1、t k DESCRIPTION LTR SND-5962-9L560 W 9999996 003q7q3 7b0 W DATE (YR-MO-DA) APPROVED SIZE A SHEET I I I REV STATUS OP SHEETS PMIC NIA STANDARD1 ZED MILITARY DRAWING CAGE CODE 5962-91560 67268 THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE MSC N/A ISC FO
2、RM 193 JUL 91 SHEET PREPARED BY Gary Zahn CHECKED BY Hichael C. Jones APPROVED BY Kendall A. Cottongin DRAWING APPROVAL DATE 9361-19 REVISION LEVEL 5962-627-92 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 MICROCIRCUIT, LINEAR, 11.8 VOLTS, MICROPROCESSOR COMPATIBLE, SYNCHRO TO DIGITAL CONVERT
3、ER, HYBRID I I SHEET 1 OF 13 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-1. SCOPE 1.1 m. This drawing forw a pert of 8 cm part - one part nu-r docu#ntation systcl (
4、see 6.6 herein). This Irauing descriks device requirements for hybrid microcircuits to be processed in accordmm with RIL-H-38534. fvo iroduct ossurmce classes, milit8ry high reliability (device class H) and space applicetion (device cl-s K) and a :hoice of case outlines ad lead finiahes are availabl
5、e and are ruflectd in the Part or Identtfying Mumbar (PIN). ihen available, a choice of radiation hardness assurance levels er4 reflected in the PIN. 1.2 m. he PW ahall be as shown in the following example: 5962 9l%o M A I I T H I I I I I I I I I Ld Case Devi ce Device LI Federal wu stock class desi
6、gnator tm class outline finish designator (see 1.2.1) (see 1.2.2) designator (rea 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing nuher 1.2.1 Radiation hrdtwss usurw (RHer de sigutor. evice clisses H and K having RHA marked devices shall met lhe MIL-H-38534 specified RHA levels aid shall be marked with t
7、he appropriate RHA designator. A dash (-1 indicates a mRHA device. STAUMRDIZED MILITARY DiUiUIIG DEFESE ELECTRONICS SPPLY CEIOTEEL DAYTON, OHIO 45444 1.2.2 pavice tvw(r). The device typds) shall identify the circuit function as follows: Device tme Generic n&ie r Circuit function &curacy M HSDl44-341
8、V/2 11.8 V, 4X Hz, 16-bit, S/D converter 11.3 arc min. 02 HSD104b341H/Z 11.8 V, 4M Hz, l-bit, S/D converter I2.6 arc min. o3 HSD1046-341S/2 11.8 V, 4 Hz, l&bit, S/D converter 15.2 arc min. 1.2.3 Device class desianator. This device class designator shall be a single letter identifying the product is
9、surance level as follows: Device clara H or K pice rcquireaents docurmi tstion Certificaticm and qualification to MIL-H-38534 1.2.4 Case outline(s). The case outlinab) shall be as designated in NIL-STD-1835 and as follows: Outline letter DescriRtive designator Terminals Package style X See figure 1
10、36 Dwl-in-line 1.2.5 Lead finish. The lead finish ahall k sa specified In MIL-H-38534 for classes H rnd K. Finieh letter “X“ ha11 not be marked on the microcircuit or its packaging. The *XI designation is for Ute in specifications when lead finishes A, B, and C are considerad acceptable and intercha
11、ngeable vithaut preferace. SIZE 5962-91560 A REVISION UVEL SHEET 2 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-9L560 9999996 003q7q5 533 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 1.3 Absolute maxi
12、mum ratings. 11 Logic supply voltage (VL) +6.5 V dc Signal inputs 25.98 V ac rins Reference input . 200 V dc rms Digital inputs range -0.3 V dc to VL Junction temperature (TJ): Junction rise above case . SOC/U Junction rise above ambient 1Z0C/U Power dissipation (PD) . 100 mu 2/ Junction temperature
13、 (TJ) +15C Lead temperature (soldering, 10 seconds) +3oO0C Storage temperature range -65OC to +13SoC 1.4 Recommended operating conditions. Logic supply voltage range (VL) . +4.5 V dc +5.5 V dc Signal input Frequency range . 360 Hz to loo0 Hz Ambient operating temperature range (TA) 11.8 V ac rms -55
14、OC to +12SC 2. APPLICABLE DOCUMENTS SIZE 5962-91560 A REVISION LEVEL SHEET 3 2.1 Government specification, standards, and handbook. Unless otherwise specified, the following specification, standards, and handbook of the issue listed in that issue of the Department of Defense Index of Specifications
15、and Standards specified in the solicitation, form a part of this drawing to the extent specified herein. SPECIFICATION MILITARY MIL-H-38534 - Hybrid Microcircuits, General Specification for. STANDARDS MILITARY MIL-STD-480 - Configuration Control-Engineering Changes, Deviations, and hivers. MIL-STD-8
16、83 - Test Methods and Procedures for Microelectronics. MIL-STD-1835 - Microcircuit Case Outlines. HANDBOOK MILITARY MIL-HDBK-780 - Standardized Mi Litary Drawings. (Copies of the specification, standards, and handbook required by manufacturers in connection with specific acquisition functions should
17、 be obtained from the contracting activity or as directed by the contracting activity.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing shall take precedence. - - I/ Stresses above the absolute maximum rat
18、ing may cause permanent damage to the device. maximum levels may degrade performance and affect reliability. - 2/ Power dissipation applies up to TA = +12S0C. Extended operation at the Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-L5bO W 9
19、999996 003474b 47T I STMInARDIZED SIZt 5962-91560 MILITARY DRAWIG A DE-SE ELBCTRICS SUPPLY CElTlR lY_. WY -. MYT, OHIO 45444 W&VY.S161Q LgWL SBBET 4, *i?“) IVL = t5.0 V dc data bits(B1 - 8161, I I I I CB, and BIT I I I 1.6 I IRA Logic “O“ sink current I IOL IVOL = O.# V dc Logic “1“ source 1 IOH IVO
20、H = 2.8 V dc current I I I I I I Drive capability 2/ I IO IA11 analog outputs I 1,2,3 I ALL I *I I , I ANALOG OUTPUT I I I I I I I I I I I I I I I I I I I l I I It0 v I I I I II“ error I I I 1,2,3 I All I 1.93 1 2.4 I V dc I 4,5,6 I All I 500 I 1500 ImV ru for Bias voltage - 2/ I V IVL = t5.0 V dc A
21、C error - 2/ I e IAC voltage referenced VELOCITY OUTPUT I I I I I 7,8 I All I Negative for I I 1 I increasing angle I I Polarity 21 I I See footnotes at end of table. STANDARD1 ZED SIZE 5962-91560 MILITARY DRAWNG A DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL SHEET 7 DESC FORM
22、 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-59b2-915bO 9997996 0034750 9TO - I/ unless otherwise specified, VL = t4.S V dc to t5.5 V dc. - 2/ Paraneter shall be tasted as pert of device initio1 chrracteritatrn mi after dalign Md
23、process changha. Parameter shall be guirranteed to the limits sprcitied in table i for ali Lots not apaeificatly tmd. - 3/ These parameters are tested on a go-no-qo basis only or in conjunction with other measured piiwiemr aml are not directly testable. - 4/ IntemgActi& pull dom to ground will apply
24、 lagic “On to E and L8E thw enbling all data bits 81 throrgh 16. HBE and CBE may be left unconnected for 16-bit parallel output. - - 5/ internal “Active“ pul1 up will apply VL to i“. )(H my left unconnected for centinwws aperatton. STADAilIZED SI23 MILITARY DRAUUG A DEFEUS ELECTROICS SUPPLY CEmER MY
25、TOIB, OBI0 45444 SC FORM 193A JUL 91 5962-91560 6 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-59b2-915bO m 999999b 0034753 837 m STANDARD1 ZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 Y SIZE 5962-91560 A REVISION
26、LEVEL SHEET 9 .10 2.01 - r .775 2.005 DOT IDENTIFIES 1 PIN 1 Case outline X. 1.700 2.005 5 4 36 + 19 TOP VIEH 1 18 I .l.l, 1- 1.895 2.005 .o9 2.01 t .600 2.005 .O86 TYP RAD Inches rn .o05 0.13 .O1 0.3 .O18 0.46 .OM 0.76 .O55 1.40 .o86 1.18 .o9 2.3 .IO 2.5 NOTES: I. Dimensions are in inches. 2. Metri
27、c equivalents are given for information onlv. Inches 1 .loo 2.54 -18 4.6 .25 6.4 .W 15.24 .775 19.69 1.700 43.18 1.895 48.13 3. 4. 5. Case is electrically floating. 6. Unless otherwise specified, tolerance for three decimal places shall be *.o05 and for two deciml places shall be i.01. Lead spacing
28、dimensions apply only at seating plane. Standoffs are ceramic or glass (three each). FIGURE 1. Case outline($). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-59b2-9L560 D 9999996 003q752 773 = STANDARD1 ZED SIZE MILITARY DRAWING A DEFENSE ELECT
29、RONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL M I cvice type I 5962-91560 SHEET 10 X I I I 1 I rse outline erminal number I Terminal conncct ion 1 I SI 2 I s2 3 IS3 5 I NC 6 I NC 7 I NC 8 IRcference voltage low (RL) 9 IReference voltage high (RH) 10 Ivelocity voltage (8) 11 1Bias voltage (V
30、I 12 IAC error volt* (e) 13 /Inhibit not (INHI 14 Jconvertcr busy (Ce) 15 IBuilt in test (BIT) 16 I NC 17 JLou byte enable (E) 18 I Ground 19 le16 (LSB) 20 )BIS 21 le14 22 le13 4 I s4 23 le12 24 leIl 25 I BIO 27 lM 29 1% 31 le4 32 lm 33 le2 26 I 9 28 I 87 30 I 85 34 lBl (HSB) 35 IHigh byte enable ()
31、 36 ILogic supply voltage (VL) NOTE: NC is no connection. FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TABLE II. Electrical test requirements. I I MIL-STD-883 test requirements I I Subgroups i I (in accordance uith
32、I I method 5008, group I I A test table) I I i I I Interim electrical parameters I 1,4,7 I I I Final electrical test parameters I 1*,2,3,4,7,9 I l I I I l Group C end-point electrical I parameters I I I I I Group E end-point electrical I Subgroups * I parameters for RHA devices I (in accordance I I
33、I I with method 5005, I I group A test table) I * PDA applies to subgroup I. *. When applicable to this standardized military drawing, the subgroups shall be defined. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with MIL-H-38534 and as specified herein. 4
34、.3.1 Group A inspection. specified in table II herein. 4.3.2 Group B inspection. 4.3.3 Group C inspection. Group A inspection shall be in accordance uith MIL-H-38534. Tests shall be as Group B inspection shall be in accordance with MIL-H-38534. Group C inspection shall be in accordance with MIL-H-38
35、534 and as follows: a. b. End-point electrical parameters shall be as specified in table II herein. Steady-state life test, method 1005 of MIL-STD-883. (1) Test condition A, 8, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made a
36、vailable to either DESC-EC or the acquiring activity upon request. applicable, in accordance with the intent specified in test method 1005 of HIL-STD-883. TA as specified in accordance with table I of method 1005 of MIL-STD-883. Also, the test circuit shall specify the inputs, outputs, biases, and p
37、ower dissipation, as (2) (3) Test duration: 4.3.4 Group D inspection. 1,OOO hours, except as permitted by method 1005 of MIL-STD-883. Group D inspection shall be in accordance with MIL-H-38534. STANDARDIZED 5962-91560 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 19
38、3A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SflD-59b2-9L5bO = 999999b 0034754 54b STNQDADIZEZ) MILITARY DRIIWIIG DBmSE ELECTROFIICS SUPPLY CEHTER DAYToIa, OHIO 45444 ! SIZE 5962-91566 A REVXSIOH LEVEL SHEET 12 4.3.5 GrOUD E inopection.
39、Group E inspection is required only for parts intendd to be marked as radiation hardness assured (see 3.5 herein). conformance inspection sample tests shall be performed at the RHA level specified in the acquisition document. RHA levels for device classes H and K shall be M, D, R, and H. RHA quality
40、 a. RHA tests for device classes H end K for levels H, D, R, and H shall be performed through each level to determine at what levels the devices neet the RHA rquirements. These RHA tests shall be performed for initial qualification and after design or process changes which may affect the RHA perform
41、ance of the device. End-point electrical parameters shall be as specified in table II herein. Prior to total dose irradiation, each selected sample shall be assembled in its qualified package. pass the specified grwp A electrical parameters in table I for subgroups specifid in table II herein. For d
42、evice classes H and K, the devices shall be subjected to radiation hardness assured rests as spacifid in MIL-H-38534 for RHA level being tested, and meet the postirradiation end-point electrical parameter limits as defined in table I at TA = +25C i5 percent, after exposure. Prior to and during total
43、 dose irradiation testing, the devices shall be biased to establish a worst case condition as specified in the radiation exposure circuit. For device classes H and K, subgroups 1 and 2 in table V, method 5005 of HIL-STD-883 shall be tested as appropriate for device construction. Uhen specified in th
44、e purchase order or contract, a copy of the RHA delta limits shall be supplied. b. c. It shell d. e. f. g. 5. PACKAGING 5.1 Packaaimi rcauirmnts. The rquirements for packaging shall be in accordance with HIL-H-38534. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended fo
45、r use for Government microcircuit applications (original equipment), design applications, and logistics purposes. covered by a contractor-prepared specification or drawing. with the users of record for the individual docunnts. This coordination will be accomplished in accordance with MIL-STD-481 usi
46、ng DD Fon 1693, Engineering Chiingr Proposal (Short Form). 6.2 Rcplaceabilitv. Microcircuits covered by this drawing will replace the sam? generic device 6.3 Configuration control of SHDs. All proposed changes to existing SMDs will be coordinated 6.4 Record of users. Military and industrial users sh
47、all inform Defense Electronics Supply Center when a system application requires configuration control and the applicable SHO. and this list will be used for coordination and distribution of changes to the drawings. iicralectronic devices (FSC 5962) should contact DESC-EC, telephone (513) 296-6047. t
48、elephone (513) 2965373. DESC will maintain a record of users Users of drawings covering 6.5 Comments. Cements on this drawing should be directed to DESC-EC, Dayton, Ohio 45444, or DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-
49、SflD-5962-9L560 D 9999996 0034755 482 D STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 6.6 One part - one part number system. The one part - one part number system described below has been developed to allow for transitions between identical generic devices covered by the four major microcircuit requirements documents (M
