1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add device type 03, 04, 05, and 06. Add outline letter D. Make changes to 1.2.1, 1.2.2, 1.3, 1.4, table I, figure 1, and throughout. 92-12-09 M.A. FRYE B Make changes to the Input offset voltage test for device types 02, 04, and 06 as specified u
2、nder Table I in accordance with N.O.R. 5962-R207-94. 94-06-03 M.A. FRYE C Drawing updated to reflect current requirements. Redrawn. - ro 08-06-10 R. HEBER THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7
3、8 9 10 11 PMIC N/A PREPARED BY JOSEPH A. KERBY DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY CHARLES E. BESORE COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL A. FRYE AND AGENCIES OF THE DEPARTMENT OF
4、 DEFENSE DRAWING APPROVAL DATE 90-05-05 MICROCIRCUIT, LINEAR, QUAD, PRECISION OPERATIONAL AMPLIFIER, MONOLITHIC SILICON AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-90604 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E261-08 Provided by IHSNot for ResaleNo reproduction or networking permitted wi
5、thout license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90604 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcirc
6、uits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-90604 01 C A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the
7、 circuit function as follows: Device type Generic number Circuit function 01 TLC274 Precision quad operational amplifier 02 TLC279 Precision quad operational amplifier (see VIOtest, table I) 03 TLC27M4 Precision quad operational amplifier, medium power 04 TLC27M9 Precision quad operational amplifier
8、, medium power (see VIOtest, table I) 05 TLC27L4 Precision quad operational amplifier, low power 06 TLC27L9 Precision quad operational amplifier, low power (see VIOtest, table I) 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive d
9、esignator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line D GDFP1-F14 or CDFP2-F14 14 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. Provided by IHSNot for ResaleNo reproduction or networking per
10、mitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90604 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. Supply voltage (VDD) 18 V dc Differential input voltage (VID) VDDInput voltage ran
11、ge (VI) -0.3 V dc to VDDInput current (any input) (II) 5 mA Output current (each output) (IO) 30 mA Total current into VDDterminal . 45 mA Total current out of ground terminal 45 mA Output short circuit duration Unlimited 1/ Power dissipation (PD): Cases C and 2 1375 mW at TA= +25C 2/ Case D 996 mW
12、at TA= +25C 2/ Storage temperature range . -65C to +150C Lead temperature (soldering, 60 seconds) . +260C Junction temperature (TJ) . +150C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VDD) 4 V dc to 16 V dc Common mode inpu
13、t voltage: VDD= 5 V +3.5 V dc maximum VDD= 10 V +8.5 V dc maximum Unity gain bandwidth: (TA= +25C) VDD= 5 V (device types 01 and 02) 1.5 MHz VDD= 10 V (device types 01 and 02) 2.0 MHz VDD= 5 V (device types 03 and 04) 525 kHz VDD= 10 V (device types 03 and 04) 635 kHz VDD= 5 V (device types 05 and 0
14、6) 85 kHz VDD= 10 V (device types 05 and 06) 110 kHz Ambient operating temperature range (TA) . -55C to +125C _ 1/ Short circuit may be to ground or either power supply. Rating applied to TA= +25C. 2/ For case outlines C and 2, derate at 12 mW/C above TA= +25C. For case outline D, derate at 8 mW/C a
15、bove TA= +25C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90604 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Governm
16、ent specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIO
17、N MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Mic
18、rocircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the
19、 event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The in
20、dividual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been gra
21、nted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the
22、 requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design,
23、construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as sp
24、ecified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirem
25、ents shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be m
26、arked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in complianc
27、e to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STAND
28、ARD MICROCIRCUIT DRAWING SIZE A 5962-90604 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C unless otherwise specified VDDGroup A subgroups Device type Limits
29、1/ Unit Min Max VIOVO= 1.4 V, VIC= 0 V, 5 V 1 01,03, 10 mV Input offset 2/ 3/ voltage RS= 50 2,3 05 12 10 V 1 10 2,3 12 5 V 4 02,04 900 V 2,3 06 3750 10 V 4 1200 2,3 4300 Input offset current IIOVO= 2.5 V, VIC= 2.5 V 5 V 1 All 0.100 nA 2 15 VO= 5 V, VIC= 5 V 10 V 1 0.100 2 15 Input bias current IIBV
30、O= 2.5 V, VIC= 2.5 V 5 V 1 All 0.150 nA 2 35 VO= 5 V, VIC= 5 V 10 V 1 0.150 2 35 VICR5 V 1 All 0 to 4 V Common mode 4/ input voltage range 2,3 0 to 3.5 10 V 1 0 to 9 2,3 0 to 8.5 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from
31、IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90604 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics continued. Test Symbol Conditions -55C TA +125C unless otherwise specified VDDGroup A subgro
32、ups Device type Limits 1/ Unit Min Max High level output 3/ VOHVID= 100 mV 5 V 1 All 3.2 V voltage 2,3 3 10 V 1 8 2,3 7.8 Low level output VOLVID= -100 mV, 5 V 1,2,3 All 50 mV voltage IOL= 0 mA 10 V 50 AVDVO= 0.25 V to 2 V 5 V 4 01,02 5 V/mV 5,6 3.5 Large signal 4/ differential voltage gain VO= 1 V
33、to 6 V 10 V 4 10 5,6 7 VO= 0.25 V to 2 V 5 V 4 03,04 25 5,6 15 VO= 1 V to 6 V 10 V 4 25 5,6 15 VO= 0.25 V to 2 V 5 V 4 05,06 50 5,6 25 VO= 1 V to 6 V 10 V 4 50 5,6 25 CMRR VIC= VICRminimum 5 V 1 All 65 dB Common mode rejection ratio 2,3 60 10 V 1 65 2,3 60 See footnotes at end of table. Provided by
34、IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90604 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics continued. Tes
35、t Symbol Conditions -55C TA +125C unless otherwise specified VDDGroup A subgroups Device type Limits 1/ Unit Min Max PSRR VDD= 5 V to 10 V, 5 V and 1 01,02 65 dB Power supply rejection ratio VO= 1.4 V 10 V 2,3 60 5 V and 1 03,04, 70 10 V 2,3 05,06 60 Supply current IDDVO= 2.5 V, VIC= 2.5 V, 5 V 1 01
36、,02 6.4 mA (four amplifiers) no load 2 4.4 3 10 VO= 5 V, VIC= 5 V, 10 V 1 8 no load 2 5.6 3 12 VO= 2.5 V, VIC= 2.5 V, 5 V 1 03,04 1120 A no load 2 720 3 1760 VO= 5 V, VIC= 5 V, 10 V 1 1200 no load 2 960 3 2000 VO= 2.5 V, VIC= 2.5 V, 5 V 1 05,06 68 no load 2 48 3 120 VO= 5 V, VIC= 5 V, 10 V 1 92 no l
37、oad 2 60 3 192 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90604 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 TABL
38、E I. Electrical performance characteristics continued. Test Symbol Conditions -55C TA +125C unless otherwise specified VDDGroup A subgroups Device type Limits 1/ Unit Min Max Slew rate at unity gain SR RL= 10 k, CL= 100 pF, 10 V 1 01,02 2.8 V/s VIPP= 5.5 V, measured 2 1.68 at 1.6 V and 4.3 V 3 3.8 R
39、L= 100 k, CL= 20 pF, 10 V 1 03,04 0.25 VIPP= 5.5 V, measured 2 0.15 at 1.6 V and 4.3 V 3 0.35 RL= 1 M, CL= 20 pF, 10 V 1 05,06 0.02 VIPP= 5.5 V, measured 2 0.01 at 1.6 V and 4.3 V 3 0.03 1/ The limiting terms “min” (minimum) and “max” (maximum) shall be considered to apply to magnitudes only. Negati
40、ve current shall be defined as conventional current flow out of a device terminal. 2/ The difference between device types 01, 03, 05, and 02, 04, 06 is a lower input offset voltage for device types 02, 04, and 06. 3/ RL= 10 k for device types 01 and 02, RL=100 k for device types 03 and 04, and RL= 1
41、 M for device types 05 and 06. 4/ This range also applies to each input individually. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance
42、 submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A sh
43、all be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review t
44、he manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90604 DEF
45、ENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 Device types 01, 02, 03, 04, 05, and 06 Case outlines C and D 2 Terminal number Terminal symbol 1 OUTPUT 1 NC 2 -INPUT 1 OUTPUT 1 3 +INPUT 1 -INPUT 1 4 VDD+INPUT 1 5 +INPUT 2 NC 6 -INPUT 2 VDD7 OUTPU
46、T 2 NC 8 OUTPUT 3 +INPUT 2 9 -INPUT 3 -INPUT 2 10 +INPUT 3 OUTPUT 2 11 GND NC 12 +INPUT 4 OUTPUT 3 13 -INPUT 4 -INPUT 3 14 OUTPUT 4 +INPUT 3 15 - NC 16 - GND 17 - NC 18 - +INPUT 4 19 - -INPUT 4 20 - OUTPUT 4 NC = No conection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproducti
47、on or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90604 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 10 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in
48、 accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to
