1、BRITISH STANDARD Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency The European Standard EN 6133813:2000 has the status of a British Standard ICs 31.
2、140: 33.120.10 tS EN EC i 1338- 1-3:ZOOO i1338-1-3:1999 NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAW W Lb24bb9 0853933 3Tb W BS EN 61338-1-3:2000 direction of the Electrotechnical Sector Committee, was published under the authority of the Standards Committee and comes into
3、effect on 15 June 2000 Amd. No, O BSI OG2000 National foreword D - present to the responsible internationalEuropean committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; - monitor related international and European developments and promulgate the
4、m in the UK A list of organizations represented on this committee can be obtained on request to its secretary. From 1 January 1997, all IEC publications have the number 60000 added to the old number. For instance, IEC 27-1 has been renumbered as IEC 60027-1. For a period of time during the change ov
5、er from one numbering system to the other, publications may contain identifiers from both systems. Cross-references Attention is drawn to the fact that CEN and CENELEC Standards normally include an annex which lists normative references to international publications with their corresponding European
6、 publications. The British Standards which implement these international or European publications may be found in the BSI Standards Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Find” facility of the BSI Standards Electronic Catalogue. A Britis
7、h Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front
8、cover, an inside front cover, the EN title page, pages 2 to 23 and a back cover. The BSI copyright notice displayed in this document indicates when the document was last issued. ISBN O 580 34337 5 I 1624bb9 0851934 232 EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 61 338-1 -3 March 2000 ICs 3
9、3.120.10 English version Waveguide type dielectric resonators Part 1-3: General information and test conditions Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency (IEC 61 338-1 -3:1999) Rsonateurs dilectriques modes guids Partie 1-3: Informa
10、tions gnrales et conditions dessais - Mthode de mesure de la permittivit relative complexe des matriaux dilectriques pour les rsonateurs dilectriques fonctionnant aux hyperfrquences (CE1 61 338-1 -31999) Dielektrische Resonatoren vom We1 I enleit e rty p Teil 1-3: Allgemeine Informationen und Prfbed
11、ingungen - Meverfahren fr die relative Dielektrizittskonstante von dielektrischen Resonatorwerkstoffen irn Mi krowellen-Frequenzbereich (IEC 61 338-1-311 999) This European Standard was approved by CENELEC on 2000-01 -01. CENELEC members are bound to comply with the CENICENELEC Internal Regulations
12、which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This Europ
13、ean Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are t
14、he national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. CENELEC European Committee for Electrotechnical Standardization C
15、omit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, 6 - 1050 Brussels 2000 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 61338-1-3:2000 E I Lb2
16、4bb 0851935 179 Page 2 EN 61338-1-3:ZOOO Foreword The text of document 49/444/FDIS, future edition 1 of IEC 61338-1-3, prepared by IEC TC 49, Piezoelectric and dielectric devices for frequency control and selection, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 61
17、338-1-3 on 2000-0 1 -0 1 . The following dates were fixed: - latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2000- 1 0-0 1 - latest date by which the national standards conflicting with the EN have to be wit
18、hdrawn (dow 2003-0 1 -0 1 Annexes designated “informative“ are given for information only. in this standard, annex A is informative. Endorsement notice The text of the International Standard IEC 61 338-1 -3: 1999 was approved by CENELEC as a European Standard without any modification. Page 3 EN 6133
19、8-1-3:2000 CONTENTS Page INTRODUCTION 5 Clause 1 Scope and object . 6 2 Measuring parameters . 6 3 Theory and calculation equations . 7 3.1 Relative permittivity and loss factor . 7 3.2 3.3 Temperature coefficient of resonance frequency 11 3.4 Temperature dependence of tan 6 . 13 Preparation of diel
20、ectric specimen 13 4.1 Preparation of standard dielectric rods 13 4.2 Measurement equipment and apparatus . 14 5.2 Measurement apparatus for complex permittivity . 15 5.3 6 Measurement procedure 17 6.1 Measurement procedure for complex permittivity . 17 6.2 Measurement procedure for temperature coef
21、ficient . 20 Accuracy and error estimation 20 7.1 Measurement error due to the size of conducting plates . 20 7.2 Measurement error of relative conductivity . 21 7.3 Errors due to the airgap between dielectric rod and conducting plates or to field disturbance . 22 7.4 Result of round robin test (RRT
22、) 22 Determination of the relative conductivity of conducting plates . 10 4 Preparation of test specimen . 14 5.1 Measurement equipment . 14 Measurement apparatus for temperature coefficient . i 7 5 7 Annex A . Bibliography 23 Figures Figure 1 . Configuration of a cylindrical dielectric rod resonato
23、r short-circuited at both ends by two parallel conducting plates 7 Figure 2 - Chart for relative permittivity calculation using TE, e mode 8 Figure 3 - Confirmation of standard dielectric rod resonators for measurement Figure 4 - Temperature dependence off0 (figure 4a) and tan 6 (figure 4b) for five
24、 kinds of dielectrics (E = 21, 25, 30, 38 and 90) . 12 Figure 5 - Mode chart of a dielectric rod resonator short-circuited at both ends Figure 6 - Schematic diagram of measurement equipment 16 Figure 7 - Measurement apparatus for complex permittivity 16 of conductivity of conducting plates 10 by par
25、allel conducting plates . 15 O BSI 06-2000 1624669 0853937 T4L Page 4 EN 61338-1-3:ZOOO Figure 8 - Measurement apparatus for temperature coefficient 17 Figure 9 - Frequency response for TE011 mode resonator having E = 37,5, d = 8,OO mm and h = 3,3 mm 19 Figure 1 O - Insertion attenuation ZAO, resona
26、nce frequencyfo and half-power bandwidth Af . 19 Figure 1 I - Measurement error on E and tan S by the size ratio dld 21 Tables Table 1 - Examples of dimensions for standard dielectric rods 13 Table 2 - Example of TE01 1 mode resonance frequency for various E and dimensions of a dielectric specimen .
27、 . . . . . . . . ._ . . . . . . . ._. . . . . . . . . . . . . . . . . 14 Table 3 - Recommended dimensions and materials for conducting plate 17 O BSI 06-2000 Lb24bb7 0853738 788 M Page 6 EN 61338-1-3:2000 INTRODUCTION Dielectric materials for microwave resonators and filters have high relative permi
28、ttivity, a low loss factor and superior temperature stability of resonance frequencies. Knowledge of these parameters is of primary importance for the development of new materials on the supplier side and for the design of dielectric microwave components on the customer side. The parameters of diele
29、ctric resonator materials needed for the design of microwave components are: - the real component E of the complex relative permittivity; - the loss factor tan S; - the temperature coefficient of resonance frequency (TCF); - the temperature dependence of tan 6. Several measurement methods are propos
30、ed to determine the complex permittivity at microwave frequencies: - the dielectric rod resonator method using TE011 resonance mode: - the cylindrical cavity method using TE016 resonance mode: - the perturbation method using a cylindrical cavity; - the S-parameter method using a coaxial line. O BSI
31、06-2000 Page 6 EN 61338-1-3:2000 WAVEGUIDE TYPE DIELECTRIC RESONATORS - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency 1 Scope and object This part of IEC 61338 describes the dielectric
32、 rod resonator measurement method for a wide range of microwave dielectric properties in practical applications. This method has the following characteristics: - a complete and exact mathematical solution of complex relative permittivity is given by easy computer software; - the measurement error is
33、 less than 0,3 % for d and less than 0,05 x 10-4 for tan S; - the TCF is directly measured without any compensation with a measurement error less than 1 x IO-WK. The object of this standard is to describe the measurement methods of the complex relative permittivity of dielectric resonator materials
34、at microwave frequencies by means of the dielectric rod resonator method short-circuited at both ends by parallel conducting plates. The measuring parameters are d, tan S, TCF and the temperature dependence of tan 6 at the resonance frequency. The dielectric materials are assumed to be isotropic and
35、 homogeneous. 2 Measuring parameters The terms of the measuring parameters are defined as follows: tan 6= E and E“ are the real and imaginary components of the complex relative permittivity E. is the electric flux density; is the electric field strength; It should be noted that the TCF is defined by
36、 equation (3) as the material constant, TCs being the temperature coefficient of relative permittivity and a the coefficient of thermal expansion of the dielectric specimen. Each of the temperature coefficients is given as follows: O BSI 06-2000 M 11b24bb9 08511940 536 E Page 7 EN 61338-1-3:ZOOO whe
37、re f andf,f are the resonance frequencies at temperature T and reference temperature Tref (Tref= 20 OC to 25 OC); .q and Eref are the real parts of the complex relative permittivity at temperatures T and Tref; hT and bref are the lengths of the dielectric specimen which is assumed to be isotropic at
38、 temperatures T and Tref. The applicable measuring ranges of dielectric properties for this method are the following: - frequency: 2 GHz 3 d in figure 1). Measurement apparatus for complex permittivity Table 3 shows an example of the recommended dimensions and materials for the conducting plates. It
39、 is preferable that the conducting plates have a high conductivity. Therefore, metals such as silver, copper, and other metals plated by silver with a thickness greater than 5 pm, are often used. The surface of the plates shall be polished to a mirror-like sheen. The surface roughness should prefera
40、bly be reduced to the order of 0,l pm because the skin depth of the standard annealed copper is 0,66 pm at 10 GHz. O BSI 06-2000 Page 16 EN 6 1338- 1-3 :2000 Sweep oscillator, frequency counter Scalar network analyzer Measuring apparatus Temperature controlled oven IEC 1581/99 Figure 6 - Schematic d
41、iagram of measurement equipment Each of the two semi-rigid cables has a small loop at the top so that the plane of the loop parallels that of the conducting plates. These cables can move right and left to adjust the insertion attenuation (1.40) to around 30 dB (figure 7). The 1.40 value shall be sel
42、ected so as to be greater than 20 dB, in order to decrease the field disturbance due to the coupling loop, and smaller than 40 dB, to decrease the effect of thermal noise due to the network analyzer. Hence, a mean value of 30 dB is generally chosen. A third semi-rigid cable, shown in figure 7, is us
43、ed as a reference line to measure the full transmission power level, i.e the reference level. This cable has a length equal to the total sum of the two cables of the measurement apparatus. The recommended types of semi-rigid cables are UT-141, UT-85 and UT-47 with outer diameters of 3,58 mm, 2,20 mm
44、 and 1,20 mm, respectively. Dielectric specimen Cable clamp Reference line /C 1582/99 Figure 7 - Measurement apparatus for complex permittivity BS1 06-2000 Page 17 EN 61338-1-3:2000 Diameter (d) Thickness Table 3 - Recommended dimensions and materials for conducting plate _ 60 mm to 80 mm (for diele
45、ctric specimens with dimensions of d = 5 mm to 20 mm and dlh = 0,8 to 1,2) 4 mm to 5 mm Material Silver, copper or metals plated by silver thicker than 5 pn 5.3 A measurement apparatus for the measurement of the temperature coefficient of resonance frequency is shown in figure 8. The dielectric reso
46、nator is short-circuited at both ends by two parallel conducting plates, the upper plate being pressed down by a spring. Use of a plate-type spring is recommended for the improvement of measurement accuracy. This type of spring reduces the friction between the spring and the other part of the appara
47、tus, thus allowing the smooth movement of the conducting plates due to the thermal expansion of the test specimen. Measurement apparatus for temperature coefficient If the diameter of the conducting plates is three times larger than that of the dielectric specimen (d 3 d), the measured TCF approxima
48、tely satisfies the relation of equation (3). 6 Measurement procedure 6.1 a) Preparation Measurement procedure for complex permittivity Set up the measurement equipment as shown in figure 6. All measurement equipment, apparatus and dielectric specimens shall be kept in a clean, dry state as high humi
49、dity degrades the unloaded Q value. Relative humidity shall, preferably, be less than 60 YO. The level of full transmission power (reference level) is measured first. Connect the reference line (figure 7) between the power splitter and the detector using the semi-rigid cable. Then, measure the full transmission power level over the entire measurement frequency range. c) Measurement of standard dielectric rods The resonance frequency and unloaded Q of TE011 and TEol modes of the standard dielectric rods are measured as follo
