1、BRITISH STANDARDBS EN62363:2011Radiation protection instrumentation Portable photon contamination meters and monitors ICS 13.280g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g
2、60g53g44g42g43g55g3g47g36g58National forewordThis British Standard is the UK implementation of EN 62363:2011. It is identical with IEC 62363:2008. It supersedes BS IEC 62363:2008, which is withdrawn.The CENELEC common modifications have been implemented at the appropriate places in the text. The sta
3、rt and finish of each common modification is indicated in the text by tags.The UK participation in its preparation was entrusted to Technical Committee NCE/2, Radiation protection and measurement.A list of organizations represented on this committee can be obtained on request to its secretary.This p
4、ublication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application.Compliance with a British Standard cannot confer immunity from legal obligations.BS EN 62363:2011This British Standard was published under the authority of the Standar
5、ds Policy and Strategy Committee on 30 June 2008 BSI 2011Amendments/corrigenda issued since publicationDate Comments 31 August 2011 This corrigendum renumbers BS IEC 62363:2008 as BS EN 62363:2011ISBN 978 0 580 68099 1EUROPEAN STANDARD EN 62363 NORME EUROPENNE EUROPISCHE NORM June 2011 CENELEC Europ
6、ean Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Management Centre: Avenue Marnix 17, B - 1000 Brussels 2011 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CEN
7、ELEC members. Ref. No. EN 62363:2011 E ICS 13.280 English version Radiation protection instrumentation - Portable photon contamination meters and monitors (IEC 62363:2008, modified) Instrumentation pour la radioprotection - Appareils portables de mesure et de surveillance de la contamination par des
8、 photons (CEI 62363:2008, modifie) Strahlenschutz-Messgerte - Tragbare Oberflchenkontaminations-Messgerte und -berwachungsgerte fr Photonenstrahlung (IEC 62363:2008, modifiziert) This European Standard was approved by CENELEC on 2011-06-20. CENELEC members are bound to comply with the CEN/CENELEC In
9、ternal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC
10、 member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CE
11、NELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romani
12、a, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. Foreword The text of the International Standard IEC 62363:2008, prepared by SC 45B, Radiation protection instrumentation, of IEC TC 45, Nuclear instrumentation, together with the common modifications prepared by the Technical
13、Committee CENELEC TC 45B, Radiation protection instrumentation, was submitted to the formal vote and was approved by CENELEC as EN 62363 on 2011-06-20. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard
14、 or by endorsement (dop) 2012-06-20 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2014-06-20 Annex ZA has been added by CENELEC. _ BS EN 62363:2011EN 62363:2011 (E) 2 Endorsement notice The text of the International Standard IEC 62363:2008 was approve
15、d by CENELEC as a European Standard with agreed common modifications as given below. BS EN 62363:2011EN 62363:2011 (E) 3 CONTENTS 0H1 Scope and object71H 2 Normative references .72H 3 Terms and definitions .83H 4 Units 12 14H 5 General characteristics. 5H12 5.1 Classification. 6H12 5.2 Detection ass
16、emblies 7H12 5.3 Ease of decontamination . 8H12 5.4 Sealing 9H13 5.5 Alarm threshold . 10H13 5.6 Pulse height thresholds . 11H13 5.7 Measurement assembly indications . 12H13 5.7.1 Meter display. 13H13 5.7.2 Audible indication 14H14 5.7.3 Additional indication 15H14 5.7.4 Monitors 16H14 5.8 Effective
17、 range of measurement 17H14 5.9 Mechanical shocks 18H14 5.10 Setting up and maintenance facilities for electronic equipment 19H14 6 General test procedures . 20H15 6.1 Nature of tests. 21H15 6.2 Test conditions 22H15 6.2.1 Reference and standard test conditions. 23H15 6.2.2 Tests performed under sta
18、ndard test conditions 24H15 6.2.3 Tests performed with variation of influence quantities 25H15 6.3 Reference radionuclides 26H15 6.4 Background . 27H15 6.5 Statistical fluctuations . 28H16 6.6 Test source . 29H16 7 Electrical characteristics. 30H16 7.1 Statistical fluctuations . 31H16 7.1.1 Requirem
19、ents 32H16 7.1.2 Method of test . 33H16 7.2 Response time 34H17 7.2.1 Requirements 35H17 7.2.2 Method of test . 36H17 7.3 Interrelationship between response time and statistical fluctuations 37H17 7.4 Warm-up time test . 38H18 7.4.1 Requirements 39H18 7.4.2 Method of test . 40H18 7.5 Overload protec
20、tion. 41H18 7.5.1 Requirements 42H18 7.5.2 Method of test . 43H18 7.6 Power supplies battery operation 44H18 BS EN 62363:2011EN 62363:2011 (E) 4 2 50H18 51H180 53H18 BS EN 62363:2011EN 62363:2011 (E) 5 7.6.1 General . 45H18 7.6.2 Requirements primary batteries (non-rechargeable) . 46H18 7.6.3 Requir
21、ements secondary batteries (rechargeable) 47H19 7.6.4 Method of test . 48H19 8 Radiation characteristics 49H20 8.1 General . 208.2 Detector profile 208.2.1 Requirements 52H20 8.2.2 Method of test . 208.3 Surface emission rate response 54H20 8.3.1 General . 55H20 8.3.2 Type test . 20 8.3.3 Method of
22、test . 57H21 8.3.4 Routine test. 58H22 8.4 Relative intrinsic error . 59H22 8.4.1 Requirements 60H22 8.4.2 Method of test . 61H22 8.5 Variation of surface emission rate response with photon radiation energy . 62H22 8.5.1 Requirements 63H22 8.5.2 Method of test . 64H23 8.6 Variation of response with
23、absorption 65H23 8.6.1 Requirement 66H23 8.6.2 Method of test . 67H24 8.7 Response to beta radiation 68H24 8.7.1 Requirement 69H24 8.7.2 Method of test . 70H24 8.8 Response to background photon radiation. 71H24 8.8.1 Requirement 72H24 8.8.2 Method of test . 73H25 8.9 Neutrons . 74H25 8.10 Detection
24、limit (minimum detectable surface emission rate per unit area) 75H25 8.10.1 Requirement 76H25 8.10.2 Method of test . 77H25 9 Environmental characteristics. 78H25 9.1 Ambient temperature . 79H25 9.1.1 Requirements 80H25 9.1.2 Methods of test 81H26 9.2 Relative humidity. 82H26 9.2.1 Requirements 83H2
25、6 9.2.2 Method of test . 84H26 9.3 Electromagnetic compatibility 85H26 10 Storage 86H27 10.1 General . 87H27 10.2 Mechanical shock 88H27 11 Documentation . 89H27 11.1 Identification certificate . 90H27 11.2 Operation and maintenance manual 91H27 50H18 51H180 53H18 526HBS EN 62363:2011EN 62363:2011 (
26、E) 6 Annex A (informative) Limit distances for typical detector volumes 92H31 Figure 1 Detector profile 93H29 Figure 2 Contiguous portions area for testing.934H30 Table 1 Reference conditions and standard test conditions 95H28 Table 2 Test performed under standard test conditions 96H28 Table 3 Test
27、performed with variation of influence quantities . 97H29 Table A.1 Limit distance for various detector volumes and window types .3198HAnnex ZA (normative) Normative references to international publications with their32corresponding European publications RADIATION PROTECTION INSTRUMENTATION PORTABLE
28、PHOTON CONTAMINATION METERS AND MONITORS 1 Scope and object This International Standard is applicable to portable and transportable contamination meters and monitors designed for the direct measurement or the direct detection of surface contamination by photon radiation emitting radionuclides and wh
29、ich comprise at least: a detection assembly (comprising counter tube, scintillation detector or semiconductor detector, etc.), which may be connected either rigidly or by means of a flexible cable or incorporated into a single assembly; a measurement assembly. The standard is applicable to: photon s
30、urface contamination meters; photon surface contamination monitors. The standard is applicable to detection assemblies that are designed to measure photon contamination from radionuclides which emit photons with energy in excess of 5 keV. In particular, this standard should be used to assess the per
31、formance of assemblies used to demonstrate that material is free from surface contamination by photon emitting radionuclides. This standard is also applicable to special purpose assemblies and to assemblies specifically designed to provide limited spectroscopic information to the user. NOTE These de
32、tection assemblies may be used to measure photon emissions from radionuclides that also emit alpha and beta radiations, where the alpha and beta emissions may be shielded due to the nature of the contamination. If shielding of the radioactive emissions occurs, then strictly speaking, the contaminati
33、on is near to rather than on the surface of the article being monitored. The object of this standard is to lay down standard requirements and to give examples of acceptable methods, and also to specify general characteristics, general test conditions, radiation characteristics, electrical safety, en
34、vironmental characteristics, and the requirements of the identification certificate for photon contamination meters and monitors. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. Fo
35、r undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60050-393:2003, International Electrotechnical Vocabulary (IEV) Part 393: Nuclear Instrumentation Physical phenomena and basic concepts IEC 60050(394):2007, International Electrotechnical Voca
36、bulary (IEV) Part 394: Nuclear instrumentation: Instruments, systems, equipment and detectors IEC 60068-2-27, Environmental testing Part 2: Tests Test Ea and guidance: Shock IEC 60086 (all parts), Primary batteries BS EN 62363:2011EN 62363:2011 (E) 7 IEC 60325:2002, Radiation protection instrumentat
37、ion Alpha, beta and alpha/beta (beta energy 60 keV) contamination meters and monitors IEC 61187:1993, Electrical and electronic measuring equipment Documentation ISO 7503-1:1988, Evaluation of surface contamination Part 1: Beta-emitters (maximum beta energy greater than 0,15 MeV) and alpha-emitters
38、ISO 7503-3:1996, Evaluation of surface contamination Part 3: Isomeric transition and electron capture emitters, low energy beta-emitters (E Beta max less than 0,15 MeV) ISO 8769-2:1996, Reference sources for the calibration of surface contamination monitors Part 2: Electrons of energy less than 0,15
39、 MeV and photons of energy less than 1,5 MeV ISO 11929-1:2000, Determination of the detection limit and decision threshold for ionizing radiation measurements Part 1: Fundamentals and application to counting measurements without the influence of sample treatment BIPM, The international system of uni
40、ts (SI), 7thedition, 1998 3 Terms and definitions For the purposes of this document, the general terminology concerning the detection and measurement of ionizing radiation and nuclear instrumentation given in IEC 60050-393 and IEC 60050-394 applies. Also, the terms and definitions specific to this s
41、tandard given in ISO 7503-1, ISO 7503-3, ISO 8769-2 and ISO 11929-1, as well as the following, apply. 3.1 particle very small portion of matter or energy IEV 393-11-01 3.2 photon quantum of electromagnetic radiation considered as an elementary particle of energy hv, where h is the Planck constant an
42、d v the frequency of the radiation IEV 393-11-06 3.3 surface emission rate (for a radioactive source) number of particles of a given type, whose energies are above a given value, emerging from the face of the radioactive source or its window per unit time IEV 393-14-87 NOTE In the context of this st
43、andard, a particle refers to a photon. 3.4 calibrated source activity activity of a test source in Becquerels, as stated by the source manufacturer at the time of purchase, or an appropriately accredited calibration laboratory. The calibrated activity shall always have a correction applied to take i
44、nto account radioactive decay 3.5 effective range of measurement absolute value of the difference between the two limits of a nominal range BS EN 62363:2011EN 62363:2011 (E) 8 IEV 394-40-16 3.6 response time (of a measuring assembly) duration between the instant of a step change in the measured quan
45、tity and the instant when the output signal reaches for the first time a specified percentage of its final value, that percentage being usually taken as 90 % IEV 394-39-09 NOTE For integrating measuring assemblies, the response time is 90 % of the equilibrium value of the first derivative or slope o
46、f the indication. 3.7 source efficiency s ratio between the surface emission rate and the number of particles of the same type created or released within the source per unit time ISO 8769-2, 3.3, modified NOTE Source efficiency will be affected by self-absorption and backscatter. 3.8 decay efficienc
47、y of a radionuclide with respect to photons dratio of the number of photons of a given energy, created per unit time by a given radionuclide, to the number of decays of this radionuclide per unit time ISO 7503-3, 3.1, modified 3.9 small area source source where the largest dimension of the active su
48、rface does not exceed 1 cm 3.10 surface emission rate response S ratio of the number of detected photons per unit time (for example the net count rate) to the conventionally true surface emission rate of photons of the same type per unit area, under stated conditions specified by the manufacturer 3.
49、11 surface activity response ratio of the number of detected photons per unit time (for example the net count rate) to the activity (in Becquerels) of the radioactive source per unit area, under stated conditions specified by the manufacturer 3.12 effective sensitive area area under the detector, where the efficiency to a small area source located within that area is always greater than 1 % of the maximum efficiency to the same source within that area NOTE The plane of the sensi
