1、 EIA STANDARD TP-25E Probe Damage Test Procedure for Electrical Connectors EIA-364-25E (Revision of EIA-364-25D) March 2017 Electronic Components Industry Association EIA-364-25E ANSI/EIA-364-25E-2017 Approved: March 28, 2017 NOTICE EIA Engineering Standards and Publications are designed to serve th
2、e public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards
3、 and Publications shall not in any respect preclude any member or nonmember of EIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than EIA members, whethe
4、r the standard is to be used either domestically or internationally. Standards and Publications are adopted by EIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, EIA does not assume any liability to any patent owner, nor does it assume any obligati
5、on whatever to parties adopting the Standard or Publication. This standard is based upon the major technical content of International Electrotechnical Commission standard 512-8, test 16a, probe damage, 1993-01. There are known differences between this standard and the IEC standard. This Standard doe
6、s not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use. (Fro
7、m Standards Proposal No. 5373.02 formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Sockets Standards.) Published by Electronic Components Industry Association 2017 EIA Standards intended primarily for round socket contacts in electrical connectors and possibly app
8、licable to other type contacts as well. This test is to simulate a form of field abuse of contacts during test by inserting probes into socket contacts. The purpose of this test is as follows: to simulate probing of socket contacts while installed in the connector for non-removable contacts and for
9、removable contacts while outside of the connector housing; to verify performance characteristics of the socket contacts have not been adversely impacted as may be specified in the referencing document (i.e. engagement and separation forces). 2 Test resources 2.1 Equipment The equipment required to p
10、erform the test shall be a probe damage tool similar to that shown in figure 1 and mounting fixtures similar to that shown in figures 2 and 3. The test pin shall be as shown in figure 1 and shall be of hardened steel or tungsten carbide and have a polished surface containing a 0.15 micrometer (6 mic
11、roinches) to 0.25 micrometer (10 microinches) finish. 3 Test specimen 3.1 Description 3.1.1 The specimen shall consist of one socket contact assembled in its connector housing for non-removable contacts or the socket contact only for contacts that are removable from the connector housing, unless oth
12、erwise specified in the referencing document. 3.1.2 The specimen may be wired as required by the referencing document. 3.1.3 Wires required for other tests may be terminated to the contacts. EIA-364-25E Page 2 3.2 Preparation 3.2.1 Crimp or other removable contacts shall use a suitable collet type h
13、olding device, as shown in figure 2, unless otherwise specified in the referencing document. Non-removable socket contacts shall be tested in their connector housing, as shown in figure 3. 3.2.2 The collet type holding device shall not support the contact in any way that interferes with the free rot
14、ation of the test probe fixture. The collet device shall grip the contact on the contact crimp barrel, or the termination end of the contact (e.g. wrap-type terminations, solder-tail, compliant pin, etc.) with the contact shoulder flush against the collet device. The collet shall not interfere with
15、the socket spring member under test. 4 Test procedure 4.1 The connector or the collet device with the socket contacts fixed in place shall be mounted in a horizontal position to a rotating fixture to allow 360 hand rotation during test; see figures 2 and 3. 4.2 The probe damage tool, see figure 1, s
16、hall be inserted into the contact to a “B” dimension depth as illustrated in figure 1. The “B” dimension shall be both 1/2 and 3/4 of socket bore minimum depth specified in the referencing document. The amount the socket contact is recessed from the front of the housing shall be added to probe lengt
17、h “B” when a connector holding device is used. Unless otherwise specified in the referencing document the tolerance on the “B” dimension shall be minus 0 millimeter (0 inch) plus 0.127 millimeter (0.005 inch). 4.3 When the test setup is in conformance with 4.1 and 4.2 the fixture shall be slowly rot
18、ated once through 360 at a uniform rate of no less than a 5 second rotation and no more than a 15 second rotation, unless otherwise specified in the referencing document, with the probe damage tool inserted in the contact so that the force is applied uniformly to the inside diameter of the socket. T
19、he test shall be repeated so that both insertion depths (i.e., 1/2 and 3/4) are tested. 5 Details to be specified The following details shall be specified in the referencing document: 5.1 Initial and final examination or measurement 5.2 Mounting of specimen, see clause 4. The collet device shall be
20、defined in the referencing document 5.3 Number and size of samples to be tested 5.4 Probe depth dimension 5.5 Number of 360 rotations indicated in 4.3 if other than one EIA-364-25E Page 3 6 Test documentation Documentation shall contain the details specified in clause 5, with any exceptions, and the
21、 following: 6.1 Title of test 6.2 Sample description, including fixturing 6.3 Test equipment used, and date of last and next calibration 6.4 Test procedure 6.5 Values and observations 6.6 Name of operator and start/finish date(s) of test EIA-364-25E Page 4 Contact Size Diameter, A 0.013 millimeters
22、( 0.0005 inch) Moment 10% meter-newton (inch-pound) 4/0 12.70 (0.500) 0.904 (8) 2/0 10.31 (0.406) 0.904 (8) 0 9.07 (0.357) 0.904 (8) 2 7.19 (0.283) 0.452 (4) 4 5.72 (0.225) 0.452 (4) 6 4.52 (0.178) 0.452 (4) 8 3.61 (0.142) 0.452 (4) 10 3.18 (0.125) 0.226 (2) 12 2.39 (0.094) 0.226 (2) 16 1.588 (0.062
23、5) 0.226 (2) 20 1.02 (0.040) 0.056 (0.5) 22 0.76 (0.030) 0.014 (0.125) 23 0.69 (0.027) 0.014 (0.125) 24 0.64 (0.025) 0.014 (0.125) NOTES 1 Fulcrum point for calculating moment, meter-newton (inch-pound) 2 The values for distances and weight may vary. The product of the weight and distance shall be e
24、qual to the moment specified above. 3 The weight and its shape may vary. Figure 1 - Test probe fixture EIA-364-25E Page 5 NOTE Collet to be mounted in device similar to lathe chuck. Capable of quick engage and release. Figure 2 Collet type holding device for contacts tested outside the connector Fig
25、ure 3 - Apparatus for testing nonremovable socket contacts within the connector ECIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety, health or technical reasons, please fill in the appropriate information below and mail or FAX to
26、: Electronic Components Industry Association EIA Standards & Technology Department 2214 Rock Hill Rd., Suite 265 Herndon, VA 20170 FAX: (571-323-0245) Document No.: Document Title: Submitters Name: Telephone No.: FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revision: Problem Area:
27、 a. Clause Number and /or Drawing: b. Recommended Changes: c.Reason/Rationale for Recomendation: Additional Remarks: Signature: Date: FOR ECIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Revision History Revision letter Project number Publication date Add
28、itions, changes and deletions - SP-1016 December 1969 Initially published in EIA RS-364 A SP-1556 February 1983 Published as RS-364-25AB SP-3713 April 1997 C SP-4029 May 1998 D SP-5200 November 2010 Revised paragraph 1.1, 2.1, 3.1.1, 3.2, 4.2, and 4.3, 5.1, 5.4, 6.6 and figure 2. Delete paragraph 4.
29、1 and 4.3. E SP-5373.02 Corrected paragraph references in paragraph 4.3, 5.5 and in figure 1 after “B” dimension. Corrected diameter A tolerance in figure 1 table heading. Revised metric unit in figure 1 note 1. Corrected “Weight” note reference in figure 1. Electronic Components Industry Association 2214 Rock Hill Road, Suite 265 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.ecianow.org
