1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R005-96. 95-10-18 K. A. Cottongim B Correct paragraph 1.4, output currents 97-10-22 K. A. Cottongim C Figure 1, dimension table, symbol q: inches column, change 1.950 BSC to 1.950 maximum and millimeters column
2、, 49.53 BSC to 49.53 maximum. Table I, delete note 4 from output current test (IOUT) and notes following table I. Renumber remaining notes in sequence. Redrew entire document. -sld 98-02-02 K. A. Cottongim D Changed the max limit for the input ripple current test (IRIP) for subgroup 1 from 40 mA p-p
3、 to 45 mA p-p. Table I; Changed in footnote three “At least 100 mA“ to “At least 300 mA“. -sld 98-06-25 K. A. Cottongim E Table I, VRLOAD, conditions column, change IOUT= 0 to 4 A (main) to IOUT= 300 mA to 4 A (main). Table I, note 3 changed. 99-10-20 Raymond Monnin F Update drawing boilerplate. Edi
4、torial changes throughout. 03-07-18 Raymond Monnin G Add device type 02 non-RHA class H and RHA levels D, P, L, R, classes H and K. Table I, IOUTtest, condition for the main input, device type 01, change minimum limit from 100 mA to 0.0 mA. Correct paragraphs 4.2.a.2 and 4.3.3.b.2. Table I, correct
5、note 4. -gz 07-10-01 Robert M. Heber H Add paragraph 3.2.3, radiation exposure circuit. Table I, notes, correct the numbering sequence of the notes and within the table. Figure 1, case outline Z, note 2, correct the maximum device weight from 60 grams to 62 grams. -gz 08-06-24 Robert M. Heber REV SH
6、EET REV SHEET REV STATUS REV H H H H H H H H H H H H H OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Steve L. Duncan DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABL
7、E FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, +5 AND 15-VOLT, TRIPLE CHANNEL, DC/DC CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 95-06-15 AMSC N/A REVISION LEVEL G SIZE A CAGE CODE 67268 5962-93074 SHEET 1 OF 13 DSCC FORM 223
8、3 APR 97 5962-E439-08Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93074 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This draw
9、ing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in th
10、e PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 93074 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness
11、 assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic num
12、ber Circuit function 01 MTR28515T/883, MTR28515TF/883 DC-DC converter, 30 W, +5 V and 15 V output 02 SMTR28515T, SMTR28515TF DC-DC converter, 30 W, +5 V and 15 V output 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All l
13、evels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This lev
14、el is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-
15、Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with ex
16、ception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality clas
17、s. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1
18、10 Dual-in-line Z See figure 1 10 Flange mount 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93074 DEFENSE SUPPLY CENTER COLUMBUS C
19、OLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Input voltage range (VIN) -0.5 V dc to +50 V dc Power dissipation (PD): Device types 01 and 02 (non-RHA) 14 W Device type 02 (RHA levels D, P, L, and R). 15 W Output power . 30.84 W Lead solderin
20、g temperature (10 seconds). +300C Storage temperature range -65C to +150C 1.4 Recommended operating conditions. Input voltage range (VIN) +16 V dc to +40 V dc Output currents: +5 V (main). +4000 mA 15 V (dual) 333 mA Output power 2/ 3/ . 30 W Case operating temperature range (TC) -55C to +125C 1.5 R
21、adiation features. Maximum total dose available (dose rate = 9 rad(Si)/s): Device type 02 (RHA levels D, P, L, and R) 100 krad (Si) 4/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to
22、the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Stand
23、ard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.
24、mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in
25、 this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Dera
26、te output power linearly above case temperature +125C to 0 at +135C. 3/ At least 5 percent of total power should be from the main (+5 volt) output. 4/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the
27、noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition C, tested at 9 rad(Si)/s. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93074 DEFENSE SUPPLY CENTE
28、R COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the perfor
29、mance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534
30、shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as speci
31、fied in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be mainta
32、ined by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and s
33、hall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in a
34、ccordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall main
35、tain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintain
36、ed under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (ori
37、ginal copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this dr
38、awing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4
39、.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be
40、 made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TCas specified in the approved manufacturers QM
41、 plan. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IH
42、S-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93074 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28 V dc 5 percent no external sync, CL
43、= 0 unless otherwise specified Group A subgroups Device types Min Max Unit 1 +4.95 +5.05IOUT= +4.0 A dc, (main) 2,3 01,02 +4.85 +5.15D, P, L, R 1,2,3 02 +4.71 +5.29V dc 1 14.77 15.23V dc IOUT= 333 mA dc, (dual) 2,3 01,02 14.47 15.52Output voltage 3/ VOUTD, P, L, R 1,2,3 02 14.34 15.63VIN= 16 V dc, 2
44、8 V dc, and 1,2,3 01,02 0.0 4000 to 40 V dc (main) D, P, L, R 1,2,3 02 0.0 4000 mA VIN= 16 V dc, 28 V dc, and 1,2,3 01,02 0.0 333 Output current 3/ 4/ 5/ IOUTto 40 V dc (dual) D, P, L, R 1,2,3 02 0.0 333 mA 1 125 B.W. = 10 kHz to 2 MHz (main) 2,3 01,02 180 D, P, L, R 1,2,3 02 225 mV p-p 01 60 B.W. =
45、 10 kHz to 2 MHz (dual) 1,2,3 02 120 Output ripple voltage 3/ VRIPD, P, L, R 1,2,3 02 150 mV p-p VIN= 16 V dc to 40 V dc, IOUT= 4.0 A (main) 1,2,3 01,02 20 D, P, L, R 1,2,3 02 30 mV VIN= 16 V dc to 40 V dc, IOUT= 333 mA, (dual) 1,2,3 01,02 75 Line regulation 3/ 5/ VRLINED, P, L, R 1,2,3 02 115 mV IO
46、UT= 300 mA to 4.0 A, (main) 1,2,3 01,02 50 D, P, L, R 1,2,3 02 75 mV IOUT= 0 to 333 mA, (dual) 1,2,3 01,02 75 Load regulation 3/ 5/ VRLOADD, P, L, R 1,2,3 02 115 mV See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDA
47、RD MICROCIRCUIT DRAWING SIZE A 5962-93074 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28 V dc 5 percent no external sync, CL
48、= 0 unless otherwise specified Group A subgroups Device types Min Max Unit IOUT= 0, Inhibit (pin 8) = 0 1,2,3 01,02 6 D, P, L, R 1,2,3 02 7.5 mA IOUT= 0, Inhibit (pin 8) = open 1,2,3 01,02 110 Input current IIND, P, L, R 1,2,3 02 150 mA 01 45 1 02 60 IOUT= 4.0 A, (main) IOUT= 333 mA, (dual) B.W. = 10 kHz to 10 MHz 2,3 01,02 80 Input ripple current IRIPD, P, L, R 1,2,3 02 100 mA p-p 1 73 2, 3 01 71 1 72 IOUT= 4.0 A, (main) IOUT= 333 mA, (dual) 2, 3 02 70 Efficiency Eff D, P, L, R 1,2,3 02 6
