1、 EIA STANDARD TP-27C Mechanical Shock (Specified Pulse) Test Procedure for Electrical Connectors and Sockets EIA-364-27C (Revision of EIA-364-27B) June 2011 Electronic Components Industry Association EIA-364-27C ANSI/EIA-364-27C-2011 (R2017) Approved: June 17, 2011 Reaffirmed: February 10, 2017 NOTI
2、CE EIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay t
3、he proper product for his particular need. Existence of such Specifications and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Specifications and Publications, nor shall the existence of such Specifications
4、 and Publications preclude their voluntary use by those other than ECIA members, whether the Specification is to be used either domestically or internationally. Specifications and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By s
5、uch action, ECIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Specification or Publication. This EIA Specification is considered to have International Standardization implications, but the International Electrotechnical Commiss
6、ion activity has not progressed to the point where a valid comparison between the EIA Specification and the IEC document can be made. This Specification does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the
7、user of this Specification to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use. (From Standards Proposal No. 5382.03, formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Sockets Standards)
8、Published by Electronic Components Industry Association 2017 EIA Standards where A is the acceleration amplitude and D is the pulse duration of the ideal pulse; see figure 2. The measured pulse will then be considered a nominal half-sine pulse with a nominal amplitude and duration equal to respectiv
9、e values of the corresponding ideal half-sine pulse. The duration of the measured pulse shall be taken as Dm = D(0.1A)/0.94; where D(0.1A) is the time between points at 0.1A for the faired measured acceleration pulse. EIA-364-27C Page 6 2.1.4.2 The ideal half-sine pulse An ideal half-sine accelerati
10、on pulse is given by the solid curve; see figure 2. The measured acceleration pulse shall lie within the boundaries given by the broken lines. In addition, the actual velocity change of the shock shall be within 10% of the ideal velocity change. The actual velocity change can be determined by direct
11、 measurements, or from the area under the measured acceleration curve. The ideal velocity change is equal to Vi = 2AD/pi. 2.1.4.3 Sawtooth shock pulse The sawtooth pulse shall be as indicated in figure 3. The velocity change of the faired measured pulse shall be within _+10% of the velocity change o
12、f the ideal pulse. 2.1.4.4 The ideal terminal peak sawtooth An ideal terminal peak sawtooth acceleration pulse is given by the solid line; see figure 3. The measured acceleration pulse shall be within the boundaries given by the broken lines. In addition, the actual velocity change of the shock puls
13、e shall be within 10% of the ideal value. The actual velocity change can be determined from direct measurements, or from the area under the measured acceleration curve. The ideal velocity change is equal to Vi = PD/2, where P is the peak value of acceleration, and D is the pulse duration. 3 Test spe
14、cimen 3.1 Description Unless otherwise specified in the referencing document, the test specimen shall be fully wired and mated. 3.2 Preparation The test specimen shall be mounted as specified in the referencing document. If the test specimen is normally mounted on vibration isolator, the isolators s
15、hall be functional during the test. Whenever possible, the test load shall be distributed uniformly on the test platform in order to minimize the effects of unbalanced loads. 4 Test procedure 4.1 Shock application Three shocks in each direction shall be applied along the three mutually perpendicular
16、 axes of the test specimen (18 shocks). The specified test pulse (half-sine or sawtooth pulse) shall be in accordance with figure 2 or 3, respectively, and shall have a duration and peak value in accordance with one of the test conditions shown in table 1. EIA-364-27C Page 7 Table 1 - Test condition
17、 value Test condition Peak acceleration Normal duration (D) (ms) Velocity change (Vi) (m/s : ft/s) (m/s2) (g=s) Sawtooth Half-sine H 294 30 11 2.07 : 6.8 I 294 30 11 1.62 : 5.3 A 490 50 11 3.44 : 11.3 E 490 50 11 2.68 : 8.8 B 735 75 6 2.81 : 9.2 F 735 75 6 2.20 : 7.2 C 980 100 6 3.75 : 12.3 G 980 10
18、0 6 2.96 : 9.7 D 2941 300 3 5.61 : 18.4 J 4903 500 1 3.11 : 10.2 K 9806 1000 0.5 3.11 : 10.2 L 14709 1500 0.5 4.69 : 15.4 NOTE For test conditions D, J, K and L, where the weight of multi-specimen and fixtures exceeds 68 kilograms (150 pounds), there is a question as to whether the shock pulse is pr
19、operly transmitted to all specimens. Due consideration shall be given to the design of the test fixture to assure the proper shock input to each specimen. 4.2 Measurements 4.2.1 Measurements are to be made on mated connectors before and after the required number of shocks unless otherwise specified
20、in the referencing document, and during the test, if specified. 4.2.1.1 Unless otherwise specified in the referencing document, an electrical load of 100 milliamperes maximum with a detector capable of detecting a discontinuity of 1.0 microsecond or longer. Said monitoring shall be performed in acco
21、rdance with EIA-364-46. 4.2.1.2 Unless otherwise specified in the referencing document, low nanosecond event detection shall be performed in accordance with EIA-364-87. A 100 milliamperes test current shall be applied to the areas being monitored. A detector capable of measuring an event resulting i
22、n a 10 ohm change lasting longer than 10 nanoseconds, unless otherwise specified in the referencing document. 4.2.1.2.1 Low nanosecond event detection shall not be used as a substitute for the standard 1.0 microsecond requirement. This monitoring test was developed to detect different failure mechan
23、isms than that described in 4.2.1.1. It is designed to detect large resistance fluctuations or voltage variations that may result in improper triggering of high speed digital circuits. EIA-364-27C Page 8 5 Details to be specified 5.1 Mounting method and accessories, location of wire clamps, see 3.2
24、5.2 Test specimens (mated unless otherwise specified in the referencing document) 5.3 Test condition letter, see table 1 5.4 Electrical load conditions, see 4.2 5.5 Event requirement if other than 1 microsecond. 5.6 Measurement of discontinuity during shocks, see 4.2 5.7 Tests or measurements before
25、 and after shocks, see 4.2 5.8 Monitoring instrumentation, if applicable, see 2.1.3 5.9 Location of monitoring transducers, if applicable, see 2.1.2.4 5.10 Mounting axis, see 1.4 6 Test documentation Documentation shall contain the details specified in clause 5, with any exceptions, and the followin
26、g: 6.1 Title of test 6.2 Sample description include fixture, if applicable 6.3 Test equipment used, and date of last and next calibration 6.4 Test condition letter 6.5 Photographs, plots, values and observations necessary for proof of conformance 6.6 Mounting axis, see 1.4 6.7 Name of operator and s
27、tart/finish date(s) of test EIA-364-27C Page 9 NOTE The oscillogram should include a time about 3D long with the pulse located approximately in the center. The integration to determine velocity change should extend from 0.4D before the pulse to 0.1D beyond the pulse. The acceleration amplitude of th
28、e ideal half since pulse is A and its duration is D. Any measured acceleration pulse that can be contained between the broken line boundaries is a nominal half sine pulse of nominal amplitude A and nominal duration D. The velocity-change associated with the measured acceleration pulse is V. Figure 2
29、 - Tolerances for half-sine shock pulse EIA-364-27C Page 10 NOTE The oscillogram should include a time about 3D long with the pulse approximately in the center. The integration to determine the velocity change should extend from 0.4D before the pulse to 0.1D beyond the pulse. The peak acceleration m
30、agnitude of the sawtooth pulse is P and its duration is D. Any measured acceleration pulse which can be contained between the broken line boundaries is a nominal terminal-peak sawtooth pulse of nominal peak value, P, and nominal duration, D. The velocity-change associated with the measured accelerat
31、ion pulse is V. Figure 3 - Tolerances for terminal peak sawtooth shock pulse EIA-364-27C Page 11 Duration of pulse (ms) Low-frequency cut-off (Hz) High-frequency cut-off (kHz) -1 dB Frequency beyond which the response may rise above +1 dB (kHz) -1 dB -10 dB 3 4 1 5 25 Figure 4 - Tolerance limits for
32、 measuring system frequency response EIA-364-27C Page 12 Revision History Revision letter Project number Additions, changes and deletions C SP-5213 Added paragraph 1.3. Revised paragraph 4.2. EIA Document Improvement Proposal If in the review or use of this document, a potential change is made evide
33、nt for safety, health or technical reasons, please fill in the appropriate information below and mail or FAX to: Electronic Components Association Engineering Department 2500 Wilson Blvd, Suite 310. Arlington, VA 22201 FAX: (703-875-8908) Document No.: Document Title: Submitters Name: Telephone No.:
34、 FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR ECA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Electronic Components Industry Association 2214 Rock Hill Road, Suite 265 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.ecianow.org
