1、BRITISH STANDARD BS EN 60512-10-4:2003 Connectors for electronic equipment Tests and measurements Part 10-4: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests Test 10d: Electrical overload (connectors) The European Standard EN 60512-10-4:2003 ha
2、s the status of a British Standard ICS 31.220.10 BS EN 60512-10-4:2003 This British Standard was published under the authority of the Standards Policy and Strategy Committee on 13 November 2003 BSI 13 November 2003 ISBN 0 580 42903 2 National foreword This British Standard is the official English la
3、nguage version of EN 60512-10-4:2003. It is identical with IEC 60512-10-4:2003. It supersedes BS EN 60512-10-4:1997 which is withdrawn. The UK participation in its preparation was entrusted by Technical Committee EPL/48, Electromechanical components and mechanical structures for electronic equipment
4、, to Subcommittee EPL/48/2, Connectors for electronic equipment, which has the responsibility to: A list of organizations represented on this subcommittee can be obtained on request to its secretary. Cross-references The British Standards which implement international or European publications referr
5、ed to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI Electronic Catalogue or of British Standards Online. This publication does not purport to include all the necessary provisi
6、ons of a contract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, o
7、r proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summary of pages This document comprises a front cover, an inside front cover, the EN title page, pages 2 to 7 and a back cover. The BSI copyright notice
8、 displayed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. Date CommentsEUROPEAN STANDARD EN 60512-10-4 NORME EUROPENNE EUROPISCHE NORM October 2003 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisati
9、on Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2003 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60512-10-4:2003 E ICS 31.220.10 Supersedes EN 605
10、12-10-4:1996English version Connectors for electronic equipment Tests and measurements Part 10-4: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests Test 10d: Electrical overload (connectors) (IEC 60512-10-4:2003) Connecteurs pour quipements lect
11、roniques Essais et mesures Partie 10-4: Essais dimpact (composants libres), essais dimpact sous charge statique (composants fixes), essais dendurance et essais de surcharge - Essai 10d: Surcharge lectrique (connecteurs) (CEI 60512-10-4:2003) Steckverbinder fr elektronische Einrichtungen Mess- und Pr
12、fverfahren Teil 10-4: Aufprallprfungen (freie Bauelemente), Prfungen mit statischer Last (feste Bauelemente), Dauerprfung und berlastprfungen Prfung 10d: Elektrische berlast (Steckverbinder) (IEC 60512-10-4:2003) This European Standard was approved by CENELEC on 2003-10-01. CENELEC members are bound
13、 to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Cen
14、tral Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same s
15、tatus as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Lithuania, Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzer
16、land and United Kingdom. Foreword The text of document 48B/1350/FDIS, future edition 2 of IEC 60512-10-4, prepared by SC 48B, Connectors, of IEC TC 48, Electromechanical components and mechanical structures for electronic equipment, was submitted to the IEC-CENELEC parallel vote and was approved by
17、CENELEC as EN 60512-10-4 on 2003-10-01. This European Standard supersedes EN 60512-10-4:1996. This standard is to be read in conjunction with EN 60512-1:2001 and EN 60512-1-100:2001 which explains the structure of the EN 60512 series. The following dates were fixed: latest date by which the EN has t
18、o be implemented at national level by publication of an identical national standard or by endorsement (dop) 2004-07-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2006-10-01 Annexes designated “normative“ are part of the body of the standard. In thi
19、s standard, annex ZA is normative. Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 60512-10-4:2003 was approved by CENELEC as a European Standard without any modification. _ Page2 EN60512104:2003CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASURE
20、MENTS Part 10-4: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests Test 10d: Electrical overload (connectors) 1 Scope and object This part of IEC 60512 applies to the electrical overload test of mated contact pairs of connectors. The object of t
21、his test is to draw up a standard method to assess the performance of mated contact pairs of connectors with an electrical overload current flowing through them for a limited period of time between 100 ms and 20 s. The test procedure is based on measuring the increase of temperature during the speci
22、fied period of time when the electrical overload is applied to the contacts. Temperature increase over time is measured for an electrical overload current, specified as an integer multiple of the rated current, and an overload current-over-time diagram is plotted. NOTE Practice shows that, for limit
23、ed periods of time, contacts can conduct a multiple of the maximum permissible current without damage to the contact area. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undat
24、ed references, the latest edition of the referenced document (including any amendments) applies. IEC 60512 (all parts), Connectors for electronic equipment Tests and measurements IEC 60512-1-100, Connectors for electronic equipment Tests and measurements Part 1-100: General Applicable publications 3
25、 Preparation of specimens The connector shall be wired with the maximum wire size for the contacts and, unless otherwise specified in the detail specification, the shortest possible wire lengths compatible with the contact arrangement. Contacts of the same size in a connector set shall be wired in s
26、eries. At least three mated connectors shall be tested. Page3 EN60512104:20034 Test method Overload current shall be an integer multiple of the rated current specified in the detail specification. This overload current shall be applied for a period of time and shall be switched off as soon as the te
27、mperature has reached the upper temperature limit defined in the detail specification. Recovery of the samples under test to laboratory temperature conditions shall be achieved before the next cycle is carried out. The test shall be repeated with different overload currents to plot temperature-time
28、curves as shown in Figure A.1. At least five different overload current-time values in the considered time range from 100 ms to 20 s shall be selected to plot the curve in Figure A.2. At least three samples shall be tested and the sample with the fastest temperature-increasing rate shall be selected
29、 for the overload current plot. 5 Measurements and requirements The specimen shall be checked by the following tests, unless otherwise specified in the detail specification. Test 2a (contact resistance millivolt level method) of IEC 60512; Tests 13a (engaging and separating forces) or 13b (insertion
30、 and withdrawal forces) of IEC 60512; Test 1a (visual examination) of IEC 60512. Attention should be given to any indication of deterioration of the contact surface and housing or as specified in the detail specification. 6 Details to be specified When this test is required by the detail specificati
31、on, the following details shall be specified: a) number of specimens and contacts to be tested; b) type and size of wire used; c) test points and method (thermocouple) for temperature measurement; d) upper temperature limit; e) rated current and overload current of specimens; f) measurements and req
32、uirements; g) any deviation from the standard test method. Page4 EN60512104:2003Annex A (informative) Basic consideration for measurement and overload current plot The overload current-carrying capacity is influenced by a variety of attributes (design and application) and limited by the maximum allo
33、wed temperature of contacts, plating, terminations, housing, etc. The maximum temperature increase t bunder current overload can be calculated by t b= t u t e where t uis the upper temperature limit of the connector according to the detail specification; t e is the maximum permissible environmental
34、temperature of the connectors surrounding environment in the application. The following diagrams are measured and plotted as examples. 120 0 Temperature C Time s 110 100 90 80 70 60 50 40 30 20 10 0 1234567891 0 6 I B 5 I B = 125 A 4 I B = 100 A 3 I B = 75 A 2 I B = 50 A t b = 85 C a IEC 2055/03a Ov
35、erload current, an integer multiple of rated current I B . Figure A.1 Temperature increase against time and current With the temperature-time curves and the maximum temperature increase t b(in Figure A.1 above t b= 85 C), the time and current values are used to plot Figure A.2 in a double logarithmi
36、c scale. Page5 EN60512104:2003 1 000 100 10 0,1 1 10 100 Current A Duration of overload s t b= 85 C IEC 2056/03Figure A.2 Maximum overload against time Current-time values below the curve shown in Figure A.2 are permitted. _ Page6 EN60512104:2003 Annex ZA (normative) Normative references to internat
37、ional publications with their corresponding European publications This European Standard incorporates by dated or undated reference, provisions from other publications. These normative references are cited at the appropriate places in the text and the publications are listed hereafter. For dated ref
38、erences, subsequent amendments to or revisions of any of these publications apply to this European Standard only when incorporated in it by amendment or revision. For undated references the latest edition of the publication referred to applies (including amendments). NOTE When an international publi
39、cation has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60512 Series Connectors for electronic equipment - Tests and measurements EN 60512 Series IEC 60512-1-100 2001 Connectors for electronic equipment - Tests and measu
40、rements Part 1-100: General - Applicable publications EN 60512-1-100 2001 Page7 EN60512104:2003BS EN 60512-10-4:2003 BSI 389 Chiswick High Road London W4 4AL BSI British Standards Institution BSI is the independent national body responsible for preparing British Standards. It presents the UK view on
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