1、 EIA STANDARD TP-01B Acceleration Test Procedure for Electrical Connectors EIA-364-01B (Revision of EIA-364-01A) May 2000 ANSI/EIA-364-01B-2000 (R2012) Approved: March 3, 2000 Reaffirmed: December 18, 2012 EIA-364-01B NOTICE EIA Engineering Standards and Publications are designed to serve the public
2、 interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Pub
3、lications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than ECIA members, whether the
4、standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does it assume any obligation w
5、hatever to parties adopting the Standard or Publication. This EIA Standard is considered to have International Standardization implication, but the International Electrotechnical Commission activity has not progressed to the point where a valid comparison between the EIA Standard and the IEC documen
6、t can be made. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory
7、limitations before its use. (From Standards Proposal No. 4416, formulated under the cognizance of the CE-2.0 National Connector Standards Committee and reaffirmed per Standards Proposal No. 5252.01). Published by Electronic Components Industry Association 2012 Engineering Department 2214 Rock Hill R
8、oad, Suite 170 Herndon, VA 20170 PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by the ECIA and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, contact: IHS 1
9、5 Inverness Way East Englewood, CO 80112-5704 or call USA and Canada (1-800-854-7179), International (303-397-7956) i CONTENTS Clause Page 1 Introduction . 11.1 Scope . 1 2 Test resources 1 2.1 Equipment 1 3 Test specimen . 1 3.1 Description . 1 3.2 Preparation . 1 3.3 Mounting . 2 4 Test procedure
10、. 2 4.1 Electrical tests . 2 4.2 Test conditions 2 4.3 Post test examination 2 5 Details to be specified . 3 6 Test documentation . 3 Table 1 Acceleration levels 2EIA-364-0lB Page 1 TEST PROCEDURE No. 01B ACCELERATION TEST PROCEDURE FOR ELECTRICAL CONNECTORS (From EIA Standards Proposal No. 5252.01,
11、 formulated under the cognizance EIA CE-2.0 Committee on National Connector Standards, and previously published in EIA-364-0lA.) 1 Introduction 1.1 Scope This standard establishes test methods to determine the ability of an electrical connector and sockets to withstand a specified acceleration force
12、 without damage detrimental to its specified performance. 2 Test resources 2.1 Equipment Unless otherwise specified, the acceleration test apparatus shall be the centrifuge - type and shall be capable of subjecting the test specimen to the value of acceleration (gn) as specified in 4.2. The accelera
13、tion gradient across the specimen shall not exceed 15 percent of the specified gnlevel. 3 Test specimen 3.1 Description A test specimen shall consist of a plug, a receptacle, or mated plug and receptacle, as specified in the referencing document. 3.2 Preparation All contacts shall be wired as specif
14、ied. The wires shall be bundled into harnesses and secured to the acceleration table or arm not less than 25.4 centimeters (10 inches) from the rear of the connector half to that they are attached. Any extension of the harnesses shall be secured to prevent uncontrolled motion during the test. Provis
15、ions shall be made for all electrical connections to be secured. Test condition letter Acceleration level g.(gi11vity units)A 50B 100 C 250 D 500 EIA-364-0IB Page 2 3.3 Mounting Unless otherwise specified, provisions shall be made to permit rigid mounting of the specimen by the normal mounting means
16、 so that the specimen can be tested in two directions, 180 degrees apart, along each of three mutually perpendicular axes. 4 Test procedure Each specimen under test shall be mounted in a rigid position as specified in 3.3 and subjected to the acceleration levels specified in Table 1, as applicable.
17、4.1 Electrical tests The specimen shall be electrically energized. Any circuit interruption in excess of 1 microsecond shall be recorded. 4.2 Test conditions The specimen shall be subjected to 5 minutes acceleration of the specified gnlevel in both directions of each of three mutually perpendicular
18、axes for a total of 30 minutes at the specified gnlevel. The acceleration measured at any point of the component part shall not vary from the selected “gn“ level by more than 15 percent. The specimen shall be brought from zero to the specified acceleration level at a linear rate in not less than 1 m
19、inute. Table 1 - Acceleration levels 4.3 Post test examinations Examination for the following defects shall be made at the completion of the test. 4.3.1 Unintended separation of mated connectors. 4.3.2 Inability to mate or unmate counterpart connector within specified mating and unmating force value
20、s. EIA-364-01B Page 3 4.3.3 Cracked, broken, or bent parts. 4.3.4 Loosening of parts. 4.3.5 Missing parts. 5 Details to be specified The following details shall be specified in the referencing document: 5.1 Type specimens to be tested and whether mated; see 3.1 5.2 Wiring of contacts; see 3.2 5.3 Mo
21、unting of specimen, if other than herein; see 3.3 5.4 Acceleration level, applicable test condition letter; see Table 1 5.5 Electrical tests; see 4.1 5.6 Post test examination, if other than herein; see 4.3 5.7 Number of specimens to be tested 6 Documentation Documentation shall contain the details
22、specified in clause 5, with any exceptions, and the following: 6.1 Title of test 6.2 Specimen description, including fixturing if applicable (photographs may be used) 6.3 Test equipment used, and date of last and next calibration 6.4 Test and procedure 6.5 Values and observations 6.6 Name of operato
23、r and date of test ECIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety, health or technical reasons, please fill in the appropriate information below and mail or FAX to: Electronic Components Industry Association EIA Standards &
24、Technology Department 2214 Rock Hill Rd., Suite 170 Herndon, VA 20170 FAX: (571-323-0245) Document No.: Document Title: Submitters Name: Telephone No.: FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c.
25、 Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR ECIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Electronic Components Industry Association 2214 Rock Hill Road, Suite 170 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.eciaonline.org
