1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationPlasma display panels Part 5: Generic specificationBS EN 61988-5:2009National forewordThis British Standard is the UK implementation of EN 61988-5:2009. It isidentical to IEC 619
2、88-5:2009.The UK participation in its preparation was entrusted to Technical CommitteeEPL/47, Semiconductors.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions of acontract. Users
3、are responsible for its correct application. BSI 2010ISBN 978 0 580 57115 2ICS 31.120; 31.260Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was published under the authority of the StandardsPolicy and Strategy Committee on 28 February 2010Amendm
4、ents issued since publicationAmd. No. Date Text affectedBRITISH STANDARDBS EN 61988-5:2009EUROPEAN STANDARD EN 61988-5 NORME EUROPENNE EUROPISCHE NORM December 2009 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr
5、Elektrotechnische Normung Central Secretariat: Avenue Marnix 17, B - 1000 Brussels 2009 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 61988-5:2009 E ICS 31.260 English version Plasma display panels - Part 5: Generic specificatio
6、n (IEC 61988-5:2009) Panneaux daffichage plasma - Partie 5: Spcification gnrique (CEI 61988-5:2009) Plasmabildschirme - Teil 5: Fachgrundspezifikation (IEC 61988-5:2009) This European Standard was approved by CENELEC on 2009-12-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Re
7、gulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member.
8、This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC mem
9、bers are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slove
10、nia, Spain, Sweden, Switzerland and the United Kingdom. BS EN 61988-5:2009EN 61988-5:2009 - 2 - Foreword The text of document 110/182/FDIS, future edition 1 of IEC 61988-5, prepared by IEC TC 110, Flat panel display devices, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC
11、as EN 61988-5 on 2009-12-01 The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2010-09-01 latest date by which the national standards conflicting with the EN have to be withdrawn
12、 (dow) 2012-12-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 61988-5:2009 was approved by CENELEC as a European Standard without any modification. _ BS EN 61988-5:2009- 3 - EN 61988-5:2009 Annex ZA (normative) Normative references to internati
13、onal publications with their corresponding European publications The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amend
14、ments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60027 Series Letter symbols to be used in electrical technology EN 60027Series IEC 60050 Series International electr
15、otechnical vocabulary - - IEC 60410 1973 Sampling plans and procedures for inspection by attributes - - IEC 60617 Data-base Graphical symbols for diagrams - - IEC 60747-1 -1)Semiconductor devices - Part 1: General - - IEC 61988-1 -1) Plasma display panels - Part 1: Terminology and letter symbols EN
16、61988-1 20032)IEC 61988-2-1 -1)Plasma display panels - Part 2-1: Measuring methods - Optical EN 61988-2-1 20022)IEC 61988-2-2 -1)Plasma display panels - Part 2-2: Measuring methods - Optoelectrical EN 61988-2-2 20032)IEC 61988-3-1 -1)Plasma display panels - Part 3-1: Mechanical interface EN 61988-3-
17、1 20052)IEC 61988-4 -1)Plasma display Panels - Part 4: Climatic and mechanical testing methods EN 61988-4 20072)IECQ 01 -1)IEC Quality Assessment System for Electronic Components (IECQ) - Basic Rules - - IEC QC 001002 Series IEC quality assessment system for electronic components (IECQ) - Rules of p
18、rocedure - - ISO 1000 1992 SI units and recommendations for the use of their multiples and of certain other units - - ISO 2859-1 -1)Sampling procedures for inspection by attributes - Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection - - 1)Undated reference.
19、 2)Valid edition at date of issue. BS EN 61988-5:2009EN 61988-5:2009 - 4 - Publication Year Title EN/HD Year ISO 2859-10 -1)Sampling procedures for inspection by attributes - Part 10: Introduction to the ISO 2859 series of standards for sampling for inspection by attributes - - ISO 3534-2 -1)Statist
20、ics - Vocabulary and symbols - Part 2: Applied statistics - - BS EN 61988-5:2009 2 61988-5 IEC:2009 CONTENTS 1 Scope.6 2 Normative references .6 3 Order of precedence.7 4 Terminology, units, symbols and abbreviations.7 5 Standard environmental conditions.8 6 Marking 8 6.1 Device identification code8
21、 6.2 Device traceability code 8 6.3 Packing .8 7 Quality assessment procedures8 7.1 General .8 7.2 Eligibility for qualification and/or capability approval8 7.3 Primary stage of manufacture8 7.4 Commercially confidential information .9 7.5 Formation of inspection lots.9 7.6 Structurally similar devi
22、ces9 7.7 Subcontracting 9 7.8 Incorporated components 9 7.9 Validity of release9 8 Qualification approval procedure 9 8.1 Qualification approval testing 9 8.2 Granting of qualification approval 9 8.3 Quality conformance inspection requirements9 8.3.1 General .9 8.3.2 Division into groups and subgrou
23、ps .10 8.3.3 Inspection requirements 12 8.3.4 Supplementary procedure for reduced inspection 12 8.3.5 Sampling requirements for small lots .13 8.3.6 Certified records of released lots (CRRL) 13 8.3.7 Delivery of device subjected to destructive or non-destructive tests.13 8.3.8 Delayed deliveries .13
24、 8.3.9 Supplementary procedure for deliveries.13 8.4 Statistical sampling procedures .13 8.4.1 AQL sampling plans.14 8.4.2 LTPD sampling plans.14 8.5 Endurance tests 14 8.6 Endurance tests where the failure rate is specified14 8.6.1 General .14 8.6.2 Selection of samples .14 8.6.3 Failure.14 8.6.4 E
25、ndurance test time and sample size 14 8.6.5 Procedure to be used when the number of observed failures exceeds the acceptance number .14 8.7 Accelerated test procedures 15 9 Capability approval procedures 15 BS EN 61988-5:200961988-5 IEC:2009 3 10 Test and measurement procedures.15 10.1 Standard cond
26、itions and general precautions 15 10.1.1 Standard conditions.15 10.1.2 General precautions 15 10.1.3 Precision of measurements .16 10.2 Physical examination.16 10.2.1 Visual examination 16 10.2.2 Dimensions .16 10.3 Electrical and optical measurements .16 10.4 Climatic and mechanical tests .16 10.5
27、Alternative test methods16 10.6 Endurance.16 Annex A (normative) Lot tolerance percentage defective (LTPD) sampling plans .17 Annex B (informative) General description of specifications .22 Table A.1 LTPD sampling plans .19 Table A.2 Hypergeometric sampling plans for small lot size of 200 or less .2
28、0 Table A.3 AQL and LTPD sampling plans.21 BS EN 61988-5:2009 6 61988-5 IEC:2009 PLASMA DISPLAY PANELS Part 5: Generic specification 1 Scope This generic specification for plasma display panels specifies general procedures for quality assessment to be used in the IECQ-CECC system and establishes gen
29、eral principles for describing and testing of electrical, optical, mechanical and environmental characteristics. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated referen
30、ces, the latest edition of the referenced document (including any amendments) applies. IEC 60027 (all parts), Letter symbols to be used in electrical technology IEC 60050 (all parts), International electrotechnical vocabulary IEC 60410:1973, Sampling plans and procedures for inspection by attributes
31、 IEC 60617, Graphical symbols for diagrams IEC 60747-1, Semiconductor devices Part 1: General IEC 61988-1, Plasma display panels Part 1: Terminology and letter symbols IEC 61988-2-1, Plasma display panels Part 2-1: Measuring methods Optical IEC 61988-2-2, Plasma display panels Part 2-2: Measuring me
32、thods Optoelectrical IEC 61988-3-1, Plasma display panels Part 3-1: Mechanical interface IEC 61988-4, Plasma display panels Part 4: Climatic and mechanical testing methods IECQ 01, IEC Quality Assessment System for Electronic components (IECQ) Basic Rules QC 001002 (all parts), IEC Quality Assessmen
33、t System for Electronic components (IECQ) Rules of Procedure ISO 1000:1992, SI units and recommendations for the use of their multiples and of certain other units ISO 2859-1, Sampling procedures for inspection by attributes Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-b
34、y-lot inspection ISO 2859-10, Sampling procedures for inspection by attributes Part 10: Introduction to the ISO 2859 series of standards for sampling for inspection by attributes ISO 3534-2, Statistics Vocabulary and symbols Part 2: Applied statistics BS EN 61988-5:200961988-5 IEC:2009 7 3 Terms, de
35、finitions, units, symbols and abbreviations 3.1 Terms and definitions For the purpose of this document, the following terms and definitions given in IEC 61988-1, IEC 60050 series, IECQ 01, and ISO 3534-2 apply. NOTE Special terms for statistical quality control are given in IECQ 01 and ISO 3534-2. 3
36、.2 Units, symbols and abbreviations Units, graphical and letter symbols shall, wherever possible, be taken from IEC 60027, IEC 60617 and ISO 1000:1992. Any other units, symbols or terminology peculiar to one of the devices covered by this generic specification shall be taken from the relevant IEC or
37、 ISO standards (see Clause 2) or derived in accordance with the principles of the standards listed above. In this document following abbreviations are used: AQL: Acceptance quality level (see 8.4.1) LTPD: Lot tolerance percentage defectives (see 8.4.2) SI: Supervising Inspectorate DMR: Designated Ma
38、nagement Representative 4 Order of precedence The documents are ranked in the following order of authority: a) Detail specifications b) Blank detail specifications c) Sectional specifications d) Generic specifications e) Basic specifications f) IECQ rules of procedure g) Any other international (e.g
39、. IEC) documents to which reference is made h) National documents. The same order of precedence shall apply to equivalent national documents. Detail specifications are prepared by the National Standards Organization (NSO), an approved manufacturer, industrial task groups or users as described in IEC
40、 QC 001002-2:1998, 1.4. Blank detail specifications, sectional specifications and generic specification (this standard) are to be prepared by technical committee of IEC. Basic specifications are IEC or ISO documents related to all electrical components. IECQ rules of procedure are specified in IEC Q
41、C 001002. In Annex B, the general description of specifications is shown extracted from IEC Guide 102, 2.3. BS EN 61988-5:2009 8 61988-5 IEC:2009 5 Standard environmental conditions Standard environmental conditions for the measurement of characteristics, for tests and operating conditions are at te
42、mperature of 25 C 3 C, a relative humidity of 25 % to 85 %, and pressure of 86 kPa to 106 kPa. 6 Marking 6.1 Device identification code Each device shall have a marking that will enable clear identification of the device type, for example the model number. 6.2 Device traceability code The device sha
43、ll be provided with a traceability code which enables back-tracing of the device to a certain production or inspection lot, for example the serial number. 6.3 Packing Marking on the packing shall state a) the device identification code(s) of the enclosed device(s); b) the device traceability code(s)
44、; c) the number of enclosed devices; d) the required precautions, if any. This marking shall be in accordance with import/export customs regulations. Additional requirements can be specified in the relevant detail specification. 7 Quality assessment procedures 7.1 General Quality assessment is carri
45、ed out in the following order: a) approval of the manufacturer; b) qualification approval; c) quality conformance inspection; d) certification of conformity. The quality conformance inspection are subdivided into group A, B and C tests; these are performed lot by lot or periodically, as defined in 8
46、.3.2. In some cases, group D tests may also be specified, for example, for qualification approval. 7.2 Eligibility for qualification and/or capability approval A type of device becomes eligible for qualification and/or capability approval when the rules of the following procedures are satisfied: IEC
47、 QC 001002-3:2005, Clause 3, Qualification Approval of electronic components, describing the procedure for qualification approval (QA), the release for delivery and validity of release. 7.3 Primary stage of manufacture The primary stage of manufacture is defined in the sectional specification. BS EN
48、 61988-5:200961988-5 IEC:2009 9 7.4 Commercially confidential information If any part of the manufacturing process is commercially confidential, this shall be suitably identified, and DMR shall demonstrate to the SI that the requirements of the rules of procedure given in IEC QC 001002-3:2005, 2.3.3
49、.1, have been complied with. 7.5 Formation of inspection lots See the rules of procedure given in IEC QC 001002-3:2005, 3.3.1. 7.6 Structurally similar devices See the rules of procedure given in IEC QC 001002-3:2005, 3.3.2. 7.7 Subcontracting The use of subcontracting is permitted, unreservedly. See the rules of procedure given in IEC QC001002-3:2005, from 3.1.2.3 to 3.1.2.7. 7.8 Incorporated components See the rules of procedure given in IEC QC 001002-3:2005, 5.2
