75C at 7.1 mW/C. 3/ Derate linearly above TA= +75C at 13.4 mW/C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-896
11、21 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.4 Recommended operating conditions. Operating supply voltage 15 V dc Common mode input voltage (VCM) . (+VS- -VS) / 2 Load resistance (RL) . 500 Ambient temperature range (TA) -55C to +125C 2
12、. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract.
13、DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS M
14、IL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-509
15、4.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIRE
16、MENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer
17、 or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM)
18、 plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QM
19、L flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The
20、terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test require
21、ments. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89621 DEF
22、ENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max Input offset voltage VIOVCM= 0
23、V 1 01 -5.0 +5.0 mV 2,3 -8.0 +8.0 Input bias current +IBVCM= 0 V, +RS= 100 k, 1 01 -200 +200 nA -RS= 100 2,3 -400 +400 -IBVCM= 0 V, +RS= 100 , 1 -200 +200 -RS= 100 k 2,3 -400 +400 Input offset current IIOVCM= 0 V, +RS= 100 k, 1 01 -25 +25 nA -RS= 100 k 2,3 -50 +50 Common mode voltage range +VCM+VS=
24、5.0 V, -VS= -25 V 1,2,3 01 10 V -VCM+VS= 25 V, -VS= -5.0 V -10 Common mode rejection ratio +CMRR VCM= 10 V, +VS= 5 V, 1 01 83 dB -VS= -25 V, VOUT= -10 V 2,3 80 -CMRR VCM= -10 V, +VS= 25 V, 1 83 -VS= -5 V, VOUT= +10 V 2,3 80 Output current +IOUTVOUT= -10 V 1 01 30 mA 2,3 20 -IOUTVOUT= +10 V 1 -30 2,3
25、 -20 Output voltage swing +VOUTRL= 2.0 k 1,2,3 01 10 V -VOUT-10 Quiescent power supply current +ICCVOUT= 0 V, IOUT= 0 mA 1 01 6.0 mA 2,3 7.0 -ICC1 -6.0 2,3 -7.0 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD M
26、ICROCIRCUIT DRAWING SIZE A 5962-89621 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Lim
27、its 2/ Unit Min Max Quiescent power 3/ 4/ consumption PC VOUT= 0 V, IOUT= 0 mA 1,2,3 01 210 mW Power supply rejection ratio +PSRR +VS= 10 V and 20 V, -VS= -15 V 1,2,3 01 80 dB -PSRR -VS= -10 V and -20 V, +VS= 15 V 80 Offset voltage adjustment +VIO(adj) 5/ 1,2,3 01VIO- 1.0 mV -VIO(adj) VIO+ 1.0 Diffe
28、rential input 4/ 6/ resistance RINVCM= 0 V, TA= +25C 4 01 50 M Gain bandwidth 4/ 6/ product GBWP VOUT= 200 mV, f 10 kHz, TA= +25C 4 01 15 MHz Output resistance 4/ 6/ ROUTOpen loop, TA= +25C 4 01 60 Large signal voltage gain +AVOLVOUT= 0 V and +10 V, 4 01 10 kV/V RL= 2.0 k 5,6 7.5 -AVOLVOUT= 0 V and
29、-10 V, 4 10 RL= 2.0 k 5,6 7.5 Full power 4/ 6/ 7/ bandwidth FPBW VPEAK= 10 V 4 01 2.1 MHz 5,6 1.9 Closed loop stable 4/ gain CLSG RL= 2.0 k, CL= 50 pF 4,5,6 01 3.0 V/V Slew rate 8/ 9/ +SR VOUT= -5.0 V to +5.0 V 7 01 135 V/s 8 125 -SR VOUT= +5.0 V to 5.0 V 7 135 8 125 See footnotes at end of table. P
30、rovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89621 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Con
31、tinued. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max Rise time 8/ 9/ tRVOUT= 0 mV to +200 mV 9 01 45 ns 10,11 50 Fall time 8/ 9/ tFVOUT= 0 mV to -200 mV 9 01 45 ns 10,11 50 Overshoot 9/ +OS VOUT= 0 mV to +200 mV 9,10,11 01 40
32、% -OS VOUT= 0 mV to -200 mV 40 1/ Unless otherwise specified, +VS= +15 V, -VS= -15 V, RS= 100 , RL= 500 k, and VOUT= 0 V. 2/ The algebraic convention, whereby the most negative value is a minimum and the most positive is a maximum, is used in this table. Negative current shall be defined as conventi
33、onal current flow out of a device terminal. 3/ Quiescent power consumption based on quiescent supply current test maximum (no load outputs). 4/ If not tested, shall be guaranteed to the limits specified in table I herein. 5/ Offset adjustment range is VIO(measured) +1.0 mV minimum referred to output
34、. This test is for functionality only to assure adjustment through 0 V. 6/ Characterized at RL= 2 k, CCOMP= 0 pF, and CL= 50 pF. 7/ Full power bandwidth = SR / (2 x VPK). 8/ Measured between the 10 percent and 90 percent points. 9/ Measured with RS= 50 , RL= 2 k, AVCL= +3 V/V, and CL= 50 pF. 3.5 Mar
35、king. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer h
36、as the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in ac
37、cordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted t
38、o DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRC
39、UIT DRAWING SIZE A 5962-89621 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outlines G and P 2 Terminal number Terminal symbol 1 BALANCE NC 2 -INPUT BALANCE3 +INPUT NC 4 -V NC5 BALANCE -INPUT 6 OUTPUT NC 7 +V +INPUT 8 COMP
40、ENSATION NC 9 - NC 10 - -V 11 - NC 12 - BALANCE 13 - NC 14 - NC 15 - OUTPUT 16 - NC 17 - +V 18 - NC 19 - NC 20 - COMPENSATION FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89
41、621 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notificati
42、on of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation
43、shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducte
44、d on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made ava
45、ilable to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters
46、 shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C
47、, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. Tests shall be as specified in table II herein. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 10
48、05 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as pe
