1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Clarify figure 2. Correct figure 3. Update drawing requirements to MIL-PRF-38534. 01-03-20 Raymond Monnin B Rewrite paragraphs 4.2.a.2. and 4.3.3.b.2 to add TC. 04-06-18 Raymond Monnin REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B B OF S
2、HEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Steve Duncan DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones POST OFFICE BOX 3990 COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendal
3、l A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, 2-VOLT, DIRECT RESOLVER CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-01-26 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-92050 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E245-04 Provided by IHSNot for ResaleNo reprodu
4、ction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92050 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in p
5、aragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following e
6、xample: 5962 - 92050 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet t
7、he MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function Frequency Accuracy 1 LSB 01 SDC-14573-1
8、12 14-bit, 2 V direct resolver converter 400 Hz 4 min 02 SDC-14578-112 14/16-bit, 2 V direct resolver converter 400 Hz 4 min 03 SDC-14578-114 14/16-bit, 2 V direct resolver converter 400 Hz 2 min 1.2.3 Device class designator. This device class designator shall be a single letter identifying the pro
9、duct assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliabilit
10、y class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses th
11、e Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other c
12、lasses (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufact
13、urer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-920
14、50 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 26 Rectangular, bottom
15、leaded, chip carrier 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Positive supply voltage (VCC). +7.0 V dc Negative supply voltage (VEE) . -7.0 V dc Reference input voltage 35 V rms Digital input voltage range. -0.3 V dc to +7.0 V dc Pow
16、er dissipation, TA= +125C (PD). 170 mW Thermal resistance junction-to-case (JC) . 8.0C/W Thermal resistance junction-to-ambient (JA) 20C/W Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) +300C 1.4 Recommended operating conditions. Positive supply voltage (VCC). +4.
17、75 V dc to +5.25 V dc Negative supply voltage (VEE) . -4.75 V dc to -5.25 V dc Reference input voltage range 2.0 V rms to 35 V rms Reference input carrier frequency range. 360 Hz to 5000 Hz Signal input voltage range. 1.70 V rms to 2.30 V rms Ambient operating temperature range (TA) -55C to +125C 2.
18、 APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. D
19、EPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103
20、 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, P
21、A 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained.
22、 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DR
23、AWING SIZE A 5962-92050 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Complian
24、ce with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performan
25、ce requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, constructio
26、n, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Block diagram. The block diagr
27、am shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The elect
28、rical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, th
29、e manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lo
30、t sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activit
31、y (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirem
32、ents of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordan
33、ce with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall
34、apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall spec
35、ify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAor TCas specified in the approved manufacturers QM plan. b. Interim and final electrical test parameters shall be as specified in table II herein, excep
36、t interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92050 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43
37、218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TA +125C VCC= +5 V dc, VEE= -5 V dc unless otherwise specified Group A subgroups Device type Min Max Unit 01 14 A = 0 14 Resolution 1/ RES 2/ A = 1 7,8A,8B 02,0
38、3 16 Bits 01 -4 +4 02 -13 +13 Output accuracy 3/ AOUT 7,8A,8B 03 -7 +7 LSB Accuracy repeatability 3/ 4/ AR 7,8A,8B All -1.0 +1.0 LSB Reference input voltage range 4/ VIN14,5,6 All 2.0 35 V rms Single ended 60 Reference input impedance 4/ ZIN1Differential 4,5,6 All 120 k Reference input common mode r
39、ange 4/ VCM14,5,6 All -50 +50 V pk Signal input impedance 4/ ZIN2 Line-to-ground 4,5,6 All 20 M Digital output low voltage 1/ VOLIOL= -1.6 mA 1,2,3 All 0.4 V Digital output high voltage 1/ VOHIOH= 0.4 mA 1,2,3 All 2.8 V Output leakage current 4/ IOZ1,2,3 All -20 +20 A Digital input A. VIN= 2.0 V 02,
40、03 pass/ fail Digital input high voltage 1/ VIHDigital inputs INH, EL, and EM. VIN= 2.0 V 1,2,3 01-03 pass/ fail See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92050 DEFENSE SU
41、PPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TA +125C VCC= +5 V dc, VEE= -5 V dc unless otherwise specified Group A subgroups Device type Min Max Unit Digi
42、tal input A. VIN= 0.8 V 02,03 pass/ fail Digital input low voltage 1/ VILDigital inputs INH, EL, and EM. VIN= 0.8 V 1,2,3 01-03 pass/ fail EL, EM, INH, internal pull-up 01 -2 -10 Digital input current 1/ IINA, internal pull down 4,5,6 02,03 200 A Inhibit voltage 1/ VINHNo digital angles change while
43、 INH is logic 0 and analog input is rotating 7,8A,8B All 0.8 V Enable voltage 1/ VEEM controls output bits 1 through 8 and EL controls output bits 9 through 14 for device type 01 and bits 9 through 14/16 for device types 02 and 03. 7,8A,8B All 0.8 V Disable voltage 1/ (high impedance) VDEM controls
44、output bits 1 through 8 and EL controls output bits 9 through 14 for device type 01 and bits 9 through 14/16 for device types 02 and 03. 7,8A,8B All 2.0 V Positive supply voltage ICCVCC= +5.25 V 1,2,3 All +17 mA Negative supply voltage IEEVEE= -5.25 V 1,2,3 All -17 mA Analog velocity output voltage
45、VOUT5/ 7,8A,8B All 3.24 4.00 V Bandwidth 1/ BW 7,8A,8B All 72 134 Hz 1/ These parameters are tested on a go-no-go basis only or in conjunction with other measured parameters and are not directly testable. 2/ Programmable to 14-bit or 16-bit resolution. 3/ Output accuracy is measured at angles from 0
46、, to 180, in 15 increments, and at 225, 270, and 315. 4/ Parameters shall be tested as part of device initial characterization and after design and process changes. Parameter shall be guaranteed to the limits specified in table I for all lots not specifically tested. 5/ Analog output voltage is test
47、ed at 8 revolutions per second (rps) for device type 01 and 2 rps for device types 02 and 03. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92050 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REV
48、ISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Case outline X. Millimeters Inches Symbol Minimum Maximum Minimum Maximum A - 5.08 - 0.200 b 0.41 0.51 0.016 0.020 D - 24.89 - 0.980 D1 17.65 17.91 0.695 0.705 E - 19.81 - 0.780 E1 15.11 15.37 0.595 0.605 e 2.54 TYP 0.100 TYP L 5.08 5.59 0.200 0.220 NOTES: 1. The U.S. government preferred system of measurement is the metric SI. This case outline was designed using inch-pound units of
